
BibTeX records: Veerle Reumers
@article{DBLP:journals/jssc/LopezCWBPBWFRBH18, author = {Carolina Mora Lopez and Ho Sung Chun and Shiwei Wang and Laurent Berti and Jan Putzeys and Carl Van Den Bulcke and Jan{-}Willem Weijers and Andrea Firrincieli and Veerle Reumers and Dries Braeken and Nick Van Helleputte}, title = {A Multimodal {CMOS} {MEA} for High-Throughput Intracellular Action Potential Measurements and Impedance Spectroscopy in Drug-Screening Applications}, journal = {{IEEE} J. Solid State Circuits}, volume = {53}, number = {11}, pages = {3076--3086}, year = {2018}, url = {https://doi.org/10.1109/JSSC.2018.2863952}, doi = {10.1109/JSSC.2018.2863952}, timestamp = {Tue, 29 Dec 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/jssc/LopezCWBPBWFRBH18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/isscc/LopezCBWPBWFRBH18, author = {Carolina Mora Lopez and Ho Sung Chun and Laurent Berti and Shiwei Wang and Jan Putzeys and Carl Van Den Bulcke and Jan{-}Willem Weijers and Andrea Firrincieli and Veerle Reumers and Dries Braeken and Nick Van Helleputte}, title = {A 16384-electrode 1024-channel multimodal {CMOS} {MEA} for high-throughput intracellular action potential measurements and impedance spectroscopy in drug-screening applications}, booktitle = {2018 {IEEE} International Solid-State Circuits Conference, {ISSCC} 2018, San Francisco, CA, USA, February 11-15, 2018}, pages = {464--466}, publisher = {{IEEE}}, year = {2018}, url = {https://doi.org/10.1109/ISSCC.2018.8310385}, doi = {10.1109/ISSCC.2018.8310385}, timestamp = {Tue, 29 Dec 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/isscc/LopezCBWPBWFRBH18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }

manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.