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Dongqiang Li

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2017
[j1]
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Jiaqi Liu, Yuanfu Zhao, Liang Wang, Dan Wang, Hongchao Zheng, Maoxin Chen, Lei Shu, Tongde Li, Dongqiang Li, Wei Guo:
High energy proton and heavy ion induced single event transient in 65-nm CMOS technology. Sci. China Inf. Sci. 60(12): 120405:1-120405:3 (2017)

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