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Chia-Hsiang Yen

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2016
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Wan-Yi Liu, Chih-Feng Chiang, Chia-Hsiang Yen, Rung-Jiun Lin, Te-Fu Chang, Shih-Hsin Chang, Pau-Sheng Kuo, Chih-Hsun Chu:
Fault isolation at P/N junction by nanoprober. Microelectron. Reliab. 64: 387-389 (2016)

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