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Toru Hiyoshi

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2010 – 2019

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2016
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Kosuke Uchida, Toru Hiyoshi, Taro Nishiguchi, Hirofumi Yamamoto, Masaki Furumai, Takashi Tsuno, Yasuki Mikamura:
Lifetime estimation of SiC MOSFETs under high temperature reverse bias test. Microelectron. Reliab. 64: 425-428 (2016)

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