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Takuya Kadoguchi

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2015
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Takuya Kadoguchi, Keisuke Gotou, Kimihiro Yamanaka, Shijo Nagao, Katsuaki Suganuma:
Electromigration behavior in Cu/Ni-P/Sn-Cu based joint system with low current density. Microelectron. Reliab. 55(12): 2554-2559 (2015)

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