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Yu-Huei Hwang

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2015
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Shih-Hung Lin, You-Lin Wu, Yu-Huei Hwang, Jing-Jenn Lin:
Study of radiation hardness of HfO₂-based resistive switching memory at nanoscale by conductive atomic force microscopy. Microelectron. Reliab. 55(11): 2224-2228 (2015)

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