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B. Winningham

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2015
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A. Sasikumar, A. R. Arehart, Glen David Via, B. Winningham, B. S. Poling, E. R. Heller, S. A. Ringel:
Identification of an RF degradation mechanism in GaN based HEMTs triggered by midgap traps. Microelectron. Reliab. 55(11): 2258-2262 (2015)

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