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ORCIDThomas E. Lipe
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Journal Articles
- 2021
[j16]Yasutaka Amagai
, Stefan Cular, Joseph A. Hagmann, Thomas E. Lipe, Nobu-hisa Kaneko:
Low-Frequency Characteristics of Silicon-Based High-Current Multijunction Thermal Current Converters Fabricated by Wet Chemical Etching. IEEE Trans. Instrum. Meas. 70: 1-7 (2021)- 2017
- [j15]Thomas E. Lipe:
A New Generation of Multijunction Thermal Current Converters. IEEE Trans. Instrum. Meas. 66(6): 1232-1236 (2017) - 2013
- [j14]George R. Jones, Thomas E. Lipe, Regis Pinheiro Landim, Lucas Di Lillo:
Guest Editorial. IEEE Trans. Instrum. Meas. 62(6): 1397-1399 (2013) - 2012
- [j13]Thomas E. Lipe, Joseph R. Kinard:
Quantum AC Voltage Standards. IEEE Trans. Instrum. Meas. 61(8): 2160-2166 (2012) - 2009
- [j12]Thomas E. Lipe, Yi-Hua Tang:
2008 Conference on Precision Electromagnetic Measurements (CPEM). IEEE Trans. Instrum. Meas. 58(4): 749-750 (2009) - [j11]Piotr S. Filipski, Joseph R. Kinard, Thomas E. Lipe, Yi-Hua Tang, Samuel P. Benz:
Correction of Systematic Errors Due to the Voltage Leads in an AC Josephson Voltage Standard. IEEE Trans. Instrum. Meas. 58(4): 853-858 (2009) - [j10]Luciana Scarioni, Thomas E. Lipe, Joseph R. Kinard:
Design and Fabrication of MJTCs on Quartz Substrates at NIST. IEEE Trans. Instrum. Meas. 58(4): 868-871 (2009) - 2007
- [j9]Samuel P. Benz, Charles J. Burroughs Jr., Paul D. Dresselhaus, Norman F. Bergren, Thomas E. Lipe, Joseph R. Kinard, Yi-Hua Tang:
An AC Josephson Voltage Standard for AC-DC Transfer-Standard Measurements. IEEE Trans. Instrum. Meas. 56(2): 239-243 (2007) - [j8]George M. Free, Thomas E. Lipe, Joseph R. Kinard, June E. Sims:
Characterization of RF-DC Transfer Difference for Thermal Voltage Converters With Built-in Tees in the Frequency Range 1 MHz to 1 GHz. IEEE Trans. Instrum. Meas. 56(2): 341-345 (2007) - 2005
- [j7]Héctor Laiz, Thomas F. Wunsch, Joseph R. Kinard, Thomas E. Lipe:
1-A and-120 mA thin-film multijunction thermal converters. IEEE Trans. Instrum. Meas. 54(2): 803-806 (2005) - 2002
- [j6]Joseph R. Kinard, Thomas E. Lipe, Svetlana Avramov-Zamurovic:
A new binary inductive divider comparator system for measuring high-voltage thermal converters. IEEE Trans. Instrum. Meas. 51(5): 1045-1049 (2002) - 2001
- [j5]Thomas E. Lipe, Joseph R. Kinard, Carl D. Reintsema:
Improvements in the NIST cryogenic thermal transfer standard. IEEE Trans. Instrum. Meas. 50(2): 326-329 (2001) - [j4]Thomas F. Wunsch, Joseph R. Kinard, Ronald P. Manginell, Otis M. Solomon Jr., Thomas E. Lipe, Kenneth Corneal Jungling:
A new fabrication process for planar thin-film multijunction thermal converters. IEEE Trans. Instrum. Meas. 50(2): 330-332 (2001) - [j3]Piotr S. Filipski, Cees J. van Mullem, David Janik, Manfred Klonz, Joseph R. Kinard, Thomas E. Lipe, Bryan C. Waltrip:
Comparison of high-frequency AC-DC voltage transfer standards at NRC, VSL, PTB, and NIST. IEEE Trans. Instrum. Meas. 50(2): 349-352 (2001) - 1999
- [j2]Charles J. Burroughs Jr., Samuel P. Benz, Clark A. Hamilton, Todd E. Harvey, Joseph R. Kinard, Thomas E. Lipe, Hitoshi Sasaki:
Thermoelectric transfer difference of thermal converters measured with a Josephson source. IEEE Trans. Instrum. Meas. 48(2): 282-284 (1999) - 1986
- [j1]Joesph R. Kinard, Earl S. Williams, Thomas E. Lipe:
Automated thermal voltage converter intercomparisons. Proc. IEEE 74(1): 105-107 (1986)
Coauthor Index
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