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Markus Grützner

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2010 – 2019

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2010
[j2]
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Markus Grützner, Christian Burmer, Christof Brillert:
Ultra-fast CAD scan chain highlighting for failure analysis assistance. Microelectron. Reliab. 50(9-11): 1494-1498 (2010)

2000 – 2009

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2007
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Peter Egger, Markus Grützner, Christian Burmer, Fabien Dudkiewicz:
Application of time resolved emission techniques within the failure analysis flow. Microelectron. Reliab. 47(9-11): 1545-1549 (2007)

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