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Wei Feng 0003
Person information
- affiliation: Tianjin University, State Key Laboratory of Precision Measuring Technology and Instruments, China
Other persons with the same name
- Wei Feng — disambiguation page
- Wei Feng 0001 — Tsinghua University, Department of Electronic Engineering, TNList, Beijing, China
- Wei Feng 0002 — Chicago Transit Authority, IL, USA
- Wei Feng 0004 — Xidian University, School of Electronic Engineering, Xi'an, China (and 2 more)
- Wei Feng 0005 — Tianjin University, School of Computer Science and Technology, China (and 1 more)
- Wei Feng 0006 — Chinese Academy of Sciences, Institute of Geodesy and Geophysics, Wuhan, China (and 1 more)
- Wei Feng 0007 — Tsinghua University, Department of Electrical Engineering, State Key Lab of Power Systems, Beijing, China (and 1 more)
- Wei Feng 0008 — Zhejiang University, College of Information Science and Electronic Engineering, Hangzhou, China
- Wei Feng 0009 — Chinese Academy of Sciences, Shenzhen Institutes of Advanced Technology, Guangdong Provincial Key Lab of Robotics and Intelligent Systems, China (and 1 more)
- Wei Feng 0010 — Xi'an Jiaotong University, School of Computer Science and Technology, China (and 1 more)
- Wei Feng 0011 — Hefei University of Technology, School of Electrical Engineering and Automation, China (and 1 more)
- Wei Feng 0012 — Chongqing University, College of Automation, China (and 3 more)
- Wei Feng 0013 — Henan Agricultural University, National Engineering Research Center for Wheat, Zhengzhou, China (and 1 more)
- Wei Feng 0014 — Hangzhou Dianzi University, School of Communication Engineering, China (and 1 more)
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Journal Articles
- 2023
- [j4]Wenqiang Gong, Xuanze Wang, Zhenyu Yang, Zhongsheng Zhai, Wei Feng, Da Liu:
Ultrasonic Thickness Measurement Method and System Implementation Based on Sampling Reconstruction and Phase Feature Extraction. Sensors 23(22): 9072 (2023) - 2021
- [j3]Wei Feng, Junhui Gao, Tong Qu, Shiqi Zhou, Daxing Zhao:
Three-Dimensional Reconstruction of Light Field Based on Phase Similarity. Sensors 21(22): 7734 (2021) - 2020
- [j2]Guodong Sun, Yuan Gao, Yun Xu, Wei Feng:
Data-Driven Fault Diagnosis Method Based on Second-Order Time-Reassigned Multisynchrosqueezing Transform and Evenly Mini-Batch Training. IEEE Access 8: 120859-120869 (2020) - 2016
- [j1]Wei Feng, Fumin Zhang, Xinghua Qu, Shiwei Zheng:
Per-Pixel Coded Exposure for High-Speed and High-Resolution Imaging Using a Digital Micromirror Device Camera. Sensors 16(3): 331 (2016)
Coauthor Index
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