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P. Bui-Quang

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2015
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Isik C. Kizilyalli, P. Bui-Quang, Don Disney, H. Bhatia, Ozgur Aktas:
Reliability studies of vertical GaN devices based on bulk GaN substrates. Microelectron. Reliab. 55(9-10): 1654-1661 (2015)

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