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E. Bianda

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2014
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Vinoth K. Sundaramoorthy, E. Bianda, R. Bloch, Daniele Angelosante, Iulian Nistor, G. J. Riedel, F. Zurfluh, G. Knapp, A. Heinemann:
A study on IGBT junction temperature (Tj) online estimation using gate-emitter voltage (Vge) at turn-off. Microelectron. Reliab. 54(11): 2423-2431 (2014)

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