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Ho-Nyeon Lee

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Journal Articles

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2015
[j2]
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  - journals/displays/ParkPL15
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  - https://dblp.org/rec/journals/displays/ParkPL15
Jae-Chul Park, Tae Kwang Park, Ho-Nyeon Lee:
Analysis of the dependence of indium-gallium-zinc oxide thin-film transistor properties on the gate interface material using a two-stack gate-insulator structure. Displays 39: 100-103 (2015)
2012
[j1]
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Jae-Chul Park, Ho-Nyeon Lee:
Dry etch damage and recovery of gallium indium zinc oxide thin-film transistors with etch-back structures. Displays 33(3): 133-135 (2012)

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