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In-Chil Lim

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1990 – 1999

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1991
[j1]
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Yun-Hong Kim, In-Sik Hong, Jun-Mo Jung, Young-Oo Kim, In-Chil Lim:
An Efficient Test Procedure for Functional Faults in semiconductor Random Access Memories. J. Circuits Syst. Comput. 1(2): 229-238 (1991)

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