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Gerald Matusiewicz

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2000 – 2009

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2007
[c1]
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  - https://dblp.org/rec/conf/cicc/LuAMMS07
Ning Lu, Matthew Angyal, Gerald Matusiewicz, Vincent J. McGahay, Theodorus E. Standaert:
Characterization, Modeling and Extraction of Cu Wire Resistance for 65 nm Technology. CICC 2007: 57-60

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