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Robert Steinhoff

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2006
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Charvaka Duvvury, Robert Steinhoff, Gianluca Boselli, Vijay Reddy, Hans Kunz, Steve Marum, Roger Cline:
Gate oxide failures due to anomalous stress from HBM ESD testers. Microelectron. Reliab. 46(5-6): 656-665 (2006)

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