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Steven D. McEuen

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1990 – 1999

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1992
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Steven D. McEuen:
Reliability benefits of IDDQ. J. Electron. Test. 3(4): 327-335 (1992)
1991
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Steven D. McEuen:
IDDq benefits [digital CMOS testing]. VTS 1991: 285-290
1990
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Steven D. McEuen:
Why, I_DDQ? [CMOS IC testing]. ITC 1990: 252

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