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Yi-Nan Shen

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1990 – 1999

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1992
[c2]
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Yi-Nan Shen, Fabrizio Lombardi:
Detection of multiple faults in CMOS circuits using a behavioral approach. VTS 1992: 188-193

1980 – 1989

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1989
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Yi-Nan Shen, Fabrizio Lombardi:
Fault detection in a testable PLA with low overhead for production testing. ICCAD 1989: 566-569

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