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Julio Vazquez Hernandez

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2010 – 2019

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2014
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Julio Vazquez Hernandez:
Error prediction and detection methodologies for reliable circuit operation under NBTI. ITC 2014: 1-10
2012
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Víctor H. Champac, Julio Vazquez Hernandez, Salvador Barceló, Roberto Gómez, Chuck Hawkins, Jaume Segura:
Testing of Stuck-Open Faults in Nanometer Technologies. IEEE Des. Test Comput. 29(4): 80-91 (2012)

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