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Randall S. Collica

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1990 – 1999

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1994
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Brenda S. Cantell, Randall S. Collica, José G. Ramírez:
Statistical analysis of Particle/Defect Data Experiments Using Poisson and Logistic Regression. DFT 1994: 230-238
1993
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Randall S. Collica:
A Logistic Regression Yield Model for SRAM Bit Fail Patterns. DFT 1993: 127-135
1992
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Randall S. Collica, X. Joseph Dietrich, Rudolf Lambrecht Jr., David G. Lau:
A Yield Enhancement Methodology for Custom VLSI Manufacturing. Digit. Tech. J. 4(2): 83-99 (1992)

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