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Reynaldo M. Rincon

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2000 – 2009

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2000
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Jerry J. Broz, James C. Andersen, Reynaldo M. Rincon:
Reducing device yield fallout at wafer level test with electrohydrodynamic (EHD) cleaning. ITC 2000: 477-484

1990 – 1999

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1999
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Jerry J. Broz, Reynaldo M. Rincon:
Probe contact resistance variations during elevated temperature wafer test. ITC 1999: 396-405

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