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David R. Lakin II

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1990 – 1999

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1999
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David R. Lakin II, Adit D. Singh:
Exploiting defect clustering to screen bare die for infant mortality failures: an experimental study. ITC 1999: 23-30
1998
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Adit D. Singh, David R. Lakin II, Gaurav Sinha, Phil Nigh:
Binning for IC Quality: Experimental Studies on the SEMATECH Data. DFT 1998: 4-10

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