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Rudi Stans

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1990 – 1999

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1993
[c3]
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Hans Bouwmeester, Steven Oostdijk, Frank Bouwman, Rudi Stans, Loek Thijssen, Frans P. M. Beenker:
Minimizing Test Time by Exploiting Parallelism in Macro Test. ITC 1993: 451-460
1992
[c2]
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Frank Bouwman, Steven Oostdijk, Rudi Stans, Ben Bennetts, Frans P. M. Beenker:
Macro Testability: The Results of Production Device Applications. ITC 1992: 232-241

1980 – 1989

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1989
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Frans P. M. Beenker, Rob Dekker, Rudi Stans, Max van der Star:
A Testability Strategy for Silicon Compilers. ITC 1989: 660-669

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