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Jay S. Burnham

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2005
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Terence B. Hook, Ronald J. Bolam, William Clark, Jay S. Burnham, Nivo Rovedo, Laura Schutz:
Negative bias temperature instability on three oxide thicknesses (1.4/2.2/5.2 nm) with nitridation variations and deuteration. Microelectron. Reliab. 45(1): 47-56 (2005)
1999
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Terence B. Hook, Jay S. Burnham, Ronald J. Bolam:
Nitrided gate oxides for 3.3-V logic application: Reliability and device design considerations. IBM J. Res. Dev. 43(3): 393-406 (1999)

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