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ORCIDRichard F. Rizzolo
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Journal Articles
- 2019
[j8]Christopher J. Berry
, David Wolpert, Christos Vezyrtzis, Richard F. Rizzolo, Sean M. Carey, Yaniv Maroz, Hunter F. Shi, Dureseti Chidambarrao, Christian Jacobi, Anthony Saporito, Thomas Strach, Alper Buyuktosunoglu, Preetham Lobo, Pierce Chuang, Pawel Owczarczyk, Ramon Bertran, Tobias Webel, Phillip J. Restle:
IBM z14: Processor Characterization and Power Management for High-Reliability Mainframe Systems. IEEE J. Solid State Circuits 54(1): 121-132 (2019)- 2015
- [j7]Tobias Webel, Preetham M. Lobo, Ramon Bertran, Gerard Salem, Malcolm Allen-Ware, Richard F. Rizzolo, Sean M. Carey, Thomas Strach, Alper Buyuktosunoglu, Charles Lefurgy, Pradip Bose, Ricardo Nigaglioni, Timothy J. Slegel, Michael S. Floyd, Brian W. Curran:
Robust power management in the IBM z13. IBM J. Res. Dev. 59(4/5) (2015) - 2007
- [j6]Guenter Mayer, Gerhard Döttling, Richard F. Rizzolo, Christopher J. Berry, Sean M. Carey, Christopher M. Carney, Joachim Keinert, Peter Loeffler, Walter Nop, Daniel E. Skooglund, Vern A. Victoria, Alan P. Wagstaff, Patrick M. Williams:
Design methods for attaining IBM System z9 processor cycle-time goals. IBM J. Res. Dev. 51(1/2): 19-36 (2007) - [j5]Richard F. Rizzolo, Thomas G. Foote, James M. Crafts, David A. Grosch, Tak O. Leung, David J. Lund, Bryan L. Mechtly, Bryan J. Robbins, Timothy J. Slegel, Michael J. Tremblay, Glen A. Wiedemeier:
IBM System z9 eFUSE applications and methodology. IBM J. Res. Dev. 51(1/2): 65-76 (2007) - 1999
- [j4]Richard F. Rizzolo, Guenter Hinkel, Steven Michnowski, Thomas J. McPherson, Allen J. Sutcliffe:
System performance management for the S/390 Parallel Enterprise Server G5. IBM J. Res. Dev. 43(5): 651-660 (1999) - [j3]Peilin Song, Franco Motika, Daniel R. Knebel, Richard F. Rizzolo, Mary P. Kusko:
S/390 G5 CMOS microprocessor diagnostics. IBM J. Res. Dev. 43(5): 899-914 (1999) - 1998
- [j2]Jeffrey A. Kash, James C. Tsang, Richard F. Rizzolo, A. K. Patel, A. D. Shore:
Backside optical emission diagnostics for excess IDDQ. IEEE J. Solid State Circuits 33(3): 508-511 (1998) - 1991
- [j1]Venkappa L. Gani, Matthew Graf, Richard F. Rizzolo, William F. Washburn:
IBM Enterprise System/9000 Type 9121 Model 320 air-cooled processor technology. IBM J. Res. Dev. 35(3): 342-351 (1991)
Conference and Workshop Papers
- 2018
- [c5]Christopher J. Berry, James D. Warnock, John Isakson, John Badar, Brian Bell, Frank Malgioglio, Guenter Mayer, Dina Hamid, Jesse Surprise, David Wolpert, Ofer Geva, Bill Huott, Leon J. Sigal, Sean M. Carey, Richard F. Rizzolo, Ricardo Nigaglioni, Mark Cichanowski, Dureseti Chidambarrao, Christian Jacobi, Anthony Saporito, Arthur O'neill, Robert J. Sonnelitter, Christian G. Zoellin, Michael H. Wood, José Neves:
IBM z14™: 14nm microprocessor for the next-generation mainframe. ISSCC 2018: 36-38 - [c4]Christos Vezyrtzis, Thomas Strach, Pierce I-Jen Chuang, Preetham Lobo, Richard F. Rizzolo, Tobias Webel, Pawel Owczarczyk, Alper Buyuktosunoglu, Ramon Bertran, David T. Hui, Susan M. Eickhoff, Michael S. Floyd, Gerard Salem, Sean M. Carey, Stelios G. Tsapepas, Phillip J. Restle:
Droop mitigation using critical-path sensors and an on-chip distributed power supply estimation engine in the z14™ enterprise processor. ISSCC 2018: 300-302 - 2017
- [c3]Pierce I-Jen Chuang, Christos Vezyrtzis, Divya Pathak, Richard F. Rizzolo, Tobias Webel, Thomas Strach, Otto A. Torreiter, Preetham Lobo, Alper Buyuktosunoglu, Ramon Bertran, Michael S. Floyd, Malcolm S. Ware, Gerard Salem, Sean M. Carey, Phillip J. Restle:
26.2 Power supply noise in a 22nm z13™ microprocessor. ISSCC 2017: 438-439 - 2014
- [c2]Ramon Bertran, Alper Buyuktosunoglu, Pradip Bose, Timothy J. Slegel, Gerard Salem, Sean M. Carey, Richard F. Rizzolo, Thomas Strach:
Voltage Noise in Multi-Core Processors: Empirical Characterization and Optimization Opportunities. MICRO 2014: 368-380 - 2006
- [c1]Franco Stellari, Peilin Song, Tim Diemoz, Alan J. Weger, Tami Vogel, Steven C. Wilson, John Pennings, Richard F. Rizzolo:
High-Voltage and High-Power PLL Diagnostics using Advanced Cooling and Emission Images. ITC 2006: 1-10
Coauthor Index
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