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Alessandro Paccagnella

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Marta Bagatin

> Home > Persons > Alessandro Paccagnella

Publications

2015
[c17]
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  dblp key:
  - conf/iwasi/DemariaDMRRMPCC15
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  persistent URL:
  - https://dblp.org/rec/conf/iwasi/DemariaDMRRMPCC15
N. Demaria, G. Dellacasa, G. Mazza, Angelo Rivetti, Manuel D. Da Rocha Rolo, E. Monteil, L. Pacher, Fabio Ciciriello, Francesco Corsi, Cristoforo Marzocca, G. De Roberts, F. Loddo, C. Tamma, Marta Bagatin, D. Bisello, Simone Gerardin, S. Mattiazzo, L. Ding, Piero Giubilato, Alessandro Paccagnella, Francesco De Canio, Luigi Gaioni, Massimo Manghisoni, Valerio Re, Gianluca Traversi, Elisa Riceputi, Lodovico Ratti, Carla Vacchi, Roberto Beccherle, Guido Magazzù, M. Minuti, Fabio Morsani, Fabrizio Palla, Valentino Liberali, Seyedruhollah Shojaii, Alberto Stabile, Gian Mario Bilei, Mauro Menichelli, Elia Conti, Sara Marconi, D. Passen, Pisana Placidi:
CHIPIX65: Developments on a new generation pixel readout ASIC in CMOS 65 nm for HEP experiments. IWASI 2015: 49-54
2014
[c16]
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  dblp key:
  - conf/essderc/RossettoRGMBZPMZDFAOD14
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  - https://dblp.org/rec/conf/essderc/RossettoRGMBZPMZDFAOD14
Isabella Rossetto, Fabiana Rampazzo, Simone Gerardin, Matteo Meneghini, Marta Bagatin, Alberto Zanandrea, Alessandro Paccagnella, Gaudenzio Meneghesso, Enrico Zanoni, Christian Dua, Marie-Antoinette di Forte-Poisson, Raphael Aubry, Mourad Oualli, Sylvain L. Delage:
Degradation of dc and pulsed characteristics of InAlN/GaN HEMTs under different proton fluences. ESSDERC 2014: 381-384
2012
[j8]
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  dblp key:
  - journals/mr/BagatinGPAGF12
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  - https://dblp.org/rec/journals/mr/BagatinGPAGF12
Marta Bagatin, Simone Gerardin, Alessandro Paccagnella, Carla Andreani, Giuseppe Gorini, C. D. Frost:
Temperature dependence of neutron-induced soft errors in SRAMs. Microelectron. Reliab. 52(1): 289-293 (2012)
[c13]
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  dblp key:
  - conf/dft/BolchiniMSOPSMORRSVGBP12
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  persistent URL:
  - https://dblp.org/rec/conf/dft/BolchiniMSOPSMORRSVGBP12
Cristiana Bolchini, Antonio Miele, Chiara Sandionigi, Marco Ottavi, Salvatore Pontarelli, Adelio Salsano, Cecilia Metra, Martin Omaña, Daniele Rossi, Matteo Sonza Reorda, Luca Sterpone, Massimo Violante, Simone Gerardin, Marta Bagatin, Alessandro Paccagnella:
High-reliability fault tolerant digital systems in nanometric technologies: Characterization and design methodologies. DFT 2012: 121-125
2010
[j7]
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  dblp key:
  - journals/mr/BagatinGPCIN10
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  - https://dblp.org/rec/journals/mr/BagatinGPCIN10
Marta Bagatin, Simone Gerardin, Alessandro Paccagnella, Giorgio Cellere, F. Irom, D. N. Nguyen:
Destructive events in NAND Flash memories irradiated with heavy ions. Microelectron. Reliab. 50(9-11): 1832-1836 (2010)
[j6]
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  - journals/mr/GerardinBPCVB10
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  - https://dblp.org/rec/journals/mr/GerardinBPCVB10
Simone Gerardin, Marta Bagatin, Alessandro Paccagnella, G. Cellere, Angelo Visconti, Mauro Bonanomi:
Impact of total dose on heavy-ion upsets in floating gate arrays. Microelectron. Reliab. 50(9-11): 1837-1841 (2010)
2007
[c6]
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  dblp key:
  - conf/iolts/BagatinCGPVBM07
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  - https://dblp.org/rec/conf/iolts/BagatinCGPVBM07
Marta Bagatin, Giorgio Cellere, Simone Gerardin, Alessandro Paccagnella, Angelo Visconti, Silvia Beltrami, M. Maccarrone:
Single Event Effects in 1Gbit 90nm NAND Flash Memories under Operating Conditions. IOLTS 2007: 146-151

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