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Shih-Lien Lu
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Publications
- 2012
- [c41]Michael Nicolaidis, Lorena Anghel, Nacer-Eddine Zergainoh, Yervant Zorian, Tanay Karnik, Keith A. Bowman, James W. Tschanz, Shih-Lien Lu, Carlos Tokunaga, Arijit Raychowdhury, Muhammad M. Khellah, Jaydeep Kulkarni, Vivek De, Dimiter Avresky:
Design for test and reliability in ultimate CMOS. DATE 2012: 677-682 - [c40]Shih-Lien Lu, Tanay Karnik, Ganapati Srinivasa, Kai-Yuan Chao, Doug Carmean, Jim Held:
Scaling the "Memory Wall": Designer track. ICCAD 2012: 271-272 - 2011
- [j20]Arijit Raychowdhury, Jim Tschanz, Keith A. Bowman, Shih-Lien Lu, Paolo A. Aseron, Muhammad M. Khellah, Bibiche M. Geuskens, Carlos Tokunaga, Chris Wilkerson, Tanay Karnik, Vivek De:
Error Detection and Correction in Microprocessor Core and Memory Due to Fast Dynamic Voltage Droops. IEEE J. Emerg. Sel. Topics Circuits Syst. 1(3): 208-217 (2011) - [j19]Keith A. Bowman, James W. Tschanz, Shih-Lien Lu, Paolo A. Aseron, Muhammad M. Khellah, Arijit Raychowdhury, Bibiche M. Geuskens, Carlos Tokunaga, Chris Wilkerson, Tanay Karnik, Vivek K. De:
A 45 nm Resilient Microprocessor Core for Dynamic Variation Tolerance. IEEE J. Solid State Circuits 46(1): 194-208 (2011) - [j18]Arijit Raychowdhury, Bibiche M. Geuskens, Keith A. Bowman, James W. Tschanz, Shih-Lien Lu, Tanay Karnik, Muhammad M. Khellah, Vivek K. De:
Tunable Replica Bits for Dynamic Variation Tolerance in 8T SRAM Arrays. IEEE J. Solid State Circuits 46(4): 797-805 (2011) - [j15]Keith A. Bowman, Carlos Tokunaga, James W. Tschanz, Arijit Raychowdhury, Muhammad M. Khellah, Bibiche M. Geuskens, Shih-Lien Lu, Paolo A. Aseron, Tanay Karnik, Vivek K. De:
All-Digital Circuit-Level Dynamic Variation Monitor for Silicon Debug and Adaptive Clock Control. IEEE Trans. Circuits Syst. I Regul. Pap. 58-I(9): 2017-2025 (2011) - 2010
- [c35]James W. Tschanz, Keith A. Bowman, Muhammad M. Khellah, Chris Wilkerson, Bibiche M. Geuskens, Dinesh Somasekhar, Arijit Raychowdhury, Jaydeep Kulkarni, Carlos Tokunaga, Shih-Lien Lu, Tanay Karnik, Vivek De:
Resilient design in scaled CMOS for energy efficiency. ASP-DAC 2010: 625 - [c34]Keith A. Bowman, Carlos Tokunaga, James W. Tschanz, Arijit Raychowdhury, Muhammad M. Khellah, Bibiche M. Geuskens, Shih-Lien Lu, Paolo A. Aseron, Tanay Karnik, Vivek De:
Dynamic variation monitor for measuring the impact of voltage droops on microprocessor clock frequency. CICC 2010: 1-4 - [c30]Keith A. Bowman, James W. Tschanz, Shih-Lien Lu, Paolo A. Aseron, Muhammad M. Khellah, Arijit Raychowdhury, Bibiche M. Geuskens, Carlos Tokunaga, Chris Wilkerson, Tanay Karnik, Vivek De:
Resilient microprocessor design for high performance & energy efficiency. ISLPED 2010: 355-356 - [c29]James W. Tschanz, Keith A. Bowman, Shih-Lien Lu, Paolo A. Aseron, Muhammad M. Khellah, Arijit Raychowdhury, Bibiche M. Geuskens, Carlos Tokunaga, Chris Wilkerson, Tanay Karnik, Vivek De:
A 45nm resilient and adaptive microprocessor core for dynamic variation tolerance. ISSCC 2010: 282-283 - [c28]Arijit Raychowdhury, Bibiche M. Geuskens, Jaydeep Kulkarni, James W. Tschanz, Keith A. Bowman, Tanay Karnik, Shih-Lien Lu, Vivek De, Muhammad M. Khellah:
PVT-and-aging adaptive wordline boosting for 8T SRAM power reduction. ISSCC 2010: 352-353 - 2009
- [j14]Keith A. Bowman, James W. Tschanz, Nam-Sung Kim, Janice C. Lee, Chris Wilkerson, Shih-Lien Lu, Tanay Karnik, Vivek K. De:
Energy-Efficient and Metastability-Immune Resilient Circuits for Dynamic Variation Tolerance. IEEE J. Solid State Circuits 44(1): 49-63 (2009) - [j13]Dinesh Somasekhar, Yibin Ye, Paolo A. Aseron, Shih-Lien Lu, Muhammad M. Khellah, Jason Howard, Gregory Ruhl, Tanay Karnik, Shekhar Borkar, Vivek K. De, Ali Keshavarzi:
2 GHz 2 Mb 2T Gain Cell Memory Macro With 128 GBytes/sec Bandwidth in a 65 nm Logic Process Technology. IEEE J. Solid State Circuits 44(1): 174-185 (2009) - [c26]Keith A. Bowman, James W. Tschanz, Chris Wilkerson, Shih-Lien Lu, Tanay Karnik, Vivek De, Shekhar Y. Borkar:
Circuit techniques for dynamic variation tolerance. DAC 2009: 4-7 - [c25]James W. Tschanz, Keith A. Bowman, Chris Wilkerson, Shih-Lien Lu, Tanay Karnik:
Resilient circuits - Enabling energy-efficient performance and reliability. ICCAD 2009: 71-73 - 2008
- [c20]Dinesh Somasekhar, Yibin Ye, Paolo A. Aseron, Shih-Lien Lu, Muhammad M. Khellah, Jason Howard, Gregory Ruhl, Tanay Karnik, Shekhar Y. Borkar, Vivek De, Ali Keshavarzi:
2GHz 2Mb 2T Gain-Cell Memory Macro with 128GB/s Bandwidth in a 65nm Logic Process. ISSCC 2008: 274-275 - [c19]Keith A. Bowman, James W. Tschanz, Nam-Sung Kim, Janice C. Lee, Chris Wilkerson, Shih-Lien Lu, Tanay Karnik, Vivek K. De:
Energy-Efficient and Metastability-Immune Timing-Error Detection and Instruction-Replay-Based Recovery Circuits for Dynamic-Variation Tolerance. ISSCC 2008: 402-403
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