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Gregory M. Kapfhammer

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Owain Parry

> Home > Persons > Gregory M. Kapfhammer

Publications

2023
[j15]
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  dblp key:
  - journals/ese/ParryKHM23
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  - https://dblp.org/rec/journals/ese/ParryKHM23
Owain Parry, Gregory M. Kapfhammer, Michael Hilton, Phil McMinn:
Empirically evaluating flaky test detection techniques combining test case rerunning and machine learning models. Empir. Softw. Eng. 28(3): 72 (2023)
2022
[j14]
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  - journals/tosem/ParryKHM22
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  - https://dblp.org/rec/journals/tosem/ParryKHM22
Owain Parry, Gregory M. Kapfhammer, Michael Hilton, Phil McMinn:
A Survey of Flaky Tests. ACM Trans. Softw. Eng. Methodol. 31(1): 17:1-17:74 (2022)
[c55]
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  - conf/ast/ParryHKM22
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  - https://dblp.org/rec/conf/ast/ParryHKM22
Owain Parry, Michael Hilton, Gregory M. Kapfhammer, Phil McMinn:
What Do Developer-Repaired Flaky Tests Tell Us About the Effectiveness of Automated Flaky Test Detection? AST@ICSE 2022: 160-164
[c54]
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  - conf/icse/ParryKHM22
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Owain Parry, Gregory M. Kapfhammer, Michael Hilton, Phil McMinn:
Surveying the Developer Experience of Flaky Tests. ICSE (SEIP) 2022: 253-262
[c53]
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  - conf/icst/ParryKHM22
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Owain Parry, Gregory M. Kapfhammer, Michael Hilton, Phil McMinn:
Evaluating Features for Machine Learning Detection of Order- and Non-Order-Dependent Flaky Tests. ICST 2022: 93-104
2020
[c51]
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  dblp key:
  - conf/icse/ParryKHM20
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Owain Parry, Gregory M. Kapfhammer, Michael Hilton, Phil McMinn:
Flake It 'Till You Make It: Using Automated Repair to Induce and Fix Latent Test Flakiness. ICSE (Workshops) 2020: 11-12

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