Stop the war!Остановите войну!
for scientists:
default search action
Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCIDMichiko Inoue
- > Home > Persons > Michiko Inoue
Publications
- 2012
[j16]Michiko Inoue, Akira Taketani, Tomokazu Yoneda, Hideo Fujiwara:
Test Pattern Ordering and Selection for High Quality Test Set under Constraints. IEICE Trans. Inf. Syst. 95-D(12): 3001-3009 (2012)- [j15]Hyunbean Yi, Tomokazu Yoneda, Michiko Inoue, Yasuo Sato, Seiji Kajihara, Hideo Fujiwara:
A Failure Prediction Strategy for Transistor Aging. IEEE Trans. Very Large Scale Integr. Syst. 20(11): 1951-1959 (2012) - 2011
- [j14]Michiko Inoue, Tomokazu Yoneda, Muneo Hasegawa, Hideo Fujiwara:
Balanced Secure Scan: Partial Scan Approach for Secret Information Protection. J. Electron. Test. 27(2): 99-108 (2011) - [c36]Tomokazu Yoneda, Makoto Nakao, Michiko Inoue, Yasuo Sato, Hideo Fujiwara:
Temperature-Variation-Aware Test Pattern Optimization. ETS 2011: 214 - [c35]Tomokazu Yoneda, Keigo Hori, Michiko Inoue, Hideo Fujiwara:
Faster-than-at-speed test for increased test quality and in-field reliability. ITC 2011: 1-9 - 2010
- [c34]Hiroshi Iwata, Satoshi Ohtake, Michiko Inoue, Hideo Fujiwara:
Bipartite Full Scan Design: A DFT Method for Asynchronous Circuits. Asian Test Symposium 2010: 206-211 - [c33]Tomokazu Yoneda, Michiko Inoue, Akira Taketani, Hideo Fujiwara:
Seed Ordering and Selection for High Quality Delay Test. Asian Test Symposium 2010: 313-318 - [c32]Zhiqiang You, Jiedi Huang, Michiko Inoue, Jishun Kuang, Hideo Fujiwara:
Capture in Turn Scan for Reduction of Test Data Volume, Test Application Time and Test Power. Asian Test Symposium 2010: 371-374 - [c31]Michiko Inoue, Akira Taketani, Tomokazu Yoneda, Hiroshi Iwata, Hideo Fujiwara:
Test pattern selection to optimize delay test quality with a limited size of test set. ETS 2010: 260 - [c30]Hyunbean Yi, Tomokazu Yoneda, Michiko Inoue, Yasuo Sato, Seiji Kajihara, Hideo Fujiwara:
Aging test strategy and adaptive test scheduling for SoC failure prediction. IOLTS 2010: 21-26 - [c29]Tomokazu Yoneda, Michiko Inoue, Yasuo Sato, Hideo Fujiwara:
Thermal-uniformity-aware X-filling to reduce temperature-induced delay variation for accurate at-speed testing. VTS 2010: 188-193 - 2009
- [c28]Michiko Inoue, Tomokazu Yoneda, Muneo Hasegawa, Hideo Fujiwara:
Partial Scan Approach for Secret Information Protection. ETS 2009: 143-148 - [c27]Michiko Inoue, Tsuyoshi Suzuki, Hideo Fujiwara:
Brief Announcement: Acceleration by Contention for Shared Memory Mutual Exclusion Algorithms. DISC 2009: 172-173 - 2008
- [j12]Masato Nakasato, Michiko Inoue, Satoshi Ohtake, Hideo Fujiwara:
Design for Testability Method to Avoid Error Masking of Software-Based Self-Test for Processors. IEICE Trans. Inf. Syst. 91-D(3): 763-770 (2008) - 2006
- [j11]Zhiqiang You, Tsuyoshi Iwagaki, Michiko Inoue, Hideo Fujiwara:
A Low Power Deterministic Test Using Scan Chain Disable Technique. IEICE Trans. Inf. Syst. 89-D(6): 1931-1939 (2006) - [j10]Virendra Singh, Michiko Inoue, Kewal K. Saluja, Hideo Fujiwara:
Instruction-Based Self-Testing of Delay Faults in Pipelined Processors. IEEE Trans. Very Large Scale Integr. Syst. 14(11): 1203-1215 (2006) - [c26]Masato Nakazato, Satoshi Ohtake, Michiko Inoue, Hideo Fujiwara:
Design for Testability of Software-Based Self-Test for Processors. ATS 2006: 375-380 - 2005
- [j9]Virendra Singh, Michiko Inoue, Kewal K. Saluja, Hideo Fujiwara:
Delay Fault Testing of Processor Cores in Functional Mode. IEICE Trans. Inf. Syst. 88-D(3): 610-618 (2005) - [j8]Zhiqiang You, Ken-ichi Yamaguchi, Michiko Inoue, Jacob Savir, Hideo Fujiwara:
Power-Constrained Test Synthesis and Scheduling Algorithms for Non-Scan BIST-able RTL Data Paths. IEICE Trans. Inf. Syst. 88-D(8): 1940-1947 (2005) - [c25]Yuki Yoshikawa, Satoshi Ohtake, Michiko Inoue, Hideo Fujiwara:
Design for Testability Based on Single-Port-Change Delay Testing for Data Paths. Asian Test Symposium 2005: 254-259 - [c24]Kazuko Kambe, Michiko Inoue, Hideo Fujiwara, Tsuyoshi Iwagaki:
Efficient Constraint Extraction for Template-Based Processor Self-Test Generation. Asian Test Symposium 2005: 444-449 - [c23]Virendra Singh, Michiko Inoue, Kewal K. Saluja, Hideo Fujiwara:
Testing Superscalar Processors in Functional Mode. FPL 2005: 747-750 - [c22]Virendra Singh, Michiko Inoue, Kewal K. Saluja, Hideo Fujiwara:
Instruction-based delay fault self-testing of pipelined processor cores. ISCAS (6) 2005: 5686-5689 - 2004
- [c21]Zhiqiang You, Ken-ichi Yamaguchi, Michiko Inoue, Jacob Savir, Hideo Fujiwara:
Power-Constrained DFT Algorithms for Non-Scan BIST-able RTL Data Paths. Asian Test Symposium 2004: 32-39 - [c20]Kazuko Kambe, Michiko Inoue, Hideo Fujiwara:
Efficient Template Generation for Instruction-Based Self-Test of Processor Cores. Asian Test Symposium 2004: 152-157 - [c19]Virendra Singh, Michiko Inoue, Kewal K. Saluja, Hideo Fujiwara:
Instruction-Based Delay Fault Self-Testing of Processor Cores. VLSI Design 2004: 933- - 2003
- [c18]Virendra Singh, Michiko Inoue, Kewal K. Saluja, Hideo Fujiwara:
Software-Based Delay Fault Testing of Processor Cores. Asian Test Symposium 2003: 68-71 - [c17]Michiko Inoue, Kazuhiro Suzuki, Hiroyuki Okamoto, Hideo Fujiwara:
Test Synthesis for Datapaths Using Datapath-Controller Functions. Asian Test Symposium 2003: 294-299 - 2002
- [j7]Michiko Inoue, Emil Gizdarski, Hideo Fujiwara:
Sequential Circuits with Combinational Test Generation Complexity under Single-Fault Assumption. J. Electron. Test. 18(1): 55-62 (2002) - [j6]Kunihiko Hayashi, Michiko Inoue, Toshimitsu Masuzawa, Hideo Fujiwara:
A layout adjustment problem for disjoint rectangles preserving orthogonal order. Syst. Comput. Jpn. 33(2): 31-42 (2002) - [j5]Takashi Ishimizu, Akihiro Fujiwara, Michiko Inoue, Toshimitsu Masuzawa, Hideo Fujiwara:
Parallel algorithms for selection on the BSP and BSP* models. Syst. Comput. Jpn. 33(12): 97-107 (2002) - [c16]Michiko Inoue, Chikateru Jinno, Hideo Fujiwara:
An Extended Class of Sequential Circuits with Combinational Test Generation Complexity. ICCD 2002: 200-205 - 2001
- [j4]Chikara Ohori, Michiko Inoue, Toshimitsu Masuzawa, Hideo Fujiwara:
A causal broadcast protocol for distributed mobile systems. Syst. Comput. Jpn. 32(3): 65-75 (2001) - [c15]Michiko Inoue, Shinya Umetani, Toshimitsu Masuzawa, Hideo Fujiwara:
Adaptive Long-Lived O(k2)-Renaming with O(k2) Steps. DISC 2001: 123-135 - 2000
- [c14]Michiko Inoue, Emil Gizdarski, Hideo Fujiwara:
A class of sequential circuits with combinational test generation complexity under single-fault assumption. Asian Test Symposium 2000: 398-403 - 1999
- [j3]Akihiro Fujiwara, Michiko Inoue, Toshimitsu Masuzawa, Hideo Fujiwara:
A cost optimal parallel algorithm for weighted distance transforms. Parallel Comput. 25(4): 405-416 (1999) - [c12]Satoshi Ohtake, Michiko Inoue, Hideo Fujiwara:
A Method of Test Generation for Weakly Testable Data Paths Using Test Knowledge Extracted from RTL Description. Asian Test Symposium 1999: 5-12 - [c10]Takashi Ishimizu, Akihiro Fujiwara, Michiko Inoue, Toshimitsu Masuzawa, Hideo Fujiwara:
Parallel Algorithms for All Nearest Neighbors of Binary Images on the BSP Model. ISPAN 1999: 394-399 - 1998
- [j2]Michiko Inoue, Hideo Fujiwara:
An approach to test synthesis from higher level. Integr. 26(1-2): 101-116 (1998) - [c9]Michiko Inoue, Takeshi Higashimura, Kenji Noda, Toshimitsu Masuzawa, Hideo Fujiwara:
A High-Level Synthesis Method for Weakly Testable Data Paths. Asian Test Symposium 1998: 40-45 - [c8]Kunihiko Hayashi, Michiko Inoue, Toshimitsu Masuzawa, Hideo Fujiwara:
A Layout Adjustment Problem for Disjoint Rectangles Preserving Orthogonal Order. GD 1998: 183-197 - [c7]Sen Moriya, Michiko Inoue, Toshimitsu Masuzawa, Hideo Fujiwara:
SelfStabilizing WaitFree Clock Synchronization with Bounded Space. OPODIS 1998: 129-144 - 1997
- [j1]Katsuyuki Takabatake, Michiko Inoue, Toshimitsu Masuzawa, Hideo Fujiwara:
Non-scan design for testable data paths using thru operation. Syst. Comput. Jpn. 28(10): 60-68 (1997) - [c6]Katsuyuki Takabatake, Toshimitsu Masuzawa, Michiko Inoue, Hideo Fujiwara:
Non-scan design for testable data paths using thru operation. ASP-DAC 1997: 313-318 - [c5]Akihiro Fujiwara, Michiko Inoue, Toshimitsu Masuzawa, Hideo Fujiwara:
A Parallel Algorithm for Weighted Distance Transforms. IPPS 1997: 407-412 - [c4]Michiko Inoue, Sen Moriya, Toshimitsu Masuzawa, Hideo Fujiwara:
Optimal Wait-Free Clock Synchronisation Protocol on a Shared-Memory Multi-processor System. WDAG 1997: 290-304 - 1996
- [c3]Yasuo Sato, Michiko Inoue, Toshimitsu Masuzawa, Hideo Fujiwara:
A Snapshot Algorithm for Distributed Mobile Systems. ICDCS 1996: 734-743
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from 
to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the 
of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from 
, 
, and 
to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from 
.
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
last updated on 2024-02-02 19:38 CET by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by:
