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B. S. So

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2010 – 2019

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2010
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J. Y. Seo, J. E. Seok, W. S. Kim, N. H. Cha, J. S. Kang, B. S. So:
PMOSFET anti-fuse using GIDL-induced-HEIP mechanism. Microelectron. Reliab. 50(9-11): 1309-1311 (2010)

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