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Phillip Fynan

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2010 – 2019

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2017
[c2]
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  - conf/itc/LiuFB17
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Zeye Liu, Phillip Fynan, Ronald D. Blanton:
Front-end layout reflection for test chip design. ITC 2017: 1-10
2016
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Phillip Fynan, Zeye Liu, Benjamin Niewenhuis, Soumya Mittal, Marcin Strajwas, R. D. (Shawn) Blanton:
Logic characterization vehicle design reflection via layout rewiring. ITC 2016: 1-10

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