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BibTeX records: Ingyum Kim
@inproceedings{DBLP:conf/vlsit/YangJLSKYYKKJPA22, author = {Giyoung Yang and Hakchul Jung and Jinyoung Lim and Jaewoo Seo and Ingyum Kim and Jisu Yu and Hyeoungyu You and Jeongsoon Kong and Garoom Kim and Minjae Jeong and Chanhee Park and Sera An and Woojin Rim and Hayoung Kim and Dalhee Lee and Sanghoon Baek and Jonghoon Jung and Taejoong Song and Jongwook Kye}, title = {Standard Cell Design Optimization with Advanced {MOL} Technology in 3nm {GAA} Process}, booktitle = {{IEEE} Symposium on {VLSI} Technology and Circuits {(VLSI} Technology and Circuits 2022), Honolulu, HI, USA, June 12-17, 2022}, pages = {363--364}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VLSITechnologyandCir46769.2022.9830450}, doi = {10.1109/VLSITECHNOLOGYANDCIR46769.2022.9830450}, timestamp = {Thu, 04 Aug 2022 10:53:40 +0200}, biburl = {https://dblp.org/rec/conf/vlsit/YangJLSKYYKKJPA22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/isscc/SongKRKPPHYDLLK17, author = {Taejoong Song and Hoonki Kim and Woojin Rim and Yongho Kim and Sunghyun Park and Changnam Park and Minsun Hong and Giyong Yang and Jeongho Do and Jinyoung Lim and Seungyoung Lee and Ingyum Kim and Sanghoon Baek and Jonghoon Jung and Daewon Ha and Hyungsoon Jang and Taejung Lee and Chul{-}Hong Park and Bongjae Kwon and Hyuntaek Jung and Sungwee Cho and Yongjae Choo and Jaeseung Choi}, title = {12.2 {A} 7nm FinFET {SRAM} macro using {EUV} lithography for peripheral repair analysis}, booktitle = {2017 {IEEE} International Solid-State Circuits Conference, {ISSCC} 2017, San Francisco, CA, USA, February 5-9, 2017}, pages = {208--209}, publisher = {{IEEE}}, year = {2017}, url = {https://doi.org/10.1109/ISSCC.2017.7870334}, doi = {10.1109/ISSCC.2017.7870334}, timestamp = {Fri, 14 Aug 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/isscc/SongKRKPPHYDLLK17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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