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ORCIDBibTeX records: Heinrich Theodor Vierhaus
@inproceedings{DBLP:conf/date/JenihhinHRKLSKH20,
author = {Maksim Jenihhin and
Said Hamdioui and
Matteo Sonza Reorda and
Milos Krstic and
Peter Langend{\"{o}}rfer and
Christian Sauer and
Anton Klotz and
Michael H{\"{u}}bner and
J{\"{o}}rg Nolte and
Heinrich Theodor Vierhaus and
Georgios N. Selimis and
Dan Alexandrescu and
Mottaqiallah Taouil and
Geert Jan Schrijen and
Jaan Raik and
Luca Sterpone and
Giovanni Squillero and
Zoya Dyka},
title = {{RESCUE:} Interdependent Challenges of Reliability, Security and Quality
in Nanoelectronic Systems},
booktitle = {2020 Design, Automation {\&} Test in Europe Conference {\&}
Exhibition, {DATE} 2020, Grenoble, France, March 9-13, 2020},
pages = {388--393},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.23919/DATE48585.2020.9116558},
doi = {10.23919/DATE48585.2020.9116558},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/JenihhinHRKLSKH20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/corr/abs-1912-01561,
author = {Maksim Jenihhin and
Said Hamdioui and
Matteo Sonza Reorda and
Milos Krstic and
Peter Langend{\"{o}}rfer and
Christian Sauer and
Anton Klotz and
Michael H{\"{u}}bner and
J{\"{o}}rg Nolte and
Heinrich Theodor Vierhaus and
Georgios N. Selimis and
Dan Alexandrescu and
Mottaqiallah Taouil and
Geert Jan Schrijen and
Jaan Raik and
Luca Sterpone and
Giovanni Squillero and
Zoya Dyka},
title = {{RESCUE:} Interdependent Challenges of Reliability, Security and Quality
in Nanoelectronic Systems},
journal = {CoRR},
volume = {abs/1912.01561},
year = {2019},
url = {http://arxiv.org/abs/1912.01561},
eprinttype = {arXiv},
eprint = {1912.01561},
timestamp = {Wed, 28 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/corr/abs-1912-01561.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/HosseinzadehPV18,
author = {Farnoosh Hosseinzadeh and
Petr Pfeifer and
Heinrich Theodor Vierhaus},
editor = {Martin Novotn{\'{y}} and
Nikos Konofaos and
Amund Skavhaug},
title = {Optimal Dependability and Fine Granular Error Resilience Methodology
for Reconfigurable Systems},
booktitle = {21st Euromicro Conference on Digital System Design, {DSD} 2018, Prague,
Czech Republic, August 29-31, 2018},
pages = {206--213},
publisher = {{IEEE} Computer Society},
year = {2018},
url = {https://doi.org/10.1109/DSD.2018.00048},
doi = {10.1109/DSD.2018.00048},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dsd/HosseinzadehPV18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ewme/VierhausJR18,
author = {Heinrich Theodor Vierhaus and
Maksim Jenihhin and
Matteo Sonza Reorda},
title = {{RESCUE:} Cross-Sectoral PhD Training Concept for Interdependent Reliability,
Security and Quality},
booktitle = {12th European Workshop on Microelectronics Education, {EWME} 2018,
Braunschweig, Germany, September 24-26, 2018},
pages = {45--50},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/EWME.2018.8629465},
doi = {10.1109/EWME.2018.8629465},
timestamp = {Fri, 27 Dec 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ewme/VierhausJR18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/spa/Vierhaus18,
author = {Heinrich Theodor Vierhaus},
title = {Migrating Electronic Systems from Fault Tolerant Computing to Error
Resilience},
booktitle = {Signal Processing: Algorithms, Architectures, Arrangements, and Applications,
{SPA} 2018, Poznan, Poland, September 19-21, 2018},
pages = {13},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.23919/SPA.2018.8563408},
doi = {10.23919/SPA.2018.8563408},
timestamp = {Mon, 09 Aug 2021 14:54:02 +0200},
biburl = {https://dblp.org/rec/conf/spa/Vierhaus18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jcsc/GleichnerV17,
author = {Christian Gleichner and
Heinrich Theodor Vierhaus},
title = {Test and Diagnosis of Automotive Embedded Processors via High-Speed
Standard Interfaces},
journal = {J. Circuits Syst. Comput.},
volume = {26},
number = {8},
pages = {1740006:1--1740006:17},
year = {2017},
url = {https://doi.org/10.1142/S0218126617400060},
doi = {10.1142/S0218126617400060},
timestamp = {Tue, 25 Aug 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/jcsc/GleichnerV17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/DicoratoPV17,
author = {Davide Dicorato and
Petr Pfeifer and
Heinrich Theodor Vierhaus},
editor = {Manfred Dietrich and
Ondrej Nov{\'{a}}k},
title = {Fault detection and self repair in Hsiao-code {FEC} circuits},
booktitle = {20th {IEEE} International Symposium on Design and Diagnostics of Electronic
Circuits {\&} Systems, {DDECS} 2017, Dresden, Germany, April 19-21,
2017},
pages = {42--47},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/DDECS.2017.7934588},
doi = {10.1109/DDECS.2017.7934588},
timestamp = {Wed, 16 Oct 2019 14:14:50 +0200},
biburl = {https://dblp.org/rec/conf/ddecs/DicoratoPV17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/PfeiferHV17,
author = {Petr Pfeifer and
Farnoosh Hosseinzadeh and
Heinrich Theodor Vierhaus},
title = {On comparison of robust configurable {FPGA} encoders for dependable
industrial communication systems},
booktitle = {23rd {IEEE} International Symposium on On-Line Testing and Robust
System Design, {IOLTS} 2017, Thessaloniki, Greece, July 3-5, 2017},
pages = {199--200},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/IOLTS.2017.8046217},
doi = {10.1109/IOLTS.2017.8046217},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/iolts/PfeiferHV17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/ScharobaV17,
author = {Stefan Scharoba and
Heinrich Theodor Vierhaus},
title = {Fast power overhead prediction for hardware redundancy-based fault
tolerance},
booktitle = {23rd {IEEE} International Symposium on On-Line Testing and Robust
System Design, {IOLTS} 2017, Thessaloniki, Greece, July 3-5, 2017},
pages = {265--270},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/IOLTS.2017.8046232},
doi = {10.1109/IOLTS.2017.8046232},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iolts/ScharobaV17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/spa/PfeiferV17,
author = {Petr Pfeifer and
Heinrich Theodor Vierhaus},
title = {Forward error correction in wireless communication systems for industrial
applications},
booktitle = {Signal Processing: Algorithms, Architectures, Arrangements, and Applications,
{SPA} 2017, Poznan, Poland, September 20-22, 2017},
pages = {14},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.23919/SPA.2017.8166827},
doi = {10.23919/SPA.2017.8166827},
timestamp = {Mon, 09 Aug 2021 14:54:02 +0200},
biburl = {https://dblp.org/rec/conf/spa/PfeiferV17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/spa/HosseinzadehPV17,
author = {Farnoosh Hosseinzadeh and
Petr Pfeifer and
Heinrich Theodor Vierhaus},
title = {The coarse and fine granular fault tolerance techniques in FPGA-based
processors},
booktitle = {Signal Processing: Algorithms, Architectures, Arrangements, and Applications,
{SPA} 2017, Poznan, Poland, September 20-22, 2017},
pages = {116--120},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.23919/SPA.2017.8166849},
doi = {10.23919/SPA.2017.8166849},
timestamp = {Wed, 29 Jan 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/spa/HosseinzadehPV17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jcsc/UrbanVSAS16,
author = {Roberto Urban and
Heinrich Theodor Vierhaus and
Mario Sch{\"{o}}lzel and
Enrico Altmann and
Horst Seelig},
title = {Non-Cyclic Design Space Exploration for ASIPs - Compiler-Centered
Microprocessor Design (CoMet)},
journal = {J. Circuits Syst. Comput.},
volume = {25},
number = {3},
pages = {1640012:1--1640012:16},
year = {2016},
url = {https://doi.org/10.1142/S0218126616400120},
doi = {10.1142/S0218126616400120},
timestamp = {Mon, 28 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/jcsc/UrbanVSAS16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/GleichnerV16,
author = {Christian Gleichner and
Heinrich Theodor Vierhaus},
title = {Test of automotive embedded processors with high diagnostic resolution},
booktitle = {2016 {IEEE} 19th International Symposium on Design and Diagnostics
of Electronic Circuits {\&} Systems (DDECS), Kosice, Slovakia,
April 20-22, 2016},
pages = {113--118},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/DDECS.2016.7482443},
doi = {10.1109/DDECS.2016.7482443},
timestamp = {Wed, 16 Oct 2019 14:14:50 +0200},
biburl = {https://dblp.org/rec/conf/ddecs/GleichnerV16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/ScharobaV16,
author = {Stefan Scharoba and
Heinrich Theodor Vierhaus},
editor = {Paris Kitsos},
title = {An Interactive Design Space Exploration Tool for Dependable Integrated
Circuits},
booktitle = {2016 Euromicro Conference on Digital System Design, {DSD} 2016, Limassol,
Cyprus, August 31 - September 2, 2016},
pages = {714--717},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/DSD.2016.83},
doi = {10.1109/DSD.2016.83},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dsd/ScharobaV16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/ScholzelKMSRV16,
author = {Mario Sch{\"{o}}lzel and
Tobias Koal and
Sebastian M{\"{u}}ller and
Stefan Scharoba and
Stephanie Roder and
Heinrich Theodor Vierhaus},
title = {A comprehensive software-based self-test and self-repair method for
statically scheduled superscalar processors},
booktitle = {17th Latin-American Test Symposium, {LATS} 2016, Foz do Iguacu, Brazil,
April 6-8, 2016},
pages = {33--38},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/LATW.2016.7483336},
doi = {10.1109/LATW.2016.7483336},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/latw/ScholzelKMSRV16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/spa/PfeiferV16,
author = {Petr Pfeifer and
Heinrich Theodor Vierhaus},
title = {Iterative error correction with double/triple error detection},
booktitle = {Signal Processing: Algorithms, Architectures, Arrangements, and Applications,
{SPA} 2016, Poznan, Poland, September 21-23, 2016},
pages = {14--19},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/SPA.2016.7763579},
doi = {10.1109/SPA.2016.7763579},
timestamp = {Mon, 09 Aug 2021 14:54:02 +0200},
biburl = {https://dblp.org/rec/conf/spa/PfeiferV16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ahs/KoalV15,
author = {Tobias Koal and
Heinrich Theodor Vierhaus},
title = {Redundancy evaluation process of processor components for permanent
fault compensation},
booktitle = {2015 {NASA/ESA} Conference on Adaptive Hardware and Systems, {AHS}
2015, Montreal, QC, Canada, June 15-18, 2015},
pages = {1--6},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/AHS.2015.7231158},
doi = {10.1109/AHS.2015.7231158},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/ahs/KoalV15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/UrbanSVAS15,
author = {Roberto Urban and
Mario Sch{\"{o}}lzel and
Heinrich Theodor Vierhaus and
Enrico Altmann and
Horst Seelig},
editor = {Zoran Stamenkovic and
Witold A. Pleskacz and
Jaan Raik and
Heinrich Theodor Vierhaus},
title = {Compiler-Centred Microprocessor Design (CoMet) - From C-Code to a
{VHDL} Model of an {ASIP}},
booktitle = {18th {IEEE} International Symposium on Design and Diagnostics of Electronic
Circuits {\&} Systems, {DDECS} 2015, Belgrade, Serbia, April 22-24,
2015},
pages = {17--22},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/DDECS.2015.15},
doi = {10.1109/DDECS.2015.15},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ddecs/UrbanSVAS15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/KoalSV15,
author = {Tobias Koal and
Stefan Scharoba and
Heinrich Theodor Vierhaus},
editor = {Zoran Stamenkovic and
Witold A. Pleskacz and
Jaan Raik and
Heinrich Theodor Vierhaus},
title = {Combining Correction of Delay Faults and Transient Faults},
booktitle = {18th {IEEE} International Symposium on Design and Diagnostics of Electronic
Circuits {\&} Systems, {DDECS} 2015, Belgrade, Serbia, April 22-24,
2015},
pages = {99--102},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/DDECS.2015.23},
doi = {10.1109/DDECS.2015.23},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ddecs/KoalSV15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/gi/ScholzelV15,
author = {Mario Sch{\"{o}}lzel and
Heinrich Theodor Vierhaus},
editor = {Douglas W. Cunningham and
Petra Hofstedt and
Klaus Meer and
Ingo Schmitt},
title = {Fehlertolerante und energieeffiziente eingebettete Systeme: Methoden
und Anwendungen},
booktitle = {45. Jahrestagung der Gesellschaft f{\"{u}}r Informatik, Informatik,
Energie und Umwelt, {INFORMATIK} 2015, Cottbus, Germany, September
28 - October 2, 2015},
series = {{LNI}},
volume = {{P-246}},
pages = {1377},
publisher = {{GI}},
year = {2015},
timestamp = {Wed, 13 Jan 2021 11:09:19 +0100},
biburl = {https://dblp.org/rec/conf/gi/ScholzelV15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/gi/GleichnerV15,
author = {Christian Gleichner and
Heinrich Theodor Vierhaus},
editor = {Douglas W. Cunningham and
Petra Hofstedt and
Klaus Meer and
Ingo Schmitt},
title = {Test eingebetteter Prozessoren im Zielsystem mit hoher diagnostischer
Aufl{\"{o}}sung},
booktitle = {45. Jahrestagung der Gesellschaft f{\"{u}}r Informatik, Informatik,
Energie und Umwelt, {INFORMATIK} 2015, Cottbus, Germany, September
28 - October 2, 2015},
series = {{LNI}},
volume = {{P-246}},
pages = {1399--1413},
publisher = {{GI}},
year = {2015},
url = {https://dl.gi.de/handle/20.500.12116/2124},
timestamp = {Tue, 04 Jul 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/gi/GleichnerV15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/gi/DicoratoV15,
author = {Davide Dicorato and
Heinrich Theodor Vierhaus},
editor = {Douglas W. Cunningham and
Petra Hofstedt and
Klaus Meer and
Ingo Schmitt},
title = {Detection and Correction of Logic Errors Using Extra Time Slots},
booktitle = {45. Jahrestagung der Gesellschaft f{\"{u}}r Informatik, Informatik,
Energie und Umwelt, {INFORMATIK} 2015, Cottbus, Germany, September
28 - October 2, 2015},
series = {{LNI}},
volume = {{P-246}},
pages = {1431--1443},
publisher = {{GI}},
year = {2015},
url = {https://dl.gi.de/handle/20.500.12116/2126},
timestamp = {Tue, 04 Jul 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/gi/DicoratoV15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/gi/ScherpBV15,
author = {Ansgar Scherp and
Steffen Becker and
Heinrich Theodor Vierhaus},
editor = {Douglas W. Cunningham and
Petra Hofstedt and
Klaus Meer and
Ingo Schmitt},
title = {Doktorandenprogramm der {INFORMATIK} 2015},
booktitle = {45. Jahrestagung der Gesellschaft f{\"{u}}r Informatik, Informatik,
Energie und Umwelt, {INFORMATIK} 2015, Cottbus, Germany, September
28 - October 2, 2015},
series = {{LNI}},
volume = {{P-246}},
pages = {1737--1738},
publisher = {{GI}},
year = {2015},
timestamp = {Fri, 22 Mar 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/gi/ScherpBV15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/idt/UbarOSV15,
author = {Raimund Ubar and
Stephen Adeboye Oyeniran and
Mario Sch{\"{o}}lzel and
Heinrich Theodor Vierhaus},
title = {Multiple fault testing in systems-on-chip with high-level decision
diagrams},
booktitle = {10th International Design {\&} Test Symposium, {IDT} 2015, Dead
Sea, Amman, Jordan, December 14-16, 2015},
pages = {66--71},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/IDT.2015.7396738},
doi = {10.1109/IDT.2015.7396738},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/idt/UbarOSV15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/MullerKSVS15,
author = {Sebastian M{\"{u}}ller and
Tobias Koal and
Stefan Scharoba and
Heinrich Theodor Vierhaus and
Mario Sch{\"{o}}lzel},
title = {A multi-layer software-based fault-tolerance approach for heterogenous
multi-core systems},
booktitle = {16th Latin-American Test Symposium, {LATS} 2015, Puerto Vallarta,
Mexico, March 25-27, 2015},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/LATW.2015.7102508},
doi = {10.1109/LATW.2015.7102508},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/latw/MullerKSVS15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/spa/Vierhaus15,
author = {Heinrich Theodor Vierhaus},
title = {Error resilience in nano-electronic digital circuits and systems},
booktitle = {Signal Processing: Algorithms, Architectures, Arrangements, and Applications,
{SPA} 2015, Poznan, Poland, September 23-25, 2015},
pages = {9},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/SPA.2015.7365102},
doi = {10.1109/SPA.2015.7365102},
timestamp = {Mon, 09 Aug 2021 14:54:02 +0200},
biburl = {https://dblp.org/rec/conf/spa/Vierhaus15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ddecs/2015,
editor = {Zoran Stamenkovic and
Witold A. Pleskacz and
Jaan Raik and
Heinrich Theodor Vierhaus},
title = {18th {IEEE} International Symposium on Design and Diagnostics of Electronic
Circuits {\&} Systems, {DDECS} 2015, Belgrade, Serbia, April 22-24,
2015},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://ieeexplore.ieee.org/xpl/conhome/7193738/proceeding},
isbn = {978-1-4799-6779-7},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ddecs/2015.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/KoalSV14,
author = {Tobias Koal and
Mario Sch{\"{o}}lzel and
Heinrich Theodor Vierhaus},
title = {Combining fault tolerance and self repair at minimum cost in power
and hardware},
booktitle = {17th International Symposium on Design and Diagnostics of Electronic
Circuits {\&} Systems, {DDECS} 2014, Warsaw, Poland, 23-25 April,
2014},
pages = {153--158},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/DDECS.2014.6868780},
doi = {10.1109/DDECS.2014.6868780},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ddecs/KoalSV14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/ScholzelKV14,
author = {Mario Sch{\"{o}}lzel and
Tobias Koal and
Heinrich Theodor Vierhaus},
title = {Diagnostic self-test for dynamically scheduled superscalar processors
based on reconfiguration techniques for handling permanent faults},
booktitle = {2014 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2014, Amsterdam, The Netherlands,
October 1-3, 2014},
pages = {27--32},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/DFT.2014.6962072},
doi = {10.1109/DFT.2014.6962072},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/ScholzelKV14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/SabenaSSKVWGRSPH14,
author = {Davide Sabena and
Luca Sterpone and
Mario Sch{\"{o}}lzel and
Tobias Koal and
Heinrich Theodor Vierhaus and
S. Wong and
Rob{\'{e}}rt Glein and
Florian Rittner and
C. Stender and
Mario Porrmann and
Jens Hagemeyer},
editor = {Giorgio Di Natale},
title = {Reconfigurable high performance architectures: How much are they ready
for safety-critical applications?},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--8},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847820},
doi = {10.1109/ETS.2014.6847820},
timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
biburl = {https://dblp.org/rec/conf/ets/SabenaSSKVWGRSPH14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/ScholzelKV14,
author = {Mario Sch{\"{o}}lzel and
Tobias Koal and
Heinrich Theodor Vierhaus},
editor = {Giorgio Di Natale},
title = {Systematic generation of diagnostic software-based self-test routines
for processor components},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--6},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847795},
doi = {10.1109/ETS.2014.6847795},
timestamp = {Mon, 22 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/ScholzelKV14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ewme/VierhausSRU14,
author = {Heinrich Theodor Vierhaus and
Mario Sch{\"{o}}lzel and
Jaan Raik and
Raimund Ubar},
title = {Advanced technical education in the age of cyber physical systems},
booktitle = {10th European Workshop on Microelectronics Education (EWME), Tallinn,
Estonia, May 14-16, 2014},
pages = {193--198},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/EWME.2014.6877424},
doi = {10.1109/EWME.2014.6877424},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ewme/VierhausSRU14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/MullerKSV14,
author = {Sebastian M{\"{u}}ller and
Tobias Koal and
Mario Sch{\"{o}}lzel and
Heinrich Theodor Vierhaus},
title = {Timing for virtual {TMR} in logic circuits},
booktitle = {2014 {IEEE} 20th International On-Line Testing Symposium, {IOLTS}
2014, Platja d'Aro, Girona, Spain, July 7-9, 2014},
pages = {190--193},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/IOLTS.2014.6873693},
doi = {10.1109/IOLTS.2014.6873693},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/iolts/MullerKSV14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/mbmv/UrbanLHSV14,
author = {Roberto Urban and
Kai Lehniger and
Maximilian Heyne and
Mario Sch{\"{o}}lzel and
Heinrich Theodor Vierhaus},
editor = {J{\"{u}}rgen Ruf and
Dirk Allmendinger and
Matteo Michel},
title = {Vergleich der Beschreibung und Simulation einer Befehlssatzarchitektur
in {LISA} und CoMet},
booktitle = {Methoden und Beschreibungssprachen zur Modellierung und Verifikation
von Schaltungen und Systemen, {MBMV} 2014, B{\"{o}}blingen, Germany},
pages = {101--111},
publisher = {Cuvillier},
year = {2014},
timestamp = {Tue, 17 Jul 2018 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/mbmv/UrbanLHSV14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/PfeiferPSKV13,
author = {Petr Pfeifer and
Zdenek Pl{\'{\i}}va and
Mario Sch{\"{o}}lzel and
Tobias Koal and
Heinrich Theodor Vierhaus},
editor = {Luk{\'{a}}s Sekanina and
G{\"{o}}rschwin Fey and
Jaan Raik and
Snorre Aunet and
Richard Ruzicka},
title = {On performance estimation of a scalable {VLIW} soft-core in {XILINX}
FPGAs},
booktitle = {16th {IEEE} International Symposium on Design and Diagnostics of Electronic
Circuits {\&} Systems, {DDECS} 2013, Karlovy Vary, Czech Republic,
April 8-10, 2013},
pages = {181--186},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DDECS.2013.6549813},
doi = {10.1109/DDECS.2013.6549813},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ddecs/PfeiferPSKV13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/KoalUEV13,
author = {Tobias Koal and
Markus Ulbricht and
Piet Engelke and
Heinrich Theodor Vierhaus},
editor = {Luk{\'{a}}s Sekanina and
G{\"{o}}rschwin Fey and
Jaan Raik and
Snorre Aunet and
Richard Ruzicka},
title = {On the feasibility of combining on-line-test and self repair for logic
circuits},
booktitle = {16th {IEEE} International Symposium on Design and Diagnostics of Electronic
Circuits {\&} Systems, {DDECS} 2013, Karlovy Vary, Czech Republic,
April 8-10, 2013},
pages = {187--192},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DDECS.2013.6549814},
doi = {10.1109/DDECS.2013.6549814},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ddecs/KoalUEV13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/KoalUV13,
author = {Tobias Koal and
Markus Ulbricht and
Heinrich Theodor Vierhaus},
title = {Virtual {TMR} Schemes Combining Fault Tolerance and Self Repair},
booktitle = {2013 Euromicro Conference on Digital System Design, {DSD} 2013, Los
Alamitos, CA, USA, September 4-6, 2013},
pages = {235--242},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DSD.2013.34},
doi = {10.1109/DSD.2013.34},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dsd/KoalUV13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/ScholzelKRV13,
author = {Mario Sch{\"{o}}lzel and
Tobias Koal and
Stephanie Roder and
Heinrich Theodor Vierhaus},
title = {Towards an automatic generation of diagnostic in-field {SBST} for
processor components},
booktitle = {14th Latin American Test Workshop, {LATW} 2013, Cordoba, Argentina,
3-5 April, 2013},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/LATW.2013.6562676},
doi = {10.1109/LATW.2013.6562676},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/latw/ScholzelKRV13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/mbmv/UrbanSV13,
author = {Roberto Urban and
Mario Sch{\"{o}}lzel and
Heinrich Theodor Vierhaus},
editor = {Christian Haubelt and
Dirk Timmermann},
title = {Ein konfigurierbarer Zwischencodesimulator zum compilerzentrierten
Mikroprozessorentwurf},
booktitle = {Methoden und Beschreibungssprachen zur Modellierung und Verifikation
von Schaltungen und Systemen (MBMV), Warnem{\"{u}}nde, Germany,
March 12-14, 2013},
pages = {13--24},
publisher = {Institut f{\"{u}}r Angewandte Mikroelektronik und Datentechnik,
Fakult{\"{a}}t f{\"{u}}r Informatik und Elektrotechnik,
Universit{\"{a}}t Rostock},
year = {2013},
timestamp = {Mon, 18 Mar 2013 20:33:43 +0100},
biburl = {https://dblp.org/rec/conf/mbmv/UrbanSV13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/pdp/MullerSV13,
author = {Sebastian M{\"{u}}ller and
Mario Sch{\"{o}}lzel and
Heinrich Theodor Vierhaus},
title = {Towards a Graceful Degradable Multicore-System by Hierarchical Handling
of Hard Errors},
booktitle = {21st Euromicro International Conference on Parallel, Distributed,
and Network-Based Processing, {PDP} 2013, Belfast, United Kingdom,
February 27 - March 1, 2013},
pages = {302--309},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/PDP.2013.51},
doi = {10.1109/PDP.2013.51},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/pdp/MullerSV13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/arcs/MullerSV11,
author = {Sebastian M{\"{u}}ller and
Mario Sch{\"{o}}lzel and
Heinrich Theodor Vierhaus},
editor = {Gero M{\"{u}}hl and
Jan Richling and
Andreas Herkersdorf},
title = {Hierarchical Self-repair in Heterogeneous Multi-core Systems by Means
of a Software-based Reconfiguration},
booktitle = {{ARCS} 2012 Workshops, 28. Februar - 2. M{\"{a}}rz 2012, M{\"{u}}nchen,
Germany},
series = {{LNI}},
volume = {{P-200}},
pages = {251--262},
publisher = {{GI}},
year = {2012},
url = {https://ieeexplore.ieee.org/document/6222221/},
timestamp = {Tue, 04 Jul 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/arcs/MullerSV11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/KoalUV12,
author = {Tobias Koal and
Markus Ulbricht and
Heinrich Theodor Vierhaus},
editor = {Jaan Raik and
Viera Stopjakov{\'{a}} and
Heinrich Theodor Vierhaus and
Witold A. Pleskacz and
Raimund Ubar and
Helena Kruus and
Maksim Jenihhin},
title = {Combining on-line fault detection and logic self repair},
booktitle = {{IEEE} 15th International Symposium on Design and Diagnostics of Electronic
Circuits {\&} Systems, {DDECS} 2012, Tallinn, Estonia, April 18-20,
2012},
pages = {288--293},
publisher = {{IEEE}},
year = {2012},
url = {https://doi.org/10.1109/DDECS.2012.6219076},
doi = {10.1109/DDECS.2012.6219076},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ddecs/KoalUV12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/ScholzelKV12,
author = {Mario Sch{\"{o}}lzel and
Tobias Koal and
Heinrich Theodor Vierhaus},
editor = {Jaan Raik and
Viera Stopjakov{\'{a}} and
Heinrich Theodor Vierhaus and
Witold A. Pleskacz and
Raimund Ubar and
Helena Kruus and
Maksim Jenihhin},
title = {An adaptive self-test routine for in-field diagnosis of permanent
faults in simple {RISC} cores},
booktitle = {{IEEE} 15th International Symposium on Design and Diagnostics of Electronic
Circuits {\&} Systems, {DDECS} 2012, Tallinn, Estonia, April 18-20,
2012},
pages = {312--317},
publisher = {{IEEE}},
year = {2012},
url = {https://doi.org/10.1109/DDECS.2012.6219080},
doi = {10.1109/DDECS.2012.6219080},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ddecs/ScholzelKV12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/UlbrichtVK12,
author = {Markus Ulbricht and
Heinrich Theodor Vierhaus and
Tobias Koal},
title = {Activity Migration in M-of-N-Systems by Means of Load-Balancing},
booktitle = {15th Euromicro Conference on Digital System Design, {DSD} 2012, Cesme,
Izmir, Turkey, September 5-8, 2012},
pages = {258--263},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/DSD.2012.19},
doi = {10.1109/DSD.2012.19},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dsd/UlbrichtVK12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/GleichnerVE12,
author = {Christian Gleichner and
Heinrich Theodor Vierhaus and
Piet Engelke},
title = {Scan Based Tests via Standard Interfaces},
booktitle = {15th Euromicro Conference on Digital System Design, {DSD} 2012, Cesme,
Izmir, Turkey, September 5-8, 2012},
pages = {844--851},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/DSD.2012.117},
doi = {10.1109/DSD.2012.117},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dsd/GleichnerVE12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ddecs/2012,
editor = {Jaan Raik and
Viera Stopjakov{\'{a}} and
Heinrich Theodor Vierhaus and
Witold A. Pleskacz and
Raimund Ubar and
Helena Kruus and
Maksim Jenihhin},
title = {{IEEE} 15th International Symposium on Design and Diagnostics of Electronic
Circuits {\&} Systems, {DDECS} 2012, Tallinn, Estonia, April 18-20,
2012},
publisher = {{IEEE}},
year = {2012},
url = {https://ieeexplore.ieee.org/xpl/conhome/6213418/proceeding},
isbn = {978-1-4673-1187-8},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ddecs/2012.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/UlbrichtSKV11,
author = {Markus Ulbricht and
Mario Sch{\"{o}}lzel and
Tobias Koal and
Heinrich Theodor Vierhaus},
editor = {Rolf Kraemer and
Adam Pawlak and
Andreas Steininger and
Mario Sch{\"{o}}lzel and
Jaan Raik and
Heinrich Theodor Vierhaus},
title = {A new hierarchical built-in self-test with on-chip diagnosis for {VLIW}
processors},
booktitle = {14th {IEEE} International Symposium on Design and Diagnostics of Electronic
Circuits {\&} Systems, {DDECS} 2011, Cottbus, Germany, April 13-15,
2011},
pages = {143--146},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/DDECS.2011.5783067},
doi = {10.1109/DDECS.2011.5783067},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ddecs/UlbrichtSKV11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/KoalV11,
author = {Tobias Koal and
Heinrich Theodor Vierhaus},
editor = {Rolf Kraemer and
Adam Pawlak and
Andreas Steininger and
Mario Sch{\"{o}}lzel and
Jaan Raik and
Heinrich Theodor Vierhaus},
title = {Optimal spare utilization for reliability and mean lifetime improvement
of logic built-in self-repair},
booktitle = {14th {IEEE} International Symposium on Design and Diagnostics of Electronic
Circuits {\&} Systems, {DDECS} 2011, Cottbus, Germany, April 13-15,
2011},
pages = {219--224},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/DDECS.2011.5783083},
doi = {10.1109/DDECS.2011.5783083},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ddecs/KoalV11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/KoalSSV11,
author = {Tobias Koal and
Daniel Scheit and
Mario Sch{\"{o}}lzel and
Heinrich Theodor Vierhaus},
title = {On the Feasibility of Built-In Self Repair for Logic Circuits},
booktitle = {2011 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2011, Vancouver, BC, Canada,
October 3-5, 2011},
pages = {316--324},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/DFT.2011.52},
doi = {10.1109/DFT.2011.52},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/KoalSSV11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ddecs/2011,
editor = {Rolf Kraemer and
Adam Pawlak and
Andreas Steininger and
Mario Sch{\"{o}}lzel and
Jaan Raik and
Heinrich Theodor Vierhaus},
title = {14th {IEEE} International Symposium on Design and Diagnostics of Electronic
Circuits {\&} Systems, {DDECS} 2011, Cottbus, Germany, April 13-15,
2011},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://ieeexplore.ieee.org/xpl/conhome/5771301/proceeding},
isbn = {978-1-4244-9755-3},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ddecs/2011.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/KoalV10,
author = {Tobias Koal and
Heinrich Theodor Vierhaus},
editor = {Elena Gramatov{\'{a}} and
Zdenek Kot{\'{a}}sek and
Andreas Steininger and
Heinrich Theodor Vierhaus and
Horst Zimmermann},
title = {A software-based self-test and hardware reconfiguration solution for
{VLIW} processors},
booktitle = {13th {IEEE} International Symposium on Design and Diagnostics of Electronic
Circuits and Systems, {DDECS} 2010, Vienna, Austria, April 14-16,
2010},
pages = {40--43},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/DDECS.2010.5491821},
doi = {10.1109/DDECS.2010.5491821},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ddecs/KoalV10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/KoalV10a,
author = {Tobias Koal and
Heinrich Theodor Vierhaus},
editor = {Elena Gramatov{\'{a}} and
Zdenek Kot{\'{a}}sek and
Andreas Steininger and
Heinrich Theodor Vierhaus and
Horst Zimmermann},
title = {Combining de-stressing and self repair for long-term dependable systems},
booktitle = {13th {IEEE} International Symposium on Design and Diagnostics of Electronic
Circuits and Systems, {DDECS} 2010, Vienna, Austria, April 14-16,
2010},
pages = {99--104},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/DDECS.2010.5491808},
doi = {10.1109/DDECS.2010.5491808},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ddecs/KoalV10a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/KotheV10,
author = {Ren{\'{e}} Kothe and
Heinrich Theodor Vierhaus},
editor = {Sebasti{\'{a}}n L{\'{o}}pez},
title = {Test Data and Power Reductions for Transition Delay Tests for Massive-Parallel
Scan Structures},
booktitle = {13th Euromicro Conference on Digital System Design, Architectures,
Methods and Tools, {DSD} 2010, 1-3 September 2010, Lille, France},
pages = {283--290},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/DSD.2010.89},
doi = {10.1109/DSD.2010.89},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dsd/KotheV10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ddecs/2010,
editor = {Elena Gramatov{\'{a}} and
Zdenek Kot{\'{a}}sek and
Andreas Steininger and
Heinrich Theodor Vierhaus and
Horst Zimmermann},
title = {13th {IEEE} International Symposium on Design and Diagnostics of Electronic
Circuits and Systems, {DDECS} 2010, Vienna, Austria, April 14-16,
2010},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://ieeexplore.ieee.org/xpl/conhome/5484099/proceeding},
isbn = {978-1-4244-6612-2},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ddecs/2010.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/KoalSV09,
author = {Tobias Koal and
Daniel Scheit and
Heinrich Theodor Vierhaus},
title = {A scheme of logic self repair including local interconnects},
booktitle = {Proceedings of the 2009 {IEEE} Symposium on Design and Diagnostics
of Electronic Circuits and Systems, {DDECS} 2009, April 15-17, 2009,
Liberec, Czech Republic},
pages = {8--11},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/DDECS.2009.5012088},
doi = {10.1109/DDECS.2009.5012088},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ddecs/KoalSV09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/KoalSV09,
author = {Tobias Koal and
Daniel Scheit and
Heinrich Theodor Vierhaus},
editor = {Antonio N{\'{u}}{\~{n}}ez and
Pedro P. Carballo},
title = {Reliability Estimation Process},
booktitle = {12th Euromicro Conference on Digital System Design, Architectures,
Methods and Tools, {DSD} 2009, 27-29 August 2009, Patras, Greece},
pages = {221--224},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/DSD.2009.215},
doi = {10.1109/DSD.2009.215},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dsd/KoalSV09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/KoalVS09,
author = {Tobias Koal and
Heinrich Theodor Vierhaus and
Daniel Scheit},
editor = {Antonio N{\'{u}}{\~{n}}ez and
Pedro P. Carballo},
title = {A Concept for Logic Self Repair},
booktitle = {12th Euromicro Conference on Digital System Design, Architectures,
Methods and Tools, {DSD} 2009, 27-29 August 2009, Patras, Greece},
pages = {621--624},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/DSD.2009.238},
doi = {10.1109/DSD.2009.238},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dsd/KoalVS09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jolpe/KotheV08,
author = {Ren{\'{e}} Kothe and
Heinrich Theodor Vierhaus},
title = {A Scan Controller Concept for Low Power Scan Tests},
journal = {J. Low Power Electron.},
volume = {4},
number = {3},
pages = {420--428},
year = {2008},
url = {https://doi.org/10.1166/jolpe.2008.195},
doi = {10.1166/JOLPE.2008.195},
timestamp = {Fri, 22 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/jolpe/KotheV08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mam/MiseraVS08,
author = {Silvio Misera and
Heinrich Theodor Vierhaus and
Andr{\'{e}} Sieber},
title = {Simulated fault injections and their acceleration in SystemC},
journal = {Microprocess. Microsystems},
volume = {32},
number = {5-6},
pages = {270--278},
year = {2008},
url = {https://doi.org/10.1016/j.micpro.2008.03.013},
doi = {10.1016/J.MICPRO.2008.03.013},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mam/MiseraVS08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/VierhausK08,
author = {Heinrich Theodor Vierhaus and
Ren{\'{e}} Kothe},
editor = {Luca Fanucci},
title = {Embedded Diagnostic Logic Test Exploiting Regularity},
booktitle = {11th Euromicro Conference on Digital System Design: Architectures,
Methods and Tools, {DSD} 2008, Parma, Italy, September 3-5, 2008},
pages = {873--879},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/DSD.2008.124},
doi = {10.1109/DSD.2008.124},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dsd/VierhausK08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/KoalV08,
author = {Tobias Koal and
Heinrich Theodor Vierhaus},
title = {Basic Architecture for Logic Self Repair},
booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008),
7-9 July 2008, Rhodes, Greece},
pages = {177--178},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/IOLTS.2008.17},
doi = {10.1109/IOLTS.2008.17},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/KoalV08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/KotheV07,
author = {Ren{\'{e}} Kothe and
Heinrich Theodor Vierhaus},
editor = {Patrick Girard and
Andrzej Krasniewski and
Elena Gramatov{\'{a}} and
Adam Pawlak and
Tomasz Garbolino},
title = {Flip-Flops and Scan-Path Elements for Nanoelectronics},
booktitle = {Proceedings of the 10th {IEEE} Workshop on Design {\&} Diagnostics
of Electronic Circuits {\&} Systems {(DDECS} 2007), Krak{\'{o}}w,
Poland, April 11-13, 2007},
pages = {307--312},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/DDECS.2007.4295301},
doi = {10.1109/DDECS.2007.4295301},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ddecs/KotheV07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/VierhausRM07,
author = {Heinrich Theodor Vierhaus and
Helmut Rossmann and
Silvio Misera},
title = {Timing- / Power-Optimization for Digital Logic Based on Standard Cells},
booktitle = {Tenth Euromicro Conference on Digital System Design: Architectures,
Methods and Tools {(DSD} 2007), 29-31 August 2007, L{\"{u}}beck,
Germany},
pages = {303--306},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/DSD.2007.4341484},
doi = {10.1109/DSD.2007.4341484},
timestamp = {Wed, 16 Oct 2019 14:14:57 +0200},
biburl = {https://dblp.org/rec/conf/dsd/VierhausRM07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/MiseraVS07,
author = {Silvio Misera and
Heinrich Theodor Vierhaus and
Andr{\'{e}} Sieber},
title = {Fault Injection Techniques and their Accelerated Simulation in SystemC},
booktitle = {Tenth Euromicro Conference on Digital System Design: Architectures,
Methods and Tools {(DSD} 2007), 29-31 August 2007, L{\"{u}}beck,
Germany},
pages = {587--595},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/DSD.2007.4341528},
doi = {10.1109/DSD.2007.4341528},
timestamp = {Fri, 19 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dsd/MiseraVS07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/BrandenburgRGKV07,
author = {R. Frost and
D. Rudolph and
Christian Galke and
Ren{\'{e}} Kothe and
Heinrich Theodor Vierhaus},
title = {A Configurable Modular Test Processor and Scan Controller Architecture},
booktitle = {13th {IEEE} International On-Line Testing Symposium {(IOLTS} 2007),
8-11 July 2007, Heraklion, Crete, Greece},
pages = {277--284},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/IOLTS.2007.6},
doi = {10.1109/IOLTS.2007.6},
timestamp = {Thu, 24 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iolts/BrandenburgRGKV07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/arcs/GalkeKV06,
author = {Christian Galke and
Ren{\'{e}} Kothe and
Heinrich Theodor Vierhaus},
editor = {Wolfgang Karl and
J{\"{u}}rgen Becker and
Karl{-}Erwin Gro{\ss}pietsch and
Christian Hochberger and
Erik Maehle},
title = {Logic Self Repair},
booktitle = {{ARCS} 2006 - 19th International Conference on Architecture of Computing
Systems, Workshops Proceedings, March 16, 2006, Frankfurt am Main,
Germany},
series = {{LNI}},
volume = {{P-81}},
pages = {36--44},
publisher = {{GI}},
year = {2006},
url = {https://dl.gi.de/handle/20.500.12116/29424},
timestamp = {Tue, 04 Jul 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/arcs/GalkeKV06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/KrautzP0TWV06,
author = {Udo Krautz and
Matthias Pflanz and
Christian Jacobi and
Hans{-}Werner Tast and
Kai Weber and
Heinrich Theodor Vierhaus},
editor = {Georges G. E. Gielen},
title = {Evaluating coverage of error detection logic for soft errors using
formal methods},
booktitle = {Proceedings of the Conference on Design, Automation and Test in Europe,
{DATE} 2006, Munich, Germany, March 6-10, 2006},
pages = {176--181},
publisher = {European Design and Automation Association, Leuven, Belgium},
year = {2006},
url = {https://doi.org/10.1109/DATE.2006.244062},
doi = {10.1109/DATE.2006.244062},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/KrautzP0TWV06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/KotheGSFGV06,
author = {Ren{\'{e}} Kothe and
Christian Galke and
Sabine Schultke and
Henry Fr{\"{o}}schke and
Steffen Gaede and
Heinrich Theodor Vierhaus},
editor = {Matteo Sonza Reorda and
Ondrej Nov{\'{a}}k and
Bernd Straube and
Hana Kub{\'{a}}tov{\'{a}} and
Zdenek Kot{\'{a}}sek and
Pavel Kubal{\'{\i}}k and
Raimund Ubar and
Jir{\'{\i}} Bucek},
title = {Hardware/Software Based Hierarchical Self Test for SoCs},
booktitle = {Proceedings of the 9th {IEEE} Workshop on Design {\&} Diagnostics
of Electronic Circuits {\&} Systems {(DDECS} 2006), Prague, Czech
Republic, April 18-21, 2006},
pages = {159--160},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/DDECS.2006.1649603},
doi = {10.1109/DDECS.2006.1649603},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ddecs/KotheGSFGV06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/KotheVCVS06,
author = {Ren{\'{e}} Kothe and
Heinrich Theodor Vierhaus and
Torsten Coym and
Wolfgang Vermeiren and
Bernd Straube},
editor = {Matteo Sonza Reorda and
Ondrej Nov{\'{a}}k and
Bernd Straube and
Hana Kub{\'{a}}tov{\'{a}} and
Zdenek Kot{\'{a}}sek and
Pavel Kubal{\'{\i}}k and
Raimund Ubar and
Jir{\'{\i}} Bucek},
title = {Embedded Self Repair by Transistor and Gate Level Reconfiguration},
booktitle = {Proceedings of the 9th {IEEE} Workshop on Design {\&} Diagnostics
of Electronic Circuits {\&} Systems {(DDECS} 2006), Prague, Czech
Republic, April 18-21, 2006},
pages = {210--215},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/DDECS.2006.1649613},
doi = {10.1109/DDECS.2006.1649613},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ddecs/KotheVCVS06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/MiseraVBS06,
author = {Silvio Misera and
Heinrich Theodor Vierhaus and
Lars Breitenfeld and
Andr{\'{e}} Sieber},
title = {A Mixed Language Fault Simulation of {VHDL} and SystemC},
booktitle = {Ninth Euromicro Conference on Digital System Design: Architectures,
Methods and Tools {(DSD} 2006), 30 August - 1 September 2006, Dubrovnik,
Croatia},
pages = {275--279},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/DSD.2006.10},
doi = {10.1109/DSD.2006.10},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dsd/MiseraVBS06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/GalkeGV06,
author = {Christian Galke and
U. G{\"{a}}tzschmann and
Heinrich Theodor Vierhaus},
title = {Scan-Based SoC Test Using Space / Time Pattern Compaction Schemes},
booktitle = {Ninth Euromicro Conference on Digital System Design: Architectures,
Methods and Tools {(DSD} 2006), 30 August - 1 September 2006, Dubrovnik,
Croatia},
pages = {433--438},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/DSD.2006.83},
doi = {10.1109/DSD.2006.83},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dsd/GalkeGV06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/GalkeKSWHV06,
author = {Christian Galke and
Ren{\'{e}} Kothe and
Sabine Schultke and
K. Winkler and
Jeanette Honko and
Heinrich Theodor Vierhaus},
title = {Embedded Scan Test with Diagnostic Features for Self-Testing SoCs},
booktitle = {12th {IEEE} International On-Line Testing Symposium {(IOLTS} 2006),
10-12 July 2006, Como, Italy},
pages = {181--182},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/IOLTS.2006.28},
doi = {10.1109/IOLTS.2006.28},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/GalkeKSWHV06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/HabermannKV06,
author = {S. Habermann and
Ren{\'{e}} Kothe and
Heinrich Theodor Vierhaus},
title = {Built-in Self Repair by Reconfiguration of FPGAs},
booktitle = {12th {IEEE} International On-Line Testing Symposium {(IOLTS} 2006),
10-12 July 2006, Como, Italy},
pages = {187--188},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/IOLTS.2006.13},
doi = {10.1109/IOLTS.2006.13},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/HabermannKV06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/mbmv/VickRV06,
author = {Axel Vick and
Helmut Rossmann and
Heinrich Theodor Vierhaus},
editor = {Bernd Straube and
Martin Freibothe},
title = {Timing-/Power-getriebener Layout-Entwurf f{\"{u}}r Zellen-basierte
Digitalschaltungen},
booktitle = {Methoden und Beschreibungssprachen zur Modellierung und Verifikation
von Schaltungen und Systemen (MBMV), Dresden, Germany, February 20-22,
2006},
pages = {61--68},
publisher = {Fraunhofer Institut f{\"{u}}r Integrierte Schaltungen},
year = {2006},
timestamp = {Thu, 28 Jun 2012 09:12:11 +0200},
biburl = {https://dblp.org/rec/conf/mbmv/VickRV06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/gi/VierhausR05,
author = {Heinrich Theodor Vierhaus and
Helmut Rossmann},
editor = {Armin B. Cremers and
Rainer Manthey and
Peter Martini and
Volker Steinhage},
title = {Power-/Timing - Optimierung f{\"{u}}r Zellen-basierte Digitalschaltungen
in Submikron-Technologien},
booktitle = {35. Jahrestagung der Gesellschaft f{\"{u}}r Informatik, Informatik
LIVE!, {INFORMATIK} 2005, Bonn, Germany, September 19-22, 2005, Band
1},
series = {{LNI}},
volume = {{P-67}},
pages = {339--343},
publisher = {{GI}},
year = {2005},
url = {https://dl.gi.de/handle/20.500.12116/28055},
timestamp = {Tue, 04 Jul 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/gi/VierhausR05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/KotheGV05,
author = {Ren{\'{e}} Kothe and
Christian Galke and
Heinrich Theodor Vierhaus},
title = {A Multi-Purpose Concept for SoC Self Test Including Diagnostic Features},
booktitle = {11th {IEEE} International On-Line Testing Symposium {(IOLTS} 2005),
6-8 July 2005, Saint Raphael, France},
pages = {241--246},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/IOLTS.2005.7},
doi = {10.1109/IOLTS.2005.7},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/KotheGV05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/wea/GomulkiewiczKVW05,
author = {Marcin Gomulkiewicz and
Miroslaw Kutylowski and
Heinrich Theodor Vierhaus and
Pawel Wlaz},
editor = {Sotiris E. Nikoletseas},
title = {Synchronization Fault Cryptanalysis for Breaking {A5/1}},
booktitle = {Experimental and Efficient Algorithms, 4th InternationalWorkshop,
{WEA} 2005, Santorini Island, Greece, May 10-13, 2005, Proceedings},
series = {Lecture Notes in Computer Science},
volume = {3503},
pages = {415--427},
publisher = {Springer},
year = {2005},
url = {https://doi.org/10.1007/11427186\_36},
doi = {10.1007/11427186\_36},
timestamp = {Tue, 14 May 2019 10:00:42 +0200},
biburl = {https://dblp.org/rec/conf/wea/GomulkiewiczKVW05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/KretzschmarGV04,
author = {Claudia Kretzschmar and
Christian Galke and
Heinrich Theodor Vierhaus},
title = {A Hierarchical Self Test Scheme for SoCs},
booktitle = {10th {IEEE} International On-Line Testing Symposium {(IOLTS} 2004),
12-14 July 2004, Funchal, Madeira Island, Portugal},
pages = {37--44},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.ieeecomputersociety.org/10.1109/IOLTS.2004.3},
doi = {10.1109/IOLTS.2004.3},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/KretzschmarGV04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/parelec/MiseraV04,
author = {Silvio Misera and
Heinrich Theodor Vierhaus},
title = {{FIT} - {A} Parallel Hierarchical Fault Simulation Environment},
booktitle = {2004 International Conference on Parallel Computing in Electrical
Engineering {(PARELEC} 2004), 7-10 September 2004, Dresden, Germany},
pages = {289--294},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/PCEE.2004.34},
doi = {10.1109/PCEE.2004.34},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/parelec/MiseraV04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/PflanzWGV03,
author = {Matthias Pflanz and
Karsten Walther and
Christian Galke and
Heinrich Theodor Vierhaus},
title = {On-Line Techniques for Error Detection and Correction in Processor
Registers with Cross-Parity Check},
journal = {J. Electron. Test.},
volume = {19},
number = {5},
pages = {501--510},
year = {2003},
url = {https://doi.org/10.1023/A:1025165712071},
doi = {10.1023/A:1025165712071},
timestamp = {Tue, 13 Sep 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/PflanzWGV03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/PflanzV03,
author = {Matthias Pflanz and
Heinrich Theodor Vierhaus},
title = {Control Signal Protection For High Performance Processors},
booktitle = {9th {IEEE} International On-Line Testing Symposium {(IOLTS} 2003),
7-9 July 2003, Kos Island, Greece},
pages = {173},
publisher = {{IEEE} Computer Society},
year = {2003},
url = {https://doi.org/10.1109/OLT.2003.1214394},
doi = {10.1109/OLT.2003.1214394},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/PflanzV03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/GalkeGV03,
author = {Christian Galke and
Marcus Grabow and
Heinrich Theodor Vierhaus},
title = {Perspectives of Combining on-line and off-line Test Technology for
Dependable Systems on a Chip},
booktitle = {9th {IEEE} International On-Line Testing Symposium {(IOLTS} 2003),
7-9 July 2003, Kos Island, Greece},
pages = {183},
publisher = {{IEEE} Computer Society},
year = {2003},
url = {https://doi.org/10.1109/OLT.2003.1214396},
doi = {10.1109/OLT.2003.1214396},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/GalkeGV03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccd/GalkePV02,
author = {Christian Galke and
Matthias Pflanz and
Heinrich Theodor Vierhaus},
title = {A Test Processor Concept for Systems-on-a-Chip},
booktitle = {20th International Conference on Computer Design {(ICCD} 2002), {VLSI}
in Computers and Processors, 16-18 September 2002, Freiburg, Germany,
Proceedings},
pages = {210},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/ICCD.2002.1106772},
doi = {10.1109/ICCD.2002.1106772},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccd/GalkePV02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/PflanzWGV02,
author = {Matthias Pflanz and
Karsten Walther and
Christian Galke and
Heinrich Theodor Vierhaus},
title = {On-Line Error Detection and Correction in Storage Elements with Cross-Parity
Check},
booktitle = {8th {IEEE} International On-Line Testing Workshop {(IOLTW} 2002),
8-10 July 2002, Isle of Bendor, France},
pages = {69--73},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/OLT.2002.1030186},
doi = {10.1109/OLT.2002.1030186},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/PflanzWGV02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/GalkePV02,
author = {Christian Galke and
Matthias Pflanz and
Heinrich Theodor Vierhaus},
title = {On-line Detection and Compensation of Transient Errors in Processor
Pipeline-Structures},
booktitle = {8th {IEEE} International On-Line Testing Workshop {(IOLTW} 2002),
8-10 July 2002, Isle of Bendor, France},
pages = {178},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/OLT.2002.1030204},
doi = {10.1109/OLT.2002.1030204},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/GalkePV02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/micro/PflanzV01,
author = {Matthias Pflanz and
Heinrich Theodor Vierhaus},
title = {Online Check and Recovery Techniques for Dependable Embedded Processors},
journal = {{IEEE} Micro},
volume = {21},
number = {5},
pages = {24--40},
year = {2001},
url = {https://doi.org/10.1109/40.958697},
doi = {10.1109/40.958697},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/micro/PflanzV01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/RoussellePBMV01,
author = {C. Rousselle and
Matthias Pflanz and
A. Behling and
T. Mohaupt and
Heinrich Theodor Vierhaus},
editor = {Wolfgang Nebel and
Ahmed Jerraya},
title = {A register-transfer-level fault simulator for permanent and transient
faults in embedded processors},
booktitle = {Proceedings of the Conference on Design, Automation and Test in Europe,
{DATE} 2001, Munich, Germany, March 12-16, 2001},
pages = {811},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/DATE.2001.915148},
doi = {10.1109/DATE.2001.915148},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/RoussellePBMV01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/PflanzWV01,
author = {Matthias Pflanz and
Karsten Walther and
Heinrich Theodor Vierhaus},
title = {On-line Error Detection Techniques for Dependable Embedded Processors
with High Complexity},
booktitle = {7th {IEEE} International On-Line Testing Workshop {(IOLTW} 2001),
9-11 July 2001, Taormina, Italy},
pages = {51--53},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/OLT.2001.937818},
doi = {10.1109/OLT.2001.937818},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/PflanzWV01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/hldvt/PflanzGV00,
author = {Matthias Pflanz and
Christian Galke and
Heinrich Theodor Vierhaus},
title = {A new method for on-line state machine observation for embedded microprocessors},
booktitle = {Proceedings of the {IEEE} International High-Level Design Validation
and Test Workshop 2000, Berkeley, California, USA, November 8-10,
2000},
pages = {34--39},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/HLDVT.2000.889556},
doi = {10.1109/HLDVT.2000.889556},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/hldvt/PflanzGV00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/CornoGPRVV99,
author = {Fulvio Corno and
Uwe Gl{\"{a}}ser and
Paolo Prinetto and
Matteo Sonza Reorda and
Heinrich Theodor Vierhaus and
Massimo Violante},
title = {SymFony: a hybrid topological-symbolic {ATPG} exploiting RT-level
information},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {18},
number = {2},
pages = {191--202},
year = {1999},
url = {https://doi.org/10.1109/43.743731},
doi = {10.1109/43.743731},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/CornoGPRVV99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PflanzVP99,
author = {Matthias Pflanz and
Heinrich Theodor Vierhaus and
F. Pompsch},
title = {An efficient on-line-test and back-up scheme for embedded processors},
booktitle = {Proceedings {IEEE} International Test Conference 1999, Atlantic City,
NJ, USA, 27-30 September 1999},
pages = {964--972},
publisher = {{IEEE} Computer Society},
year = {1999},
url = {https://doi.org/10.1109/TEST.1999.805829},
doi = {10.1109/TEST.1999.805829},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PflanzVP99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/micro/PflanzV98,
author = {Matthias Pflanz and
Heinrich Theodor Vierhaus},
title = {Generating reliable embedded processors},
journal = {{IEEE} Micro},
volume = {18},
number = {5},
pages = {33--41},
year = {1998},
url = {https://doi.org/10.1109/40.735942},
doi = {10.1109/40.735942},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/micro/PflanzV98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/HubnerVC97,
author = {Uwe H{\"{u}}bner and
Heinrich Theodor Vierhaus and
Raul Camposano},
title = {Partitioning and analysis of static digital {CMOS} circuits},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {16},
number = {11},
pages = {1292--1310},
year = {1997},
url = {https://doi.org/10.1109/43.663819},
doi = {10.1109/43.663819},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/HubnerVC97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/glvlsi/DahmenGV97,
author = {H.{-}Ch. Dahmen and
Uwe Gl{\"{a}}ser and
Heinrich Theodor Vierhaus},
title = {An Efficient Dynamic Parallel Approach to Automatic Test Pattern Generation},
booktitle = {7th Great Lakes Symposium on {VLSI} {(GLS-VLSI} '97), 13-15 March
1997, Urbana, IL, {USA}},
pages = {112--117},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/GLSV.1997.580503},
doi = {10.1109/GLSV.1997.580503},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/glvlsi/DahmenGV97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/parco/DahmenGV97,
author = {H.{-}Ch. Dahmen and
Uwe Gl{\"{a}}ser and
Heinrich Theodor Vierhaus},
editor = {Erik H. D'Hollander and
Gerhard R. Joubert and
Frans J. Peters and
Ulrich Trottenberg},
title = {A Parallel Approach Solving the Test Generation Problem for Synchronous
Sequential Circuits},
booktitle = {Parallel Computing: Fundamentals, Applications and New Directions,
Proceedings of the Conference ParCo'97, 19-22 September 1997, Bonn,
Germany},
series = {Advances in Parallel Computing},
volume = {12},
pages = {549--556},
publisher = {Elsevier},
year = {1997},
timestamp = {Mon, 03 Jun 2013 17:22:02 +0200},
biburl = {https://dblp.org/rec/conf/parco/DahmenGV97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/GlaserV96,
author = {Uwe Gl{\"{a}}ser and
Heinrich Theodor Vierhaus},
title = {Mixed level test generation for synchronous sequential circuits using
the {FOGBUSTER} algorithm},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {15},
number = {4},
pages = {410--423},
year = {1996},
url = {https://doi.org/10.1109/43.494704},
doi = {10.1109/43.494704},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/GlaserV96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/glvlsi/WilbergKCRV96,
author = {J{\"{o}}rg Wilberg and
A. Kuth and
Raul Camposano and
Wolfgang Rosenstiel and
Heinrich Theodor Vierhaus},
title = {A Design Exploration Environment},
booktitle = {6th Great Lakes Symposium on {VLSI} {(GLS-VLSI} '96), March 22-23,
1996, Ames, IA, {USA}},
pages = {77--80},
publisher = {{IEEE} Computer Society},
year = {1996},
url = {https://doi.org/10.1109/GLSV.1996.497597},
doi = {10.1109/GLSV.1996.497597},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/glvlsi/WilbergKCRV96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/pvm/DahmenGV96,
author = {H.{-}Ch. Dahmen and
Uwe Gl{\"{a}}ser and
Heinrich Theodor Vierhaus},
editor = {Arndt Bode and
Jack J. Dongarra and
Thomas Ludwig and
Vaidy S. Sunderam},
title = {Automatic Test Pattern Generation with Optimal Load Balancing},
booktitle = {Parallel Virtual Machine - EuroPVM'96, Third European {PVM} Conference,
M{\"{u}}nchen, Germany, October 7-9, 1996, Proceedings},
series = {Lecture Notes in Computer Science},
volume = {1156},
pages = {205--212},
publisher = {Springer},
year = {1996},
url = {https://doi.org/10.1007/3540617795\_26},
doi = {10.1007/3540617795\_26},
timestamp = {Tue, 14 May 2019 10:00:52 +0200},
biburl = {https://dblp.org/rec/conf/pvm/DahmenGV96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/BrakelGKV95,
author = {G. Van Brakel and
Uwe Gl{\"{a}}ser and
Hans G. Kerkhoff and
Heinrich Theodor Vierhaus},
title = {Gate delay fault test generation for non-scan circuits},
booktitle = {1995 European Design and Test Conference, ED{\&}TC 1995, Paris,
France, March 6-9, 1995},
pages = {308--313},
publisher = {{IEEE} Computer Society},
year = {1995},
url = {https://doi.org/10.1109/EDTC.1995.470379},
doi = {10.1109/EDTC.1995.470379},
timestamp = {Fri, 20 May 2022 15:41:46 +0200},
biburl = {https://dblp.org/rec/conf/date/BrakelGKV95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/eurodac/GlasserV95,
author = {Uwe Gl{\"{a}}ser and
Heinrich Theodor Vierhaus},
editor = {Gerald Musgrave},
title = {{FOGBUSTER:} an efficient algorithm for sequential test generation},
booktitle = {Proceedings EURO-DAC'95, European Design Automation Conference with
EURO-VHDL, Brighton, England, UK, September 18-22, 1995},
pages = {230--235},
publisher = {{IEEE} Computer Society},
year = {1995},
url = {https://doi.org/10.1109/EURDAC.1995.527411},
doi = {10.1109/EURDAC.1995.527411},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/eurodac/GlasserV95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/CornoPRGV95,
author = {Fulvio Corno and
Paolo Prinetto and
Matteo Sonza Reorda and
Uwe Gl{\"{a}}ser and
Heinrich Theodor Vierhaus},
title = {Improving topological {ATPG} with symbolic techniques},
booktitle = {13th {IEEE} {VLSI} Test Symposium (VTS'95), April 30 - May 3, 1995,
Princeton, New Jersey, {USA}},
pages = {338--343},
publisher = {{IEEE} Computer Society},
year = {1995},
url = {https://doi.org/10.1109/VTEST.1995.512658},
doi = {10.1109/VTEST.1995.512658},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/CornoPRGV95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dagstuhl/LangevinCWV94,
author = {Michel Langevin and
Eduard Cerny and
J{\"{o}}rg Wilberg and
Heinrich Theodor Vierhaus},
editor = {Peter Marwedel and
Gert Goossens},
title = {Local microcode generation in system design},
booktitle = {Code Generation for Embedded Processors [Dagstuhl Workshop, Dagstuhl,
Germany, August 31 - September 2, 1994]},
pages = {171--187},
publisher = {Kluwer},
year = {1994},
timestamp = {Tue, 19 Jun 2018 18:52:39 +0200},
biburl = {https://dblp.org/rec/conf/dagstuhl/LangevinCWV94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/GlaserVKW94,
author = {Uwe Gl{\"{a}}ser and
Heinrich Theodor Vierhaus and
M. Kley and
A. Wiederhold},
editor = {Jochen A. G. Jess and
Richard L. Rudell},
title = {Test generation for bridging faults in {CMOS} ICs based on current
monitoring versus signal propagation},
booktitle = {Proceedings of the 1994 {IEEE/ACM} International Conference on Computer-Aided
Design, {ICCAD} 1994, San Jose, California, USA, November 6-10, 1994},
pages = {36--39},
publisher = {{IEEE} Computer Society / {ACM}},
year = {1994},
url = {https://doi.org/10.1109/ICCAD.1994.629740},
doi = {10.1109/ICCAD.1994.629740},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccad/GlaserVKW94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccd/WolberGV94,
author = {R. Wolber and
Uwe Gl{\"{a}}ser and
Heinrich Theodor Vierhaus},
title = {Testability Analysis for Test Generation in Synchronous Sequential
Circuits},
booktitle = {Proceedings 1994 {IEEE} International Conference on Computer Design:
{VLSI} in Computer {\&} Processors, {ICCD} '94, Cambridge, MA,
USA, October 10-12, 1994},
pages = {350--353},
publisher = {{IEEE} Computer Society},
year = {1994},
url = {https://doi.org/10.1109/ICCD.1994.331924},
doi = {10.1109/ICCD.1994.331924},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccd/WolberGV94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jsa/VierhausMGC93,
author = {Heinrich Theodor Vierhaus and
Wolfgang Meyer and
Uwe Gl{\"{a}}ser and
Raul Camposano},
title = {Fault behavior and testability of asynchronous {CMOS} circuits},
journal = {Microprocess. Microprogramming},
volume = {38},
number = {1-5},
pages = {223--228},
year = {1993},
url = {https://doi.org/10.1016/0165-6074(93)90148-E},
doi = {10.1016/0165-6074(93)90148-E},
timestamp = {Tue, 19 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/jsa/VierhausMGC93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/VierhausMG93,
author = {Heinrich Theodor Vierhaus and
Wolfgang Meyer and
Uwe Gl{\"{a}}ser},
title = {{CMOS} Bridges and Resistive Transistor Faults: I\({}_{\mbox{DDQ}}\)
versus Delay Effects},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {83--91},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470715},
doi = {10.1109/TEST.1993.470715},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/VierhausMG93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jsa/HubnerMV92,
author = {Uwe H{\"{u}}bner and
Wolfgang Meyer and
Heinrich Theodor Vierhaus},
title = {{CMOS} transistor faults and bridging faults: Testability by delay
effects and overcurrents},
journal = {Microprocess. Microprogramming},
volume = {35},
number = {1-5},
pages = {377--382},
year = {1992},
url = {https://doi.org/10.1016/0165-6074(92)90342-5},
doi = {10.1016/0165-6074(92)90342-5},
timestamp = {Tue, 19 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/jsa/HubnerMV92.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/eurodac/GlaserV92,
author = {Uwe Gl{\"{a}}ser and
Heinrich Theodor Vierhaus},
editor = {Gerald Musgrave},
title = {{MILEF:} an efficient approach to mixed level automatic test pattern
generation},
booktitle = {Proceedings of the conference on European design automation, {EURO-DAC}
'92, Hamburg, Germany, September 7-10, 1992},
pages = {318--321},
publisher = {{IEEE} Computer Society Press},
year = {1992},
url = {https://doi.org/10.1109/EURDAC.1992.246225},
doi = {10.1109/EURDAC.1992.246225},
timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
biburl = {https://dblp.org/rec/conf/eurodac/GlaserV92.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/HubnerV92,
author = {Uwe H{\"{u}}bner and
Heinrich Theodor Vierhaus},
editor = {Louise Trevillyan and
Michael R. Lightner},
title = {Efficient partitioning and analysis of digital CMOS-circuits},
booktitle = {1992 {IEEE/ACM} International Conference on Computer-Aided Design,
{ICCAD} 1992, Santa Clara, CA, USA, November 8-12, 1992. Digest of
Technical Papers},
pages = {280--283},
publisher = {{IEEE} Computer Society / {ACM}},
year = {1992},
url = {https://doi.org/10.1109/ICCAD.1992.279360},
doi = {10.1109/ICCAD.1992.279360},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccad/HubnerV92.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccd/WesterholzV92,
author = {Ursula Westerholz and
Heinrich Theodor Vierhaus},
title = {Library Mapping of CMOS-Switch-Level-Circuits by Extraction of Isomorphic
Subgraphs},
booktitle = {Proceedings 1992 {IEEE} International Conference on Computer Design:
{VLSI} in Computer {\&} Processors, {ICCD} '92, Cambridge, MA,
USA, October 11-14, 1992},
pages = {472--475},
publisher = {{IEEE} Computer Society},
year = {1992},
url = {https://doi.org/10.1109/ICCD.1992.276318},
doi = {10.1109/ICCD.1992.276318},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccd/WesterholzV92.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GlaserHV92,
author = {Uwe Gl{\"{a}}ser and
Uwe H{\"{u}}bner and
Heinrich Theodor Vierhaus},
title = {Mixed Level Hierarchical Test Generation for Transition Faults and
Overcurrent Related Defects},
booktitle = {Proceedings {IEEE} International Test Conference 1992, Discover the
New World of Test and Design, Baltimore, Maryland, USA, September
20-24, 1992},
pages = {21--29},
publisher = {{IEEE} Computer Society},
year = {1992},
url = {https://doi.org/10.1109/TEST.1992.528533},
doi = {10.1109/TEST.1992.528533},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GlaserHV92.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jsa/HubnerHHV91,
author = {Uwe H{\"{u}}bner and
H. Hinsen and
M. Hofebauer and
Heinrich Theodor Vierhaus},
title = {Mixed level test generation for high fault coverage},
journal = {Microprocessing and Microprogramming},
volume = {32},
number = {1-5},
pages = {791--796},
year = {1991},
url = {https://doi.org/10.1016/0165-6074(91)90438-Y},
doi = {10.1016/0165-6074(91)90438-Y},
timestamp = {Wed, 17 Aug 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/jsa/HubnerHHV91.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jsa/SternV90,
author = {Olaf Stern and
Heinrich Theodor Vierhaus},
title = {{CMOS} layout generation for improved testability},
journal = {Microprocessing and Microprogramming},
volume = {30},
number = {1-5},
pages = {509--512},
year = {1990},
url = {https://doi.org/10.1016/0165-6074(90)90291-G},
doi = {10.1016/0165-6074(90)90291-G},
timestamp = {Fri, 12 Aug 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/jsa/SternV90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jsa/Vierhaus89,
author = {Heinrich Theodor Vierhaus},
title = {Testability of non-trivial {CMOS} faults under realistic conditions},
journal = {Microprocessing and Microprogramming},
volume = {27},
number = {1-5},
pages = {681--686},
year = {1989},
url = {https://doi.org/10.1016/0165-6074(89)90132-4},
doi = {10.1016/0165-6074(89)90132-4},
timestamp = {Fri, 12 Aug 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/jsa/Vierhaus89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jsa/MatthausKGHV88,
author = {C. Matth{\"{a}}us and
B. Kr{\"{u}}ger{-}Sprengel and
C. Glowacz and
Uwe H{\"{u}}bner and
Heinrich Theodor Vierhaus},
title = {{CMOS} fault modeling, test generation and design for testability},
journal = {Microprocess. Microprogramming},
volume = {24},
number = {1-5},
pages = {233--238},
year = {1988},
url = {https://doi.org/10.1016/0165-6074(88)90059-2},
doi = {10.1016/0165-6074(88)90059-2},
timestamp = {Fri, 05 Aug 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/jsa/MatthausKGHV88.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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