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BibTeX records: Paul M. Rosinger
@article{DBLP:journals/tvlsi/EjlaliARMB10, author = {Alireza Ejlali and Bashir M. Al{-}Hashimi and Paul M. Rosinger and Seyed Ghassem Miremadi and Luca Benini}, title = {Performability/Energy Tradeoff in Error-Control Schemes for On-Chip Networks}, journal = {{IEEE} Trans. Very Large Scale Integr. Syst.}, volume = {18}, number = {1}, pages = {1--14}, year = {2010}, url = {https://doi.org/10.1109/TVLSI.2008.2000994}, doi = {10.1109/TVLSI.2008.2000994}, timestamp = {Thu, 23 Jun 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/tvlsi/EjlaliARMB10.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/HePERA08, author = {Zhiyuan He and Zebo Peng and Petru Eles and Paul M. Rosinger and Bashir M. Al{-}Hashimi}, title = {Thermal-Aware SoC Test Scheduling with Test Set Partitioning and Interleaving}, journal = {J. Electron. Test.}, volume = {24}, number = {1-3}, pages = {247--257}, year = {2008}, url = {https://doi.org/10.1007/s10836-007-5030-6}, doi = {10.1007/S10836-007-5030-6}, timestamp = {Tue, 09 Aug 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/HePERA08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/tcad/KhursheedIRAH08, author = {S. Saqib Khursheed and Urban Ingelsson and Paul M. Rosinger and Bashir M. Al{-}Hashimi and Peter Harrod}, title = {Bridging Fault Test Method With Adaptive Power Management Awareness}, journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.}, volume = {27}, number = {6}, pages = {1117--1127}, year = {2008}, url = {https://doi.org/10.1109/TCAD.2008.923247}, doi = {10.1109/TCAD.2008.923247}, timestamp = {Thu, 24 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/tcad/KhursheedIRAH08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ddecs/ShafikRA08, author = {Rishad A. Shafik and Paul M. Rosinger and Bashir M. Al{-}Hashimi}, editor = {Bernd Straube and Milos Drutarovsk{\'{y}} and Michel Renovell and Peter Gramata and M{\'{a}}ria Fischerov{\'{a}}}, title = {MPEG-based Performance Comparison between Network-on-Chip and {AMBA} MPSoC}, booktitle = {Proceedings of the 11th {IEEE} Workshop on Design {\&} Diagnostics of Electronic Circuits {\&} Systems {(DDECS} 2008), Bratislava, Slovakia, April 16-18, 2008}, pages = {98--103}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/DDECS.2008.4538764}, doi = {10.1109/DDECS.2008.4538764}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ddecs/ShafikRA08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ets/KhursheedRARH08, author = {S. Saqib Khursheed and Paul M. Rosinger and Bashir M. Al{-}Hashimi and Sudhakar M. Reddy and Peter Harrod}, title = {Bridge Defect Diagnosis for Multiple-Voltage Design}, booktitle = {13th European Test Symposium, {ETS} 2008, Verbania, Italy, May 25-29, 2008}, pages = {99--104}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/ETS.2008.14}, doi = {10.1109/ETS.2008.14}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ets/KhursheedRARH08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/ShafikRA08, author = {Rishad A. Shafik and Paul M. Rosinger and Bashir M. Al{-}Hashimi}, title = {SystemC-Based Minimum Intrusive Fault Injection Technique with Improved Fault Representation}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {99--104}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.25}, doi = {10.1109/IOLTS.2008.25}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/ShafikRA08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/IngelssonRKAH07, author = {Urban Ingelsson and Paul M. Rosinger and S. Saqib Khursheed and Bashir M. Al{-}Hashimi and Peter Harrod}, title = {Resistive Bridging Faults {DFT} with Adaptive Power Management Awareness}, booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11, 2007}, pages = {101--106}, publisher = {{IEEE}}, year = {2007}, url = {https://doi.org/10.1109/ATS.2007.69}, doi = {10.1109/ATS.2007.69}, timestamp = {Wed, 09 Nov 2022 21:30:34 +0100}, biburl = {https://dblp.org/rec/conf/ats/IngelssonRKAH07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/date/EjlaliARM07, author = {Alireza Ejlali and Bashir M. Al{-}Hashimi and Paul M. Rosinger and Seyed Ghassem Miremadi}, editor = {Rudy Lauwereins and Jan Madsen}, title = {Joint consideration of fault-tolerance, energy-efficiency and performance in on-chip networks}, booktitle = {2007 Design, Automation and Test in Europe Conference and Exposition, {DATE} 2007, Nice, France, April 16-20, 2007}, pages = {1647--1652}, publisher = {{EDA} Consortium, San Jose, CA, {USA}}, year = {2007}, url = {https://dl.acm.org/citation.cfm?id=1266728}, timestamp = {Wed, 16 Oct 2019 14:14:53 +0200}, biburl = {https://dblp.org/rec/conf/date/EjlaliARM07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/corr/abs-0710-4797, author = {Paul M. Rosinger and Bashir M. Al{-}Hashimi and Krishnendu Chakrabarty}, title = {Rapid Generation of Thermal-Safe Test Schedules}, journal = {CoRR}, volume = {abs/0710.4797}, year = {2007}, url = {http://arxiv.org/abs/0710.4797}, eprinttype = {arXiv}, eprint = {0710.4797}, timestamp = {Mon, 13 Aug 2018 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/corr/abs-0710-4797.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/jolpe/DililloRAG06, author = {Luigi Dilillo and Paul M. Rosinger and Bashir M. Al{-}Hashimi and Patrick Girard}, title = {Reducing Power Dissipation in {SRAM} during Test}, journal = {J. Low Power Electron.}, volume = {2}, number = {2}, pages = {271--280}, year = {2006}, url = {https://doi.org/10.1166/jolpe.2006.062}, doi = {10.1166/JOLPE.2006.062}, timestamp = {Fri, 22 May 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/jolpe/DililloRAG06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/tcad/RosingerAC06, author = {Paul M. Rosinger and Bashir M. Al{-}Hashimi and Krishnendu Chakrabarty}, title = {Thermal-Safe Test Scheduling for Core-Based System-on-Chip Integrated Circuits}, journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.}, volume = {25}, number = {11}, pages = {2502--2512}, year = {2006}, url = {https://doi.org/10.1109/TCAD.2006.873898}, doi = {10.1109/TCAD.2006.873898}, timestamp = {Mon, 03 Jan 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/tcad/RosingerAC06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/tvlsi/EjlaliASRM06, author = {Alireza Ejlali and Bashir M. Al{-}Hashimi and Marcus T. Schmitz and Paul M. Rosinger and Seyed Ghassem Miremadi}, title = {Combined time and information redundancy for SEU-tolerance in energy-efficient real-time systems}, journal = {{IEEE} Trans. Very Large Scale Integr. Syst.}, volume = {14}, number = {4}, pages = {323--335}, year = {2006}, url = {https://doi.org/10.1109/TVLSI.2006.874355}, doi = {10.1109/TVLSI.2006.874355}, timestamp = {Thu, 23 Jun 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/tvlsi/EjlaliASRM06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/date/DililloRAG06, author = {Luigi Dilillo and Paul M. Rosinger and Bashir M. Al{-}Hashimi and Patrick Girard}, editor = {Georges G. E. Gielen}, title = {Minimizing test power in {SRAM} through reduction of pre-charge activity}, booktitle = {Proceedings of the Conference on Design, Automation and Test in Europe, {DATE} 2006, Munich, Germany, March 6-10, 2006}, pages = {1159--1164}, publisher = {European Design and Automation Association, Leuven, Belgium}, year = {2006}, url = {https://doi.org/10.1109/DATE.2006.244016}, doi = {10.1109/DATE.2006.244016}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/date/DililloRAG06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dft/HePERA06, author = {Zhiyuan He and Zebo Peng and Petru Eles and Paul M. Rosinger and Bashir M. Al{-}Hashimi}, title = {Thermal-Aware SoC Test Scheduling with Test Set Partitioning and Interleaving}, booktitle = {21th {IEEE} International Symposium on Defect and Fault-Tolerance in {VLSI} Systems {(DFT} 2006), 4-6 October 2006, Arlington, Virginia, {USA}}, pages = {477--485}, publisher = {{IEEE} Computer Society}, year = {2006}, url = {https://doi.org/10.1109/DFT.2006.65}, doi = {10.1109/DFT.2006.65}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/dft/HePERA06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/date/RosingerAC05, author = {Paul M. Rosinger and Bashir M. Al{-}Hashimi and Krishnendu Chakrabarty}, title = {Rapid Generation of Thermal-Safe Test Schedules}, booktitle = {2005 Design, Automation and Test in Europe Conference and Exposition {(DATE} 2005), 7-11 March 2005, Munich, Germany}, pages = {840--845}, publisher = {{IEEE} Computer Society}, year = {2005}, url = {https://doi.org/10.1109/DATE.2005.252}, doi = {10.1109/DATE.2005.252}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/date/RosingerAC05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dft/TafajRAC05, author = {Enkelejda Tafaj and Paul M. Rosinger and Bashir M. Al{-}Hashimi and Krishnendu Chakrabarty}, title = {Improving Thermal-Safe Test Scheduling for Core-Based Systems-on-Chip Using Shift Frequency Scaling}, booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}}, pages = {544--551}, publisher = {{IEEE} Computer Society}, year = {2005}, url = {https://doi.org/10.1109/DFTVS.2005.40}, doi = {10.1109/DFTVS.2005.40}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/dft/TafajRAC05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/islped/EjlaliSAMR05, author = {Alireza Ejlali and Marcus T. Schmitz and Bashir M. Al{-}Hashimi and Seyed Ghassem Miremadi and Paul M. Rosinger}, editor = {Kaushik Roy and Vivek Tiwari}, title = {Energy efficient SEU-tolerance in DVS-enabled real-time systems through information redundancy}, booktitle = {Proceedings of the 2005 International Symposium on Low Power Electronics and Design, 2005, San Diego, California, USA, August 8-10, 2005}, pages = {281--286}, publisher = {{ACM}}, year = {2005}, url = {https://doi.org/10.1145/1077603.1077669}, doi = {10.1145/1077603.1077669}, timestamp = {Tue, 06 Nov 2018 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/islped/EjlaliSAMR05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/tcad/RosingerAN04, author = {Paul M. Rosinger and Bashir M. Al{-}Hashimi and Nicola Nicolici}, title = {Scan architecture with mutually exclusive scan segment activation for shift- and capture-power reduction}, journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.}, volume = {23}, number = {7}, pages = {1142--1153}, year = {2004}, url = {https://doi.org/10.1109/TCAD.2004.829797}, doi = {10.1109/TCAD.2004.829797}, timestamp = {Thu, 24 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/tcad/RosingerAN04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/date/LampropoulosAR04, author = {Matheos Lampropoulos and Bashir M. Al{-}Hashimi and Paul M. Rosinger}, title = {Minimization of Crosstalk Noise, Delay and Power Using a Modified Bus Invert Technique}, booktitle = {2004 Design, Automation and Test in Europe Conference and Exposition {(DATE} 2004), 16-20 February 2004, Paris, France}, pages = {1372--1373}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/DATE.2004.1269094}, doi = {10.1109/DATE.2004.1269094}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/date/LampropoulosAR04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/tcad/RosingerAN02, author = {Paul M. Rosinger and Bashir M. Al{-}Hashimi and Nicola Nicolici}, title = {Power profile manipulation: a new approach for reducing test application time under power constraints}, journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.}, volume = {21}, number = {10}, pages = {1217--1225}, year = {2002}, url = {https://doi.org/10.1109/TCAD.2002.802256}, doi = {10.1109/TCAD.2002.802256}, timestamp = {Thu, 24 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/tcad/RosingerAN02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dft/RosingerAN02, author = {Paul M. Rosinger and Bashir M. Al{-}Hashimi and Nicola Nicolici}, title = {Scan Architecture for Shift and Capture Cycle Power Reduction}, booktitle = {17th {IEEE} International Symposium on Defect and Fault-Tolerance in {VLSI} Systems {(DFT} 2002), 6-8 November 2002, Vancouver, BC, Canada, Proceedings}, pages = {129--137}, publisher = {{IEEE} Computer Society}, year = {2002}, url = {https://doi.org/10.1109/DFTVS.2002.1173509}, doi = {10.1109/DFTVS.2002.1173509}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/dft/RosingerAN02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iccd/RosingerAN02, author = {Paul M. Rosinger and Bashir M. Al{-}Hashimi and Nicola Nicolici}, title = {Low Power Mixed-Mode {BIST} Based on Mask Pattern Generation Using Dual {LFSR} Re-Seeding}, booktitle = {20th International Conference on Computer Design {(ICCD} 2002), {VLSI} in Computers and Processors, 16-18 September 2002, Freiburg, Germany, Proceedings}, pages = {474--479}, publisher = {{IEEE} Computer Society}, year = {2002}, url = {https://doi.org/10.1109/ICCD.2002.1106816}, doi = {10.1109/ICCD.2002.1106816}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iccd/RosingerAN02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iscas/RosingerAN01, author = {Paul M. Rosinger and Bashir M. Al{-}Hashimi and Nicola Nicolici}, title = {Power constrained test scheduling using power profile manipulation}, booktitle = {Proceedings of the 2001 International Symposium on Circuits and Systems, {ISCAS} 2001, Sydney, Australia, May 6-9, 2001}, pages = {251--254}, publisher = {{IEEE}}, year = {2001}, url = {https://doi.org/10.1109/ISCAS.2001.922032}, doi = {10.1109/ISCAS.2001.922032}, timestamp = {Wed, 16 Oct 2019 14:14:49 +0200}, biburl = {https://dblp.org/rec/conf/iscas/RosingerAN01.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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