BibTeX records: Ilia Polian

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@article{DBLP:journals/it/Polian19,
  author    = {Ilia Polian},
  title     = {Hardware-oriented security},
  journal   = {it - Information Technology},
  volume    = {61},
  number    = {1},
  pages     = {1--2},
  year      = {2019},
  url       = {https://doi.org/10.1515/itit-2019-0008},
  doi       = {10.1515/itit-2019-0008},
  timestamp = {Thu, 11 Apr 2019 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/it/Polian19},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tetc/KinseherVP19,
  author    = {Josef Kinseher and
               Moritz V{\"{o}}lker and
               Ilia Polian},
  title     = {Improving Testability and Reliability of Advanced {SRAM} Architectures},
  journal   = {{IEEE} Trans. Emerging Topics Comput.},
  volume    = {7},
  number    = {3},
  pages     = {456--467},
  year      = {2019},
  url       = {https://doi.org/10.1109/TETC.2017.2677400},
  doi       = {10.1109/TETC.2017.2677400},
  timestamp = {Mon, 23 Sep 2019 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/tetc/KinseherVP19},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/cf/NeugebauerPH19,
  author    = {Florian Neugebauer and
               Ilia Polian and
               John P. Hayes},
  title     = {On the maximum function in stochastic computing},
  booktitle = {Proceedings of the 16th {ACM} International Conference on Computing
               Frontiers, {CF} 2019, Alghero, Italy, April 30 - May 2, 2019},
  pages     = {59--66},
  year      = {2019},
  crossref  = {DBLP:conf/cf/2019},
  url       = {https://doi.org/10.1145/3310273.3323050},
  doi       = {10.1145/3310273.3323050},
  timestamp = {Mon, 20 May 2019 09:32:18 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/cf/NeugebauerPH19},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/KatzenbeisserPR19,
  author    = {Stefan Katzenbeisser and
               Ilia Polian and
               Francesco Regazzoni and
               Marc St{\"{o}}ttinger},
  title     = {Security in Autonomous Systems},
  booktitle = {24th {IEEE} European Test Symposium, {ETS} 2019, Baden-Baden, Germany,
               May 27-31, 2019},
  pages     = {1--8},
  year      = {2019},
  crossref  = {DBLP:conf/ets/2019},
  url       = {https://doi.org/10.1109/ETS.2019.8791552},
  doi       = {10.1109/ETS.2019.8791552},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ets/KatzenbeisserPR19},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/fdtc/GayPU0P19,
  author    = {Ma{\"{e}}l Gay and
               Tobias Paxian and
               Devanshi Upadhyaya and
               Bernd Becker and
               Ilia Polian},
  title     = {Hardware-Oriented Algebraic Fault Attack Framework with Multiple Fault
               Injection Support},
  booktitle = {2019 Workshop on Fault Diagnosis and Tolerance in Cryptography, {FDTC}
               2019, Atlanta, GA, USA, August 24, 2019},
  pages     = {25--32},
  year      = {2019},
  crossref  = {DBLP:conf/fdtc/2019},
  url       = {https://doi.org/10.1109/FDTC.2019.00012},
  doi       = {10.1109/FDTC.2019.00012},
  timestamp = {Wed, 16 Oct 2019 14:14:49 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/fdtc/GayPU0P19},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ivsw/DuKZBSESSP19,
  author    = {Nan Du and
               Mahdi Kiani and
               Xianyue Zhao and
               Danilo B{\"{u}}rger and
               Oliver G. Schmidt and
               Ramona Ecke and
               Stefan E. Schulz and
               Heidemarie Schmidt and
               Ilia Polian},
  title     = {Electroforming-free Memristors for Hardware Security Primitives},
  booktitle = {4th {IEEE} International Verification and Security Workshop, {IVSW}
               2019, Rhodes Island, Greece, July 1-3, 2019},
  pages     = {67--70},
  year      = {2019},
  crossref  = {DBLP:conf/ivsw/2019},
  url       = {https://doi.org/10.1109/IVSW.2019.8854394},
  doi       = {10.1109/IVSW.2019.8854394},
  timestamp = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ivsw/DuKZBSESSP19},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/samos/ValenciaPR19,
  author    = {Felipe Valencia and
               Ilia Polian and
               Francesco Regazzoni},
  title     = {Fault Sensitivity Analysis of Lattice-Based Post-Quantum Cryptographic
               Components},
  booktitle = {Embedded Computer Systems: Architectures, Modeling, and Simulation
               - 19th International Conference, {SAMOS} 2019, Samos, Greece, July
               7-11, 2019, Proceedings},
  pages     = {107--123},
  year      = {2019},
  crossref  = {DBLP:conf/samos/2019},
  url       = {https://doi.org/10.1007/978-3-030-27562-4\_8},
  doi       = {10.1007/978-3-030-27562-4\_8},
  timestamp = {Fri, 09 Aug 2019 14:45:31 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/samos/ValenciaPR19},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/cosade/2019,
  editor    = {Ilia Polian and
               Marc St{\"{o}}ttinger},
  title     = {Constructive Side-Channel Analysis and Secure Design - 10th International
               Workshop, {COSADE} 2019, Darmstadt, Germany, April 3-5, 2019, Proceedings},
  series    = {Lecture Notes in Computer Science},
  volume    = {11421},
  publisher = {Springer},
  year      = {2019},
  url       = {https://doi.org/10.1007/978-3-030-16350-1},
  doi       = {10.1007/978-3-030-16350-1},
  isbn      = {978-3-030-16349-5},
  timestamp = {Tue, 14 May 2019 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/cosade/2019},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/esl/Polian18,
  author    = {Ilia Polian},
  title     = {Test and Reliability Challenges for Approximate Circuitry},
  journal   = {Embedded Systems Letters},
  volume    = {10},
  number    = {1},
  pages     = {26--29},
  year      = {2018},
  url       = {https://doi.org/10.1109/LES.2017.2754446},
  doi       = {10.1109/LES.2017.2754446},
  timestamp = {Wed, 11 Apr 2018 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/esl/Polian18},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jetc/NeugebauerPH18,
  author    = {Florian Neugebauer and
               Ilia Polian and
               John P. Hayes},
  title     = {Framework for Quantifying and Managing Accuracy in Stochastic Circuit
               Design},
  journal   = {{JETC}},
  volume    = {14},
  number    = {2},
  pages     = {31:1--31:21},
  year      = {2018},
  url       = {https://doi.org/10.1145/3183345},
  doi       = {10.1145/3183345},
  timestamp = {Wed, 21 Nov 2018 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/journals/jetc/NeugebauerPH18},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mam/NeugebauerPH18,
  author    = {Florian Neugebauer and
               Ilia Polian and
               John P. Hayes},
  title     = {S-box-based random number generation for stochastic computing},
  journal   = {Microprocessors and Microsystems - Embedded Hardware Design},
  volume    = {61},
  pages     = {316--326},
  year      = {2018},
  url       = {https://doi.org/10.1016/j.micpro.2018.06.009},
  doi       = {10.1016/j.micpro.2018.06.009},
  timestamp = {Sat, 01 Dec 2018 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/journals/mam/NeugebauerPH18},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ches/KarpGKP18,
  author    = {Batya Karp and
               Ma{\"{e}}l Gay and
               Osnat Keren and
               Ilia Polian},
  title     = {Detection and Correction of Malicious and Natural Faults in Cryptographic
               Modules},
  booktitle = {{PROOFS} 2018, 7th International Workshop on Security Proofs for Embedded
               Systems, colocated with {CHES} 2018, Amsterdam, The Netherlands, September
               13, 2018},
  pages     = {68--82},
  year      = {2018},
  crossref  = {DBLP:conf/ches/2018proofs},
  url       = {http://www.easychair.org/publications/paper/zMjh},
  timestamp = {Tue, 20 Nov 2018 09:14:48 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/ches/KarpGKP18},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dcis/KarpGKP18,
  author    = {Batya Karp and
               Mael Gay and
               Osnat Keren and
               Ilia Polian},
  title     = {Security-oriented Code-based Architectures for Mitigating Fault Attacks},
  booktitle = {Conference on Design of Circuits and Integrated Systems, {DCIS} 2018,
               Lyon, France, November 14-16, 2018},
  pages     = {1--6},
  year      = {2018},
  crossref  = {DBLP:conf/dcis/2018},
  url       = {https://doi.org/10.1109/DCIS.2018.8681476},
  doi       = {10.1109/DCIS.2018.8681476},
  timestamp = {Wed, 16 Oct 2019 14:14:50 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/dcis/KarpGKP18},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ewme/PolianG18,
  author    = {Ilia Polian and
               Mael Gay},
  title     = {Hardware-oriented Security in a Computer Science Curriculum},
  booktitle = {12th European Workshop on Microelectronics Education, {EWME} 2018,
               Braunschweig, Germany, September 24-26, 2018},
  pages     = {59--62},
  year      = {2018},
  crossref  = {DBLP:conf/ewme/2018},
  url       = {https://doi.org/10.1109/EWME.2018.8629483},
  doi       = {10.1109/EWME.2018.8629483},
  timestamp = {Wed, 16 Oct 2019 14:14:48 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ewme/PolianG18},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/RegazzoniAP18,
  author    = {Francesco Regazzoni and
               Cesare Alippi and
               Ilia Polian},
  title     = {Security: the dark side of approximate computing?},
  booktitle = {Proceedings of the International Conference on Computer-Aided Design,
               {ICCAD} 2018, San Diego, CA, USA, November 05-08, 2018},
  pages     = {44},
  year      = {2018},
  crossref  = {DBLP:conf/iccad/2018},
  url       = {https://doi.org/10.1145/3240765.3243497},
  doi       = {10.1145/3240765.3243497},
  timestamp = {Mon, 07 Jan 2019 11:16:31 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/iccad/RegazzoniAP18},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/samos/RegazzoniFP18,
  author    = {Francesco Regazzoni and
               Austin G. Fowler and
               Ilia Polian},
  title     = {Quantum era challenges for classical computers},
  booktitle = {Proceedings of the 18th International Conference on Embedded Computer
               Systems: Architectures, Modeling, and Simulation, Pythagorion, Greece,
               July 15-19, 2018},
  pages     = {173--178},
  year      = {2018},
  crossref  = {DBLP:conf/samos/2018},
  url       = {https://doi.org/10.1145/3229631.3264737},
  doi       = {10.1145/3229631.3264737},
  timestamp = {Mon, 14 Jan 2019 07:39:33 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/samos/RegazzoniFP18},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/aspdac/RegazzoniP17,
  author    = {Francesco Regazzoni and
               Ilia Polian},
  title     = {Securing the hardware of cyber-physical systems},
  booktitle = {22nd Asia and South Pacific Design Automation Conference, {ASP-DAC}
               2017, Chiba, Japan, January 16-19, 2017},
  pages     = {194--199},
  year      = {2017},
  crossref  = {DBLP:conf/aspdac/2017},
  url       = {https://doi.org/10.1109/ASPDAC.2017.7858319},
  doi       = {10.1109/ASPDAC.2017.7858319},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/aspdac/RegazzoniP17},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/NeugebauerPH17,
  author    = {Florian Neugebauer and
               Ilia Polian and
               John P. Hayes},
  title     = {Framework for quantifying and managing accuracy in stochastic circuit
               design},
  booktitle = {Design, Automation {\&} Test in Europe Conference {\&} Exhibition,
               {DATE} 2017, Lausanne, Switzerland, March 27-31, 2017},
  pages     = {1--6},
  year      = {2017},
  crossref  = {DBLP:conf/date/2017},
  url       = {https://doi.org/10.23919/DATE.2017.7926949},
  doi       = {10.23919/DATE.2017.7926949},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/NeugebauerPH17},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/SauerRF0RP17,
  author    = {Matthias Sauer and
               Pascal Raiola and
               Linus Feiten and
               Bernd Becker and
               Ulrich R{\"{u}}hrmair and
               Ilia Polian},
  title     = {Sensitized path {PUF:} {A} lightweight embedded physical unclonable
               function},
  booktitle = {Design, Automation {\&} Test in Europe Conference {\&} Exhibition,
               {DATE} 2017, Lausanne, Switzerland, March 27-31, 2017},
  pages     = {680--685},
  year      = {2017},
  crossref  = {DBLP:conf/date/2017},
  url       = {https://doi.org/10.23919/DATE.2017.7927076},
  doi       = {10.23919/DATE.2017.7927076},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/SauerRF0RP17},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/KinseherHP17,
  author    = {Josef Kinseher and
               Leonhard Heis and
               Ilia Polian},
  title     = {Analyzing the effects of peripheral circuit aging of embedded {SRAM}
               architectures},
  booktitle = {Design, Automation {\&} Test in Europe Conference {\&} Exhibition,
               {DATE} 2017, Lausanne, Switzerland, March 27-31, 2017},
  pages     = {852--857},
  year      = {2017},
  crossref  = {DBLP:conf/date/2017},
  url       = {https://doi.org/10.23919/DATE.2017.7927106},
  doi       = {10.23919/DATE.2017.7927106},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/KinseherHP17},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/NeugebauerPH17,
  author    = {Florian Neugebauer and
               Ilia Polian and
               John P. Hayes},
  title     = {Building a Better Random Number Generator for Stochastic Computing},
  booktitle = {Euromicro Conference on Digital System Design, {DSD} 2017, Vienna,
               Austria, August 30 - Sept. 1, 2017},
  pages     = {1--8},
  year      = {2017},
  crossref  = {DBLP:conf/dsd/2017},
  url       = {https://doi.org/10.1109/DSD.2017.29},
  doi       = {10.1109/DSD.2017.29},
  timestamp = {Wed, 16 Oct 2019 14:14:57 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/dsd/NeugebauerPH17},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/PolianR17,
  author    = {Ilia Polian and
               Francesco Regazzoni},
  title     = {Counteracting malicious faults in cryptographic circuits},
  booktitle = {22nd {IEEE} European Test Symposium, {ETS} 2017, Limassol, Cyprus,
               May 22-26, 2017},
  pages     = {1--10},
  year      = {2017},
  crossref  = {DBLP:conf/ets/2017},
  url       = {https://doi.org/10.1109/ETS.2017.7968230},
  doi       = {10.1109/ETS.2017.7968230},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ets/PolianR17},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/fdtc/BurchardGEH00KP17,
  author    = {Jan Burchard and
               Mael Gay and
               Ange Salome Messeng Ekossono and
               Jan Hor{\'{a}}cek and
               Bernd Becker and
               Tobias Schubert and
               Martin Kreuzer and
               Ilia Polian},
  title     = {AutoFault: Towards Automatic Construction of Algebraic Fault Attacks},
  booktitle = {2017 Workshop on Fault Diagnosis and Tolerance in Cryptography, {FDTC}
               2017, Taipei, Taiwan, September 25, 2017},
  pages     = {65--72},
  year      = {2017},
  crossref  = {DBLP:conf/fdtc/2017},
  url       = {https://doi.org/10.1109/FDTC.2017.13},
  doi       = {10.1109/FDTC.2017.13},
  timestamp = {Wed, 16 Oct 2019 14:14:49 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/fdtc/BurchardGEH00KP17},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ivsw/BurchardEHG0SKP17,
  author    = {Jan Burchard and
               Ange Salome Messeng Ekossono and
               Jan Hor{\'{a}}cek and
               Mael Gay and
               Bernd Becker and
               Tobias Schubert and
               Martin Kreuzer and
               Ilia Polian},
  title     = {Towards mixed structural-functional models for algebraic fault attacks
               on ciphers},
  booktitle = {{IEEE} 2nd International Verification and Security Workshop, {IVSW}
               2017, Thessaloniki, Greece, July 3-5, 2017},
  pages     = {7--12},
  year      = {2017},
  crossref  = {DBLP:conf/ivsw/2017},
  url       = {https://doi.org/10.1109/IVSW.2017.8031537},
  doi       = {10.1109/IVSW.2017.8031537},
  timestamp = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ivsw/BurchardEHG0SKP17},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/socc/PolianRS17,
  author    = {Ilia Polian and
               Francesco Regazzoni and
               Johanna Sep{\'{u}}lveda},
  title     = {Introduction to hardware-oriented security for MPSoCs},
  booktitle = {30th {IEEE} International System-on-Chip Conference, {SOCC} 2017,
               Munich, Germany, September 5-8, 2017},
  pages     = {102--107},
  year      = {2017},
  crossref  = {DBLP:conf/socc/2017},
  url       = {https://doi.org/10.1109/SOCC.2017.8226017},
  doi       = {10.1109/SOCC.2017.8226017},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/socc/PolianRS17},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/SauerBP16,
  author    = {Matthias Sauer and
               Bernd Becker and
               Ilia Polian},
  title     = {{PHAETON:} {A} SAT-Based Framework for Timing-Aware Path Sensitization},
  journal   = {{IEEE} Trans. Computers},
  volume    = {65},
  number    = {6},
  pages     = {1869--1881},
  year      = {2016},
  url       = {https://doi.org/10.1109/TC.2015.2458869},
  doi       = {10.1109/TC.2015.2458869},
  timestamp = {Mon, 04 Dec 2017 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/journals/tc/SauerBP16},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SauerJRMWBP16,
  author    = {Matthias Sauer and
               Jie Jiang and
               Sven Reimer and
               Kohei Miyase and
               Xiaoqing Wen and
               Bernd Becker and
               Ilia Polian},
  title     = {On Optimal Power-Aware Path Sensitization},
  booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
               21-24, 2016},
  pages     = {179--184},
  year      = {2016},
  crossref  = {DBLP:conf/ats/2016},
  url       = {https://doi.org/10.1109/ATS.2016.63},
  doi       = {10.1109/ATS.2016.63},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ats/SauerJRMWBP16},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/KinseherZPL16,
  author    = {Josef Kinseher and
               Leonardo Bonet Zordan and
               Ilia Polian and
               Andreas Leininger},
  title     = {Improving {SRAM} test quality by leveraging self-timed circuits},
  booktitle = {2016 Design, Automation {\&} Test in Europe Conference {\&}
               Exhibition, {DATE} 2016, Dresden, Germany, March 14-18, 2016},
  pages     = {984--989},
  year      = {2016},
  crossref  = {DBLP:conf/date/2016},
  url       = {http://ieeexplore.ieee.org/document/7459450/},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/KinseherZPL16},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/KinseherVZP16,
  author    = {Josef Kinseher and
               Moritz V{\"{o}}lker and
               Leonardo Bonet Zordan and
               Ilia Polian},
  title     = {Failure mechanisms and test methods for the {SRAM} {TVC} write-assist
               technique},
  booktitle = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
               May 23-27, 2016},
  pages     = {1--2},
  year      = {2016},
  crossref  = {DBLP:conf/ets/2016},
  url       = {https://doi.org/10.1109/ETS.2016.7519324},
  doi       = {10.1109/ETS.2016.7519324},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ets/KinseherVZP16},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/eusipco/TomashevichP16,
  author    = {Victor Tomashevich and
               Ilia Polian},
  title     = {Memory error resilient detection for massive {MIMO} systems},
  booktitle = {24th European Signal Processing Conference, {EUSIPCO} 2016, Budapest,
               Hungary, August 29 - September 2, 2016},
  pages     = {1623--1627},
  year      = {2016},
  crossref  = {DBLP:conf/eusipco/2016},
  url       = {https://doi.org/10.1109/EUSIPCO.2016.7760523},
  doi       = {10.1109/EUSIPCO.2016.7760523},
  timestamp = {Wed, 16 Oct 2019 14:14:50 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/eusipco/TomashevichP16},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/wsa/TomashevichP16,
  author    = {Victor Tomashevich and
               Ilia Polian},
  title     = {Detection Performance of {MIMO} Unique Word {OFDM}},
  booktitle = {{WSA} 2016, 20th International {ITG} Workshop on Smart Antennas, Munich,
               Germany, 9-11 March 2016},
  pages     = {1--8},
  year      = {2016},
  crossref  = {DBLP:conf/wsa/2016},
  url       = {http://ieeexplore.ieee.org/document/7499144/},
  timestamp = {Wed, 16 Oct 2019 14:14:50 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/wsa/TomashevichP16},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dagstuhl-reports/KerenPT16,
  author    = {Osnat Keren and
               Ilia Polian and
               Mark M. Tehranipoor},
  title     = {Hardware Security (Dagstuhl Seminar 16202)},
  journal   = {Dagstuhl Reports},
  volume    = {6},
  number    = {5},
  pages     = {72--93},
  year      = {2016},
  url       = {https://doi.org/10.4230/DagRep.6.5.72},
  doi       = {10.4230/DagRep.6.5.72},
  timestamp = {Wed, 07 Jun 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/dagstuhl-reports/KerenPT16},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/FeitenSSTPB15,
  author    = {Linus Feiten and
               Matthias Sauer and
               Tobias Schubert and
               Victor Tomashevich and
               Ilia Polian and
               Bernd Becker},
  title     = {Formal Vulnerability Analysis of Security Components},
  journal   = {{IEEE} Trans. on {CAD} of Integrated Circuits and Systems},
  volume    = {34},
  number    = {8},
  pages     = {1358--1369},
  year      = {2015},
  url       = {https://doi.org/10.1109/TCAD.2015.2448687},
  doi       = {10.1109/TCAD.2015.2448687},
  timestamp = {Mon, 04 Dec 2017 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/journals/tcad/FeitenSSTPB15},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KinseherZP15,
  author    = {Josef Kinseher and
               Leonardo Bonet Zordan and
               Ilia Polian},
  title     = {On the Use of Assist Circuits for Improved Coupling Fault Detection
               in SRAMs},
  booktitle = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
               22-25, 2015},
  pages     = {61--66},
  year      = {2015},
  crossref  = {DBLP:conf/ats/2015},
  url       = {https://doi.org/10.1109/ATS.2015.18},
  doi       = {10.1109/ATS.2015.18},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ats/KinseherZP15},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/PolianF15,
  author    = {Ilia Polian and
               Austin G. Fowler},
  title     = {Design automation challenges for scalable quantum architectures},
  booktitle = {Proceedings of the 52nd Annual Design Automation Conference, San Francisco,
               CA, USA, June 7-11, 2015},
  pages     = {61:1--61:6},
  year      = {2015},
  crossref  = {DBLP:conf/dac/2015},
  url       = {https://doi.org/10.1145/2744769.2747921},
  doi       = {10.1145/2744769.2747921},
  timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/dac/PolianF15},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/JovanovicP15,
  author    = {Philipp Jovanovic and
               Ilia Polian},
  title     = {Fault-based attacks on the Bel-T block cipher family},
  booktitle = {Proceedings of the 2015 Design, Automation {\&} Test in Europe
               Conference {\&} Exhibition, {DATE} 2015, Grenoble, France, March
               9-13, 2015},
  pages     = {601--604},
  year      = {2015},
  crossref  = {DBLP:conf/date/2015},
  url       = {http://dl.acm.org/citation.cfm?id=2755889},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/JovanovicP15},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/rc/PalerPND15,
  author    = {Alexandru Paler and
               Ilia Polian and
               Kae Nemoto and
               Simon J. Devitt},
  title     = {A Fully Fault-Tolerant Representation of Quantum Circuits},
  booktitle = {Reversible Computation - 7th International Conference, {RC} 2015,
               Grenoble, France, July 16-17, 2015, Proceedings},
  pages     = {139--154},
  year      = {2015},
  crossref  = {DBLP:conf/rc/2015},
  url       = {https://doi.org/10.1007/978-3-319-20860-2\_9},
  doi       = {10.1007/978-3-319-20860-2\_9},
  timestamp = {Tue, 14 May 2019 10:00:38 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/rc/PalerPND15},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/iet-cdt/PolianT14,
  author    = {Ilia Polian and
               Mark Mohammad Tehranipoor},
  title     = {Guest Editorial},
  journal   = {{IET} Computers {\&} Digital Techniques},
  volume    = {8},
  number    = {6},
  pages     = {237--238},
  year      = {2014},
  url       = {https://doi.org/10.1049/iet-cdt.2014.0194},
  doi       = {10.1049/iet-cdt.2014.0194},
  timestamp = {Sat, 20 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/iet-cdt/PolianT14},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/it/Polian14,
  author    = {Ilia Polian},
  title     = {Hardware security and test: Friends or enemies?},
  journal   = {it - Information Technology},
  volume    = {56},
  number    = {4},
  pages     = {192--202},
  year      = {2014},
  url       = {https://doi.org/10.1515/itit-2013-1038},
  doi       = {10.1515/itit-2013-1038},
  timestamp = {Sat, 20 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/it/Polian14},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/PalerDNP14,
  author    = {Alexandru Paler and
               Simon J. Devitt and
               Kae Nemoto and
               Ilia Polian},
  title     = {Software-based Pauli tracking in fault-tolerant quantum circuits},
  booktitle = {Design, Automation {\&} Test in Europe Conference {\&} Exhibition,
               {DATE} 2014, Dresden, Germany, March 24-28, 2014},
  pages     = {1--4},
  year      = {2014},
  crossref  = {DBLP:conf/date/2014},
  url       = {https://doi.org/10.7873/DATE.2014.137},
  doi       = {10.7873/DATE.2014.137},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/PalerDNP14},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/TomashevichGFWP14,
  author    = {Victor Tomashevich and
               Christina Gimmler{-}Dumont and
               Christian Fesl and
               Norbert Wehn and
               Ilia Polian},
  title     = {A new architecture for minimum mean square error sorted {QR} decomposition
               for {MIMO} wireless communication systems},
  booktitle = {17th International Symposium on Design and Diagnostics of Electronic
               Circuits {\&} Systems, {DDECS} 2014, Warsaw, Poland, 23-25 April,
               2014},
  pages     = {246--249},
  year      = {2014},
  crossref  = {DBLP:conf/ddecs/2014},
  url       = {https://doi.org/10.1109/DDECS.2014.6868800},
  doi       = {10.1109/DDECS.2014.6868800},
  timestamp = {Wed, 16 Oct 2019 14:14:50 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ddecs/TomashevichGFWP14},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/TomashevichNKKP14,
  author    = {Victor Tomashevich and
               Yaara Neumeier and
               Raghavan Kumar and
               Osnat Keren and
               Ilia Polian},
  title     = {Protecting cryptographic hardware against malicious attacks by nonlinear
               robust codes},
  booktitle = {2014 {IEEE} International Symposium on Defect and Fault Tolerance
               in {VLSI} and Nanotechnology Systems, {DFT} 2014, Amsterdam, The Netherlands,
               October 1-3, 2014},
  pages     = {40--45},
  year      = {2014},
  crossref  = {DBLP:conf/dft/2014},
  url       = {https://doi.org/10.1109/DFT.2014.6962084},
  doi       = {10.1109/DFT.2014.6962084},
  timestamp = {Wed, 16 Oct 2019 14:14:57 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/dft/TomashevichNKKP14},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/PolianJS14,
  author    = {Ilia Polian and
               Jie Jiang and
               Adit D. Singh},
  title     = {Detection conditions for errors in self-adaptive better-than-worst-case
               designs},
  booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
               May 26-30, 2014},
  pages     = {1--6},
  year      = {2014},
  crossref  = {DBLP:conf/ets/2014},
  url       = {https://doi.org/10.1109/ETS.2014.6847794},
  doi       = {10.1109/ETS.2014.6847794},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ets/PolianJS14},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/SauerPIMSCWB14,
  author    = {Matthias Sauer and
               Ilia Polian and
               Michael E. Imhof and
               Abdullah Mumtaz and
               Eric Schneider and
               Alexander Czutro and
               Hans{-}Joachim Wunderlich and
               Bernd Becker},
  title     = {Variation-aware deterministic {ATPG}},
  booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
               May 26-30, 2014},
  pages     = {1--6},
  year      = {2014},
  crossref  = {DBLP:conf/ets/2014},
  url       = {https://doi.org/10.1109/ETS.2014.6847806},
  doi       = {10.1109/ETS.2014.6847806},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ets/SauerPIMSCWB14},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/fdtc/KumarJBP14,
  author    = {Raghavan Kumar and
               Philipp Jovanovic and
               Wayne P. Burleson and
               Ilia Polian},
  title     = {Parametric Trojans for Fault-Injection Attacks on Cryptographic Hardware},
  booktitle = {2014 Workshop on Fault Diagnosis and Tolerance in Cryptography, {FDTC}
               2014, Busan, South Korea, September 23, 2014},
  pages     = {18--28},
  year      = {2014},
  crossref  = {DBLP:conf/fdtc/2014},
  url       = {https://doi.org/10.1109/FDTC.2014.12},
  doi       = {10.1109/FDTC.2014.12},
  timestamp = {Wed, 16 Oct 2019 14:14:49 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/fdtc/KumarJBP14},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/KumarJP14,
  author    = {Raghavan Kumar and
               Philipp Jovanovic and
               Ilia Polian},
  title     = {Precise fault-injections using voltage and temperature manipulation
               for differential cryptanalysis},
  booktitle = {2014 {IEEE} 20th International On-Line Testing Symposium, {IOLTS}
               2014, Platja d'Aro, Girona, Spain, July 7-9, 2014},
  pages     = {43--48},
  year      = {2014},
  crossref  = {DBLP:conf/iolts/2014},
  url       = {https://doi.org/10.1109/IOLTS.2014.6873670},
  doi       = {10.1109/IOLTS.2014.6873670},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/iolts/KumarJP14},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/rc/PalerDNP14,
  author    = {Alexandru Paler and
               Simon J. Devitt and
               Kae Nemoto and
               Ilia Polian},
  title     = {Cross-Level Validation of Topological Quantum Circuits},
  booktitle = {Reversible Computation - 6th International Conference, {RC} 2014,
               Kyoto, Japan, July 10-11, 2014. Proceedings},
  pages     = {189--200},
  year      = {2014},
  crossref  = {DBLP:conf/rc/2014},
  url       = {https://doi.org/10.1007/978-3-319-08494-7\_15},
  doi       = {10.1007/978-3-319-08494-7\_15},
  timestamp = {Tue, 14 May 2019 10:00:38 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/rc/PalerDNP14},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/CzutroRPB14,
  author    = {Alexander Czutro and
               Sudhakar M. Reddy and
               Ilia Polian and
               Bernd Becker},
  title     = {SAT-Based Test Pattern Generation with Improved Dynamic Compaction},
  booktitle = {2014 27th International Conference on {VLSI} Design and 2014 13th
               International Conference on Embedded Systems, Mumbai, India, January
               5-9, 2014},
  pages     = {56--61},
  year      = {2014},
  crossref  = {DBLP:conf/vlsid/2014},
  url       = {https://doi.org/10.1109/VLSID.2014.17},
  doi       = {10.1109/VLSID.2014.17},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vlsid/CzutroRPB14},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/UppuUSP14,
  author    = {Ravi Kanth Uppu and
               Ravi Tej Uppu and
               Adit D. Singh and
               Ilia Polian},
  title     = {Better-than-Worst-Case Timing Design with Latch Buffers on Short Paths},
  booktitle = {2014 27th International Conference on {VLSI} Design and 2014 13th
               International Conference on Embedded Systems, Mumbai, India, January
               5-9, 2014},
  pages     = {133--138},
  year      = {2014},
  crossref  = {DBLP:conf/vlsid/2014},
  url       = {https://doi.org/10.1109/VLSID.2014.30},
  doi       = {10.1109/VLSID.2014.30},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vlsid/UppuUSP14},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/wisee/TomashevichGWP14,
  author    = {Victor Tomashevich and
               Christina Gimmler{-}Dumont and
               Norbert Wehn and
               Ilia Polian},
  title     = {Reliability analysis of {MIMO} channel preprocessing by fault injection},
  booktitle = {2014 {IEEE} International Conference on Wireless for Space and Extreme
               Environments, WiSEE 2014, Noordwijk, Netherlands, October 30-31, 2014},
  pages     = {1--6},
  year      = {2014},
  crossref  = {DBLP:conf/wisee/2014},
  url       = {https://doi.org/10.1109/WiSEE.2014.6973066},
  doi       = {10.1109/WiSEE.2014.6973066},
  timestamp = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/wisee/TomashevichGWP14},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/iacr/KumarJP14,
  author    = {Raghavan Kumar and
               Philipp Jovanovic and
               Ilia Polian},
  title     = {Precise Fault-Injections using Voltage and Temperature Manipulation
               for Differential Cryptanalysis},
  journal   = {{IACR} Cryptology ePrint Archive},
  volume    = {2014},
  pages     = {782},
  year      = {2014},
  url       = {http://eprint.iacr.org/2014/782},
  timestamp = {Tue, 14 Aug 2018 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/iacr/KumarJP14},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/iacr/KumarJBP14,
  author    = {Raghavan Kumar and
               Philipp Jovanovic and
               Wayne P. Burleson and
               Ilia Polian},
  title     = {Parametric Trojans for Fault-Injection Attacks on Cryptographic Hardware},
  journal   = {{IACR} Cryptology ePrint Archive},
  volume    = {2014},
  pages     = {783},
  year      = {2014},
  url       = {http://eprint.iacr.org/2014/783},
  timestamp = {Tue, 14 Aug 2018 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/iacr/KumarJBP14},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/SauerCSHPB13,
  author    = {Matthias Sauer and
               Alexander Czutro and
               Tobias Schubert and
               Stefan Hillebrecht and
               Ilia Polian and
               Bernd Becker},
  title     = {SAT-Based Analysis of Sensitizable Paths},
  journal   = {{IEEE} Design {\&} Test},
  volume    = {30},
  number    = {4},
  pages     = {81--88},
  year      = {2013},
  url       = {https://doi.org/10.1109/MDT.2012.2230297},
  doi       = {10.1109/MDT.2012.2230297},
  timestamp = {Mon, 04 Dec 2017 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/journals/dt/SauerCSHPB13},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/aspdac/SauerRPSB13,
  author    = {Matthias Sauer and
               Sven Reimer and
               Ilia Polian and
               Tobias Schubert and
               Bernd Becker},
  title     = {Provably optimal test cube generation using quantified boolean formula
               solving},
  booktitle = {18th Asia and South Pacific Design Automation Conference, {ASP-DAC}
               2013, Yokohama, Japan, January 22-25, 2013},
  pages     = {533--539},
  year      = {2013},
  crossref  = {DBLP:conf/aspdac/2013},
  url       = {https://doi.org/10.1109/ASPDAC.2013.6509651},
  doi       = {10.1109/ASPDAC.2013.6509651},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/aspdac/SauerRPSB13},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/JiangACARP13,
  author    = {J. Jiang and
               M. Aparicio and
               Mariane Comte and
               Florence Aza{\"{\i}}s and
               Michel Renovell and
               Ilia Polian},
  title     = {{MIRID:} Mixed-Mode IR-Drop Induced Delay Simulator},
  booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
               18-21, 2013},
  pages     = {177--182},
  year      = {2013},
  crossref  = {DBLP:conf/ats/2013},
  url       = {https://doi.org/10.1109/ATS.2013.41},
  doi       = {10.1109/ATS.2013.41},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ats/JiangACARP13},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/SauerRSPB13,
  author    = {Matthias Sauer and
               Sven Reimer and
               Tobias Schubert and
               Ilia Polian and
               Bernd Becker},
  title     = {Efficient SAT-based dynamic compaction and relaxation for longest
               sensitizable paths},
  booktitle = {Design, Automation and Test in Europe, {DATE} 13, Grenoble, France,
               March 18-22, 2013},
  pages     = {448--453},
  year      = {2013},
  crossref  = {DBLP:conf/date/2013},
  url       = {https://doi.org/10.7873/DATE.2013.100},
  doi       = {10.7873/DATE.2013.100},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/SauerRSPB13},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/PolianK13,
  author    = {Ilia Polian and
               Martin Kreuzer},
  title     = {Fault-based attacks on cryptographic hardware},
  booktitle = {16th {IEEE} International Symposium on Design and Diagnostics of Electronic
               Circuits {\&} Systems, {DDECS} 2013, Karlovy Vary, Czech Republic,
               April 8-10, 2013},
  pages     = {12--17},
  year      = {2013},
  crossref  = {DBLP:conf/ddecs/2013},
  url       = {https://doi.org/10.1109/DDECS.2013.6549781},
  doi       = {10.1109/DDECS.2013.6549781},
  timestamp = {Wed, 16 Oct 2019 14:14:50 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ddecs/PolianK13},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/PalerKPH13,
  author    = {Alexandru Paler and
               Josef Kinseher and
               Ilia Polian and
               John P. Hayes},
  title     = {Approximate simulation of circuits with probabilistic behavior},
  booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
               in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
               NY, USA, October 2-4, 2013},
  pages     = {95--100},
  year      = {2013},
  crossref  = {DBLP:conf/dft/2013},
  url       = {https://doi.org/10.1109/DFT.2013.6653589},
  doi       = {10.1109/DFT.2013.6653589},
  timestamp = {Wed, 16 Oct 2019 14:14:57 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/dft/PalerKPH13},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/AparicioCARJPB13,
  author    = {M. Aparicio and
               Mariane Comte and
               Florence Aza{\"{\i}}s and
               Michel Renovell and
               J. Jiang and
               Ilia Polian and
               Bernd Becker},
  title     = {Pre-characterization procedure for a mixed mode simulation of IR-drop
               induced delays},
  booktitle = {14th Latin American Test Workshop, {LATW} 2013, Cordoba, Argentina,
               3-5 April, 2013},
  pages     = {1--6},
  year      = {2013},
  crossref  = {DBLP:conf/latw/2013},
  url       = {https://doi.org/10.1109/LATW.2013.6562657},
  doi       = {10.1109/LATW.2013.6562657},
  timestamp = {Wed, 16 Oct 2019 16:49:09 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/latw/AparicioCARJPB13},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/PolianT13,
  author    = {Ilia Polian and
               Mohammad Tehranipoor},
  title     = {Special session 12A: Hot topic counterfeit {IC} identification: How
               can test help?},
  booktitle = {31st {IEEE} {VLSI} Test Symposium, {VTS} 2013, Berkeley, CA, USA,
               April 29 - May 2, 2013},
  pages     = {1},
  year      = {2013},
  crossref  = {DBLP:conf/vts/2013},
  url       = {https://doi.org/10.1109/VTS.2013.6548944},
  doi       = {10.1109/VTS.2013.6548944},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vts/PolianT13},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/iacr/JovanovicKP13,
  author    = {Philipp Jovanovic and
               Martin Kreuzer and
               Ilia Polian},
  title     = {Multi-Stage Fault Attacks on Block Ciphers},
  journal   = {{IACR} Cryptology ePrint Archive},
  volume    = {2013},
  pages     = {778},
  year      = {2013},
  url       = {http://eprint.iacr.org/2013/778},
  timestamp = {Tue, 14 Aug 2018 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/iacr/JovanovicKP13},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/aspdac/PalerPH12,
  author    = {Alexandru Paler and
               Ilia Polian and
               John P. Hayes},
  title     = {Detection and diagnosis of faulty quantum circuits},
  booktitle = {Proceedings of the 17th Asia and South Pacific Design Automation Conference,
               {ASP-DAC} 2012, Sydney, Australia, January 30 - February 2, 2012},
  pages     = {181--186},
  year      = {2012},
  crossref  = {DBLP:conf/aspdac/2012},
  url       = {https://doi.org/10.1109/ASPDAC.2012.6164942},
  doi       = {10.1109/ASPDAC.2012.6164942},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/aspdac/PalerPH12},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Polian12,
  author    = {Ilia Polian},
  title     = {Session Summary {I:} Quantum informatics: Classical circuit synthesis,
               resource optimisation and benchmarking},
  booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
               19-22, 2012},
  pages     = {49},
  year      = {2012},
  crossref  = {DBLP:conf/ats/2012},
  url       = {https://doi.org/10.1109/ATS.2012.88},
  doi       = {10.1109/ATS.2012.88},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ats/Polian12},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/CzutroIJMSBPW12,
  author    = {Alexander Czutro and
               Michael E. Imhof and
               J. Jiang and
               Abdullah Mumtaz and
               Matthias Sauer and
               Bernd Becker and
               Ilia Polian and
               Hans{-}Joachim Wunderlich},
  title     = {Variation-Aware Fault Grading},
  booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
               19-22, 2012},
  pages     = {344--349},
  year      = {2012},
  crossref  = {DBLP:conf/ats/2012},
  url       = {https://doi.org/10.1109/ATS.2012.14},
  doi       = {10.1109/ATS.2012.14},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ats/CzutroIJMSBPW12},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/cosade/JovanovicKP12,
  author    = {Philipp Jovanovic and
               Martin Kreuzer and
               Ilia Polian},
  title     = {A Fault Attack on the {LED} Block Cipher},
  booktitle = {Constructive Side-Channel Analysis and Secure Design - Third International
               Workshop, {COSADE} 2012, Darmstadt, Germany, May 3-4, 2012. Proceedings},
  pages     = {120--134},
  year      = {2012},
  crossref  = {DBLP:conf/cosade/2012},
  url       = {https://doi.org/10.1007/978-3-642-29912-4\_10},
  doi       = {10.1007/978-3-642-29912-4\_10},
  timestamp = {Tue, 14 May 2019 10:00:39 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/cosade/JovanovicKP12},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/JiangSCBP12,
  author    = {Jie Jiang and
               Matthias Sauer and
               Alexander Czutro and
               Bernd Becker and
               Ilia Polian},
  title     = {On the optimality of {K} longest path generation algorithm under memory
               constraints},
  booktitle = {2012 Design, Automation {\&} Test in Europe Conference {\&}
               Exhibition, {DATE} 2012, Dresden, Germany, March 12-16, 2012},
  pages     = {418--423},
  year      = {2012},
  crossref  = {DBLP:conf/date/2012},
  url       = {https://doi.org/10.1109/DATE.2012.6176507},
  doi       = {10.1109/DATE.2012.6176507},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/JiangSCBP12},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/FeitenSSCBPB12,
  author    = {Linus Feiten and
               Matthias Sauer and
               Tobias Schubert and
               Alexander Czutro and
               Eberhard B{\"{o}}hl and
               Ilia Polian and
               Bernd Becker},
  title     = {{\#}SAT-based vulnerability analysis of security components - {A}
               case study},
  booktitle = {2012 {IEEE} International Symposium on Defect and Fault Tolerance
               in {VLSI} and Nanotechnology Systems, {DFT} 2012, Austin, TX, USA,
               October 3-5, 2012},
  pages     = {49--54},
  year      = {2012},
  crossref  = {DBLP:conf/dft/2012},
  url       = {https://doi.org/10.1109/DFT.2012.6378198},
  doi       = {10.1109/DFT.2012.6378198},
  timestamp = {Wed, 16 Oct 2019 14:14:57 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/dft/FeitenSSCBPB12},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/CzutroSPB12,
  author    = {Alexander Czutro and
               Matthias Sauer and
               Ilia Polian and
               Bernd Becker},
  title     = {Multi-conditional {SAT-ATPG} for power-droop testing},
  booktitle = {17th {IEEE} European Test Symposium, {ETS} 2012, Annecy, France, May
               28 - June 1 2012},
  pages     = {1--6},
  year      = {2012},
  crossref  = {DBLP:conf/ets/2012},
  url       = {https://doi.org/10.1109/ETS.2012.6233026},
  doi       = {10.1109/ETS.2012.6233026},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ets/CzutroSPB12},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/SauerCBP12,
  author    = {Matthias Sauer and
               Alexander Czutro and
               Bernd Becker and
               Ilia Polian},
  title     = {On the quality of test vectors for post-silicon characterization},
  booktitle = {17th {IEEE} European Test Symposium, {ETS} 2012, Annecy, France, May
               28 - June 1 2012},
  pages     = {1--6},
  year      = {2012},
  crossref  = {DBLP:conf/ets/2012},
  url       = {https://doi.org/10.1109/ETS.2012.6233027},
  doi       = {10.1109/ETS.2012.6233027},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ets/SauerCBP12},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/SauerCPB12,
  author    = {Matthias Sauer and
               Alexander Czutro and
               Ilia Polian and
               Bernd Becker},
  title     = {Small-delay-fault {ATPG} with waveform accuracy},
  booktitle = {2012 {IEEE/ACM} International Conference on Computer-Aided Design,
               {ICCAD} 2012, San Jose, CA, USA, November 5-8, 2012},
  pages     = {30--36},
  year      = {2012},
  crossref  = {DBLP:conf/iccad/2012},
  url       = {https://doi.org/10.1145/2429384.2429391},
  doi       = {10.1145/2429384.2429391},
  timestamp = {Wed, 16 Oct 2019 14:14:49 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/iccad/SauerCPB12},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/TomashevichSFP12,
  author    = {Victor Tomashevich and
               Sudarshan Srinivasan and
               Fabian Foerg and
               Ilia Polian},
  title     = {Cross-level protection of circuits against faults and malicious attacks},
  booktitle = {18th {IEEE} International On-Line Testing Symposium, {IOLTS} 2012,
               Sitges, Spain, June 27-29, 2012},
  pages     = {150--155},
  year      = {2012},
  crossref  = {DBLP:conf/iolts/2012},
  url       = {https://doi.org/10.1109/IOLTS.2012.6313862},
  doi       = {10.1109/IOLTS.2012.6313862},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/iolts/TomashevichSFP12},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SauerKCPRB12,
  author    = {Matthias Sauer and
               Stefan Kupferschmid and
               Alexander Czutro and
               Ilia Polian and
               Sudhakar M. Reddy and
               Bernd Becker},
  title     = {Functional test of small-delay faults using {SAT} and Craig interpolation},
  booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
               USA, November 5-8, 2012},
  pages     = {1--8},
  year      = {2012},
  crossref  = {DBLP:conf/itc/2012},
  url       = {https://doi.org/10.1109/TEST.2012.6401550},
  doi       = {10.1109/TEST.2012.6401550},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/SauerKCPRB12},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/nanoarch/PalerDNP12,
  author    = {Alexandru Paler and
               Simon J. Devitt and
               Kae Nemoto and
               Ilia Polian},
  title     = {Synthesis of topological quantum circuits},
  booktitle = {Proceedings of the 2012 {IEEE/ACM} International Symposium on Nanoscale
               Architectures, {NANOARCH} 2012, Amsterdam, The Netherlands, July 4-6,
               2012},
  pages     = {181--187},
  year      = {2012},
  crossref  = {DBLP:conf/nanoarch/2012},
  url       = {https://doi.org/10.1145/2765491.2765524},
  doi       = {10.1145/2765491.2765524},
  timestamp = {Wed, 16 Oct 2019 14:14:50 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/nanoarch/PalerDNP12},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/CzutroSSPB12,
  author    = {Alexander Czutro and
               Matthias Sauer and
               Tobias Schubert and
               Ilia Polian and
               Bernd Becker},
  title     = {{SAT-ATPG} using preferences for improved detection of complex defect
               mechanisms},
  booktitle = {30th {IEEE} {VLSI} Test Symposium, {VTS} 2012, Maui, Hawaii, USA,
               23-26 April 2012},
  pages     = {170--175},
  year      = {2012},
  crossref  = {DBLP:conf/vts/2012},
  url       = {https://doi.org/10.1109/VTS.2012.6231098},
  doi       = {10.1109/VTS.2012.6231098},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vts/CzutroSSPB12},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/iacr/JovanovicKP12,
  author    = {Philipp Jovanovic and
               Martin Kreuzer and
               Ilia Polian},
  title     = {An Algebraic Fault Attack on the {LED} Block Cipher},
  journal   = {{IACR} Cryptology ePrint Archive},
  volume    = {2012},
  pages     = {400},
  year      = {2012},
  url       = {http://eprint.iacr.org/2012/400},
  timestamp = {Tue, 14 Aug 2018 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/iacr/JovanovicKP12},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/chinaf/HopschBHPSVW11,
  author    = {Fabian Hopsch and
               Bernd Becker and
               Sybille Hellebrand and
               Ilia Polian and
               Bernd Straube and
               Wolfgang Vermeiren and
               Hans{-}Joachim Wunderlich},
  title     = {Variation-aware fault modeling},
  journal   = {{SCIENCE} {CHINA} Information Sciences},
  volume    = {54},
  number    = {9},
  pages     = {1813--1826},
  year      = {2011},
  url       = {https://doi.org/10.1007/s11432-011-4367-8},
  doi       = {10.1007/s11432-011-4367-8},
  timestamp = {Wed, 17 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/chinaf/HopschBHPSVW11},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/PolianH11,
  author    = {Ilia Polian and
               John P. Hayes},
  title     = {Selective Hardening: Toward Cost-Effective Error Tolerance},
  journal   = {{IEEE} Design {\&} Test of Computers},
  volume    = {28},
  number    = {3},
  pages     = {54--63},
  year      = {2011},
  url       = {https://doi.org/10.1109/MDT.2010.120},
  doi       = {10.1109/MDT.2010.120},
  timestamp = {Thu, 18 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/dt/PolianH11},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tdsc/PolianHRB11,
  author    = {Ilia Polian and
               John P. Hayes and
               Sudhakar M. Reddy and
               Bernd Becker},
  title     = {Modeling and Mitigating Transient Errors in Logic Circuits},
  journal   = {{IEEE} Trans. Dependable Sec. Comput.},
  volume    = {8},
  number    = {4},
  pages     = {537--547},
  year      = {2011},
  url       = {https://doi.org/10.1109/TDSC.2010.26},
  doi       = {10.1109/TDSC.2010.26},
  timestamp = {Sun, 28 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/tdsc/PolianHRB11},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SauerJCPB11,
  author    = {Matthias Sauer and
               Jie Jiang and
               Alejandro Czutro and
               Ilia Polian and
               Bernd Becker},
  title     = {Efficient SAT-Based Search for Longest Sensitisable Paths},
  booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
               Delhi, India, November 20-23, 2011},
  pages     = {108--113},
  year      = {2011},
  crossref  = {DBLP:conf/ats/2011},
  url       = {https://doi.org/10.1109/ATS.2011.43},
  doi       = {10.1109/ATS.2011.43},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ats/SauerJCPB11},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/KrauseP11,
  author    = {Philipp Klaus Krause and
               Ilia Polian},
  title     = {Adaptive voltage over-scaling for resilient applications},
  booktitle = {Design, Automation and Test in Europe, {DATE} 2011, Grenoble, France,
               March 14-18, 2011},
  pages     = {944--949},
  year      = {2011},
  crossref  = {DBLP:conf/date/2011},
  url       = {https://doi.org/10.1109/DATE.2011.5763153},
  doi       = {10.1109/DATE.2011.5763153},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/KrauseP11},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/SauerCSHPB11,
  author    = {Matthias Sauer and
               Alexander Czutro and
               Tobias Schubert and
               Stefan Hillebrecht and
               Ilia Polian and
               Bernd Becker},
  title     = {SAT-based analysis of sensitisable paths},
  booktitle = {14th {IEEE} International Symposium on Design and Diagnostics of Electronic
               Circuits {\&} Systems, {DDECS} 2011, Cottbus, Germany, April 13-15,
               2011},
  pages     = {93--98},
  year      = {2011},
  crossref  = {DBLP:conf/ddecs/2011},
  url       = {https://doi.org/10.1109/DDECS.2011.5783055},
  doi       = {10.1109/DDECS.2011.5783055},
  timestamp = {Wed, 16 Oct 2019 14:14:50 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ddecs/SauerCSHPB11},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/PalerAPH11,
  author    = {Alexandru Paler and
               Armin Alaghi and
               Ilia Polian and
               John P. Hayes},
  title     = {Tomographic Testing and Validation of Probabilistic Circuits},
  booktitle = {16th European Test Symposium, {ETS} 2011, Trondheim, Norway, May 23-27,
               2011},
  pages     = {63--68},
  year      = {2011},
  crossref  = {DBLP:conf/ets/2011},
  url       = {https://doi.org/10.1109/ETS.2011.43},
  doi       = {10.1109/ETS.2011.43},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ets/PalerAPH11},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/PolianBHWM11,
  author    = {Ilia Polian and
               Bernd Becker and
               Sybille Hellebrand and
               Hans{-}Joachim Wunderlich and
               Peter C. Maxwell},
  title     = {Towards Variation-Aware Test Methods},
  booktitle = {16th European Test Symposium, {ETS} 2011, Trondheim, Norway, May 23-27,
               2011},
  pages     = {219--225},
  year      = {2011},
  crossref  = {DBLP:conf/ets/2011},
  url       = {https://doi.org/10.1109/ETS.2011.51},
  doi       = {10.1109/ETS.2011.51},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ets/PolianBHWM11},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/SauerCPB11,
  author    = {Matthias Sauer and
               Alejandro Czutro and
               Ilia Polian and
               Bernd Becker},
  title     = {Estimation of component criticality in early design steps},
  booktitle = {17th {IEEE} International On-Line Testing Symposium {(IOLTS} 2011),
               13-15 July, 2011, Athens, Greece},
  pages     = {104--110},
  year      = {2011},
  crossref  = {DBLP:conf/iolts/2011},
  url       = {https://doi.org/10.1109/IOLTS.2011.5993819},
  doi       = {10.1109/IOLTS.2011.5993819},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/iolts/SauerCPB11},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/SauerTMLSPBB11,
  author    = {Matthias Sauer and
               Victor Tomashevich and
               J{\"{o}}rg M{\"{u}}ller and
               Matthew D. T. Lewis and
               Andreas Spilla and
               Ilia Polian and
               Bernd Becker and
               Wolfram Burgard},
  title     = {An FPGA-based framework for run-time injection and analysis of soft
               errors in microprocessors},
  booktitle = {17th {IEEE} International On-Line Testing Symposium {(IOLTS} 2011),
               13-15 July, 2011, Athens, Greece},
  pages     = {182--185},
  year      = {2011},
  crossref  = {DBLP:conf/iolts/2011},
  url       = {https://doi.org/10.1109/IOLTS.2011.5993836},
  doi       = {10.1109/IOLTS.2011.5993836},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/iolts/SauerTMLSPBB11},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ijpp/CzutroPLERB10,
  author    = {Alejandro Czutro and
               Ilia Polian and
               Matthew D. T. Lewis and
               Piet Engelke and
               Sudhakar M. Reddy and
               Bernd Becker},
  title     = {Thread-Parallel Integrated Test Pattern Generator Utilizing Satisfiability
               Analysis},
  journal   = {International Journal of Parallel Programming},
  volume    = {38},
  number    = {3-4},
  pages     = {185--202},
  year      = {2010},
  url       = {https://doi.org/10.1007/s10766-009-0124-7},
  doi       = {10.1007/s10766-009-0124-7},
  timestamp = {Sun, 28 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/ijpp/CzutroPLERB10},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/it/PolianB10,
  author    = {Ilia Polian and
               Bernd Becker},
  title     = {Fault Models and Test Algorithms for Nanoscale Technologies (Fehlermodelle
               und Testalgorithmen f{\"{u}}r Nanoscale-Technologien)},
  journal   = {it - Information Technology},
  volume    = {52},
  number    = {4},
  pages     = {189--194},
  year      = {2010},
  url       = {https://doi.org/10.1524/itit.2010.0590},
  doi       = {10.1524/itit.2010.0590},
  timestamp = {Sat, 20 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/it/PolianB10},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jolpe/Polian10,
  author    = {Ilia Polian},
  title     = {Power Supply Noise: Causes, Effects, and Testing},
  journal   = {J. Low Power Electronics},
  volume    = {6},
  number    = {2},
  pages     = {326--338},
  year      = {2010},
  url       = {https://doi.org/10.1166/jolpe.2010.1075},
  doi       = {10.1166/jolpe.2010.1075},
  timestamp = {Fri, 26 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/jolpe/Polian10},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HopschBHPSVW10,
  author    = {Fabian Hopsch and
               Bernd Becker and
               Sybille Hellebrand and
               Ilia Polian and
               Bernd Straube and
               Wolfgang Vermeiren and
               Hans{-}Joachim Wunderlich},
  title     = {Variation-Aware Fault Modeling},
  booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
               December 2010, Shanghai, China},
  pages     = {87--93},
  year      = {2010},
  crossref  = {DBLP:conf/ats/2010},
  url       = {https://doi.org/10.1109/ATS.2010.24},
  doi       = {10.1109/ATS.2010.24},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ats/HopschBHPSVW10},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsn/BeckerHPSVW10,
  author    = {Bernd Becker and
               Sybille Hellebrand and
               Ilia Polian and
               Bernd Straube and
               Wolfgang Vermeiren and
               Hans{-}Joachim Wunderlich},
  title     = {Massive statistical process variations: {A} grand challenge for testing
               nanoelectronic circuits},
  booktitle = {{IEEE/IFIP} International Conference on Dependable Systems and Networks
               Workshops {(DSN-W} 2010), Chicago, Illinois, USA, June 28 - July 1,
               2010},
  pages     = {95--100},
  year      = {2010},
  crossref  = {DBLP:conf/dsn/2010w},
  url       = {https://doi.org/10.1109/DSNW.2010.5542612},
  doi       = {10.1109/DSNW.2010.5542612},
  timestamp = {Wed, 16 Oct 2019 16:49:09 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/dsn/BeckerHPSVW10},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ewdts/PolianH10,
  author    = {Ilia Polian and
               John P. Hayes},
  title     = {Advanced modeling of faults in Reversible circuits},
  booktitle = {2010 East-West Design {\&} Test Symposium, {EWDTS} 2010, St. Petersburg,
               Russia, September 17-20, 2010},
  pages     = {376--381},
  year      = {2010},
  crossref  = {DBLP:conf/ewdts/2010},
  url       = {https://doi.org/10.1109/EWDTS.2010.5742135},
  doi       = {10.1109/EWDTS.2010.5742135},
  timestamp = {Wed, 16 Oct 2019 14:14:56 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ewdts/PolianH10},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Polian10,
  author    = {Ilia Polian},
  title     = {Special session 4B: Panel low-power test and noise-aware test: Foes
               or friends?},
  booktitle = {28th {IEEE} {VLSI} Test Symposium, {VTS} 2010, April 19-22, 2010,
               Santa Cruz, California, {USA}},
  pages     = {130},
  year      = {2010},
  crossref  = {DBLP:conf/vts/2010},
  url       = {https://doi.org/10.1109/VTS.2010.5469594},
  doi       = {10.1109/VTS.2010.5469594},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vts/Polian10},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/todaes/EngelkeBRSBP09,
  author    = {Piet Engelke and
               Bernd Becker and
               Michel Renovell and
               J{\"{u}}rgen Schl{\"{o}}ffel and
               Bettina Braitling and
               Ilia Polian},
  title     = {{SUPERB:} Simulator utilizing parallel evaluation of resistive bridges},
  journal   = {{ACM} Trans. Design Autom. Electr. Syst.},
  volume    = {14},
  number    = {4},
  pages     = {56:1--56:21},
  year      = {2009},
  url       = {https://doi.org/10.1145/1562514.1596831},
  doi       = {10.1145/1562514.1596831},
  timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/journals/todaes/EngelkeBRSBP09},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/CzutroPERB09,
  author    = {Alejandro Czutro and
               Ilia Polian and
               Piet Engelke and
               Sudhakar M. Reddy and
               Bernd Becker},
  title     = {Dynamic Compaction in SAT-Based {ATPG}},
  booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
               November 2009, Taichung, Taiwan},
  pages     = {187--190},
  year      = {2009},
  crossref  = {DBLP:conf/ats/2009},
  url       = {https://doi.org/10.1109/ATS.2009.31},
  doi       = {10.1109/ATS.2009.31},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ats/CzutroPERB09},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/IzosimovPPEP09,
  author    = {Viacheslav Izosimov and
               Ilia Polian and
               Paul Pop and
               Petru Eles and
               Zebo Peng},
  title     = {Analysis and optimization of fault-tolerant embedded systems with
               hardened processors},
  booktitle = {Design, Automation and Test in Europe, {DATE} 2009, Nice, France,
               April 20-24, 2009},
  pages     = {682--687},
  year      = {2009},
  crossref  = {DBLP:conf/date/2009},
  url       = {https://doi.org/10.1109/DATE.2009.5090752},
  doi       = {10.1109/DATE.2009.5090752},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/IzosimovPPEP09},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/glvlsi/GaneshpurePKB09,
  author    = {Kunal P. Ganeshpure and
               Ilia Polian and
               Sandip Kundu and
               Bernd Becker},
  title     = {Reducing temperature variability by routing heat pipes},
  booktitle = {Proceedings of the 19th {ACM} Great Lakes Symposium on {VLSI} 2009,
               Boston Area, MA, USA, May 10-12 2009},
  pages     = {63--68},
  year      = {2009},
  crossref  = {DBLP:conf/glvlsi/2009},
  url       = {https://doi.org/10.1145/1531542.1531560},
  doi       = {10.1145/1531542.1531560},
  timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/glvlsi/GaneshpurePKB09},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/HungerHCPB09,
  author    = {Marc Hunger and
               Sybille Hellebrand and
               Alejandro Czutro and
               Ilia Polian and
               Bernd Becker},
  title     = {ATPG-based grading of strong fault-secureness},
  booktitle = {15th {IEEE} International On-Line Testing Symposium {(IOLTS} 2009),
               24-26 June 2009, Sesimbra-Lisbon, Portugal},
  pages     = {269--274},
  year      = {2009},
  crossref  = {DBLP:conf/iolts/2009},
  url       = {https://doi.org/10.1109/IOLTS.2009.5196027},
  doi       = {10.1109/IOLTS.2009.5196027},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/iolts/HungerHCPB09},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/CzutroPLERB09,
  author    = {Alejandro Czutro and
               Ilia Polian and
               Matthew D. T. Lewis and
               Piet Engelke and
               Sudhakar M. Reddy and
               Bernd Becker},
  title     = {{TIGUAN:} Thread-Parallel Integrated Test Pattern Generator Utilizing
               Satisfiability ANalysis},
  booktitle = {{VLSI} Design 2009: Improving Productivity through Higher Abstraction,
               The 22nd International Conference on {VLSI} Design, New Delhi, India,
               5-9 January 2009},
  pages     = {227--232},
  year      = {2009},
  crossref  = {DBLP:conf/vlsid/2009},
  url       = {https://doi.org/10.1109/VLSI.Design.2009.20},
  doi       = {10.1109/VLSI.Design.2009.20},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vlsid/CzutroPLERB09},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/HouarcheCRCEPB09,
  author    = {Nicolas Houarche and
               Mariane Comte and
               Michel Renovell and
               Alejandro Czutro and
               Piet Engelke and
               Ilia Polian and
               Bernd Becker},
  title     = {An Electrical Model for the Fault Simulation of Small Delay Faults
               Caused by Crosstalk Aggravated Resistive Short Defects},
  booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
               Cruz, California, {USA}},
  pages     = {21--26},
  year      = {2009},
  crossref  = {DBLP:conf/vts/2009},
  url       = {https://doi.org/10.1109/VTS.2009.57},
  doi       = {10.1109/VTS.2009.57},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vts/HouarcheCRCEPB09},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/EngelkePRKSB08,
  author    = {Piet Engelke and
               Ilia Polian and
               Michel Renovell and
               Sandip Kundu and
               Bharath Seshadri and
               Bernd Becker},
  title     = {On Detection of Resistive Bridging Defects by Low-Temperature and
               Low-Voltage Testing},
  journal   = {{IEEE} Trans. on {CAD} of Integrated Circuits and Systems},
  volume    = {27},
  number    = {2},
  pages     = {327--338},
  year      = {2008},
  url       = {https://doi.org/10.1109/TCAD.2007.913382},
  doi       = {10.1109/TCAD.2007.913382},
  timestamp = {Sat, 20 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/tcad/EngelkePRKSB08},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/EngelkePSB08,
  author    = {Piet Engelke and
               Ilia Polian and
               J{\"{u}}rgen Schl{\"{o}}ffel and
               Bernd Becker},
  title     = {Resistive Bridging Fault Simulation of Industrial Circuits},
  booktitle = {Design, Automation and Test in Europe, {DATE} 2008, Munich, Germany,
               March 10-14, 2008},
  pages     = {628--633},
  year      = {2008},
  crossref  = {DBLP:conf/date/2008},
  url       = {https://doi.org/10.1109/DATE.2008.4484747},
  doi       = {10.1109/DATE.2008.4484747},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/EngelkePSB08},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/PolianMNKEBSW08,
  author    = {Ilia Polian and
               Kohei Miyase and
               Yusuke Nakamura and
               Seiji Kajihara and
               Piet Engelke and
               Bernd Becker and
               Stefan Spinner and
               Xiaoqing Wen},
  title     = {Diagnosis of Realistic Defects Based on the X-Fault Model},
  booktitle = {Proceedings of the 11th {IEEE} Workshop on Design {\&} Diagnostics
               of Electronic Circuits {\&} Systems {(DDECS} 2008), Bratislava,
               Slovakia, April 16-18, 2008},
  pages     = {263--266},
  year      = {2008},
  crossref  = {DBLP:conf/ddecs/2008},
  url       = {https://doi.org/10.1109/DDECS.2008.4538798},
  doi       = {10.1109/DDECS.2008.4538798},
  timestamp = {Wed, 16 Oct 2019 14:14:50 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ddecs/PolianMNKEBSW08},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/PolianRPTB08,
  author    = {Ilia Polian and
               Sudhakar M. Reddy and
               Irith Pomeranz and
               Xun Tang and
               Bernd Becker},
  title     = {On Reducing Circuit Malfunctions Caused by Soft Errors},
  booktitle = {23rd {IEEE} International Symposium on Defect and Fault-Tolerance
               in {VLSI} Systems {(DFT} 2008), 1-3 October 2008, Boston, MA, {USA}},
  pages     = {245--253},
  year      = {2008},
  crossref  = {DBLP:conf/dft/2008},
  url       = {https://doi.org/10.1109/DFT.2008.20},
  doi       = {10.1109/DFT.2008.20},
  timestamp = {Wed, 16 Oct 2019 14:14:57 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/dft/PolianRPTB08},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/PolianR08,
  author    = {Ilia Polian and
               Wenjing Rao},
  title     = {Selective Hardening of NanoPLA Circuits},
  booktitle = {23rd {IEEE} International Symposium on Defect and Fault-Tolerance
               in {VLSI} Systems {(DFT} 2008), 1-3 October 2008, Boston, MA, {USA}},
  pages     = {263--271},
  year      = {2008},
  crossref  = {DBLP:conf/dft/2008},
  url       = {https://doi.org/10.1109/DFT.2008.26},
  doi       = {10.1109/DFT.2008.26},
  timestamp = {Wed, 16 Oct 2019 14:14:57 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/dft/PolianR08},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsn/NowrothPB08,
  author    = {Damian Nowroth and
               Ilia Polian and
               Bernd Becker},
  title     = {A study of cognitive resilience in a {JPEG} compressor},
  booktitle = {The 38th Annual {IEEE/IFIP} International Conference on Dependable
               Systems and Networks, {DSN} 2008, June 24-27, 2008, Anchorage, Alaska,
               USA, Proceedings},
  pages     = {32--41},
  year      = {2008},
  crossref  = {DBLP:conf/dsn/2008},
  url       = {https://doi.org/10.1109/DSN.2008.4630068},
  doi       = {10.1109/DSN.2008.4630068},
  timestamp = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/dsn/NowrothPB08},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/CzutroHEPCRB08,
  author    = {Alejandro Czutro and
               Nicolas Houarche and
               Piet Engelke and
               Ilia Polian and
               Mariane Comte and
               Michel Renovell and
               Bernd Becker},
  title     = {A Simulator of Small-Delay Faults Caused by Resistive-Open Defects},
  booktitle = {13th European Test Symposium, {ETS} 2008, Verbania, Italy, May 25-29,
               2008},
  pages     = {113--118},
  year      = {2008},
  crossref  = {DBLP:conf/ets/2008},
  url       = {https://doi.org/10.1109/ETS.2008.19},
  doi       = {10.1109/ETS.2008.19},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ets/CzutroHEPCRB08},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/ZoellinWPB08,
  author    = {Christian G. Zoellin and
               Hans{-}Joachim Wunderlich and
               Ilia Polian and
               Bernd Becker},
  title     = {Selective Hardening in Early Design Steps},
  booktitle = {13th European Test Symposium, {ETS} 2008, Verbania, Italy, May 25-29,
               2008},
  pages     = {185--190},
  year      = {2008},
  crossref  = {DBLP:conf/ets/2008},
  url       = {https://doi.org/10.1109/ETS.2008.30},
  doi       = {10.1109/ETS.2008.30},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ets/ZoellinWPB08},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isvlsi/PolianRB08,
  author    = {Ilia Polian and
               Sudhakar M. Reddy and
               Bernd Becker},
  title     = {Scalable Calculation of Logical Masking Effects for Selective Hardening
               Against Soft Errors},
  booktitle = {{IEEE} Computer Society Annual Symposium on VLSI, {ISVLSI} 2008, 7-9
               April 2008, Montpellier, France},
  pages     = {257--262},
  year      = {2008},
  crossref  = {DBLP:conf/isvlsi/2008},
  url       = {https://doi.org/10.1109/ISVLSI.2008.22},
  doi       = {10.1109/ISVLSI.2008.22},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/isvlsi/PolianRB08},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HillebrechtPEBKC08,
  author    = {Stefan Hillebrecht and
               Ilia Polian and
               Piet Engelke and
               Bernd Becker and
               Martin Keim and
               Wu{-}Tung Cheng},
  title     = {Extraction, Simulation and Test Generation for Interconnect Open Defects
               Based on Enhanced Aggressor-Victim Model},
  booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
               California, USA, October 26-31, 2008},
  pages     = {1--10},
  year      = {2008},
  crossref  = {DBLP:conf/itc/2008},
  url       = {https://doi.org/10.1109/TEST.2008.4700642},
  doi       = {10.1109/TEST.2008.4700642},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/HillebrechtPEBKC08},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/SpinnerPEBKC08,
  author    = {Stefan Spinner and
               Ilia Polian and
               Piet Engelke and
               Bernd Becker and
               Martin Keim and
               Wu{-}Tung Cheng},
  title     = {Automatic Test Pattern Generation for Interconnect Open Defects},
  booktitle = {26th {IEEE} {VLSI} Test Symposium {(VTS} 2008), April 27 - May 1,
               2008, San Diego, California, {USA}},
  pages     = {181--186},
  year      = {2008},
  crossref  = {DBLP:conf/vts/2008},
  url       = {https://doi.org/10.1109/VTS.2008.30},
  doi       = {10.1109/VTS.2008.30},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vts/SpinnerPEBKC08},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/PolianCKB07,
  author    = {Ilia Polian and
               Alejandro Czutro and
               Sandip Kundu and
               Bernd Becker},
  title     = {Power Droop Testing},
  journal   = {{IEEE} Design {\&} Test of Computers},
  volume    = {24},
  number    = {3},
  pages     = {276--284},
  year      = {2007},
  url       = {https://doi.org/10.1109/MDT.2007.77},
  doi       = {10.1109/MDT.2007.77},
  timestamp = {Thu, 18 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/dt/PolianCKB07},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/PolianF07,
  author    = {Ilia Polian and
               Hideo Fujiwara},
  title     = {Functional Constraints vs. Test Compression in Scan-Based Delay Testing},
  journal   = {J. Electronic Testing},
  volume    = {23},
  number    = {5},
  pages     = {445--455},
  year      = {2007},
  url       = {https://doi.org/10.1007/s10836-007-5013-7},
  doi       = {10.1007/s10836-007-5013-7},
  timestamp = {Thu, 18 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/et/PolianF07},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/PolianNB07,
  author    = {Ilia Polian and
               Damian Nowroth and
               Bernd Becker},
  title     = {Identification of Critical Errors in Imaging Applications},
  booktitle = {13th {IEEE} International On-Line Testing Symposium {(IOLTS} 2007),
               8-11 July 2007, Heraklion, Crete, Greece},
  pages     = {201--202},
  year      = {2007},
  crossref  = {DBLP:conf/iolts/2007},
  url       = {https://doi.org/10.1109/IOLTS.2007.38},
  doi       = {10.1109/IOLTS.2007.38},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/iolts/PolianNB07},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/HayesPB07,
  author    = {John P. Hayes and
               Ilia Polian and
               Bernd Becker},
  title     = {An Analysis Framework for Transient-Error Tolerance},
  booktitle = {25th {IEEE} {VLSI} Test Symposium {(VTS} 2007), 6-10 May 2007, Berkeley,
               California, {USA}},
  pages     = {249--255},
  year      = {2007},
  crossref  = {DBLP:conf/vts/2007},
  url       = {https://doi.org/10.1109/VTS.2007.13},
  doi       = {10.1109/VTS.2007.13},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vts/HayesPB07},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/corr/abs-0710-4670,
  author    = {Ilia Polian and
               Alejandro Czutro and
               Bernd Becker},
  title     = {Evolutionary Optimization in Code-Based Test Compression},
  journal   = {CoRR},
  volume    = {abs/0710.4670},
  year      = {2007},
  url       = {http://arxiv.org/abs/0710.4670},
  archivePrefix = {arXiv},
  eprint    = {0710.4670},
  timestamp = {Mon, 13 Aug 2018 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/corr/abs-0710-4670},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/corr/abs-0711-3289,
  author    = {Stefan Spinner and
               J. Bartholomeyczik and
               Bernd Becker and
               M. Doelle and
               Oliver Paul and
               Ilia Polian and
               R. Roth and
               K. Seitz and
               Patrick Ruther},
  title     = {Electromechanical Reliability Testing of Three-Axial Silicon Force
               Sensors},
  journal   = {CoRR},
  volume    = {abs/0711.3289},
  year      = {2007},
  url       = {http://arxiv.org/abs/0711.3289},
  archivePrefix = {arXiv},
  eprint    = {0711.3289},
  timestamp = {Sat, 03 Nov 2018 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/journals/corr/abs-0711-3289},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/EngelkePRB06,
  author    = {Piet Engelke and
               Ilia Polian and
               Michel Renovell and
               Bernd Becker},
  title     = {Automatic Test Pattern Generation for Resistive Bridging Faults},
  journal   = {J. Electronic Testing},
  volume    = {22},
  number    = {1},
  pages     = {61--69},
  year      = {2006},
  url       = {https://doi.org/10.1007/s10836-006-6392-x},
  doi       = {10.1007/s10836-006-6392-x},
  timestamp = {Thu, 18 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/et/EngelkePRB06},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/it/BeckerPHSW06,
  author    = {Bernd Becker and
               Ilia Polian and
               Sybille Hellebrand and
               Bernd Straube and
               Hans{-}Joachim Wunderlich},
  title     = {DFG-Projekt RealTest - Test und Zuverl{\"{a}}ssigkeit nanoelektronischer
               Systeme (DFG-Project - Test and Reliability of Nano-Electronic Systems)},
  journal   = {it - Information Technology},
  volume    = {48},
  number    = {5},
  pages     = {304},
  year      = {2006},
  url       = {https://doi.org/10.1524/itit.2006.48.5.304},
  doi       = {10.1524/itit.2006.48.5.304},
  timestamp = {Sat, 20 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/it/BeckerPHSW06},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/EngelkePRB06,
  author    = {Piet Engelke and
               Ilia Polian and
               Michel Renovell and
               Bernd Becker},
  title     = {Simulating Resistive-Bridging and Stuck-At Faults},
  journal   = {{IEEE} Trans. on {CAD} of Integrated Circuits and Systems},
  volume    = {25},
  number    = {10},
  pages     = {2181--2192},
  year      = {2006},
  url       = {https://doi.org/10.1109/TCAD.2006.871626},
  doi       = {10.1109/TCAD.2006.871626},
  timestamp = {Sat, 20 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/tcad/EngelkePRB06},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tvlsi/TangWEPBSHW06,
  author    = {Yuyi Tang and
               Hans{-}Joachim Wunderlich and
               Piet Engelke and
               Ilia Polian and
               Bernd Becker and
               J{\"{u}}rgen Schl{\"{o}}ffel and
               Friedrich Hapke and
               Michael Wittke},
  title     = {X-masking during logic {BIST} and its impact on defect coverage},
  journal   = {{IEEE} Trans. {VLSI} Syst.},
  volume    = {14},
  number    = {2},
  pages     = {193--202},
  year      = {2006},
  url       = {https://doi.org/10.1109/TVLSI.2005.863742},
  doi       = {10.1109/TVLSI.2005.863742},
  timestamp = {Thu, 18 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/tvlsi/TangWEPBSHW06},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/PolianF06,
  author    = {Ilia Polian and
               Hideo Fujiwara},
  title     = {Functional constraints vs. test compression in scan-based delay testing},
  booktitle = {Proceedings of the Conference on Design, Automation and Test in Europe,
               {DATE} 2006, Munich, Germany, March 6-10, 2006},
  pages     = {1039--1044},
  year      = {2006},
  crossref  = {DBLP:conf/date/2006p},
  url       = {https://doi.org/10.1109/DATE.2006.243927},
  doi       = {10.1109/DATE.2006.243927},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/PolianF06},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/EisingerPBMTW06,
  author    = {Jochen Eisinger and
               Ilia Polian and
               Bernd Becker and
               Alexander Metzner and
               Stephan Thesing and
               Reinhard Wilhelm},
  title     = {Automatic Identification of Timing Anomalies for Cycle-Accurate Worst-Case
               Execution Time Analysis},
  booktitle = {Proceedings of the 9th {IEEE} Workshop on Design {\&} Diagnostics
               of Electronic Circuits {\&} Systems {(DDECS} 2006), Prague, Czech
               Republic, April 18-21, 2006},
  pages     = {15--20},
  year      = {2006},
  crossref  = {DBLP:conf/ddecs/2006},
  url       = {https://doi.org/10.1109/DDECS.2006.1649563},
  doi       = {10.1109/DDECS.2006.1649563},
  timestamp = {Wed, 16 Oct 2019 14:14:50 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ddecs/EisingerPBMTW06},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/PolianBNOF06,
  author    = {Ilia Polian and
               Bernd Becker and
               Masato Nakasato and
               Satoshi Ohtake and
               Hideo Fujiwara},
  title     = {Low-Cost Hardening of Image Processing Applications Against Soft Errors},
  booktitle = {21th {IEEE} International Symposium on Defect and Fault-Tolerance
               in {VLSI} Systems {(DFT} 2006), 4-6 October 2006, Arlington, Virginia,
               {USA}},
  pages     = {274--279},
  year      = {2006},
  crossref  = {DBLP:conf/dft/2006},
  url       = {https://doi.org/10.1109/DFT.2006.40},
  doi       = {10.1109/DFT.2006.40},
  timestamp = {Wed, 16 Oct 2019 14:14:57 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/dft/PolianBNOF06},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccd/PolianCKB06,
  author    = {Ilia Polian and
               Alejandro Czutro and
               Sandip Kundu and
               Bernd Becker},
  title     = {Power Droop Testing},
  booktitle = {24th International Conference on Computer Design {(ICCD} 2006), 1-4
               October 2006, San Jose, CA, {USA}},
  pages     = {243--250},
  year      = {2006},
  crossref  = {DBLP:conf/iccd/2006},
  url       = {https://doi.org/10.1109/ICCD.2006.4380824},
  doi       = {10.1109/ICCD.2006.4380824},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/iccd/PolianCKB06},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/KunduP06,
  author    = {Sandip Kundu and
               Ilia Polian},
  title     = {An Improved Technique for Reducing False Alarms Due to Soft Errors},
  booktitle = {12th {IEEE} International On-Line Testing Symposium {(IOLTS} 2006),
               10-12 July 2006, Como, Italy},
  pages     = {105--110},
  year      = {2006},
  crossref  = {DBLP:conf/iolts/2006},
  url       = {https://doi.org/10.1109/IOLTS.2006.10},
  doi       = {10.1109/IOLTS.2006.10},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/iolts/KunduP06},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/wcet/ReinekeWTWPEB06,
  author    = {Jan Reineke and
               Bj{\"{o}}rn Wachter and
               Stephan Thesing and
               Reinhard Wilhelm and
               Ilia Polian and
               Jochen Eisinger and
               Bernd Becker},
  title     = {A Definition and Classification of Timing Anomalies},
  booktitle = {6th Intl. Workshop on Worst-Case Execution Time {(WCET)} Analysis,
               July 4, 2006, Dresden, Germany},
  year      = {2006},
  crossref  = {DBLP:conf/wcet/2006},
  url       = {http://drops.dagstuhl.de/opus/volltexte/2006/671},
  timestamp = {Thu, 16 May 2019 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/wcet/ReinekeWTWPEB06},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/PolianERB05,
  author    = {Ilia Polian and
               Piet Engelke and
               Michel Renovell and
               Bernd Becker},
  title     = {Modeling Feedback Bridging Faults with Non-Zero Resistance},
  journal   = {J. Electronic Testing},
  volume    = {21},
  number    = {1},
  pages     = {57--69},
  year      = {2005},
  url       = {https://doi.org/10.1007/s10836-005-5287-6},
  doi       = {10.1007/s10836-005-5287-6},
  timestamp = {Thu, 18 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/et/PolianERB05},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/it/Polian05,
  author    = {Ilia Polian},
  title     = {Nichtstandardfehlermodelle f{\"{u}}r digitale Logikschaltkreise:
               Simulation, pr{\"{u}}fgerechter Entwurf, industrielle Anwendungen
               (On Non-standard Fault Models for Logic Digital Circuits: Simulation,
               Design for Testability, Industrial Applications)},
  journal   = {it - Information Technology},
  volume    = {47},
  number    = {3},
  pages     = {172--174},
  year      = {2005},
  url       = {https://doi.org/10.1524/itit.47.3.172.65613},
  doi       = {10.1524/itit.47.3.172.65613},
  timestamp = {Sat, 20 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/it/Polian05},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KunduEPB05,
  author    = {Sandip Kundu and
               Piet Engelke and
               Ilia Polian and
               Bernd Becker},
  title     = {On Detection of Resistive Bridging Defects by Low-Temperature and
               Low-Voltage Testing},
  booktitle = {14th Asian Test Symposium {(ATS} 2005), 18-21 December 2005, Calcutta,
               India},
  pages     = {266--271},
  year      = {2005},
  crossref  = {DBLP:conf/ats/2005},
  url       = {https://doi.org/10.1109/ATS.2005.83},
  doi       = {10.1109/ATS.2005.83},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ats/KunduEPB05},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/PolianFBH05,
  author    = {Ilia Polian and
               Thomas Fiehn and
               Bernd Becker and
               John P. Hayes},
  title     = {A Family of Logical Fault Models for Reversible Circuits},
  booktitle = {14th Asian Test Symposium {(ATS} 2005), 18-21 December 2005, Calcutta,
               India},
  pages     = {422--427},
  year      = {2005},
  crossref  = {DBLP:conf/ats/2005},
  url       = {https://doi.org/10.1109/ATS.2005.9},
  doi       = {10.1109/ATS.2005.9},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ats/PolianFBH05},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/PolianCB05,
  author    = {Ilia Polian and
               Alejandro Czutro and
               Bernd Becker},
  title     = {Evolutionary Optimization in Code-Based Test Compression},
  booktitle = {2005 Design, Automation and Test in Europe Conference and Exposition
               {(DATE} 2005), 7-11 March 2005, Munich, Germany},
  pages     = {1124--1129},
  year      = {2005},
  crossref  = {DBLP:conf/date/2005},
  url       = {https://doi.org/10.1109/DATE.2005.144},
  doi       = {10.1109/DATE.2005.144},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/PolianCB05},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PolianHKB05,
  author    = {Ilia Polian and
               John P. Hayes and
               Sandip Kundu and
               Bernd Becker},
  title     = {Transient fault characterization in dynamic noisy environments},
  booktitle = {Proceedings 2005 {IEEE} International Test Conference, {ITC} 2005,
               Austin, TX, USA, November 8-10, 2005},
  pages     = {10},
  year      = {2005},
  crossref  = {DBLP:conf/itc/2005},
  url       = {https://doi.org/10.1109/TEST.2005.1584070},
  doi       = {10.1109/TEST.2005.1584070},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/PolianHKB05},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/PolianKGERB05,
  author    = {Ilia Polian and
               Sandip Kundu and
               Jean Marc Galli{\`{e}}re and
               Piet Engelke and
               Michel Renovell and
               Bernd Becker},
  title     = {Resistive Bridge Fault Model Evolution from Conventional to Ultra
               Deep Submicron Technologies},
  booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
               Springs, CA, {USA}},
  pages     = {343--348},
  year      = {2005},
  crossref  = {DBLP:conf/vts/2005},
  url       = {https://doi.org/10.1109/VTS.2005.72},
  doi       = {10.1109/VTS.2005.72},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vts/PolianKGERB05},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/PolianB04,
  author    = {Ilia Polian and
               Bernd Becker},
  title     = {Scalable Delay Fault {BIST} for Use with Low-Cost {ATE}},
  journal   = {J. Electronic Testing},
  volume    = {20},
  number    = {2},
  pages     = {181--197},
  year      = {2004},
  url       = {https://doi.org/10.1023/B:JETT.0000023681.25483.59},
  doi       = {10.1023/B:JETT.0000023681.25483.59},
  timestamp = {Thu, 18 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/et/PolianB04},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HayesPB04,
  author    = {John P. Hayes and
               Ilia Polian and
               Bernd Becker},
  title     = {Testing for Missing-Gate Faults in Reversible Circuits},
  booktitle = {13th Asian Test Symposium {(ATS} 2004), 15-17 November 2004, Kenting,
               Taiwan},
  pages     = {100--105},
  year      = {2004},
  crossref  = {DBLP:conf/ats/2004},
  url       = {https://doi.org/10.1109/ATS.2004.84},
  doi       = {10.1109/ATS.2004.84},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ats/HayesPB04},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/EngelkePRB04,
  author    = {Piet Engelke and
               Ilia Polian and
               Michel Renovell and
               Bernd Becker},
  title     = {Automatic test pattern generation for resistive bridging faults},
  booktitle = {9th European Test Symposium, {ETS} 2004, Ajaccio, France, May 23-26,
               2004},
  pages     = {160--165},
  year      = {2004},
  crossref  = {DBLP:conf/ets/2004},
  url       = {https://doi.org/10.1109/ETSYM.2004.1347652},
  doi       = {10.1109/ETSYM.2004.1347652},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ets/EngelkePRB04},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TangWVHWEPB04,
  author    = {Yuyi Tang and
               Hans{-}Joachim Wunderlich and
               Harald P. E. Vranken and
               Friedrich Hapke and
               Michael Wittke and
               Piet Engelke and
               Ilia Polian and
               Bernd Becker},
  title     = {X-Masking During Logic {BIST} and Its Impact on Defect Coverage},
  booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
               26-28, 2004, Charlotte, NC, {USA}},
  pages     = {442--451},
  year      = {2004},
  crossref  = {DBLP:conf/itc/2004},
  url       = {https://doi.org/10.1109/TEST.2004.1386980},
  doi       = {10.1109/TEST.2004.1386980},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/TangWVHWEPB04},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/mbmv/BeckerBEFHHHKNPW04,
  author    = {Bernd Becker and
               Markus Behle and
               Friedrich Eisenbrand and
               Martin Fr{\"{a}}nzle and
               Marc Herbstritt and
               Christian Herde and
               J{\"{o}}rg Hoffmann and
               Daniel Kr{\"{o}}ning and
               Bernhard Nebel and
               Ilia Polian and
               Ralf Wimmer},
  title     = {Bounded Model Checking and Inductive Verification of Hybrid Discrete-continuous
               Systems},
  booktitle = {Methoden und Beschreibungssprachen zur Modellierung und Verifikation
               von Schaltungen und Systemen (MBMV), Kaiserslautern, Germany, February
               24-25, 2004},
  pages     = {65--75},
  year      = {2004},
  crossref  = {DBLP:conf/mbmv/2004},
  timestamp = {Fri, 20 Jan 2017 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/mbmv/BeckerBEFHHHKNPW04},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/EngelkePRSB04,
  author    = {Piet Engelke and
               Ilia Polian and
               Michel Renovell and
               Bharath Seshadri and
               Bernd Becker},
  title     = {The Pros and Cons of Very-Low-Voltage Testing: An Analysis based on
               Resistive Bridging Faults},
  booktitle = {22nd {IEEE} {VLSI} Test Symposium {(VTS} 2004), 25-29 April 2004,
               Napa Valley, CA, {USA}},
  pages     = {171--178},
  year      = {2004},
  crossref  = {DBLP:conf/vts/2004},
  url       = {https://doi.org/10.1109/VTEST.2004.1299240},
  doi       = {10.1109/VTEST.2004.1299240},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vts/EngelkePRSB04},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/PolianB03,
  author    = {Ilia Polian and
               Bernd Becker},
  title     = {Multiple Scan Chain Design for Two-Pattern Testing},
  journal   = {J. Electronic Testing},
  volume    = {19},
  number    = {1},
  pages     = {37--48},
  year      = {2003},
  url       = {https://doi.org/10.1023/A:1021991828423},
  doi       = {10.1023/A:1021991828423},
  timestamp = {Thu, 18 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/et/PolianB03},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/BradfordDPB03,
  author    = {Jonathan Bradford and
               Hartmut Delong and
               Ilia Polian and
               Bernd Becker},
  title     = {Simulating Realistic Bridging and Crosstalk Faults in an Industrial
               Setting},
  journal   = {J. Electronic Testing},
  volume    = {19},
  number    = {4},
  pages     = {387--395},
  year      = {2003},
  url       = {https://doi.org/10.1023/A:1024635824944},
  doi       = {10.1023/A:1024635824944},
  timestamp = {Thu, 18 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/et/BradfordDPB03},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/integration/PolianGB03,
  author    = {Ilia Polian and
               Wolfgang G{\"{u}}nther and
               Bernd Becker},
  title     = {Pattern-based verification of connections to intellectual property
               cores},
  journal   = {Integration},
  volume    = {35},
  number    = {1},
  pages     = {25--44},
  year      = {2003},
  url       = {https://doi.org/10.1016/S0167-9260(03)00003-8},
  doi       = {10.1016/S0167-9260(03)00003-8},
  timestamp = {Mon, 11 Mar 2019 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/journals/integration/PolianGB03},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/PolianBR03,
  author    = {Ilia Polian and
               Bernd Becker and
               Sudhakar M. Reddy},
  title     = {Evolutionary Optimization of Markov Sources for Pseudo Random Scan
               {BIST}},
  booktitle = {2003 Design, Automation and Test in Europe Conference and Exposition
               {(DATE} 2003), 3-7 March 2003, Munich, Germany},
  pages     = {11184--11185},
  year      = {2003},
  crossref  = {DBLP:conf/date/2003},
  url       = {http://doi.ieeecomputersociety.org/10.1109/DATE.2003.10051},
  doi       = {10.1109/DATE.2003.10051},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/PolianBR03},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/gi/Polian03,
  author    = {Ilia Polian},
  title     = {On non-standard fault models for logic digital circuits},
  booktitle = {Ausgezeichnete Informatikdissertationen 2003},
  pages     = {169--178},
  year      = {2003},
  crossref  = {DBLP:conf/gi/2003diss},
  url       = {http://subs.emis.de/LNI/Dissertation/Dissertation4/article21.html},
  timestamp = {Wed, 10 Dec 2014 13:15:30 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/gi/Polian03},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/EngelkePRB03,
  author    = {Piet Engelke and
               Ilia Polian and
               Michel Renovell and
               Bernd Becker},
  title     = {Simulating Resistive Bridging and Stuck-At Faults},
  booktitle = {Proceedings 2003 International Test Conference {(ITC} 2003), Breaking
               Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte,
               NC, {USA}},
  pages     = {1051--1059},
  year      = {2003},
  crossref  = {DBLP:conf/itc/2003},
  url       = {https://doi.org/10.1109/TEST.2003.1271093},
  doi       = {10.1109/TEST.2003.1271093},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/EngelkePRB03},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/mbmv/PolianGB03,
  author    = {Ilia Polian and
               Wolfgang G{\"{u}}nther and
               Bernd Becker},
  title     = {The Case for 2-POF},
  booktitle = {Methoden und Beschreibungssprachen zur Modellierung und Verifikation
               von Schaltungen und Systemen (MBMV), Bremen, Germany, February 24-25,
               2003},
  pages     = {164--173},
  year      = {2003},
  crossref  = {DBLP:conf/mbmv/2003},
  timestamp = {Mon, 11 Mar 2019 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/mbmv/PolianGB03},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsi/PolianB03,
  author    = {Ilia Polian and
               Bernd Becker},
  title     = {Reducing {ATE} Cost in System-on-Chip Test},
  booktitle = {{IFIP} VLSI-SoC 2003, {IFIP} {WG} 10.5 International Conference on
               Very Large Scale Integration of System-on-Chip, Darmstadt, Germany,
               1-3 December 2003},
  pages     = {337--342},
  year      = {2003},
  crossref  = {DBLP:conf/vlsi/2003soc},
  timestamp = {Fri, 20 Jan 2017 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/vlsi/PolianB03},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/PolianPB02,
  author    = {Ilia Polian and
               Irith Pomeranz and
               Bernd Becker},
  title     = {Exact Computation of Maximally Dominating Faults and Its Application
               to n-Detection Tests},
  booktitle = {11th Asian Test Symposium {(ATS} 2002), 18-20 November 2002, Guam,
               {USA}},
  pages     = {2--14},
  year      = {2002},
  crossref  = {DBLP:conf/ats/2002},
  url       = {https://doi.org/10.1109/ATS.2002.1181677},
  doi       = {10.1109/ATS.2002.1181677},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ats/PolianPB02},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/PolianB02,
  author    = {Ilia Polian and
               Bernd Becker},
  title     = {Stop {\&} Go {BIST}},
  booktitle = {8th {IEEE} International On-Line Testing Workshop {(IOLTW} 2002),
               8-10 July 2002, Isle of Bendor, France},
  pages     = {147--151},
  year      = {2002},
  crossref  = {DBLP:conf/iolts/2002},
  url       = {https://doi.org/10.1109/OLT.2002.1030198},
  doi       = {10.1109/OLT.2002.1030198},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/iolts/PolianB02},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/PolianKMB02,
  author    = {Ilia Polian and
               Martin Keim and
               Nicolai Mallig and
               Bernd Becker},
  title     = {Sequential n -Detection Criteria: Keep It Simple},
  booktitle = {8th {IEEE} International On-Line Testing Workshop {(IOLTW} 2002),
               8-10 July 2002, Isle of Bendor, France},
  pages     = {189},
  year      = {2002},
  crossref  = {DBLP:conf/iolts/2002},
  url       = {https://doi.org/10.1109/OLT.2002.1030213},
  doi       = {10.1109/OLT.2002.1030213},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/iolts/PolianKMB02},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ismvl/PolianEB02,
  author    = {Ilia Polian and
               Piet Engelke and
               Bernd Becker},
  title     = {Efficient Bridging Fault Simulation of Sequential Circuits Based on
               Multi-Valued Logics},
  booktitle = {32nd {IEEE} International Symposium on Multiple-Valued Logic {(ISMVL}
               2002), May 15-18, 2002, Boston, Massachusetts, {USA}},
  pages     = {216--223},
  year      = {2002},
  crossref  = {DBLP:conf/ismvl/2002},
  url       = {https://doi.org/10.1109/ISMVL.2002.1011092},
  doi       = {10.1109/ISMVL.2002.1011092},
  timestamp = {Wed, 16 Oct 2019 14:14:57 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ismvl/PolianEB02},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/PoliaGB01,
  author    = {Ilia Polian and
               Wolfgang G{\"{u}}nther and
               Bernd Becker},
  title     = {Efficient Pattern-Based Verification of Connections to {IP} Cores},
  booktitle = {10th Asian Test Symposium {(ATS} 2001), 19-21 November 2001, Kyoto,
               Japan},
  pages     = {443--448},
  year      = {2001},
  crossref  = {DBLP:conf/ats/2001},
  url       = {https://doi.org/10.1109/ATS.2001.990324},
  doi       = {10.1109/ATS.2001.990324},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ats/PoliaGB01},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/mbmv/PolianGB01,
  author    = {Ilia Polian and
               Wolfgang G{\"{u}}nther and
               Bernd Becker},
  title     = {Efficient Pattern-Based Verification of Connections to Intellectual
               Property Cores},
  booktitle = {Methoden und Beschreibungssprachen zur Modellierung und Verifikation
               von Schaltungen und Systemen (MBMV), Mei{\ss}en, Germany, February
               19-21, 2001},
  pages     = {111--120},
  year      = {2001},
  crossref  = {DBLP:conf/mbmv/2001},
  timestamp = {Mon, 11 Mar 2019 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/mbmv/PolianGB01},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/PolianB01,
  author    = {Ilia Polian and
               Bernd Becker},
  title     = {Multiple Scan Chain Design for Two-Pattern Testing},
  booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
               in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
               {USA}},
  pages     = {88--93},
  year      = {2001},
  crossref  = {DBLP:conf/vts/2001},
  url       = {https://doi.org/10.1109/VTS.2001.923423},
  doi       = {10.1109/VTS.2001.923423},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vts/PolianB01},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/cf/2019,
  editor    = {Francesca Palumbo and
               Michela Becchi and
               Martin Schulz and
               Kento Sato},
  title     = {Proceedings of the 16th {ACM} International Conference on Computing
               Frontiers, {CF} 2019, Alghero, Italy, April 30 - May 2, 2019},
  publisher = {{ACM}},
  year      = {2019},
  url       = {https://doi.org/10.1145/3310273},
  doi       = {10.1145/3310273},
  isbn      = {978-1-4503-6685-4},
  timestamp = {Mon, 20 May 2019 09:32:18 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/cf/2019},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ets/2019,
  title     = {24th {IEEE} European Test Symposium, {ETS} 2019, Baden-Baden, Germany,
               May 27-31, 2019},
  publisher = {{IEEE}},
  year      = {2019},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/8784130/proceeding},
  isbn      = {978-1-7281-1173-5},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ets/2019},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/fdtc/2019,
  title     = {2019 Workshop on Fault Diagnosis and Tolerance in Cryptography, {FDTC}
               2019, Atlanta, GA, USA, August 24, 2019},
  publisher = {{IEEE}},
  year      = {2019},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/8831118/proceeding},
  isbn      = {978-1-7281-2667-8},
  timestamp = {Wed, 16 Oct 2019 14:14:49 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/fdtc/2019},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ivsw/2019,
  title     = {4th {IEEE} International Verification and Security Workshop, {IVSW}
               2019, Rhodes Island, Greece, July 1-3, 2019},
  publisher = {{IEEE}},
  year      = {2019},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/8850848/proceeding},
  isbn      = {978-1-7281-2671-5},
  timestamp = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ivsw/2019},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/samos/2019,
  editor    = {Dionisios N. Pnevmatikatos and
               Maxime Pelcat and
               Matthias Jung},
  title     = {Embedded Computer Systems: Architectures, Modeling, and Simulation
               - 19th International Conference, {SAMOS} 2019, Samos, Greece, July
               7-11, 2019, Proceedings},
  series    = {Lecture Notes in Computer Science},
  volume    = {11733},
  publisher = {Springer},
  year      = {2019},
  url       = {https://doi.org/10.1007/978-3-030-27562-4},
  doi       = {10.1007/978-3-030-27562-4},
  isbn      = {978-3-030-27561-7},
  timestamp = {Fri, 09 Aug 2019 14:45:31 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/samos/2019},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ches/2018proofs,
  editor    = {Lejla Batina and
               Ulrich K{\"{u}}hne and
               Nele Mentens},
  title     = {{PROOFS} 2018, 7th International Workshop on Security Proofs for Embedded
               Systems, colocated with {CHES} 2018, Amsterdam, The Netherlands, September
               13, 2018},
  series    = {Kalpa Publications in Computing},
  volume    = {7},
  publisher = {EasyChair},
  year      = {2018},
  url       = {http://www.easychair.org/publications/volume/PROOFS\_2018},
  timestamp = {Tue, 20 Nov 2018 09:14:48 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/ches/2018proofs},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/dcis/2018,
  title     = {Conference on Design of Circuits and Integrated Systems, {DCIS} 2018,
               Lyon, France, November 14-16, 2018},
  publisher = {{IEEE}},
  year      = {2018},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/8679952/proceeding},
  isbn      = {978-1-7281-0171-2},
  timestamp = {Wed, 16 Oct 2019 14:14:50 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/dcis/2018},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ewme/2018,
  title     = {12th European Workshop on Microelectronics Education, {EWME} 2018,
               Braunschweig, Germany, September 24-26, 2018},
  publisher = {{IEEE}},
  year      = {2018},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/8622718/proceeding},
  isbn      = {978-1-5386-9114-4},
  timestamp = {Wed, 16 Oct 2019 14:14:48 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ewme/2018},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/iccad/2018,
  editor    = {Iris Bahar},
  title     = {Proceedings of the International Conference on Computer-Aided Design,
               {ICCAD} 2018, San Diego, CA, USA, November 05-08, 2018},
  publisher = {{ACM}},
  year      = {2018},
  url       = {https://doi.org/10.1145/3240765},
  doi       = {10.1145/3240765},
  isbn      = {978-1-4503-5950-4},
  timestamp = {Mon, 07 Jan 2019 11:16:31 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/iccad/2018},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/samos/2018,
  editor    = {Trevor N. Mudge and
               Dionisios N. Pnevmatikatos},
  title     = {Proceedings of the 18th International Conference on Embedded Computer
               Systems: Architectures, Modeling, and Simulation, Pythagorion, Greece,
               July 15-19, 2018},
  publisher = {{ACM}},
  year      = {2018},
  url       = {https://dl.acm.org/citation.cfm?id=3229631},
  isbn      = {978-1-4503-6494-2},
  timestamp = {Mon, 14 Jan 2019 07:39:33 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/samos/2018},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/aspdac/2017,
  title     = {22nd Asia and South Pacific Design Automation Conference, {ASP-DAC}
               2017, Chiba, Japan, January 16-19, 2017},
  publisher = {{IEEE}},
  year      = {2017},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/7847727/proceeding},
  isbn      = {978-1-5090-1558-0},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/aspdac/2017},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/date/2017,
  editor    = {David Atienza and
               Giorgio Di Natale},
  title     = {Design, Automation {\&} Test in Europe Conference {\&} Exhibition,
               {DATE} 2017, Lausanne, Switzerland, March 27-31, 2017},
  publisher = {{IEEE}},
  year      = {2017},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/7919927/proceeding},
  isbn      = {978-3-9815370-8-6},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/2017},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/dsd/2017,
  editor    = {Hana Kub{\'{a}}tov{\'{a}} and
               Martin Novotn{\'{y}} and
               Amund Skavhaug},
  title     = {Euromicro Conference on Digital System Design, {DSD} 2017, Vienna,
               Austria, August 30 - Sept. 1, 2017},
  publisher = {{IEEE} Computer Society},
  year      = {2017},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/8048781/proceeding},
  isbn      = {978-1-5386-2146-2},
  timestamp = {Wed, 16 Oct 2019 14:14:57 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/dsd/2017},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ets/2017,
  title     = {22nd {IEEE} European Test Symposium, {ETS} 2017, Limassol, Cyprus,
               May 22-26, 2017},
  publisher = {{IEEE}},
  year      = {2017},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/7960777/proceeding},
  isbn      = {978-1-5090-5457-2},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ets/2017},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/fdtc/2017,
  title     = {2017 Workshop on Fault Diagnosis and Tolerance in Cryptography, {FDTC}
               2017, Taipei, Taiwan, September 25, 2017},
  publisher = {{IEEE} Computer Society},
  year      = {2017},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/8126806/proceeding},
  isbn      = {978-1-5386-2948-2},
  timestamp = {Wed, 16 Oct 2019 14:14:49 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/fdtc/2017},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ivsw/2017,
  title     = {{IEEE} 2nd International Verification and Security Workshop, {IVSW}
               2017, Thessaloniki, Greece, July 3-5, 2017},
  publisher = {{IEEE}},
  year      = {2017},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/8024489/proceeding},
  isbn      = {978-1-5386-1708-3},
  timestamp = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ivsw/2017},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/socc/2017,
  editor    = {Massimo Alioto and
               Hai Helen Li and
               J{\"{u}}rgen Becker and
               Ulf Schlichtmann and
               Ramalingam Sridhar},
  title     = {30th {IEEE} International System-on-Chip Conference, {SOCC} 2017,
               Munich, Germany, September 5-8, 2017},
  publisher = {{IEEE}},
  year      = {2017},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/8170502/proceeding},
  isbn      = {978-1-5386-4034-0},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/socc/2017},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ats/2016,
  title     = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
               21-24, 2016},
  publisher = {{IEEE} Computer Society},
  year      = {2016},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/7795842/proceeding},
  isbn      = {978-1-5090-3809-1},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ats/2016},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/date/2016,
  editor    = {Luca Fanucci and
               J{\"{u}}rgen Teich},
  title     = {2016 Design, Automation {\&} Test in Europe Conference {\&}
               Exhibition, {DATE} 2016, Dresden, Germany, March 14-18, 2016},
  publisher = {{IEEE}},
  year      = {2016},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/7454909/proceeding},
  isbn      = {978-3-9815-3707-9},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/2016},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ets/2016,
  title     = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
               May 23-27, 2016},
  publisher = {{IEEE}},
  year      = {2016},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/7510593/proceeding},
  isbn      = {978-1-4673-9659-2},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ets/2016},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/eusipco/2016,
  title     = {24th European Signal Processing Conference, {EUSIPCO} 2016, Budapest,
               Hungary, August 29 - September 2, 2016},
  publisher = {{IEEE}},
  year      = {2016},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/7740646/proceeding},
  isbn      = {978-0-9928-6265-7},
  timestamp = {Wed, 16 Oct 2019 14:14:50 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/eusipco/2016},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/wsa/2016,
  title     = {{WSA} 2016, 20th International {ITG} Workshop on Smart Antennas, Munich,
               Germany, 9-11 March 2016},
  publisher = {VDE-Verlag / {IEEE}},
  year      = {2016},
  url       = {https://www.vde-verlag.de/buecher/454177/itg-fb-261-wsa-2016.html},
  timestamp = {Wed, 16 Oct 2019 14:14:50 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/wsa/2016},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ats/2015,
  title     = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
               22-25, 2015},
  publisher = {{IEEE} Computer Society},
  year      = {2015},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/7421875/proceeding},
  isbn      = {978-1-4673-9739-1},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ats/2015},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/dac/2015,
  title     = {Proceedings of the 52nd Annual Design Automation Conference, San Francisco,
               CA, USA, June 7-11, 2015},
  publisher = {{ACM}},
  year      = {2015},
  url       = {http://dl.acm.org/citation.cfm?id=2744769},
  isbn      = {978-1-4503-3520-1},
  timestamp = {Mon, 08 Jun 2015 08:35:39 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/dac/2015},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/date/2015,
  editor    = {Wolfgang Nebel and
               David Atienza},
  title     = {Proceedings of the 2015 Design, Automation {\&} Test in Europe
               Conference {\&} Exhibition, {DATE} 2015, Grenoble, France, March
               9-13, 2015},
  publisher = {{ACM}},
  year      = {2015},
  url       = {http://dl.acm.org/citation.cfm?id=2755753},
  isbn      = {978-3-9815370-4-8},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/2015},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/rc/2015,
  editor    = {Jean Krivine and
               Jean{-}Bernard Stefani},
  title     = {Reversible Computation - 7th International Conference, {RC} 2015,
               Grenoble, France, July 16-17, 2015, Proceedings},
  series    = {Lecture Notes in Computer Science},
  volume    = {9138},
  publisher = {Springer},
  year      = {2015},
  url       = {https://doi.org/10.1007/978-3-319-20860-2},
  doi       = {10.1007/978-3-319-20860-2},
  isbn      = {978-3-319-20859-6},
  timestamp = {Tue, 14 May 2019 10:00:38 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/rc/2015},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/date/2014,
  editor    = {Gerhard P. Fettweis and
               Wolfgang Nebel},
  title     = {Design, Automation {\&} Test in Europe Conference {\&} Exhibition,
               {DATE} 2014, Dresden, Germany, March 24-28, 2014},
  publisher = {European Design and Automation Association},
  year      = {2014},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/6784162/proceeding},
  isbn      = {978-3-9815370-2-4},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/2014},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ddecs/2014,
  title     = {17th International Symposium on Design and Diagnostics of Electronic
               Circuits {\&} Systems, {DDECS} 2014, Warsaw, Poland, 23-25 April,
               2014},
  publisher = {{IEEE} Computer Society},
  year      = {2014},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/6862738/proceeding},
  isbn      = {978-1-4799-4560-3},
  timestamp = {Wed, 16 Oct 2019 14:14:50 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ddecs/2014},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/dft/2014,
  title     = {2014 {IEEE} International Symposium on Defect and Fault Tolerance
               in {VLSI} and Nanotechnology Systems, {DFT} 2014, Amsterdam, The Netherlands,
               October 1-3, 2014},
  publisher = {{IEEE} Computer Society},
  year      = {2014},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/6942523/proceeding},
  isbn      = {978-1-4799-6155-9},
  timestamp = {Wed, 16 Oct 2019 14:14:57 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/dft/2014},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ets/2014,
  editor    = {Giorgio Di Natale},
  title     = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
               May 26-30, 2014},
  publisher = {{IEEE}},
  year      = {2014},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/6842412/proceeding},
  isbn      = {978-1-4799-3415-7},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ets/2014},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/fdtc/2014,
  editor    = {Assia Tria and
               Dooho Choi},
  title     = {2014 Workshop on Fault Diagnosis and Tolerance in Cryptography, {FDTC}
               2014, Busan, South Korea, September 23, 2014},
  publisher = {{IEEE} Computer Society},
  year      = {2014},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/6975317/proceeding},
  isbn      = {978-1-4799-6292-1},
  timestamp = {Wed, 16 Oct 2019 14:14:49 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/fdtc/2014},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/iolts/2014,
  title     = {2014 {IEEE} 20th International On-Line Testing Symposium, {IOLTS}
               2014, Platja d'Aro, Girona, Spain, July 7-9, 2014},
  publisher = {{IEEE}},
  year      = {2014},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/6867432/proceeding},
  isbn      = {978-1-4799-5323-3},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/iolts/2014},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/rc/2014,
  editor    = {Shigeru Yamashita and
               Shin{-}ichi Minato},
  title     = {Reversible Computation - 6th International Conference, {RC} 2014,
               Kyoto, Japan, July 10-11, 2014. Proceedings},
  series    = {Lecture Notes in Computer Science},
  volume    = {8507},
  publisher = {Springer},
  year      = {2014},
  url       = {https://doi.org/10.1007/978-3-319-08494-7},
  doi       = {10.1007/978-3-319-08494-7},
  isbn      = {978-3-319-08493-0},
  timestamp = {Tue, 14 May 2019 10:00:38 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/rc/2014},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/vlsid/2014,
  title     = {2014 27th International Conference on {VLSI} Design and 2014 13th
               International Conference on Embedded Systems, Mumbai, India, January
               5-9, 2014},
  publisher = {{IEEE} Computer Society},
  year      = {2014},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/6732243/proceeding},
  isbn      = {978-1-4799-2513-1},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vlsid/2014},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/wisee/2014,
  title     = {2014 {IEEE} International Conference on Wireless for Space and Extreme
               Environments, WiSEE 2014, Noordwijk, Netherlands, October 30-31, 2014},
  publisher = {{IEEE}},
  year      = {2014},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/6963813/proceeding},
  isbn      = {978-1-4799-5653-1},
  timestamp = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/wisee/2014},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/aspdac/2013,
  title     = {18th Asia and South Pacific Design Automation Conference, {ASP-DAC}
               2013, Yokohama, Japan, January 22-25, 2013},
  publisher = {{IEEE}},
  year      = {2013},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/6507004/proceeding},
  isbn      = {978-1-4673-3029-9},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/aspdac/2013},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ats/2013,
  title     = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
               18-21, 2013},
  publisher = {{IEEE} Computer Society},
  year      = {2013},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/6689800/proceeding},
  isbn      = {978-0-7695-5080-0},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ats/2013},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/date/2013,
  editor    = {Enrico Macii},
  title     = {Design, Automation and Test in Europe, {DATE} 13, Grenoble, France,
               March 18-22, 2013},
  publisher = {{EDA} Consortium San Jose, CA, {USA} / {ACM} {DL}},
  year      = {2013},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/6507370/proceeding},
  isbn      = {978-1-4503-2153-2},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/2013},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ddecs/2013,
  editor    = {Luk{\'{a}}s Sekanina and
               G{\"{o}}rschwin Fey and
               Jaan Raik and
               Snorre Aunet and
               Richard Ruzicka},
  title     = {16th {IEEE} International Symposium on Design and Diagnostics of Electronic
               Circuits {\&} Systems, {DDECS} 2013, Karlovy Vary, Czech Republic,
               April 8-10, 2013},
  publisher = {{IEEE} Computer Society},
  year      = {2013},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/6533795/proceeding},
  isbn      = {978-1-4673-6135-4},
  timestamp = {Wed, 16 Oct 2019 14:14:50 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ddecs/2013},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/dft/2013,
  title     = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
               in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
               NY, USA, October 2-4, 2013},
  publisher = {{IEEE} Computer Society},
  year      = {2013},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/6644330/proceeding},
  timestamp = {Wed, 16 Oct 2019 14:14:57 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/dft/2013},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/latw/2013,
  title     = {14th Latin American Test Workshop, {LATW} 2013, Cordoba, Argentina,
               3-5 April, 2013},
  publisher = {{IEEE} Computer Society},
  year      = {2013},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/6554180/proceeding},
  isbn      = {978-1-4799-0595-9},
  timestamp = {Wed, 16 Oct 2019 16:49:09 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/latw/2013},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/vts/2013,
  title     = {31st {IEEE} {VLSI} Test Symposium, {VTS} 2013, Berkeley, CA, USA,
               April 29 - May 2, 2013},
  publisher = {{IEEE} Computer Society},
  year      = {2013},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/6530960/proceeding},
  isbn      = {978-1-4673-5542-1},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vts/2013},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/aspdac/2012,
  title     = {Proceedings of the 17th Asia and South Pacific Design Automation Conference,
               {ASP-DAC} 2012, Sydney, Australia, January 30 - February 2, 2012},
  publisher = {{IEEE}},
  year      = {2012},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/6156603/proceeding},
  isbn      = {978-1-4673-0770-3},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/aspdac/2012},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ats/2012,
  title     = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
               19-22, 2012},
  publisher = {{IEEE} Computer Society},
  year      = {2012},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/6392591/proceeding},
  isbn      = {978-1-4673-4555-2},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ats/2012},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/cosade/2012,
  editor    = {Werner Schindler and
               Sorin A. Huss},
  title     = {Constructive Side-Channel Analysis and Secure Design - Third International
               Workshop, {COSADE} 2012, Darmstadt, Germany, May 3-4, 2012. Proceedings},
  series    = {Lecture Notes in Computer Science},
  volume    = {7275},
  publisher = {Springer},
  year      = {2012},
  url       = {https://doi.org/10.1007/978-3-642-29912-4},
  doi       = {10.1007/978-3-642-29912-4},
  isbn      = {978-3-642-29911-7},
  timestamp = {Tue, 14 May 2019 10:00:39 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/cosade/2012},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/date/2012,
  editor    = {Wolfgang Rosenstiel and
               Lothar Thiele},
  title     = {2012 Design, Automation {\&} Test in Europe Conference {\&}
               Exhibition, {DATE} 2012, Dresden, Germany, March 12-16, 2012},
  publisher = {{IEEE}},
  year      = {2012},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/6171057/proceeding},
  isbn      = {978-1-4577-2145-8},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/2012},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/dft/2012,
  title     = {2012 {IEEE} International Symposium on Defect and Fault Tolerance
               in {VLSI} and Nanotechnology Systems, {DFT} 2012, Austin, TX, USA,
               October 3-5, 2012},
  publisher = {{IEEE} Computer Society},
  year      = {2012},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/6362314/proceeding},
  isbn      = {978-1-4673-3043-5},
  timestamp = {Wed, 16 Oct 2019 14:14:57 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/dft/2012},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ets/2012,
  title     = {17th {IEEE} European Test Symposium, {ETS} 2012, Annecy, France, May
               28 - June 1 2012},
  publisher = {{IEEE} Computer Society},
  year      = {2012},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/6222773/proceeding},
  isbn      = {978-1-4673-0697-3},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ets/2012},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/iccad/2012,
  editor    = {Alan J. Hu},
  title     = {2012 {IEEE/ACM} International Conference on Computer-Aided Design,
               {ICCAD} 2012, San Jose, CA, USA, November 5-8, 2012},
  publisher = {{ACM}},
  year      = {2012},
  url       = {https://doi.org/10.1145/2429384},
  doi       = {10.1145/2429384},
  isbn      = {978-1-4577-1398-9},
  timestamp = {Wed, 16 Oct 2019 14:14:49 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/iccad/2012},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/iolts/2012,
  title     = {18th {IEEE} International On-Line Testing Symposium, {IOLTS} 2012,
               Sitges, Spain, June 27-29, 2012},
  publisher = {{IEEE} Computer Society},
  year      = {2012},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/6304844/proceeding},
  isbn      = {978-1-4673-2082-5},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/iolts/2012},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/2012,
  title     = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
               USA, November 5-8, 2012},
  publisher = {{IEEE} Computer Society},
  year      = {2012},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/6387511/proceeding},
  isbn      = {978-1-4673-1594-4},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/2012},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/nanoarch/2012,
  editor    = {Csaba Andras Moritz},
  title     = {Proceedings of the 2012 {IEEE/ACM} International Symposium on Nanoscale
               Architectures, {NANOARCH} 2012, Amsterdam, The Netherlands, July 4-6,
               2012},
  publisher = {{ACM}},
  year      = {2012},
  url       = {https://doi.org/10.1145/2765491},
  doi       = {10.1145/2765491},
  isbn      = {978-1-4503-1671-2},
  timestamp = {Wed, 16 Oct 2019 14:14:50 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/nanoarch/2012},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/vts/2012,
  title     = {30th {IEEE} {VLSI} Test Symposium, {VTS} 2012, Maui, Hawaii, USA,
               23-26 April 2012},
  publisher = {{IEEE} Computer Society},
  year      = {2012},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/6222548/proceeding},
  isbn      = {978-1-4673-1074-1},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vts/2012},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ats/2011,
  title     = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
               Delhi, India, November 20-23, 2011},
  publisher = {{IEEE} Computer Society},
  year      = {2011},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/6114262/proceeding},
  isbn      = {978-1-4577-1984-4},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ats/2011},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/date/2011,
  title     = {Design, Automation and Test in Europe, {DATE} 2011, Grenoble, France,
               March 14-18, 2011},
  publisher = {{IEEE}},
  year      = {2011},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/5754459/proceeding},
  isbn      = {978-1-61284-208-0},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/2011},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ddecs/2011,
  editor    = {Rolf Kraemer and
               Adam Pawlak and
               Andreas Steininger and
               Mario Sch{\"{o}}lzel and
               Jaan Raik and
               Heinrich Theodor Vierhaus},
  title     = {14th {IEEE} International Symposium on Design and Diagnostics of Electronic
               Circuits {\&} Systems, {DDECS} 2011, Cottbus, Germany, April 13-15,
               2011},
  publisher = {{IEEE} Computer Society},
  year      = {2011},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/5771301/proceeding},
  isbn      = {978-1-4244-9755-3},
  timestamp = {Wed, 16 Oct 2019 14:14:50 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ddecs/2011},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ets/2011,
  title     = {16th European Test Symposium, {ETS} 2011, Trondheim, Norway, May 23-27,
               2011},
  publisher = {{IEEE} Computer Society},
  year      = {2011},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/5955410/proceeding},
  isbn      = {978-0-7695-4433-5},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ets/2011},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/iolts/2011,
  title     = {17th {IEEE} International On-Line Testing Symposium {(IOLTS} 2011),
               13-15 July, 2011, Athens, Greece},
  publisher = {{IEEE} Computer Society},
  year      = {2011},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/5979170/proceeding},
  isbn      = {978-1-4577-1053-7},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/iolts/2011},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ats/2010,
  title     = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
               December 2010, Shanghai, China},
  publisher = {{IEEE} Computer Society},
  year      = {2010},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/5689827/proceeding},
  isbn      = {978-0-7695-4248-5},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ats/2010},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/dsn/2010w,
  title     = {{IEEE/IFIP} International Conference on Dependable Systems and Networks
               Workshops {(DSN-W} 2010), Chicago, Illinois, USA, June 28 - July 1,
               2010},
  publisher = {{IEEE} Computer Society},
  year      = {2010},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/5532085/proceeding},
  isbn      = {978-1-4244-7729-6},
  timestamp = {Wed, 16 Oct 2019 16:49:09 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/dsn/2010w},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ewdts/2010,
  title     = {2010 East-West Design {\&} Test Symposium, {EWDTS} 2010, St. Petersburg,
               Russia, September 17-20, 2010},
  publisher = {{IEEE} Computer Society},
  year      = {2010},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/5738234/proceeding},
  isbn      = {978-1-4244-9555-9},
  timestamp = {Wed, 16 Oct 2019 14:14:56 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ewdts/2010},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/vts/2010,
  title     = {28th {IEEE} {VLSI} Test Symposium, {VTS} 2010, April 19-22, 2010,
               Santa Cruz, California, {USA}},
  publisher = {{IEEE} Computer Society},
  year      = {2010},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/5464131/proceeding},
  isbn      = {978-1-4244-6648-1},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vts/2010},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ats/2009,
  title     = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
               November 2009, Taichung, Taiwan},
  publisher = {{IEEE} Computer Society},
  year      = {2009},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/5359186/proceeding},
  isbn      = {978-0-7695-3864-8},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ats/2009},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/date/2009,
  editor    = {Luca Benini and
               Giovanni De Micheli and
               Bashir M. Al{-}Hashimi and
               Wolfgang M{\"{u}}ller},
  title     = {Design, Automation and Test in Europe, {DATE} 2009, Nice, France,
               April 20-24, 2009},
  publisher = {{IEEE}},
  year      = {2009},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/4926138/proceeding},
  isbn      = {978-1-4244-3781-8},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/2009},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/glvlsi/2009,
  editor    = {Fabrizio Lombardi and
               Sanjukta Bhanja and
               Yehia Massoud and
               R. Iris Bahar},
  title     = {Proceedings of the 19th {ACM} Great Lakes Symposium on {VLSI} 2009,
               Boston Area, MA, USA, May 10-12 2009},
  publisher = {{ACM}},
  year      = {2009},
  url       = {https://doi.org/10.1145/1531542},
  doi       = {10.1145/1531542},
  isbn      = {978-1-60558-522-2},
  timestamp = {Wed, 24 May 2017 08:28:02 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/glvlsi/2009},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/iolts/2009,
  title     = {15th {IEEE} International On-Line Testing Symposium {(IOLTS} 2009),
               24-26 June 2009, Sesimbra-Lisbon, Portugal},
  publisher = {{IEEE} Computer Society},
  year      = {2009},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/5176124/proceeding},
  isbn      = {978-1-4244-4596-7},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/iolts/2009},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/vlsid/2009,
  title     = {{VLSI} Design 2009: Improving Productivity through Higher Abstraction,
               The 22nd International Conference on {VLSI} Design, New Delhi, India,
               5-9 January 2009},
  publisher = {{IEEE} Computer Society},
  year      = {2009},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/4749609/proceeding},
  isbn      = {978-0-7695-3506-7},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vlsid/2009},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/vts/2009,
  title     = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
               Cruz, California, {USA}},
  publisher = {{IEEE} Computer Society},
  year      = {2009},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/5116585/proceeding},
  isbn      = {978-0-7695-3598-2},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vts/2009},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/date/2008,
  editor    = {Donatella Sciuto},
  title     = {Design, Automation and Test in Europe, {DATE} 2008, Munich, Germany,
               March 10-14, 2008},
  publisher = {{ACM}},
  year      = {2008},
  url       = {https://doi.org/10.1145/1403375},
  doi       = {10.1145/1403375},
  isbn      = {978-3-9810801-3-1},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/2008},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ddecs/2008,
  editor    = {Bernd Straube and
               Milos Drutarovsk{\'{y}} and
               Michel Renovell and
               Peter Gramata and
               M{\'{a}}ria Fischerov{\'{a}}},
  title     = {Proceedings of the 11th {IEEE} Workshop on Design {\&} Diagnostics
               of Electronic Circuits {\&} Systems {(DDECS} 2008), Bratislava,
               Slovakia, April 16-18, 2008},
  publisher = {{IEEE} Computer Society},
  year      = {2008},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/4534845/proceeding},
  isbn      = {978-1-4244-2276-0},
  timestamp = {Wed, 16 Oct 2019 14:14:50 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ddecs/2008},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/dft/2008,
  editor    = {Cristiana Bolchini and
               Yong{-}Bin Kim and
               Dimitris Gizopoulos and
               Mohammad Tehranipoor},
  title     = {23rd {IEEE} International Symposium on Defect and Fault-Tolerance
               in {VLSI} Systems {(DFT} 2008), 1-3 October 2008, Boston, MA, {USA}},
  publisher = {{IEEE} Computer Society},
  year      = {2008},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/4641141/proceeding},
  isbn      = {978-0-7695-3365-0},
  timestamp = {Wed, 16 Oct 2019 14:14:57 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/dft/2008},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/dsn/2008,
  title     = {The 38th Annual {IEEE/IFIP} International Conference on Dependable
               Systems and Networks, {DSN} 2008, June 24-27, 2008, Anchorage, Alaska,
               USA, Proceedings},
  publisher = {{IEEE} Computer Society},
  year      = {2008},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/4610267/proceeding},
  isbn      = {978-1-4244-2397-2},
  timestamp = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/dsn/2008},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ets/2008,
  title     = {13th European Test Symposium, {ETS} 2008, Verbania, Italy, May 25-29,
               2008},
  publisher = {{IEEE} Computer Society},
  year      = {2008},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/4556006/proceeding},
  isbn      = {978-0-7695-3150-2},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ets/2008},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/isvlsi/2008,
  title     = {{IEEE} Computer Society Annual Symposium on VLSI, {ISVLSI} 2008, 7-9
               April 2008, Montpellier, France},
  publisher = {{IEEE} Computer Society},
  year      = {2008},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/4556750/proceeding},
  isbn      = {978-0-7695-3170-0},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/isvlsi/2008},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/2008,
  editor    = {Douglas Young and
               Nur A. Touba},
  title     = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
               California, USA, October 26-31, 2008},
  publisher = {{IEEE} Computer Society},
  year      = {2008},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/4690905/proceeding},
  isbn      = {978-1-4244-2403-0},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/2008},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/vts/2008,
  title     = {26th {IEEE} {VLSI} Test Symposium {(VTS} 2008), April 27 - May 1,
               2008, San Diego, California, {USA}},
  publisher = {{IEEE} Computer Society},
  year      = {2008},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/4511672/proceeding},
  isbn      = {978-0-7695-3123-6},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vts/2008},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/iolts/2007,
  title     = {13th {IEEE} International On-Line Testing Symposium {(IOLTS} 2007),
               8-11 July 2007, Heraklion, Crete, Greece},
  publisher = {{IEEE} Computer Society},
  year      = {2007},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/4274802/proceeding},
  isbn      = {0-7695-2918-6},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/iolts/2007},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/vts/2007,
  title     = {25th {IEEE} {VLSI} Test Symposium {(VTS} 2007), 6-10 May 2007, Berkeley,
               California, {USA}},
  publisher = {{IEEE} Computer Society},
  year      = {2007},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/4209869/proceeding},
  isbn      = {0-7695-2812-0},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vts/2007},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/date/2006p,
  editor    = {Georges G. E. Gielen},
  title     = {Proceedings of the Conference on Design, Automation and Test in Europe,
               {DATE} 2006, Munich, Germany, March 6-10, 2006},
  publisher = {European Design and Automation Association, Leuven, Belgium},
  year      = {2006},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/11014/proceeding},
  isbn      = {3-9810801-1-4},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/2006p},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ddecs/2006,
  editor    = {Matteo Sonza Reorda and
               Ondrej Nov{\'{a}}k and
               Bernd Straube and
               Hana Kub{\'{a}}tov{\'{a}} and
               Zdenek Kot{\'{a}}sek and
               Pavel Kubal{\'{\i}}k and
               Raimund Ubar and
               Jir{\'{\i}} Bucek},
  title     = {Proceedings of the 9th {IEEE} Workshop on Design {\&} Diagnostics
               of Electronic Circuits {\&} Systems {(DDECS} 2006), Prague, Czech
               Republic, April 18-21, 2006},
  publisher = {{IEEE} Computer Society},
  year      = {2006},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/10974/proceeding},
  isbn      = {1-4244-0185-2},
  timestamp = {Wed, 16 Oct 2019 14:14:50 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ddecs/2006},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/dft/2006,
  title     = {21th {IEEE} International Symposium on Defect and Fault-Tolerance
               in {VLSI} Systems {(DFT} 2006), 4-6 October 2006, Arlington, Virginia,
               {USA}},
  publisher = {{IEEE} Computer Society},
  year      = {2006},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/4030903/proceeding},
  isbn      = {0-7695-2706-X},
  timestamp = {Wed, 16 Oct 2019 14:14:57 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/dft/2006},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/iccd/2006,
  title     = {24th International Conference on Computer Design {(ICCD} 2006), 1-4
               October 2006, San Jose, CA, {USA}},
  publisher = {{IEEE}},
  year      = {2006},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/4380776/proceeding},
  isbn      = {978-0-7803-9707-1},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/iccd/2006},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/iolts/2006,
  title     = {12th {IEEE} International On-Line Testing Symposium {(IOLTS} 2006),
               10-12 July 2006, Como, Italy},
  publisher = {{IEEE} Computer Society},
  year      = {2006},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/11010/proceeding},
  isbn      = {0-7695-2620-9},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/iolts/2006},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/wcet/2006,
  editor    = {Frank Mueller},
  title     = {6th Intl. Workshop on Worst-Case Execution Time {(WCET)} Analysis,
               July 4, 2006, Dresden, Germany},
  series    = {{OASICS}},
  volume    = {4},
  publisher = {Internationales Begegnungs- und Forschungszentrum fuer Informatik
               (IBFI), Schloss Dagstuhl, Germany},
  year      = {2006},
  url       = {http://drops.dagstuhl.de/portals/06902/},
  timestamp = {Tue, 12 Feb 2013 21:25:59 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/wcet/2006},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ats/2005,
  title     = {14th Asian Test Symposium {(ATS} 2005), 18-21 December 2005, Calcutta,
               India},
  publisher = {{IEEE} Computer Society},
  year      = {2005},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/10525/proceeding},
  isbn      = {0-7695-2481-8},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ats/2005},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/date/2005,
  title     = {2005 Design, Automation and Test in Europe Conference and Exposition
               {(DATE} 2005), 7-11 March 2005, Munich, Germany},
  publisher = {{IEEE} Computer Society},
  year      = {2005},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/9609/proceeding},
  isbn      = {0-7695-2288-2},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/2005},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/2005,
  title     = {Proceedings 2005 {IEEE} International Test Conference, {ITC} 2005,
               Austin, TX, USA, November 8-10, 2005},
  publisher = {{IEEE} Computer Society},
  year      = {2005},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/10560/proceeding},
  isbn      = {0-7803-9038-5},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/2005},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/vts/2005,
  title     = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
               Springs, CA, {USA}},
  publisher = {{IEEE} Computer Society},
  year      = {2005},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/9857/proceeding},
  isbn      = {0-7695-2314-5},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vts/2005},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ats/2004,
  title     = {13th Asian Test Symposium {(ATS} 2004), 15-17 November 2004, Kenting,
               Taiwan},
  publisher = {{IEEE} Computer Society},
  year      = {2004},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/9468/proceeding},
  isbn      = {0-7695-2235-1},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ats/2004},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ets/2004,
  title     = {9th European Test Symposium, {ETS} 2004, Ajaccio, France, May 23-26,
               2004},
  publisher = {{IEEE} Computer Society},
  year      = {2004},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/9329/proceeding},
  isbn      = {0-7695-2119-3},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ets/2004},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/2004,
  title     = {Proceedings 2004 International Test Conference {(ITC} 2004), October
               26-28, 2004, Charlotte, NC, {USA}},
  publisher = {{IEEE} Computer Society},
  year      = {2003},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/9526/proceeding},
  isbn      = {0-7803-8581-0},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/2004},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/mbmv/2004,
  editor    = {Dominik Stoffel and
               Wolfgang Kunz},
  title     = {Methoden und Beschreibungssprachen zur Modellierung und Verifikation
               von Schaltungen und Systemen (MBMV), Kaiserslautern, Germany, February
               24-25, 2004},
  publisher = {Shaker},
  year      = {2004},
  timestamp = {Thu, 28 Jun 2012 09:44:44 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/mbmv/2004},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/vts/2004,
  title     = {22nd {IEEE} {VLSI} Test Symposium {(VTS} 2004), 25-29 April 2004,
               Napa Valley, CA, {USA}},
  publisher = {{IEEE} Computer Society},
  year      = {2004},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/9095/proceeding},
  isbn      = {0-7695-2134-7},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vts/2004},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/date/2003,
  title     = {2003 Design, Automation and Test in Europe Conference and Exposition
               {(DATE} 2003), 3-7 March 2003, Munich, Germany},
  publisher = {{IEEE} Computer Society},
  year      = {2003},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/8443/proceeding},
  isbn      = {0-7695-1870-2},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/2003},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/gi/2003diss,
  editor    = {Dorothea Wagner},
  title     = {Ausgezeichnete Informatikdissertationen 2003},
  series    = {{LNI}},
  volume    = {{D-4}},
  publisher = {{GI}},
  year      = {2004},
  url       = {http://subs.emis.de/LNI/Dissertation/Dissertation4.html},
  isbn      = {3-88579-408-X},
  timestamp = {Wed, 10 Dec 2014 13:15:30 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/gi/2003diss},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/2003,
  title     = {Proceedings 2003 International Test Conference {(ITC} 2003), Breaking
               Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte,
               NC, {USA}},
  publisher = {{IEEE} Computer Society},
  year      = {2003},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/8970/proceeding},
  isbn      = {0-7803-8106-8},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/2003},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/mbmv/2003,
  editor    = {Rolf Drechsler},
  title     = {Methoden und Beschreibungssprachen zur Modellierung und Verifikation
               von Schaltungen und Systemen (MBMV), Bremen, Germany, February 24-25,
               2003},
  publisher = {Shaker},
  year      = {2003},
  timestamp = {Thu, 28 Jun 2012 12:33:11 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/mbmv/2003},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/vlsi/2003soc,
  editor    = {Manfred Glesner and
               Ricardo Augusto da Luz Reis and
               Hans Eveking and
               Vincent John Mooney III and
               Leandro Soares Indrusiak and
               Peter Zipf},
  title     = {{IFIP} VLSI-SoC 2003, {IFIP} {WG} 10.5 International Conference on
               Very Large Scale Integration of System-on-Chip, Darmstadt, Germany,
               1-3 December 2003},
  publisher = {Technische Universit{\"{a}}t Darmstadt, Insitute of Microelectronic
               Systems},
  year      = {2003},
  isbn      = {3-901882-17-0},
  timestamp = {Thu, 07 Oct 2004 09:29:26 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vlsi/2003soc},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ats/2002,
  title     = {11th Asian Test Symposium {(ATS} 2002), 18-20 November 2002, Guam,
               {USA}},
  publisher = {{IEEE} Computer Society},
  year      = {2002},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/8413/proceeding},
  isbn      = {0-7695-1825-7},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ats/2002},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/iolts/2002,
  title     = {8th {IEEE} International On-Line Testing Workshop {(IOLTW} 2002),
               8-10 July 2002, Isle of Bendor, France},
  publisher = {{IEEE} Computer Society},
  year      = {2002},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/8008/proceeding},
  isbn      = {0-7695-1641-6},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/iolts/2002},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ismvl/2002,
  title     = {32nd {IEEE} International Symposium on Multiple-Valued Logic {(ISMVL}
               2002), May 15-18, 2002, Boston, Massachusetts, {USA}},
  publisher = {{IEEE} Computer Society},
  year      = {2002},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/7900/proceeding},
  isbn      = {0-7695-1462-6},
  timestamp = {Wed, 16 Oct 2019 14:14:57 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ismvl/2002},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ats/2001,
  title     = {10th Asian Test Symposium {(ATS} 2001), 19-21 November 2001, Kyoto,
               Japan},
  publisher = {{IEEE} Computer Society},
  year      = {2001},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/7765/proceeding},
  isbn      = {0-7695-1378-6},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ats/2001},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/mbmv/2001,
  editor    = {Dieter Monjau},
  title     = {Methoden und Beschreibungssprachen zur Modellierung und Verifikation
               von Schaltungen und Systemen (MBMV), Mei{\ss}en, Germany, February
               19-21, 2001},
  publisher = {MoPress},
  year      = {2001},
  timestamp = {Thu, 28 Jun 2012 13:09:12 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/mbmv/2001},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/vts/2001,
  title     = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
               in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
               {USA}},
  publisher = {{IEEE} Computer Society},
  year      = {2001},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/7354/proceeding},
  isbn      = {0-7695-1122-8},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vts/2001},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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