BibTeX records: Alessandro Paccagnella

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@article{DBLP:journals/sensors/PasqualottoCFTP23,
  author       = {Elisabetta Pasqualotto and
                  Erica Cretaio and
                  Lara Franchin and
                  Alessandro De Toni and
                  Alessandro Paccagnella and
                  Stefano Bonaldo and
                  Matteo Scaramuzza},
  title        = {{SPECTRA:} {A} Novel Compact System for Surface Plasmon Resonance
                  Measurements},
  journal      = {Sensors},
  volume       = {23},
  number       = {9},
  pages        = {4309},
  year         = {2023},
  url          = {https://doi.org/10.3390/s23094309},
  doi          = {10.3390/S23094309},
  timestamp    = {Fri, 22 Mar 2024 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/sensors/PasqualottoCFTP23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tim/TonelloFBGNPSSC23,
  author       = {Sarah Tonello and
                  Tiziano Fapanni and
                  Stefano Bonaldo and
                  Giada Giorgi and
                  Claudio Narduzzi and
                  Alessandro Paccagnella and
                  Mauro Serpelloni and
                  Emilio Sardini and
                  Sandro Carrara},
  title        = {Amperometric Measurements by a Novel Aerosol Jet Printed Flexible
                  Sensor for Wearable Applications},
  journal      = {{IEEE} Trans. Instrum. Meas.},
  volume       = {72},
  pages        = {1--12},
  year         = {2023},
  url          = {https://doi.org/10.1109/TIM.2022.3225014},
  doi          = {10.1109/TIM.2022.3225014},
  timestamp    = {Tue, 31 Jan 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/tim/TonelloFBGNPSSC23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ieeesensors/BonaldoFCPSP23,
  author       = {Stefano Bonaldo and
                  Lara Franchin and
                  Erica Cretaio and
                  Elisabetta Pasqualotto and
                  Matteo Scaramuzza and
                  Alessandro Paccagnella},
  title        = {Electrochemical Biosensor for Timely Detection of Lactococcus Lactis
                  Bacteriophage in Milk Samples},
  booktitle    = {2023 {IEEE} SENSORS, Vienna, Austria, October 29 - Nov. 1, 2023},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/SENSORS56945.2023.10325232},
  doi          = {10.1109/SENSORS56945.2023.10325232},
  timestamp    = {Thu, 21 Mar 2024 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ieeesensors/BonaldoFCPSP23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/metroi/BonaldoTFMRP23,
  author       = {Stefano Bonaldo and
                  Sarah Tonello and
                  Lara Franchin and
                  Arben Merko{\c{c}}i and
                  Giulio Rosati and
                  Alessandro Paccagnella},
  title        = {Multiphysics simulations of screen-printed electrodes for electrochemical
                  biosensing},
  booktitle    = {2023 {IEEE} International Workshop on Metrology for Industry 4.0 {\&}
                  IoT, MetroInd4.0{\&}IoT 2023, Brescia, Italy, June 6-8, 2023},
  pages        = {320--325},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/MetroInd4.0IoT57462.2023.10180155},
  doi          = {10.1109/METROIND4.0IOT57462.2023.10180155},
  timestamp    = {Fri, 22 Mar 2024 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/metroi/BonaldoTFMRP23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/embc/CisottoRP19,
  author       = {Giulia Cisotto and
                  Giulio Rosati and
                  Alessandro Paccagnella},
  title        = {A simple and accessible inkjet platform for ultra-short concept-to-prototype
                  sEMG electrodes production},
  booktitle    = {41st Annual International Conference of the {IEEE} Engineering in
                  Medicine and Biology Society, {EMBC} 2019, Berlin, Germany, July 23-27,
                  2019},
  pages        = {5765--5768},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/EMBC.2019.8857817},
  doi          = {10.1109/EMBC.2019.8857817},
  timestamp    = {Sat, 30 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/embc/CisottoRP19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/integration/RestaGMPMEB18,
  author       = {Federica Resta and
                  Simone Gerardin and
                  S. Mattiazzo and
                  Alessandro Paccagnella and
                  Marcello De Matteis and
                  Christian C. Enz and
                  Andrea Baschirotto},
  title        = {1GigaRad {TID} impact on 28{\unicode{8239}}nm {HEP} analog circuits},
  journal      = {Integr.},
  volume       = {63},
  pages        = {306--314},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.vlsi.2018.04.007},
  doi          = {10.1016/J.VLSI.2018.04.007},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/integration/RestaGMPMEB18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/sensors/RosatiSPTP16,
  author       = {Giulio Rosati and
                  Matteo Scaramuzza and
                  Elisabetta Pasqualotto and
                  Alessandro De Toni and
                  Alessandro Paccagnella},
  editor       = {Bruno And{\`{o}} and
                  Francesco Baldini and
                  Corrado Di Natale and
                  Giovanna Marrazza and
                  Pietro Siciliano},
  title        = {Optimization of Cyclic Voltammetric Curve Parameters to Measure Lactate
                  Concentration in Urine Samples},
  booktitle    = {Sensors - Proceedings of the Third National Conference on Sensors,
                  February 23-25, 2016, Rome, Italy},
  series       = {Lecture Notes in Electrical Engineering},
  volume       = {431},
  pages        = {103--110},
  publisher    = {Springer},
  year         = {2016},
  url          = {https://doi.org/10.1007/978-3-319-55077-0\_14},
  doi          = {10.1007/978-3-319-55077-0\_14},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/sensors/RosatiSPTP16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/sensors/ZuppellaPZGCSTP15,
  author       = {Paola Zuppella and
                  Elisabetta Pasqualotto and
                  Sara Zuccon and
                  Francesca Gerlin and
                  Alain Jody Corso and
                  Matteo Scaramuzza and
                  Alessandro De Toni and
                  Alessandro Paccagnella and
                  Maria Guglielmina Pelizzo},
  title        = {Palladium on Plastic Substrates for Plasmonic Devices},
  journal      = {Sensors},
  volume       = {15},
  number       = {1},
  pages        = {1138--1147},
  year         = {2015},
  url          = {https://doi.org/10.3390/s150101138},
  doi          = {10.3390/S150101138},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/sensors/ZuppellaPZGCSTP15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tvlsi/RossiOMP15,
  author       = {Daniele Rossi and
                  Martin Oma{\~{n}}a and
                  Cecilia Metra and
                  Alessandro Paccagnella},
  title        = {Impact of Bias Temperature Instability on Soft Error Susceptibility},
  journal      = {{IEEE} Trans. Very Large Scale Integr. Syst.},
  volume       = {23},
  number       = {4},
  pages        = {743--751},
  year         = {2015},
  url          = {https://doi.org/10.1109/TVLSI.2014.2320307},
  doi          = {10.1109/TVLSI.2014.2320307},
  timestamp    = {Sun, 20 Nov 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/tvlsi/RossiOMP15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iscas/AndreouPCRLPCJV15,
  author       = {Charalambos M. Andreou and
                  Alessandro Paccagnella and
                  Diego Gonz{\'{a}}lez Casta{\~{n}}o and
                  Faustino G{\'{o}}mez Rodr{\'{\i}}guez and
                  Valentino Liberali and
                  Alexander V. Prokofiev and
                  Cristiano Calligaro and
                  Arto Javanainen and
                  Ari Virtanen and
                  Daniel Nahmad and
                  Julius Georgiou},
  title        = {A subthreshold, low-power, {RHBD} reference circuit, for earth observation
                  and communication satellites},
  booktitle    = {2015 {IEEE} International Symposium on Circuits and Systems, {ISCAS}
                  2015, Lisbon, Portugal, May 24-27, 2015},
  pages        = {2245--2248},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/ISCAS.2015.7169129},
  doi          = {10.1109/ISCAS.2015.7169129},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/iscas/AndreouPCRLPCJV15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iwasi/DemariaDMRRMPCC15,
  author       = {N. Demaria and
                  G. Dellacasa and
                  G. Mazza and
                  Angelo Rivetti and
                  Manuel D. Da Rocha Rolo and
                  E. Monteil and
                  L. Pacher and
                  Fabio Ciciriello and
                  Francesco Corsi and
                  Cristoforo Marzocca and
                  G. De Roberts and
                  F. Loddo and
                  C. Tamma and
                  Marta Bagatin and
                  D. Bisello and
                  Simone Gerardin and
                  S. Mattiazzo and
                  L. Ding and
                  Piero Giubilato and
                  Alessandro Paccagnella and
                  Francesco De Canio and
                  Luigi Gaioni and
                  Massimo Manghisoni and
                  Valerio Re and
                  Gianluca Traversi and
                  Elisa Riceputi and
                  Lodovico Ratti and
                  Carla Vacchi and
                  Roberto Beccherle and
                  Guido Magazz{\`{u}} and
                  M. Minuti and
                  Fabio Morsani and
                  Fabrizio Palla and
                  Valentino Liberali and
                  Seyedruhollah Shojaii and
                  Alberto Stabile and
                  Gian Mario Bilei and
                  Mauro Menichelli and
                  Elia Conti and
                  Sara Marconi and
                  D. Passen and
                  Pisana Placidi},
  title        = {{CHIPIX65:} Developments on a new generation pixel readout {ASIC}
                  in {CMOS} 65 nm for {HEP} experiments},
  booktitle    = {6th International Workshop on Advances in Sensors and Interfaces,
                  {IWASI} 2015, Gallipoli, Italy, June 18-19, 2015},
  pages        = {49--54},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/IWASI.2015.7184947},
  doi          = {10.1109/IWASI.2015.7184947},
  timestamp    = {Sun, 29 Oct 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/iwasi/DemariaDMRRMPCC15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/essderc/RossettoRGMBZPMZDFAOD14,
  author       = {Isabella Rossetto and
                  Fabiana Rampazzo and
                  Simone Gerardin and
                  Matteo Meneghini and
                  Marta Bagatin and
                  Alberto Zanandrea and
                  Alessandro Paccagnella and
                  Gaudenzio Meneghesso and
                  Enrico Zanoni and
                  Christian Dua and
                  Marie{-}Antoinette di Forte{-}Poisson and
                  Raphael Aubry and
                  Mourad Oualli and
                  Sylvain L. Delage},
  title        = {Degradation of dc and pulsed characteristics of InAlN/GaN HEMTs under
                  different proton fluences},
  booktitle    = {44th European Solid State Device Research Conference, {ESSDERC} 2014,
                  Venice Lido, Italy, September 22-26, 2014},
  pages        = {381--384},
  publisher    = {{IEEE}},
  year         = {2014},
  url          = {https://doi.org/10.1109/ESSDERC.2014.6948840},
  doi          = {10.1109/ESSDERC.2014.6948840},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/essderc/RossettoRGMBZPMZDFAOD14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsi/BruniRTNKRP14,
  author       = {Giovanni Bruni and
                  Paolo Rech and
                  Lucas A. Tambara and
                  Gabriel L. Nazar and
                  Fernanda Gusm{\~{a}}o de Lima Kastensmidt and
                  Ricardo Reis and
                  Alessandro Paccagnella},
  editor       = {Lorena Garcia},
  title        = {Power dissipation effects on 28nm FPGA-based System on Chips neutron
                  sensitivity},
  booktitle    = {22nd International Conference on Very Large Scale Integration, VLSI-SoC,
                  Playa del Carmen, Mexico, October 6-8, 2014},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2014},
  url          = {https://doi.org/10.1109/VLSI-SoC.2014.7004195},
  doi          = {10.1109/VLSI-SOC.2014.7004195},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/vlsi/BruniRTNKRP14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BagatinGPAGF12,
  author       = {Marta Bagatin and
                  Simone Gerardin and
                  Alessandro Paccagnella and
                  Carla Andreani and
                  Giuseppe Gorini and
                  C. D. Frost},
  title        = {Temperature dependence of neutron-induced soft errors in SRAMs},
  journal      = {Microelectron. Reliab.},
  volume       = {52},
  number       = {1},
  pages        = {289--293},
  year         = {2012},
  url          = {https://doi.org/10.1016/j.microrel.2011.08.011},
  doi          = {10.1016/J.MICROREL.2011.08.011},
  timestamp    = {Thu, 20 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/BagatinGPAGF12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/biostec/ScaramuzzaFPRTQPR12,
  author       = {Matteo Scaramuzza and
                  Alberto Ferrario and
                  Elisabetta Pasqualotto and
                  Giulio Rosati and
                  Alessandro De Toni and
                  Marco Quarta and
                  Alessandro Paccagnella and
                  Carlo Reggiani},
  editor       = {Joaquim Gabriel and
                  Carlos Manuel B. A. Correia and
                  Ana L. N. Fred and
                  Hugo Gamboa},
  title        = {Low-cost Enzyme-based Biosensor for Lactic Acid Amperometric Detection
                  - Electrical Modeling and Validation for Clinical and Food Processing
                  Applications},
  booktitle    = {{BIODEVICES} 2012 - Proceedings of the International Conference on
                  Biomedical Electronics and Devices, Vilamoura, Algarve, Portugal,
                  1 - 4 February, 2012},
  pages        = {380--383},
  publisher    = {SciTePress},
  year         = {2012},
  timestamp    = {Tue, 12 Jan 2021 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/biostec/ScaramuzzaFPRTQPR12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/BolchiniMSOPSMORRSVGBP12,
  author       = {Cristiana Bolchini and
                  Antonio Miele and
                  Chiara Sandionigi and
                  Marco Ottavi and
                  Salvatore Pontarelli and
                  Adelio Salsano and
                  Cecilia Metra and
                  Martin Oma{\~{n}}a and
                  Daniele Rossi and
                  Matteo Sonza Reorda and
                  Luca Sterpone and
                  Massimo Violante and
                  Simone Gerardin and
                  Marta Bagatin and
                  Alessandro Paccagnella},
  title        = {High-reliability fault tolerant digital systems in nanometric technologies:
                  Characterization and design methodologies},
  booktitle    = {2012 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2012, Austin, TX, USA,
                  October 3-5, 2012},
  pages        = {121--125},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/DFT.2012.6378211},
  doi          = {10.1109/DFT.2012.6378211},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/BolchiniMSOPSMORRSVGBP12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/RossiOMP11,
  author       = {Daniele Rossi and
                  Martin Oma{\~{n}}a and
                  Cecilia Metra and
                  Alessandro Paccagnella},
  title        = {Impact of Aging Phenomena on Soft Error Susceptibility},
  booktitle    = {2011 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2011, Vancouver, BC, Canada,
                  October 3-5, 2011},
  pages        = {18--24},
  publisher    = {{IEEE} Computer Society},
  year         = {2011},
  url          = {https://doi.org/10.1109/DFT.2011.45},
  doi          = {10.1109/DFT.2011.45},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/RossiOMP11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BagatinGPCIN10,
  author       = {Marta Bagatin and
                  Simone Gerardin and
                  Alessandro Paccagnella and
                  Giorgio Cellere and
                  F. Irom and
                  D. N. Nguyen},
  title        = {Destructive events in {NAND} Flash memories irradiated with heavy
                  ions},
  journal      = {Microelectron. Reliab.},
  volume       = {50},
  number       = {9-11},
  pages        = {1832--1836},
  year         = {2010},
  url          = {https://doi.org/10.1016/j.microrel.2010.07.032},
  doi          = {10.1016/J.MICROREL.2010.07.032},
  timestamp    = {Sat, 22 Apr 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/BagatinGPCIN10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GerardinBPCVB10,
  author       = {Simone Gerardin and
                  Marta Bagatin and
                  Alessandro Paccagnella and
                  G. Cellere and
                  Angelo Visconti and
                  Mauro Bonanomi},
  title        = {Impact of total dose on heavy-ion upsets in floating gate arrays},
  journal      = {Microelectron. Reliab.},
  volume       = {50},
  number       = {9-11},
  pages        = {1837--1841},
  year         = {2010},
  url          = {https://doi.org/10.1016/j.microrel.2010.07.142},
  doi          = {10.1016/J.MICROREL.2010.07.142},
  timestamp    = {Sat, 22 Apr 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/GerardinBPCVB10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/RechGMLADPR10,
  author       = {Paolo Rech and
                  Michelangelo Grosso and
                  Fabio Melchiori and
                  Domenico Loparco and
                  Davide Appello and
                  Luigi Dilillo and
                  Alessandro Paccagnella and
                  Matteo Sonza Reorda},
  title        = {Analysis of root causes of alpha sensitivity variations on microprocessors
                  manufactured using different cell layouts},
  booktitle    = {16th {IEEE} International On-Line Testing Symposium {(IOLTS} 2010),
                  5-7 July, 2010, Corfu, Greece},
  pages        = {29--34},
  publisher    = {{IEEE} Computer Society},
  year         = {2010},
  url          = {https://doi.org/10.1109/IOLTS.2010.5560236},
  doi          = {10.1109/IOLTS.2010.5560236},
  timestamp    = {Fri, 28 Apr 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/iolts/RechGMLADPR10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/RechGPBGRA09,
  author       = {Paolo Rech and
                  Simone Gerardin and
                  Alessandro Paccagnella and
                  Paolo Bernardi and
                  Michelangelo Grosso and
                  Matteo Sonza Reorda and
                  Davide Appello},
  title        = {Evaluating Alpha-induced soft errors in embedded microprocessors},
  booktitle    = {15th {IEEE} International On-Line Testing Symposium {(IOLTS} 2009),
                  24-26 June 2009, Sesimbra-Lisbon, Portugal},
  pages        = {69--74},
  publisher    = {{IEEE} Computer Society},
  year         = {2009},
  url          = {https://doi.org/10.1109/IOLTS.2009.5195985},
  doi          = {10.1109/IOLTS.2009.5195985},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/iolts/RechGPBGRA09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/AppelloBGGPRR09,
  author       = {Davide Appello and
                  Paolo Bernardi and
                  Simone Gerardin and
                  Michelangelo Grosso and
                  Alessandro Paccagnella and
                  Paolo Rech and
                  Matteo Sonza Reorda},
  title        = {DfT Reuse for Low-Cost Radiation Testing of SoCs: {A} Case Study},
  booktitle    = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
                  Cruz, California, {USA}},
  pages        = {276--281},
  publisher    = {{IEEE} Computer Society},
  year         = {2009},
  url          = {https://doi.org/10.1109/VTS.2009.26},
  doi          = {10.1109/VTS.2009.26},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/AppelloBGGPRR09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/BattezzatiGMPRSV08,
  author       = {Niccol{\`{o}} Battezzati and
                  Simone Gerardin and
                  Andrea Manuzzato and
                  Alessandro Paccagnella and
                  Sana Rezgui and
                  Luca Sterpone and
                  Massimo Violante},
  title        = {On the Evaluation of Radiation-Induced Transient Faults in Flash-Based
                  FPGAs},
  booktitle    = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008),
                  7-9 July 2008, Rhodes, Greece},
  pages        = {135--140},
  publisher    = {{IEEE} Computer Society},
  year         = {2008},
  url          = {https://doi.org/10.1109/IOLTS.2008.47},
  doi          = {10.1109/IOLTS.2008.47},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/iolts/BattezzatiGMPRSV08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CesterGWPAG07,
  author       = {Andrea Cester and
                  A. Gasperin and
                  Nicola Wrachien and
                  Alessandro Paccagnella and
                  Valentina Ancarani and
                  Cosimo Gerardi},
  title        = {Ionising radiation and electrical stress on nanocrystal memory cell
                  array},
  journal      = {Microelectron. Reliab.},
  volume       = {47},
  number       = {4-5},
  pages        = {602--605},
  year         = {2007},
  url          = {https://doi.org/10.1016/j.microrel.2007.01.008},
  doi          = {10.1016/J.MICROREL.2007.01.008},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/CesterGWPAG07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Martin-MartinezGRNACPG07,
  author       = {Javier Mart{\'{\i}}n{-}Mart{\'{\i}}nez and
                  Simone Gerardin and
                  Rosana Rodr{\'{\i}}guez and
                  Montserrat Nafr{\'{\i}}a and
                  Xavier Aymerich and
                  Andrea Cester and
                  Alessandro Paccagnella and
                  G. Ghidini},
  title        = {Lifetime estimation of analog circuits from the electrical characteristics
                  of stressed MOSFETs},
  journal      = {Microelectron. Reliab.},
  volume       = {47},
  number       = {9-11},
  pages        = {1349--1352},
  year         = {2007},
  url          = {https://doi.org/10.1016/j.microrel.2007.07.088},
  doi          = {10.1016/J.MICROREL.2007.07.088},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/Martin-MartinezGRNACPG07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/ManuzzatoRGPSV07,
  author       = {Andrea Manuzzato and
                  Paolo Rech and
                  Simone Gerardin and
                  Alessandro Paccagnella and
                  Luca Sterpone and
                  Massimo Violante},
  editor       = {Cristiana Bolchini and
                  Yong{-}Bin Kim and
                  Adelio Salsano and
                  Nur A. Touba},
  title        = {Sensitivity Evaluation of TMR-Hardened Circuits to Multiple SEUs Induced
                  by Alpha Particles in Commercial SRAM-Based FPGAs},
  booktitle    = {22nd {IEEE} International Symposium on Defect and Fault-Tolerance
                  in {VLSI} Systems {(DFT} 2007), 26-28 September 2007, Rome, Italy},
  pages        = {79--86},
  publisher    = {{IEEE} Computer Society},
  year         = {2007},
  url          = {https://doi.org/10.1109/DFT.2007.57},
  doi          = {10.1109/DFT.2007.57},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/ManuzzatoRGPSV07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/BagatinCGPVBM07,
  author       = {Marta Bagatin and
                  Giorgio Cellere and
                  Simone Gerardin and
                  Alessandro Paccagnella and
                  Angelo Visconti and
                  Silvia Beltrami and
                  M. Maccarrone},
  title        = {Single Event Effects in 1Gbit 90nm {NAND} Flash Memories under Operating
                  Conditions},
  booktitle    = {13th {IEEE} International On-Line Testing Symposium {(IOLTS} 2007),
                  8-11 July 2007, Heraklion, Crete, Greece},
  pages        = {146--151},
  publisher    = {{IEEE} Computer Society},
  year         = {2007},
  url          = {https://doi.org/10.1109/IOLTS.2007.59},
  doi          = {10.1109/IOLTS.2007.59},
  timestamp    = {Sat, 22 Apr 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/iolts/BagatinCGPVBM07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GerardinGCPG06,
  author       = {Simone Gerardin and
                  Alessio Griffoni and
                  Andrea Cester and
                  Alessandro Paccagnella and
                  G. Ghidini},
  title        = {Degradation of static and dynamic behavior of {CMOS} inverters during
                  constant and pulsed voltage stress},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1669--1672},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.052},
  doi          = {10.1016/J.MICROREL.2006.07.052},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/GerardinGCPG06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DanesinZGRMZP06,
  author       = {Francesca Danesin and
                  Franco Zanon and
                  Simone Gerardin and
                  Fabiana Rampazzo and
                  Gaudenzio Meneghesso and
                  Enrico Zanoni and
                  Alessandro Paccagnella},
  title        = {Degradation induced by 2-MeV alpha particles on AlGaN/GaN high electron
                  mobility transistors},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1750--1753},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.066},
  doi          = {10.1016/J.MICROREL.2006.07.066},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/DanesinZGRMZP06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/CellerePVB06,
  author       = {G. Cellere and
                  Alessandro Paccagnella and
                  Angelo Visconti and
                  Mauro Bonanomi},
  title        = {Erratic Effects of Irradiation in Floating Gate Memory Cells},
  booktitle    = {12th {IEEE} International On-Line Testing Symposium {(IOLTS} 2006),
                  10-12 July 2006, Como, Italy},
  pages        = {51--56},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/IOLTS.2006.30},
  doi          = {10.1109/IOLTS.2006.30},
  timestamp    = {Sat, 22 Apr 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/iolts/CellerePVB06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/CellerePVB05,
  author       = {G. Cellere and
                  Alessandro Paccagnella and
                  Angelo Visconti and
                  Mauro Bonanomi},
  title        = {Soft Errors induced by single heavy ions in Floating Gate memory arrays},
  booktitle    = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
                  in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
  pages        = {275--284},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/DFTVS.2005.62},
  doi          = {10.1109/DFTVS.2005.62},
  timestamp    = {Sat, 22 Apr 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/dft/CellerePVB05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/AlderighiCCDMPPS05,
  author       = {Monica Alderighi and
                  A. Candelori and
                  Fabio Casini and
                  Sergio D'Angelo and
                  Marcello Mancini and
                  Alessandro Paccagnella and
                  Sandro Pastore and
                  Giacomo R. Sechi},
  title        = {Heavy Ion Effects on Configuration Logic of Virtex FPGAs},
  booktitle    = {11th {IEEE} International On-Line Testing Symposium {(IOLTS} 2005),
                  6-8 July 2005, Saint Raphael, France},
  pages        = {49--53},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/IOLTS.2005.31},
  doi          = {10.1109/IOLTS.2005.31},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/iolts/AlderighiCCDMPPS05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/BellatoBBCCPRRVZ04,
  author       = {M. Bellato and
                  Paolo Bernardi and
                  D. Bortolato and
                  A. Candelori and
                  M. Ceschia and
                  Alessandro Paccagnella and
                  Maurizio Rebaudengo and
                  Matteo Sonza Reorda and
                  Massimo Violante and
                  P. Zambolin},
  title        = {Evaluating the Effects of SEUs Affecting the Configuration Memory
                  of an SRAM-Based {FPGA}},
  booktitle    = {2004 Design, Automation and Test in Europe Conference and Exposition
                  {(DATE} 2004), 16-20 February 2004, Paris, France},
  pages        = {584--589},
  publisher    = {{IEEE} Computer Society},
  year         = {2004},
  url          = {https://doi.org/10.1109/DATE.2004.1268908},
  doi          = {10.1109/DATE.2004.1268908},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/date/BellatoBBCCPRRVZ04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CiminoCPG03,
  author       = {S. Cimino and
                  Andrea Cester and
                  Alessandro Paccagnella and
                  G. Ghidini},
  title        = {Ionising radiation effects on {MOSFET} drain current},
  journal      = {Microelectron. Reliab.},
  volume       = {43},
  number       = {8},
  pages        = {1247--1251},
  year         = {2003},
  url          = {https://doi.org/10.1016/S0026-2714(03)00179-3},
  doi          = {10.1016/S0026-2714(03)00179-3},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/CiminoCPG03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/ViolanteCRPBRBBZC03,
  author       = {Massimo Violante and
                  M. Ceschia and
                  Matteo Sonza Reorda and
                  Alessandro Paccagnella and
                  Paolo Bernardi and
                  Maurizio Rebaudengo and
                  D. Bortolato and
                  M. Bellato and
                  P. Zambolin and
                  A. Candelori},
  title        = {Analyzing {SEU} Effects in SRAM-based FPGAs},
  booktitle    = {9th {IEEE} International On-Line Testing Symposium {(IOLTS} 2003),
                  7-9 July 2003, Kos Island, Greece},
  pages        = {119--123},
  publisher    = {{IEEE} Computer Society},
  year         = {2003},
  url          = {https://doi.org/10.1109/OLT.2003.1214377},
  doi          = {10.1109/OLT.2003.1214377},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/iolts/ViolanteCRPBRBBZC03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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