BibTeX records: Albert Mann

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@inproceedings{DBLP:conf/itc/SharmaBLALKTCTCLM08,
  author       = {Manish Sharma and
                  Brady Benware and
                  Lei Ling and
                  David Abercrombie and
                  Lincoln Lee and
                  Martin Keim and
                  Huaxing Tang and
                  Wu{-}Tung Cheng and
                  Ting{-}Pu Tai and
                  Yi{-}Jung Chang and
                  Reinhart Lin and
                  Albert Mann},
  editor       = {Douglas Young and
                  Nur A. Touba},
  title        = {Efficiently Performing Yield Enhancements by Identifying Dominant
                  Physical Root Cause from Test Fail Data},
  booktitle    = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
                  California, USA, October 26-31, 2008},
  pages        = {1--9},
  publisher    = {{IEEE} Computer Society},
  year         = {2008},
  url          = {https://doi.org/10.1109/TEST.2008.4700589},
  doi          = {10.1109/TEST.2008.4700589},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/SharmaBLALKTCTCLM08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/HuangCGHCM07,
  author       = {Yu Huang and
                  Wu{-}Tung Cheng and
                  Ruifeng Guo and
                  Will Hsu and
                  Yuan{-}Shih Chen and
                  Albert Mann},
  editor       = {Jill Sibert and
                  Janusz Rajski},
  title        = {Diagnose compound scan chain and system logic defects},
  booktitle    = {2007 {IEEE} International Test Conference, {ITC} 2007, Santa Clara,
                  California, USA, October 21-26, 2007},
  pages        = {1--10},
  publisher    = {{IEEE} Computer Society},
  year         = {2007},
  url          = {https://doi.org/10.1109/TEST.2007.4437578},
  doi          = {10.1109/TEST.2007.4437578},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/HuangCGHCM07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/SharmaCTCHLRM07,
  author       = {Manish Sharma and
                  Wu{-}Tung Cheng and
                  Ting{-}Pu Tai and
                  Y. S. Cheng and
                  Will Hsu and
                  Chen Liu and
                  Sudhakar M. Reddy and
                  Albert Mann},
  editor       = {Jill Sibert and
                  Janusz Rajski},
  title        = {Faster defect localization in nanometer technology based on defective
                  cell diagnosis},
  booktitle    = {2007 {IEEE} International Test Conference, {ITC} 2007, Santa Clara,
                  California, USA, October 21-26, 2007},
  pages        = {1--10},
  publisher    = {{IEEE} Computer Society},
  year         = {2007},
  url          = {https://doi.org/10.1109/TEST.2007.4437604},
  doi          = {10.1109/TEST.2007.4437604},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/SharmaCTCHLRM07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}