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ORCIDBibTeX records: Artur Jutman
@book{DBLP:books/sp/UbarRJJ24,
author = {Raimund Ubar and
Jaan Raik and
Maksim Jenihhin and
Artur Jutman},
title = {Structural Decision Diagrams in Digital Test - Theory and Applications},
publisher = {Springer},
year = {2024},
url = {https://doi.org/10.1007/978-3-031-44734-1},
doi = {10.1007/978-3-031-44734-1},
isbn = {978-3-031-44733-4},
timestamp = {Mon, 04 Mar 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/books/sp/UbarRJJ24.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/JenihhinTCASJSTDKRRD24,
author = {Maksim Jenihhin and
Mahdi Taheri and
Natalia Cherezova and
Mohammad Hasan Ahmadilivani and
Hardi Selg and
Artur Jutman and
Konstantin Shibin and
Anton Tsertov and
Sergei Devadze and
Rama Mounika Kodamanchili and
Ahsan Rafiq and
Jaan Raik and
Masoud Daneshtalab},
title = {Keynote: Cost-Efficient Reliability for Edge-AI Chips},
booktitle = {25th {IEEE} Latin American Test Symposium, {LATS} 2024, Maceio, Brazil,
April 9-12, 2024},
pages = {1--2},
publisher = {{IEEE}},
year = {2024},
url = {https://doi.org/10.1109/LATS62223.2024.10534610},
doi = {10.1109/LATS62223.2024.10534610},
timestamp = {Wed, 05 Jun 2024 20:57:58 +0200},
biburl = {https://dblp.org/rec/conf/latw/JenihhinTCASJSTDKRRD24.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/ShibinJJDT23,
author = {Konstantin Shibin and
Maksim Jenihhin and
Artur Jutman and
Sergei Devadze and
Anton Tsertov},
editor = {Luca Cassano and
Mihalis Psarakis and
Marcello Traiola and
Alberto Bosio},
title = {On-Chip Sensors Data Collection and Analysis for SoC Health Management},
booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October
3-5, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DFT59622.2023.10313562},
doi = {10.1109/DFT59622.2023.10313562},
timestamp = {Tue, 21 Nov 2023 12:38:06 +0100},
biburl = {https://dblp.org/rec/conf/dft/ShibinJJDT23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/corr/abs-2308-15917,
author = {Konstantin Shibin and
Maksim Jenihhin and
Artur Jutman and
Sergei Devadze and
Anton Tsertov},
title = {On-Chip Sensors Data Collection and Analysis for SoC Health Management},
journal = {CoRR},
volume = {abs/2308.15917},
year = {2023},
url = {https://doi.org/10.48550/arXiv.2308.15917},
doi = {10.48550/ARXIV.2308.15917},
eprinttype = {arXiv},
eprint = {2308.15917},
timestamp = {Mon, 04 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/corr/abs-2308-15917.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/corr/abs-2212-04374,
author = {Natalia Cherezova and
Dmitri Mihhailov and
Sergei Devadze and
Artur Jutman},
title = {HLS-based Optimization of Tau Triggering Algorithm for {LHC:} a case
study},
journal = {CoRR},
volume = {abs/2212.04374},
year = {2022},
url = {https://doi.org/10.48550/arXiv.2212.04374},
doi = {10.48550/ARXIV.2212.04374},
eprinttype = {arXiv},
eprint = {2212.04374},
timestamp = {Mon, 02 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/corr/abs-2212-04374.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/OdintsovBSSJ19,
author = {Sergei Odintsov and
Ludovica Bozzoli and
Corrado De Sio and
Luca Sterpone and
Artur Jutman},
title = {A new FPGA-based Detection Method for Spurious Variations in {PCBA}
Power Distribution Network},
booktitle = {22nd {IEEE} International Symposium on Design and Diagnostics of Electronic
Circuits {\&} Systems, {DDECS} 2019, Cluj-Napoca, Romania, April
24-26, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/DDECS.2019.8724662},
doi = {10.1109/DDECS.2019.8724662},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ddecs/OdintsovBSSJ19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/DamljanovicJST19,
author = {Aleksa Damljanovic and
Artur Jutman and
Giovanni Squillero and
Anton Tsertov},
title = {Post-Silicon Validation of {IEEE} 1687 Reconfigurable Scan Networks},
booktitle = {24th {IEEE} European Test Symposium, {ETS} 2019, Baden-Baden, Germany,
May 27-31, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ETS.2019.8791546},
doi = {10.1109/ETS.2019.8791546},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/DamljanovicJST19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DamljanovicJPSS19,
author = {Aleksa Damljanovic and
Artur Jutman and
Michele Portolan and
Ernesto S{\'{a}}nchez and
Giovanni Squillero and
Anton Tsertov},
title = {Simulation-based Equivalence Checking between {IEEE} 1687 {ICL} and
{RTL}},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--8},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000181},
doi = {10.1109/ITC44170.2019.9000181},
timestamp = {Mon, 15 Jun 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/DamljanovicJPSS19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/EggersglussHJMR19,
author = {Stephan Eggersgl{\"{u}}{\ss} and
Said Hamdioui and
Artur Jutman and
Maria K. Michael and
Jaan Raik and
Matteo Sonza Reorda and
Mehdi Baradaran Tahoori and
Elena Ioana Vatajelu},
title = {{IEEE} European Test Symposium {(ETS)}},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--4},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000148},
doi = {10.1109/ITC44170.2019.9000148},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/EggersglussHJMR19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/ShibinDJGP17,
author = {Konstantin Shibin and
Sergei Devadze and
Artur Jutman and
Martin Grabmann and
Robin Pricken},
title = {Health Management for Self-Aware SoCs Based on {IEEE} 1687 Infrastructure},
journal = {{IEEE} Des. Test},
volume = {34},
number = {6},
pages = {27--35},
year = {2017},
url = {https://doi.org/10.1109/MDAT.2017.2750902},
doi = {10.1109/MDAT.2017.2750902},
timestamp = {Fri, 13 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/dt/ShibinDJGP17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/imm/AleksejevJD17,
author = {Igor Aleksejev and
Artur Jutman and
Sergei Devadze},
title = {Run-time reconfigurable instruments for advanced board-level testing},
journal = {{IEEE} Instrum. Meas. Mag.},
volume = {20},
number = {4},
pages = {23--30},
year = {2017},
url = {https://doi.org/10.1109/MIM.2017.8006390},
doi = {10.1109/MIM.2017.8006390},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/imm/AleksejevJD17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/JutmanLLRJRKKE17,
author = {Artur Jutman and
Christophe Lotz and
Erik Larsson and
Matteo Sonza Reorda and
Maksim Jenihhin and
Jaan Raik and
Hans G. Kerkhoff and
Rene Krenz{-}Baath and
Piet Engelke},
editor = {David Atienza and
Giorgio Di Natale},
title = {{BASTION:} Board and SoC test instrumentation for ageing and no failure
found},
booktitle = {Design, Automation {\&} Test in Europe Conference {\&} Exhibition,
{DATE} 2017, Lausanne, Switzerland, March 27-31, 2017},
pages = {115--120},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.23919/DATE.2017.7926968},
doi = {10.23919/DATE.2017.7926968},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/date/JutmanLLRJRKKE17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/OdintsovJD17,
author = {Sergei Odintsov and
Artur Jutman and
Sergei Devadze},
title = {Marginal {PCB} assembly defect detection on {DDR3/4} memory bus},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--10},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242070},
doi = {10.1109/TEST.2017.8242070},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/OdintsovJD17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/AleksejevDJS16,
author = {Igor Aleksejev and
Sergei Devadze and
Artur Jutman and
Konstantin Shibin},
title = {Optimization of Boundary Scan Tests Using FPGA-Based Efficient Scan
Architectures},
journal = {J. Electron. Test.},
volume = {32},
number = {3},
pages = {245--255},
year = {2016},
url = {https://doi.org/10.1007/s10836-016-5588-y},
doi = {10.1007/S10836-016-5588-Y},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/AleksejevDJS16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/JutmanAD16,
author = {Artur Jutman and
Igor Aleksejev and
Sergei Devadze},
title = {On coverage of timing related faults at board level},
booktitle = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
May 23-27, 2016},
pages = {1--2},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/ETS.2016.7519295},
doi = {10.1109/ETS.2016.7519295},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/JutmanAD16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/fdl/AleksandrowiczA16,
author = {Gadi Aleksandrowicz and
Eli Arbel and
Roderick Bloem and
Timon D. ter Braak and
Sergei Devadze and
G{\"{o}}rschwin Fey and
Maksim Jenihhin and
Artur Jutman and
Hans G. Kerkhoff and
Robert K{\"{o}}nighofer and
Jan Malburg and
Shiri Moran and
Jaan Raik and
Gerard K. Rauwerda and
Heinz Riener and
Franz R{\"{o}}ck and
Konstantin Shibin and
Kim Sunesen and
Jinbo Wan and
Yong Zhao},
editor = {Rolf Drechsler and
Robert Wille},
title = {Designing reliable cyber-physical systems overview associated to the
special session at FDL'16},
booktitle = {2016 Forum on Specification and Design Languages, {FDL} 2016, Bremen,
Germany, September 14-16, 2016},
pages = {1--8},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/FDL.2016.7880382},
doi = {10.1109/FDL.2016.7880382},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/fdl/AleksandrowiczA16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TsertovJDRLZCMK16,
author = {Anton Tsertov and
Artur Jutman and
Sergei Devadze and
Matteo Sonza Reorda and
Erik Larsson and
Farrokh Ghani Zadegan and
Riccardo Cantoro and
Mehrdad Montazeri and
Rene Krenz{-}Baath},
title = {A suite of {IEEE} 1687 benchmark networks},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805840},
doi = {10.1109/TEST.2016.7805840},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TsertovJDRLZCMK16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/ShibinDJ16,
author = {Konstantin Shibin and
Sergei Devadze and
Artur Jutman},
title = {On-line fault classification and handling in {IEEE1687} based fault
management system for complex SoCs},
booktitle = {17th Latin-American Test Symposium, {LATS} 2016, Foz do Iguacu, Brazil,
April 6-8, 2016},
pages = {69--74},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/LATW.2016.7483342},
doi = {10.1109/LATW.2016.7483342},
timestamp = {Fri, 27 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/latw/ShibinDJ16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/AleksejevDJS15,
author = {Igor Aleksejev and
Sergei Devadze and
Artur Jutman and
Konstantin Shibin},
title = {Virtual reconfigurable scan-chains on FPGAs for optimized board test},
booktitle = {16th Latin-American Test Symposium, {LATS} 2015, Puerto Vallarta,
Mexico, March 25-27, 2015},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/LATW.2015.7102411},
doi = {10.1109/LATW.2015.7102411},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/latw/AleksejevDJS15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/LarssonEDAJL15,
author = {Erik Larsson and
Bill Eklow and
Scott Davidsson and
Rob Aitken and
Artur Jutman and
Christophe Lotz},
title = {No Fault Found: The root cause},
booktitle = {33rd {IEEE} {VLSI} Test Symposium, {VTS} 2015, Napa, CA, USA, April
27-29, 2015},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/VTS.2015.7116284},
doi = {10.1109/VTS.2015.7116284},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/LarssonEDAJL15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZadeganLJDK14,
author = {Farrokh Ghani Zadegan and
Erik Larsson and
Artur Jutman and
Sergei Devadze and
Rene Krenz{-}Baath},
title = {Design, Verification, and Application of {IEEE} 1687},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {93--100},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.28},
doi = {10.1109/ATS.2014.28},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ZadeganLJDK14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/JutmanRW14,
author = {Artur Jutman and
Matteo Sonza Reorda and
Hans{-}Joachim Wunderlich},
title = {High Quality System Level Test and Diagnosis},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {298--305},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.62},
doi = {10.1109/ATS.2014.62},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/JutmanRW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/ShibinDJ14,
author = {Konstantin Shibin and
Sergei Devadze and
Artur Jutman},
title = {Asynchronous Fault Detection in {IEEE} {P1687} Instrument Network},
booktitle = {{IEEE} 23rd North Atlantic Test Workshop, {NATW} 2014, Johnson City,
NY, USA, May 14-16, 2014},
pages = {73--78},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/NATW.2014.24},
doi = {10.1109/NATW.2014.24},
timestamp = {Fri, 27 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/natw/ShibinDJ14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/JutmanDS13,
author = {Artur Jutman and
Sergei Devadze and
Konstantin Shibin},
title = {Effective Scalable {IEEE} 1687 Instrumentation Network for Fault Management},
journal = {{IEEE} Des. Test},
volume = {30},
number = {5},
pages = {26--35},
year = {2013},
url = {https://doi.org/10.1109/MDAT.2013.2278535},
doi = {10.1109/MDAT.2013.2278535},
timestamp = {Fri, 27 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/dt/JutmanDS13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/mixdes/TsertovDJJ13,
author = {Anton Tsertov and
Sergei Devadze and
Artur Jutman and
Artjom Jasnetski},
title = {On in-system programming of non-volatile memories},
booktitle = {Proceedings of the 20th International Conference Mixed Design of Integrated
Circuits and Systems - {MIXDES} 2013, Gdynia, Poland, June 20-22,
2013},
pages = {408--413},
publisher = {{IEEE}},
year = {2013},
url = {https://ieeexplore.ieee.org/xpl/freeabs\_all.jsp?arnumber=6613385},
timestamp = {Wed, 11 Aug 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/mixdes/TsertovDJJ13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/GuREKQJCL12,
author = {Xinli Gu and
Jeff Rearick and
Bill Eklow and
Martin Keim and
Jun Qian and
Artur Jutman and
Krishnendu Chakrabarty and
Erik Larsson},
title = {Re-using chip level {DFT} at board level},
booktitle = {17th {IEEE} European Test Symposium, {ETS} 2012, Annecy, France, May
28 - June 1 2012},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ETS.2012.6233049},
doi = {10.1109/ETS.2012.6233049},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/GuREKQJCL12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/JutmanDAW12,
author = {Artur Jutman and
Sergei Devadze and
Igor Aleksejev and
Thomas Wenzel},
title = {Embedded synthetic instruments for Board-Level testing},
booktitle = {17th {IEEE} European Test Symposium, {ETS} 2012, Annecy, France, May
28 - June 1 2012},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ETS.2012.6233044},
doi = {10.1109/ETS.2012.6233044},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/JutmanDAW12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AleksejevJDOW12,
author = {Igor Aleksejev and
Artur Jutman and
Sergei Devadze and
Sergei Odintsov and
Thomas Wenzel},
title = {FPGA-based synthetic instrumentation for board test},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401571},
doi = {10.1109/TEST.2012.6401571},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AleksejevJDOW12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TsertovUJD11,
author = {Anton Tsertov and
Raimund Ubar and
Artur Jutman and
Sergei Devadze},
title = {Automatic SoC Level Test Path Synthesis Based on Partial Functional
Models},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {532--538},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.79},
doi = {10.1109/ATS.2011.79},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TsertovUJD11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/TsertovUJD11,
author = {Anton Tsertov and
Raimund Ubar and
Artur Jutman and
Sergei Devadze},
title = {SoC and Board Modeling for Processor-Centric Board Testing},
booktitle = {14th Euromicro Conference on Digital System Design, Architectures,
Methods and Tools, {DSD} 2011, August 31 - September 2, 2011, Oulu,
Finland},
pages = {575--582},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/DSD.2011.79},
doi = {10.1109/DSD.2011.79},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dsd/TsertovUJD11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/recosoc/JutmanDA11,
author = {Artur Jutman and
Sergei Devadze and
Igor Aleksejev},
title = {Invited paper: System-wide fault management based on {IEEE} {P1687}
{IJTAG}},
booktitle = {Proceedings of the 6th International Workshop on Reconfigurable Communication-centric
Systems-on-Chip, ReCoSoC 2011, Montpellier, France, 20-22 June, 2011},
pages = {1--4},
publisher = {{IEEE}},
year = {2011},
url = {https://doi.org/10.1109/ReCoSoC.2011.5981520},
doi = {10.1109/RECOSOC.2011.5981520},
timestamp = {Sat, 19 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/recosoc/JutmanDA11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/UbarDRJ10,
author = {Raimund Ubar and
Sergei Devadze and
Jaan Raik and
Artur Jutman},
editor = {Giovanni De Micheli and
Bashir M. Al{-}Hashimi and
Wolfgang M{\"{u}}ller and
Enrico Macii},
title = {Parallel X-fault simulation with critical path tracing technique},
booktitle = {Design, Automation and Test in Europe, {DATE} 2010, Dresden, Germany,
March 8-12, 2010},
pages = {879--884},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/DATE.2010.5456929},
doi = {10.1109/DATE.2010.5456929},
timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
biburl = {https://dblp.org/rec/conf/date/UbarDRJ10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/delta/UbarDRJ10,
author = {Raimund Ubar and
Sergei Devadze and
Jaan Raik and
Artur Jutman},
title = {Fast Fault Simulation for Extended Class of Faults in Scan Path Circuits},
booktitle = {Fifth {IEEE} International Symposium on Electronic Design, Test {\&}
Applications, {DELTA} 2010, Ho Chi Minh City, Vietnam, January 13-15,
2010},
pages = {14--19},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/DELTA.2010.32},
doi = {10.1109/DELTA.2010.32},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/delta/UbarDRJ10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/MironovUDRJ10,
author = {Dmitri Mironov and
Raimund Ubar and
Sergei Devadze and
Jaan Raik and
Artur Jutman},
editor = {Sebasti{\'{a}}n L{\'{o}}pez},
title = {Structurally Synthesized Multiple Input BDDs for Speeding Up Logic-Level
Simulation of Digital Circuits},
booktitle = {13th Euromicro Conference on Digital System Design, Architectures,
Methods and Tools, {DSD} 2010, 1-3 September 2010, Lille, France},
pages = {658--663},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/DSD.2010.27},
doi = {10.1109/DSD.2010.27},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dsd/MironovUDRJ10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ewdts/TsertovJD10,
author = {Anton Tsertov and
Artur Jutman and
Sergei Devadze},
title = {Testing beyond the SoCs in a lego style},
booktitle = {2010 East-West Design {\&} Test Symposium, {EWDTS} 2010, St. Petersburg,
Russia, September 17-20, 2010},
pages = {334--338},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/EWDTS.2010.5742052},
doi = {10.1109/EWDTS.2010.5742052},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ewdts/TsertovJD10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iscas/UbarMRJ10,
author = {Raimund Ubar and
Dmitri Mironov and
Jaan Raik and
Artur Jutman},
title = {Fault collapsing with linear complexity in digital circuits},
booktitle = {International Symposium on Circuits and Systems {(ISCAS} 2010), May
30 - June 2, 2010, Paris, France},
pages = {653--656},
publisher = {{IEEE}},
year = {2010},
url = {https://doi.org/10.1109/ISCAS.2010.5537504},
doi = {10.1109/ISCAS.2010.5537504},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iscas/UbarMRJ10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/UbarMRJ10,
author = {Raimund Ubar and
Dmitri Mironov and
Jaan Raik and
Artur Jutman},
title = {Structural fault collapsing by superposition of BDDs for test generation
in digital circuits},
booktitle = {11th International Symposium on Quality of Electronic Design {(ISQED}
2010), 22-24 March 2010, San Jose, CA, {USA}},
pages = {250--257},
publisher = {{IEEE}},
year = {2010},
url = {https://doi.org/10.1109/ISQED.2010.5450451},
doi = {10.1109/ISQED.2010.5450451},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/isqed/UbarMRJ10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/icecsys/UbarMRJ09,
author = {Raimund Ubar and
Dmitri Mironov and
Jaan Raik and
Artur Jutman},
title = {Structurally synthesized multiple input BDDs for simulation of digital
circuits},
booktitle = {16th {IEEE} International Conference on Electronics, Circuits, and
Systems, {ICECS} 2009, Yasmine Hammamet, Tunisia, 13-19 December,
2009},
pages = {451--454},
publisher = {{IEEE}},
year = {2009},
url = {https://doi.org/10.1109/ICECS.2009.5410895},
doi = {10.1109/ICECS.2009.5410895},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/icecsys/UbarMRJ09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DevadzeJAU09,
author = {Sergei Devadze and
Artur Jutman and
Igor Aleksejev and
Raimund Ubar},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {Fast extended test access via {JTAG} and FPGAs},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1--7},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355668},
doi = {10.1109/TEST.2009.5355668},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DevadzeJAU09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/DevadzeJAU09,
author = {Sergei Devadze and
Artur Jutman and
Igor Aleksejev and
Raimund Ubar},
title = {Turning {JTAG} inside out for fast extended test access},
booktitle = {10th Latin American Test Workshop, {LATW} 2009, Rio de Janeiro, Brazil,
March 2-5, 2009},
pages = {1--6},
publisher = {{IEEE}},
year = {2009},
url = {https://doi.org/10.1109/LATW.2009.4813799},
doi = {10.1109/LATW.2009.4813799},
timestamp = {Sun, 06 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/latw/DevadzeJAU09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/mse/UbarJRKW09,
author = {Raimund Ubar and
Artur Jutman and
Jaan Raik and
Sergei Kostin and
Heinz{-}Dietrich Wuttke},
title = {Diagnozer: {A} laboratory tool for teaching research in diagnosis
of electronic systems},
booktitle = {{IEEE} International Conference on Microelectronic Systems Education,
{MSE} '09, San Francisco, CA, USA, July 25-27, 2009},
pages = {12--15},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/MSE.2009.5270842},
doi = {10.1109/MSE.2009.5270842},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/mse/UbarJRKW09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/iet-cdt/BengtssonKUJP08,
author = {Tomas Bengtsson and
Shashi Kumar and
Raimund Ubar and
Artur Jutman and
Zebo Peng},
title = {Test methods for crosstalk-induced delay and glitch faults in network-on-chip
interconnects implementing asynchronous communication protocols},
journal = {{IET} Comput. Digit. Tech.},
volume = {2},
number = {6},
pages = {445--460},
year = {2008},
url = {https://doi.org/10.1049/iet-cdt:20070048},
doi = {10.1049/IET-CDT:20070048},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/iet-cdt/BengtssonKUJP08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tie/PleskaczSBJW08,
author = {Witold A. Pleskacz and
Viera Stopjakov{\'{a}} and
Tomasz Borejko and
Artur Jutman and
Andrzej Walkanis},
title = {DefSim: {A} Remote Laboratory for Studying Physical Defects in {CMOS}
Digital Circuits},
journal = {{IEEE} Trans. Ind. Electron.},
volume = {55},
number = {6},
pages = {2405--2415},
year = {2008},
url = {https://doi.org/10.1109/TIE.2008.920581},
doi = {10.1109/TIE.2008.920581},
timestamp = {Wed, 06 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tie/PleskaczSBJW08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/aspdac/UbarDRJ08,
author = {Raimund Ubar and
Sergei Devadze and
Jaan Raik and
Artur Jutman},
editor = {Chong{-}Min Kyung and
Kiyoung Choi and
Soonhoi Ha},
title = {Parallel fault backtracing for calculation of fault coverage},
booktitle = {Proceedings of the 13th Asia South Pacific Design Automation Conference,
{ASP-DAC} 2008, Seoul, Korea, January 21-24, 2008},
pages = {667--672},
publisher = {{IEEE}},
year = {2008},
url = {https://doi.org/10.1109/ASPDAC.2008.4484035},
doi = {10.1109/ASPDAC.2008.4484035},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/aspdac/UbarDRJ08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/JutmanTU08,
author = {Artur Jutman and
Anton Tsertov and
Raimund Ubar},
editor = {Bernd Straube and
Milos Drutarovsk{\'{y}} and
Michel Renovell and
Peter Gramata and
M{\'{a}}ria Fischerov{\'{a}}},
title = {Calculation of {LFSR} Seed and Polynomial Pair for {BIST} Applications},
booktitle = {Proceedings of the 11th {IEEE} Workshop on Design {\&} Diagnostics
of Electronic Circuits {\&} Systems {(DDECS} 2008), Bratislava,
Slovakia, April 16-18, 2008},
pages = {275--278},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/DDECS.2008.4538801},
doi = {10.1109/DDECS.2008.4538801},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ddecs/JutmanTU08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/icecsys/JutmanARU08,
author = {Artur Jutman and
Igor Aleksejev and
Jaan Raik and
Raimund Ubar},
title = {Reseeding using compaction of pre-generated {LFSR} sub-sequences},
booktitle = {15th {IEEE} International Conference on Electronics, Circuits and
Systems, {ICECS} 2008, St. Julien's, Malta, August 31 2008-September
3, 2008},
pages = {1290--1295},
publisher = {{IEEE}},
year = {2008},
url = {https://doi.org/10.1109/ICECS.2008.4675096},
doi = {10.1109/ICECS.2008.4675096},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/icecsys/JutmanARU08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ijoe/UbarJKODW07,
author = {Raimund Ubar and
Artur Jutman and
Margus Kruus and
Elmet Orasson and
Sergei Devadze and
Heinz{-}Dietrich Wuttke},
title = {Learning Digital Test and Diagnostics via Internet},
journal = {Int. J. Online Eng.},
volume = {3},
number = {1},
year = {2007},
url = {https://www.online-journals.org/index.php/i-joe/article/view/361},
timestamp = {Wed, 04 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/ijoe/UbarJKODW07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/UbarDRJ07,
author = {Raimund Ubar and
Sergei Devadze and
Jaan Raik and
Artur Jutman},
title = {Ultra Fast Parallel Fault Analysis on Structurally Synthesized BDDs},
booktitle = {12th European Test Symposium, {ETS} 2007, Freiburg, Germany, May 20,
2007},
pages = {131--136},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/ETS.2007.43},
doi = {10.1109/ETS.2007.43},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/UbarDRJ07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/BengtssonJKUP06,
author = {Tomas Bengtsson and
Artur Jutman and
Shashi Kumar and
Raimund Ubar and
Zebo Peng},
title = {Off-Line Testing of Delay Faults in NoC Interconnects},
booktitle = {Ninth Euromicro Conference on Digital System Design: Architectures,
Methods and Tools {(DSD} 2006), 30 August - 1 September 2006, Dubrovnik,
Croatia},
pages = {677--680},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/DSD.2006.72},
doi = {10.1109/DSD.2006.72},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dsd/BengtssonJKUP06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/PleskaczBWSJU06,
author = {Witold A. Pleskacz and
Tomasz Borejko and
Andrzej Walkanis and
Viera Stopjakov{\'{a}} and
Artur Jutman and
Raimund Ubar},
title = {DefSim: {CMOS} Defects on Chip for Research and Education},
booktitle = {7th Latin American Test Workshop, {LATW} 2006, Buenos Aires, Argentina,
March 26-29, 2006},
pages = {74--79},
publisher = {{IEEE}},
year = {2006},
timestamp = {Tue, 05 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/latw/PleskaczBWSJU06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/DevadzeRJU06,
author = {Sergei Devadze and
Jaan Raik and
Artur Jutman and
Raimund Ubar},
title = {Fault Simulation with Parallel Critical Path Tracing for Combinatorial
Circuits Using Structurally Synthesized BDDs},
booktitle = {7th Latin American Test Workshop, {LATW} 2006, Buenos Aires, Argentina,
March 26-29, 2006},
pages = {97--102},
publisher = {{IEEE}},
year = {2006},
timestamp = {Thu, 27 Jul 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/latw/DevadzeRJU06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/JutmanRUV05,
author = {Artur Jutman and
Jaan Raik and
Raimund Ubar and
V. Vislogubov},
title = {An Educational Environment for Digital Testing: Hardware, Tools, and
Web-Based Runtime Platform},
booktitle = {Eighth Euromicro Symposium on Digital Systems Design {(DSD} 2005),
30 August - 3 September 2005, Porto, Portugal},
pages = {412--419},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DSD.2005.15},
doi = {10.1109/DSD.2005.15},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dsd/JutmanRUV05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/edcc/RaikUDJ05,
author = {Jaan Raik and
Raimund Ubar and
Sergei Devadze and
Artur Jutman},
editor = {Mario Dal Cin and
Mohamed Ka{\^{a}}niche and
Andr{\'{a}}s Pataricza},
title = {Efficient Single-Pattern Fault Simulation on Structurally Synthesized
BDDs},
booktitle = {Dependable Computing - EDCC-5, 5th European Dependable Computing Conference,
Budapest, Hungary, April 20-22, 2005, Proceedings},
series = {Lecture Notes in Computer Science},
volume = {3463},
pages = {332--344},
publisher = {Springer},
year = {2005},
url = {https://doi.org/10.1007/11408901\_25},
doi = {10.1007/11408901\_25},
timestamp = {Tue, 14 May 2019 10:00:54 +0200},
biburl = {https://dblp.org/rec/conf/edcc/RaikUDJ05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/compsystech/JutmanSUW04,
author = {Artur Jutman and
Alexander Sudnitson and
Raimund Ubar and
Heinz{-}Dietrich Wuttke},
editor = {Kiril Boyanov},
title = {Asynchronous e-learning resources for hardware design issues},
booktitle = {Proceedings of the 5th International Conference on Computer Systems
and Technologies, CompSysTech 2004, Rousse, Bulgaria, June 17-18,
2004},
pages = {1--6},
publisher = {{ACM}},
year = {2004},
url = {https://doi.org/10.1145/1050330.1050420},
doi = {10.1145/1050330.1050420},
timestamp = {Tue, 31 May 2022 15:40:03 +0200},
biburl = {https://dblp.org/rec/conf/compsystech/JutmanSUW04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/Jutman04,
author = {Artur Jutman},
title = {At-speed on-chip diagnosis of board-level interconnect faults},
booktitle = {9th European Test Symposium, {ETS} 2004, Ajaccio, France, May 23-26,
2004},
pages = {2--7},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/ETSYM.2004.1347572},
doi = {10.1109/ETSYM.2004.1347572},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/Jutman04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/icecsys/RaikJU02,
author = {Jaan Raik and
Artur Jutman and
Raimund Ubar},
title = {Fast static compaction of tests composed of independent sequences:
basic properties and comparison of methods},
booktitle = {Proceedings of the 2002 9th {IEEE} International Conference on Electronics,
Circuits and Systems, {ICECS} 2002, Dubrovnik, Croatia, September
15-18, 2002},
pages = {445--448},
publisher = {{IEEE}},
year = {2002},
url = {https://doi.org/10.1109/ICECS.2002.1046190},
doi = {10.1109/ICECS.2002.1046190},
timestamp = {Mon, 09 Aug 2021 14:54:04 +0200},
biburl = {https://dblp.org/rec/conf/icecsys/RaikJU02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/icecsys/JutmanUHS02,
author = {Artur Jutman and
Raimund Ubar and
Vladimir Hahanov and
O. Skvortsova},
title = {Practical works for on-line teaching design and test of digital circuits},
booktitle = {Proceedings of the 2002 9th {IEEE} International Conference on Electronics,
Circuits and Systems, {ICECS} 2002, Dubrovnik, Croatia, September
15-18, 2002},
pages = {1223--1226},
publisher = {{IEEE}},
year = {2002},
url = {https://doi.org/10.1109/ICECS.2002.1046474},
doi = {10.1109/ICECS.2002.1046474},
timestamp = {Thu, 21 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/icecsys/JutmanUHS02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/UbarJP01,
author = {Raimund Ubar and
Artur Jutman and
Zebo Peng},
editor = {Wolfgang Nebel and
Ahmed Jerraya},
title = {Timing simulation of digital circuits with binary decision diagrams},
booktitle = {Proceedings of the Conference on Design, Automation and Test in Europe,
{DATE} 2001, Munich, Germany, March 12-16, 2001},
pages = {460--466},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/DATE.2001.915063},
doi = {10.1109/DATE.2001.915063},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/UbarJP01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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