BibTeX records: Andreas Glowatz

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@inproceedings{DBLP:conf/itc/RameshKYGRS23,
  author       = {Saidapet Ramesh and
                  Rahul Kalyan and
                  Jesse Yanez and
                  Andreas Glowatz and
                  Maija Ryyn{\"{a}}nen and
                  Sergej Schwarz},
  title        = {Measuring Non-Redundant {VIA} Test-Coverage for Automotive Designs
                  in Lower Process Nodes},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
                  October 7-15, 2023},
  pages        = {286--292},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/ITC51656.2023.00045},
  doi          = {10.1109/ITC51656.2023.00045},
  timestamp    = {Tue, 09 Jan 2024 17:03:11 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/RameshKYGRS23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/dt/CoteFSDLGYKGRPM22,
  author       = {Jean{-}Fran{\c{c}}ois C{\^{o}}t{\'{e}} and
                  Jeff Fan and
                  Sean Shen and
                  Givargis Danialy and
                  Marcin Lipinski and
                  Michael Garbers and
                  Wu Yang and
                  Martin Keim and
                  Andreas Glowatz and
                  Joe Reynick and
                  Ayush Patel and
                  Joanna Michna},
  title        = {Affordable and Comprehensive Testing of 3-D Stacked Die Devices},
  journal      = {{IEEE} Des. Test},
  volume       = {39},
  number       = {5},
  pages        = {17--25},
  year         = {2022},
  url          = {https://doi.org/10.1109/MDAT.2022.3191016},
  doi          = {10.1109/MDAT.2022.3191016},
  timestamp    = {Tue, 18 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/CoteFSDLGYKGRPM22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/tcad/HapkeHMBVDGFR21,
  author       = {Friedrich Hapke and
                  Will Howell and
                  Peter C. Maxwell and
                  Edward Brazil and
                  Srikanth Venkataraman and
                  Rudrajit Dutta and
                  Andreas Glowatz and
                  Anja Fast and
                  Janusz Rajski},
  title        = {Defect-Oriented Test: Effectiveness in High Volume Manufacturing},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {40},
  number       = {3},
  pages        = {584--597},
  year         = {2021},
  url          = {https://doi.org/10.1109/TCAD.2020.3001259},
  doi          = {10.1109/TCAD.2020.3001259},
  timestamp    = {Thu, 27 Jul 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tcad/HapkeHMBVDGFR21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ats/LinCKG21,
  author       = {Xijiang Lin and
                  Wu{-}Tung Cheng and
                  Takeo Kobayashi and
                  Andreas Glowatz},
  title        = {On Modeling {CMOS} Library Cells for Cell Internal Fault Test Pattern
                  Generation},
  booktitle    = {30th {IEEE} Asian Test Symposium, {ATS} 2021, Matsuyama, Ehime, Japan,
                  November 22-25, 2021},
  pages        = {103--108},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/ATS52891.2021.00030},
  doi          = {10.1109/ATS52891.2021.00030},
  timestamp    = {Mon, 17 Jan 2022 16:24:22 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/LinCKG21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/HowellHBVDGRSFR18,
  author       = {Will Howell and
                  Friedrich Hapke and
                  Edward Brazil and
                  Srikanth Venkataraman and
                  R. Datta and
                  Andreas Glowatz and
                  Wilfried Redemund and
                  J. Schmerberg and
                  Anja Fast and
                  Janusz Rajski},
  title        = {{DPPM} Reduction Methods and New Defect Oriented Test Methods Applied
                  to Advanced FinFET Technologies},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
                  October 29 - Nov. 1, 2018},
  pages        = {1--10},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/TEST.2018.8624906},
  doi          = {10.1109/TEST.2018.8624906},
  timestamp    = {Mon, 01 Mar 2021 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/HowellHBVDGRSFR18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/tcad/HapkeRGRRHKSF14,
  author       = {Friedrich Hapke and
                  Wilfried Redemund and
                  Andreas Glowatz and
                  Janusz Rajski and
                  Michael Reese and
                  Marek Hustava and
                  Martin Keim and
                  Juergen Schloeffel and
                  Anja Fast},
  title        = {Cell-Aware Test},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {33},
  number       = {9},
  pages        = {1396--1409},
  year         = {2014},
  url          = {https://doi.org/10.1109/TCAD.2014.2323216},
  doi          = {10.1109/TCAD.2014.2323216},
  timestamp    = {Thu, 24 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tcad/HapkeRGRRHKSF14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/HapkeABBSGPBMPSRGFR14,
  author       = {Friedrich Hapke and
                  Ralf Arnold and
                  Matthias Beck and
                  M. Baby and
                  S. Straehle and
                  J. F. Goncalves and
                  A. Panait and
                  R. Behr and
                  Gwenol{\'{e}} Maugard and
                  A. Prashanthi and
                  Juergen Schloeffel and
                  Wilfried Redemund and
                  Andreas Glowatz and
                  Anja Fast and
                  Janusz Rajski},
  editor       = {Giorgio Di Natale},
  title        = {Cell-aware experiences in a high-quality automotive test suite},
  booktitle    = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
                  May 26-30, 2014},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2014},
  url          = {https://doi.org/10.1109/ETS.2014.6847814},
  doi          = {10.1109/ETS.2014.6847814},
  timestamp    = {Wed, 21 Apr 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/HapkeABBSGPBMPSRGFR14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ddecs/Krenz-BaathGH13,
  author       = {Rene Krenz{-}Baath and
                  Andreas Glowatz and
                  Friedrich Hapke},
  editor       = {Luk{\'{a}}s Sekanina and
                  G{\"{o}}rschwin Fey and
                  Jaan Raik and
                  Snorre Aunet and
                  Richard Ruzicka},
  title        = {Fault collapsing of multi-conditional faults},
  booktitle    = {16th {IEEE} International Symposium on Design and Diagnostics of Electronic
                  Circuits {\&} Systems, {DDECS} 2013, Karlovy Vary, Czech Republic,
                  April 8-10, 2013},
  pages        = {42--47},
  publisher    = {{IEEE} Computer Society},
  year         = {2013},
  url          = {https://doi.org/10.1109/DDECS.2013.6549786},
  doi          = {10.1109/DDECS.2013.6549786},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ddecs/Krenz-BaathGH13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ddecs/EggersglussKGHD12,
  author       = {Stephan Eggersgl{\"{u}}{\ss} and
                  Rene Krenz{-}Baath and
                  Andreas Glowatz and
                  Friedrich Hapke and
                  Rolf Drechsler},
  editor       = {Jaan Raik and
                  Viera Stopjakov{\'{a}} and
                  Heinrich Theodor Vierhaus and
                  Witold A. Pleskacz and
                  Raimund Ubar and
                  Helena Kruus and
                  Maksim Jenihhin},
  title        = {A new SAT-based {ATPG} for generating highly compacted test sets},
  booktitle    = {{IEEE} 15th International Symposium on Design and Diagnostics of Electronic
                  Circuits {\&} Systems, {DDECS} 2012, Tallinn, Estonia, April 18-20,
                  2012},
  pages        = {230--235},
  publisher    = {{IEEE}},
  year         = {2012},
  url          = {https://doi.org/10.1109/DDECS.2012.6219063},
  doi          = {10.1109/DDECS.2012.6219063},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ddecs/EggersglussKGHD12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dsd/Krenz-BaathHHMRG12,
  author       = {Rene Krenz{-}Baath and
                  Friedrich Hapke and
                  Rolf Hinze and
                  Reinhard Meier and
                  Maija Ryynaenen and
                  Andreas Glowatz},
  title        = {Robust Evaluation of Weighted Random Logic {BIST} Structures in Industrial
                  Designs},
  booktitle    = {15th Euromicro Conference on Digital System Design, {DSD} 2012, Cesme,
                  Izmir, Turkey, September 5-8, 2012},
  pages        = {823--829},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/DSD.2012.115},
  doi          = {10.1109/DSD.2012.115},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dsd/Krenz-BaathHHMRG12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/HapkeRRORRGSR12,
  author       = {Friedrich Hapke and
                  Michael Reese and
                  Jason Rivers and
                  A. Over and
                  V. Ravikumar and
                  Wilfried Redemund and
                  Andreas Glowatz and
                  J{\"{u}}rgen Schl{\"{o}}ffel and
                  Janusz Rajski},
  title        = {Cell-aware Production test results from a 32-nm notebook processor},
  booktitle    = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
                  USA, November 5-8, 2012},
  pages        = {1--9},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/TEST.2012.6401533},
  doi          = {10.1109/TEST.2012.6401533},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/HapkeRRORRGSR12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/HapkeSRGRRRR11,
  author       = {Friedrich Hapke and
                  J{\"{u}}rgen Schl{\"{o}}ffel and
                  Wilfried Redemund and
                  Andreas Glowatz and
                  Janusz Rajski and
                  Michael Reese and
                  J. Rearick and
                  Jason Rivers},
  editor       = {Bill Eklow and
                  R. D. (Shawn) Blanton},
  title        = {Cell-aware analysis for small-delay effects and production test results
                  from different fault models},
  booktitle    = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
                  USA, September 20-22, 2011},
  pages        = {1--8},
  publisher    = {{IEEE} Computer Society},
  year         = {2011},
  url          = {https://doi.org/10.1109/TEST.2011.6139151},
  doi          = {10.1109/TEST.2011.6139151},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/HapkeSRGRRRR11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/EggersglussFGHSD10,
  author       = {Stephan Eggersgl{\"{u}}{\ss} and
                  G{\"{o}}rschwin Fey and
                  Andreas Glowatz and
                  Friedrich Hapke and
                  J{\"{u}}rgen Schl{\"{o}}ffel and
                  Rolf Drechsler},
  title        = {{MONSOON:} SAT-Based {ATPG} for Path Delay Faults Using Multiple-Valued
                  Logics},
  journal      = {J. Electron. Test.},
  volume       = {26},
  number       = {3},
  pages        = {307--322},
  year         = {2010},
  url          = {https://doi.org/10.1007/s10836-010-5146-y},
  doi          = {10.1007/S10836-010-5146-Y},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/EggersglussFGHSD10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/HapkeRSKGWHE10,
  author       = {Friedrich Hapke and
                  Wilfried Redemund and
                  J{\"{u}}rgen Schl{\"{o}}ffel and
                  Rene Krenz{-}Baath and
                  Andreas Glowatz and
                  Michael Wittke and
                  Hamidreza Hashempour and
                  Stefan Eichenberger},
  editor       = {Ron Press and
                  Erik H. Volkerink},
  title        = {Defect-oriented cell-internal testing},
  booktitle    = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
                  USA, November 2-4, 2010},
  pages        = {285--294},
  publisher    = {{IEEE} Computer Society},
  year         = {2010},
  url          = {https://doi.org/10.1109/TEST.2010.5699229},
  doi          = {10.1109/TEST.2010.5699229},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/HapkeRSKGWHE10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/HapkeKGSHEHA09,
  author       = {Friedrich Hapke and
                  Rene Krenz{-}Baath and
                  Andreas Glowatz and
                  J{\"{u}}rgen Schl{\"{o}}ffel and
                  Hamidreza Hashempour and
                  Stefan Eichenberger and
                  Camelia Hora and
                  Dan Adolfsson},
  editor       = {Gordon W. Roberts and
                  Bill Eklow},
  title        = {Defect-oriented cell-aware {ATPG} and fault simulation for industrial
                  cell libraries and designs},
  booktitle    = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
                  USA, November 1-6, 2009},
  pages        = {1--10},
  publisher    = {{IEEE} Computer Society},
  year         = {2009},
  url          = {https://doi.org/10.1109/TEST.2009.5355741},
  doi          = {10.1109/TEST.2009.5355741},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/HapkeKGSHEHA09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/MessingGHD09,
  author       = {Marc Messing and
                  Andreas Glowatz and
                  Friedrich Hapke and
                  Rolf Drechsler},
  title        = {Using a two-dimensional fault list for compact Automatic Test Pattern
                  Generation},
  booktitle    = {10th Latin American Test Workshop, {LATW} 2009, Rio de Janeiro, Brazil,
                  March 2-5, 2009},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2009},
  url          = {https://doi.org/10.1109/LATW.2009.4813791},
  doi          = {10.1109/LATW.2009.4813791},
  timestamp    = {Mon, 28 Aug 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/MessingGHD09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/HakmiHWSHG09,
  author       = {Abdul Wahid Hakmi and
                  Stefan Holst and
                  Hans{-}Joachim Wunderlich and
                  J{\"{u}}rgen Schl{\"{o}}ffel and
                  Friedrich Hapke and
                  Andreas Glowatz},
  title        = {Restrict Encoding for Mixed-Mode {BIST}},
  booktitle    = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
                  Cruz, California, {USA}},
  pages        = {179--184},
  publisher    = {{IEEE} Computer Society},
  year         = {2009},
  url          = {https://doi.org/10.1109/VTS.2009.43},
  doi          = {10.1109/VTS.2009.43},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/HakmiHWSHG09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/tcad/DrechslerEFGHST08,
  author       = {Rolf Drechsler and
                  Stephan Eggersgl{\"{u}}{\ss} and
                  G{\"{o}}rschwin Fey and
                  Andreas Glowatz and
                  Friedrich Hapke and
                  J{\"{u}}rgen Schl{\"{o}}ffel and
                  Daniel Tille},
  title        = {On Acceleration of SAT-Based {ATPG} for Industrial Designs},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {27},
  number       = {7},
  pages        = {1329--1333},
  year         = {2008},
  url          = {https://doi.org/10.1109/TCAD.2008.923107},
  doi          = {10.1109/TCAD.2008.923107},
  timestamp    = {Thu, 24 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tcad/DrechslerEFGHST08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/Krenz-BaathGS07,
  author       = {Rene Krenz{-}Baath and
                  Andreas Glowatz and
                  J{\"{u}}rgen Schl{\"{o}}ffel},
  title        = {Computation and Application of Absolute Dominators in Industrial Designs},
  booktitle    = {12th European Test Symposium, {ETS} 2007, Freiburg, Germany, May 20,
                  2007},
  pages        = {137--144},
  publisher    = {{IEEE} Computer Society},
  year         = {2007},
  url          = {https://doi.org/10.1109/ETS.2007.15},
  doi          = {10.1109/ETS.2007.15},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/Krenz-BaathGS07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ismvl/EggersglussTFDGHS07,
  author       = {Stephan Eggersgl{\"{u}}{\ss} and
                  Daniel Tille and
                  G{\"{o}}rschwin Fey and
                  Rolf Drechsler and
                  Andreas Glowatz and
                  Friedrich Hapke and
                  J{\"{u}}rgen Schl{\"{o}}ffel},
  title        = {Experimental Studies on SAT-Based {ATPG} for Gate Delay Faults},
  booktitle    = {37th International Symposium on Multiple-Valued Logic, {ISMVL} 2007,
                  13-16 May 2007, Oslo, Norway},
  pages        = {6},
  publisher    = {{IEEE} Computer Society},
  year         = {2007},
  url          = {https://doi.org/10.1109/ISMVL.2007.21},
  doi          = {10.1109/ISMVL.2007.21},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ismvl/EggersglussTFDGHS07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/GeuzebroekMMGH07,
  author       = {Jeroen Geuzebroek and
                  Erik Jan Marinissen and
                  Ananta K. Majhi and
                  Andreas Glowatz and
                  Friedrich Hapke},
  editor       = {Jill Sibert and
                  Janusz Rajski},
  title        = {Embedded multi-detect {ATPG} and Its Effect on the Detection of Unmodeled
                  Defects},
  booktitle    = {2007 {IEEE} International Test Conference, {ITC} 2007, Santa Clara,
                  California, USA, October 21-26, 2007},
  pages        = {1--10},
  publisher    = {{IEEE} Computer Society},
  year         = {2007},
  url          = {https://doi.org/10.1109/TEST.2007.4437649},
  doi          = {10.1109/TEST.2007.4437649},
  timestamp    = {Mon, 05 Feb 2024 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/GeuzebroekMMGH07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/HakmiWZGHSS07,
  author       = {Abdul Wahid Hakmi and
                  Hans{-}Joachim Wunderlich and
                  Christian G. Zoellin and
                  Andreas Glowatz and
                  Friedrich Hapke and
                  J{\"{u}}rgen Schl{\"{o}}ffel and
                  Laurent Souef},
  editor       = {Jill Sibert and
                  Janusz Rajski},
  title        = {Programmable deterministic Built-In Self-Test},
  booktitle    = {2007 {IEEE} International Test Conference, {ITC} 2007, Santa Clara,
                  California, USA, October 21-26, 2007},
  pages        = {1--9},
  publisher    = {{IEEE} Computer Society},
  year         = {2007},
  url          = {https://doi.org/10.1109/TEST.2007.4437611},
  doi          = {10.1109/TEST.2007.4437611},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/HakmiWZGHSS07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/memocode/EggersglussFDGHS07,
  author       = {Stephan Eggersgl{\"{u}}{\ss} and
                  G{\"{o}}rschwin Fey and
                  Rolf Drechsler and
                  Andreas Glowatz and
                  Friedrich Hapke and
                  J{\"{u}}rgen Schl{\"{o}}ffel},
  title        = {Combining Multi-Valued Logics in SAT-based {ATPG} for Path Delay Faults},
  booktitle    = {5th {ACM} {\&} {IEEE} International Conference on Formal Methods
                  and Models for Co-Design {(MEMOCODE} 2007), May 30 - June 1st, Nice,
                  France},
  pages        = {181--187},
  publisher    = {{IEEE} Computer Society},
  year         = {2007},
  url          = {https://doi.org/10.1109/MEMCOD.2007.371226},
  doi          = {10.1109/MEMCOD.2007.371226},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/memocode/EggersglussFDGHS07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dac/VrankenGGSH06,
  author       = {Harald P. E. Vranken and
                  Sandeep Kumar Goel and
                  Andreas Glowatz and
                  J{\"{u}}rgen Schl{\"{o}}ffel and
                  Friedrich Hapke},
  editor       = {Ellen Sentovich},
  title        = {Fault detection and diagnosis with parity trees for space compaction
                  of test responses},
  booktitle    = {Proceedings of the 43rd Design Automation Conference, {DAC} 2006,
                  San Francisco, CA, USA, July 24-28, 2006},
  pages        = {1095--1098},
  publisher    = {{ACM}},
  year         = {2006},
  url          = {https://doi.org/10.1145/1146909.1147185},
  doi          = {10.1145/1146909.1147185},
  timestamp    = {Tue, 06 Nov 2018 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dac/VrankenGGSH06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/isvlsi/ShiFDGHS05,
  author       = {Junhao Shi and
                  G{\"{o}}rschwin Fey and
                  Rolf Drechsler and
                  Andreas Glowatz and
                  Friedrich Hapke and
                  J{\"{u}}rgen Schl{\"{o}}ffel},
  title        = {{PASSAT:} Efficient SAT-Based Test Pattern Generation for Industrial
                  Circuits},
  booktitle    = {2005 {IEEE} Computer Society Annual Symposium on {VLSI} {(ISVLSI}
                  2005), New Frontiers in {VLSI} Design, 11-12 May 2005, Tampa, FL,
                  {USA}},
  pages        = {212--217},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/ISVLSI.2005.55},
  doi          = {10.1109/ISVLSI.2005.55},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/isvlsi/ShiFDGHS05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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