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BibTeX records: Kevin Carrejo
@inproceedings{DBLP:conf/isqed/SultanFSvMPHCKCMTCHKAGHWBBIA09, author = {Akif Sultan and John Faricelli and Sushant Suryagandh and Hans vanMeer and Kaveri Mathur and James Pattison and Sean Hannon and Greg Constant and Kalyana Kumar and Kevin Carrejo and Joe Meier and Rasit Onur Topaloglu and Darin Chan and Uwe Hahn and Thorsten Knopp and Victor Andrade and Bill Gardiol and Steve Hejl and David Wu and James Buller and Larry Bair and Ali Icel and Yuri Apanovich}, title = {{CAD} utilities to comprehend layout-dependent stress effects in 45 nm high- performance {SOI} custom macro design}, booktitle = {10th International Symposium on Quality of Electronic Design {(ISQED} 2009), 16-18 March 2009, San Jose, CA, {USA}}, pages = {442--446}, publisher = {{IEEE} Computer Society}, year = {2009}, url = {https://doi.org/10.1109/ISQED.2009.4810335}, doi = {10.1109/ISQED.2009.4810335}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/isqed/SultanFSvMPHCKCMTCHKAGHWBBIA09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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