BibTeX records: Rajendra Bishnoi

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@article{DBLP:journals/tcad/GebregiorgisBT19,
  author    = {Anteneh Gebregiorgis and
               Rajendra Bishnoi and
               Mehdi Baradaran Tahoori},
  title     = {A Comprehensive Reliability Analysis Framework for {NTC} Caches: {A}
               System to Device Approach},
  journal   = {{IEEE} Trans. on {CAD} of Integrated Circuits and Systems},
  volume    = {38},
  number    = {3},
  pages     = {439--452},
  year      = {2019},
  url       = {https://doi.org/10.1109/TCAD.2018.2818691},
  doi       = {10.1109/TCAD.2018.2818691},
  timestamp = {Fri, 12 Apr 2019 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/tcad/GebregiorgisBT19},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/aspdac/MunchBT19,
  author    = {Christopher M{\"{u}}nch and
               Rajendra Bishnoi and
               Mehdi Baradaran Tahoori},
  title     = {Reliable in-memory neuromorphic computing using spintronics},
  booktitle = {Proceedings of the 24th Asia and South Pacific Design Automation Conference,
               {ASPDAC} 2019, Tokyo, Japan, January 21-24, 2019},
  pages     = {230--236},
  year      = {2019},
  crossref  = {DBLP:conf/aspdac/2019},
  url       = {https://doi.org/10.1145/3287624.3288745},
  doi       = {10.1145/3287624.3288745},
  timestamp = {Sun, 20 Jan 2019 16:08:16 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/aspdac/MunchBT19},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/NairBGOHT18,
  author    = {Sarath Mohanachandran Nair and
               Rajendra Bishnoi and
               Mohammad Saber Golanbari and
               Fabian Oboril and
               Fazal Hameed and
               Mehdi Baradaran Tahoori},
  title     = {{VAET-STT:} Variation Aware {STT-MRAM} Analysis and Design Space Exploration
               Tool},
  journal   = {{IEEE} Trans. on {CAD} of Integrated Circuits and Systems},
  volume    = {37},
  number    = {7},
  pages     = {1396--1407},
  year      = {2018},
  url       = {https://doi.org/10.1109/TCAD.2017.2760861},
  doi       = {10.1109/TCAD.2017.2760861},
  timestamp = {Tue, 10 Jul 2018 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/tcad/NairBGOHT18},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tvlsi/ErozanMGBDAT18,
  author    = {Ahmet Turan Erozan and
               Gabriel Cadilha Marques and
               Mohammad Saber Golanbari and
               Rajendra Bishnoi and
               Simone Dehm and
               Jasmin Aghassi{-}Hagmann and
               Mehdi Baradaran Tahoori},
  title     = {Inkjet-Printed EGFET-Based Physical Unclonable Function - Design,
               Evaluation, and Fabrication},
  journal   = {{IEEE} Trans. {VLSI} Syst.},
  volume    = {26},
  number    = {12},
  pages     = {2935--2946},
  year      = {2018},
  url       = {https://doi.org/10.1109/TVLSI.2018.2866188},
  doi       = {10.1109/TVLSI.2018.2866188},
  timestamp = {Wed, 26 Dec 2018 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/journals/tvlsi/ErozanMGBDAT18},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/aspdac/SayedNBT18,
  author    = {Nour Sayed and
               Sarath Mohanachandran Nair and
               Rajendra Bishnoi and
               Mehdi Baradaran Tahoori},
  title     = {Process variation and temperature aware adaptive scrubbing for retention
               failures in {STT-MRAM}},
  booktitle = {23rd Asia and South Pacific Design Automation Conference, {ASP-DAC}
               2018, Jeju, Korea (South), January 22-25, 2018},
  pages     = {203--208},
  year      = {2018},
  crossref  = {DBLP:conf/aspdac/2018},
  url       = {https://doi.org/10.1109/ASPDAC.2018.8297306},
  doi       = {10.1109/ASPDAC.2018.8297306},
  timestamp = {Mon, 09 Apr 2018 15:36:28 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/aspdac/SayedNBT18},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/GebregiorgisBT18,
  author    = {Anteneh Gebregiorgis and
               Rajendra Bishnoi and
               Mehdi Baradaran Tahoori},
  title     = {Spintronic normally-off heterogeneous system-on-chip design},
  booktitle = {2018 Design, Automation {\&} Test in Europe Conference {\&}
               Exhibition, {DATE} 2018, Dresden, Germany, March 19-23, 2018},
  pages     = {113--118},
  year      = {2018},
  crossref  = {DBLP:conf/date/2018},
  url       = {https://doi.org/10.23919/DATE.2018.8341989},
  doi       = {10.23919/DATE.2018.8341989},
  timestamp = {Tue, 24 Apr 2018 20:36:50 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/GebregiorgisBT18},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/NairBT18,
  author    = {Sarath Mohanachandran Nair and
               Rajendra Bishnoi and
               Mehdi Baradaran Tahoori},
  title     = {Parametric failure modeling and yield analysis for {STT-MRAM}},
  booktitle = {2018 Design, Automation {\&} Test in Europe Conference {\&}
               Exhibition, {DATE} 2018, Dresden, Germany, March 19-23, 2018},
  pages     = {265--268},
  year      = {2018},
  crossref  = {DBLP:conf/date/2018},
  url       = {https://doi.org/10.23919/DATE.2018.8342016},
  doi       = {10.23919/DATE.2018.8342016},
  timestamp = {Tue, 24 Apr 2018 20:36:50 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/NairBT18},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/SayedBOT18,
  author    = {Nour Sayed and
               Rajendra Bishnoi and
               Fabian Oboril and
               Mehdi Baradaran Tahoori},
  title     = {A cross-layer adaptive approach for performance and power optimization
               in {STT-MRAM}},
  booktitle = {2018 Design, Automation {\&} Test in Europe Conference {\&}
               Exhibition, {DATE} 2018, Dresden, Germany, March 19-23, 2018},
  pages     = {791--796},
  year      = {2018},
  crossref  = {DBLP:conf/date/2018},
  url       = {https://doi.org/10.23919/DATE.2018.8342114},
  doi       = {10.23919/DATE.2018.8342114},
  timestamp = {Tue, 24 Apr 2018 20:36:50 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/SayedBOT18},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/TahooriNBSMMTBG18,
  author    = {Mehdi Baradaran Tahoori and
               Sarath Mohanachandran Nair and
               Rajendra Bishnoi and
               Sophiane Senni and
               Jad Mohdad and
               Fr{\'{e}}d{\'{e}}rick Mailly and
               Lionel Torres and
               Pascal Benoit and
               Abdoulaye Gamati{\'{e}} and
               Pascal Nouet and
               Frederic Ouattara and
               Gilles Sassatelli and
               Kotb Jabeur and
               Pierre Vanhauwaert and
               A. Atitoaie and
               I. Firastrau and
               Gregory di Pendina and
               Guillaume Prenat},
  title     = {Using multifunctional standardized stack as universal spintronic technology
               for IoT},
  booktitle = {2018 Design, Automation {\&} Test in Europe Conference {\&}
               Exhibition, {DATE} 2018, Dresden, Germany, March 19-23, 2018},
  pages     = {931--936},
  year      = {2018},
  crossref  = {DBLP:conf/date/2018},
  url       = {https://doi.org/10.23919/DATE.2018.8342143},
  doi       = {10.23919/DATE.2018.8342143},
  timestamp = {Tue, 26 Feb 2019 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/date/TahooriNBSMMTBG18},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/MunchBT18,
  author    = {Christopher M{\"{u}}nch and
               Rajendra Bishnoi and
               Mehdi Baradaran Tahoori},
  title     = {Multi-bit non-volatile spintronic flip-flop},
  booktitle = {2018 Design, Automation {\&} Test in Europe Conference {\&}
               Exhibition, {DATE} 2018, Dresden, Germany, March 19-23, 2018},
  pages     = {1229--1234},
  year      = {2018},
  crossref  = {DBLP:conf/date/2018},
  url       = {https://doi.org/10.23919/DATE.2018.8342203},
  doi       = {10.23919/DATE.2018.8342203},
  timestamp = {Sun, 20 Jan 2019 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/date/MunchBT18},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/GolanbariKBT18,
  author    = {Mohammad Saber Golanbari and
               Saman Kiamehr and
               Rajendra Bishnoi and
               Mehdi Baradaran Tahoori},
  title     = {Reliable memory {PUF} design for low-power applications},
  booktitle = {19th International Symposium on Quality Electronic Design, {ISQED}
               2018, Santa Clara, CA, USA, March 13-14, 2018},
  pages     = {207--213},
  year      = {2018},
  crossref  = {DBLP:conf/isqed/2018},
  url       = {https://doi.org/10.1109/ISQED.2018.8357289},
  doi       = {10.1109/ISQED.2018.8357289},
  timestamp = {Tue, 15 May 2018 09:14:45 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/isqed/GolanbariKBT18},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/ErozanGBAT18,
  author    = {Ahmet Turan Erozan and
               Mohammad Saber Golanbari and
               Rajendra Bishnoi and
               Jasmin Aghassi{-}Hagmann and
               Mehdi Baradaran Tahoori},
  title     = {Design and evaluation of physical unclonable function for inorganic
               printed electronics},
  booktitle = {19th International Symposium on Quality Electronic Design, {ISQED}
               2018, Santa Clara, CA, USA, March 13-14, 2018},
  pages     = {419--424},
  year      = {2018},
  crossref  = {DBLP:conf/isqed/2018},
  url       = {https://doi.org/10.1109/ISQED.2018.8357323},
  doi       = {10.1109/ISQED.2018.8357323},
  timestamp = {Tue, 15 May 2018 09:14:45 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/isqed/ErozanGBAT18},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NairBTTGHZ18,
  author    = {Sarath Mohanachandran Nair and
               Rajendra Bishnoi and
               Mehdi Baradaran Tahoori and
               G. Tshagharyan and
               H. Grigoryan and
               Gurgen Harutyunyan and
               Yervant Zorian},
  title     = {Defect injection, Fault Modeling and Test Algorithm Generation Methodology
               for {STT-MRAM}},
  booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
               October 29 - Nov. 1, 2018},
  pages     = {1--10},
  year      = {2018},
  crossref  = {DBLP:conf/itc/2018},
  url       = {https://doi.org/10.1109/TEST.2018.8624725},
  doi       = {10.1109/TEST.2018.8624725},
  timestamp = {Sat, 26 Jan 2019 17:53:25 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/itc/NairBTTGHZ18},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TshagharyanHZGG18,
  author    = {G. Tshagharyan and
               Gurgen Harutyunyan and
               Yervant Zorian and
               Anteneh Gebregiorgis and
               Mohammad Saber Golanbari and
               Rajendra Bishnoi and
               Mehdi Baradaran Tahoori},
  title     = {Modeling and Testing of Aging Faults in FinFET Memories for Automotive
               Applications},
  booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
               October 29 - Nov. 1, 2018},
  pages     = {1--10},
  year      = {2018},
  crossref  = {DBLP:conf/itc/2018},
  url       = {https://doi.org/10.1109/TEST.2018.8624890},
  doi       = {10.1109/TEST.2018.8624890},
  timestamp = {Sat, 26 Jan 2019 17:53:25 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/itc/TshagharyanHZGG18},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tvlsi/BishnoiOT17,
  author    = {Rajendra Bishnoi and
               Fabian Oboril and
               Mehdi Baradaran Tahoori},
  title     = {Design of Defect and Fault-Tolerant Nonvolatile Spintronic Flip-Flops},
  journal   = {{IEEE} Trans. {VLSI} Syst.},
  volume    = {25},
  number    = {4},
  pages     = {1421--1432},
  year      = {2017},
  url       = {https://doi.org/10.1109/TVLSI.2016.2630315},
  doi       = {10.1109/TVLSI.2016.2630315},
  timestamp = {Thu, 21 Sep 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/tvlsi/BishnoiOT17},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/SayedEBT17,
  author    = {Nour Sayed and
               Mojtaba Ebrahimi and
               Rajendra Bishnoi and
               Mehdi Baradaran Tahoori},
  title     = {Opportunistic write for fast and reliable {STT-MRAM}},
  booktitle = {Design, Automation {\&} Test in Europe Conference {\&} Exhibition,
               {DATE} 2017, Lausanne, Switzerland, March 27-31, 2017},
  pages     = {554--559},
  year      = {2017},
  crossref  = {DBLP:conf/date/2017},
  url       = {https://doi.org/10.23919/DATE.2017.7927049},
  doi       = {10.23919/DATE.2017.7927049},
  timestamp = {Mon, 14 Aug 2017 16:15:29 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/SayedEBT17},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/NairBGOT17,
  author    = {Sarath Mohanachandran Nair and
               Rajendra Bishnoi and
               Mohammad Saber Golanbari and
               Fabian Oboril and
               Mehdi Baradaran Tahoori},
  title     = {{VAET-STT:} {A} variation aware estimator tool for {STT-MRAM} based
               memories},
  booktitle = {Design, Automation {\&} Test in Europe Conference {\&} Exhibition,
               {DATE} 2017, Lausanne, Switzerland, March 27-31, 2017},
  pages     = {1456--1461},
  year      = {2017},
  crossref  = {DBLP:conf/date/2017},
  url       = {https://doi.org/10.23919/DATE.2017.7927221},
  doi       = {10.23919/DATE.2017.7927221},
  timestamp = {Mon, 14 Aug 2017 16:15:29 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/NairBGOT17},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/SayedOSBT17,
  author    = {Nour Sayed and
               Fabian Oboril and
               Azadeh Shirvanian and
               Rajendra Bishnoi and
               Mehdi Baradaran Tahoori},
  title     = {Exploiting {STT-MRAM} for approximate computing},
  booktitle = {22nd {IEEE} European Test Symposium, {ETS} 2017, Limassol, Cyprus,
               May 22-26, 2017},
  pages     = {1--6},
  year      = {2017},
  crossref  = {DBLP:conf/ets/2017},
  url       = {https://doi.org/10.1109/ETS.2017.7968217},
  doi       = {10.1109/ETS.2017.7968217},
  timestamp = {Thu, 13 Jul 2017 13:55:35 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ets/SayedOSBT17},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isvlsi/MittalBOWTJV17,
  author    = {Sparsh Mittal and
               Rajendra Bishnoi and
               Fabian Oboril and
               Haonan Wang and
               Mehdi Baradaran Tahoori and
               Adwait Jog and
               Jeffrey S. Vetter},
  title     = {Architecting {SOT-RAM} Based {GPU} Register File},
  booktitle = {2017 {IEEE} Computer Society Annual Symposium on VLSI, {ISVLSI} 2017,
               Bochum, Germany, July 3-5, 2017},
  pages     = {38--44},
  year      = {2017},
  crossref  = {DBLP:conf/isvlsi/2017},
  url       = {https://doi.org/10.1109/ISVLSI.2017.17},
  doi       = {10.1109/ISVLSI.2017.17},
  timestamp = {Tue, 14 Aug 2018 10:06:04 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/isvlsi/MittalBOWTJV17},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isvlsi/TahooriNBSMMTBN17,
  author    = {Mehdi Baradaran Tahoori and
               Sarath Mohanachandran Nair and
               Rajendra Bishnoi and
               Sophiane Senni and
               Jad Mohdad and
               Fr{\'{e}}d{\'{e}}rick Mailly and
               Lionel Torres and
               Pascal Benoit and
               Pascal Nouet and
               Rui Ma and
               Martin Krei{\ss}ig and
               Frank Ellinger and
               Kotb Jabeur and
               Pierre Vanhauwaert and
               Gregory di Pendina and
               Guillaume Prenat},
  title     = {{GREAT:} HeteroGeneous IntegRated Magnetic tEchnology Using Multifunctional
               Standardized sTack},
  booktitle = {2017 {IEEE} Computer Society Annual Symposium on VLSI, {ISVLSI} 2017,
               Bochum, Germany, July 3-5, 2017},
  pages     = {344--349},
  year      = {2017},
  crossref  = {DBLP:conf/isvlsi/2017},
  url       = {https://doi.org/10.1109/ISVLSI.2017.67},
  doi       = {10.1109/ISVLSI.2017.67},
  timestamp = {Tue, 14 Aug 2018 10:06:04 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/isvlsi/TahooriNBSMMTBN17},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/SayedOBT17,
  author    = {Nour Sayed and
               Fabian Oboril and
               Rajendra Bishnoi and
               Mehdi Baradaran Tahoori},
  title     = {Leveraging Systematic Unidirectional Error-Detecting Codes for fast
               {STT-MRAM} cache},
  booktitle = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
               April 9-12, 2017},
  pages     = {1--6},
  year      = {2017},
  crossref  = {DBLP:conf/vts/2017},
  url       = {https://doi.org/10.1109/VTS.2017.7928937},
  doi       = {10.1109/VTS.2017.7928937},
  timestamp = {Mon, 04 Jun 2018 17:15:34 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vts/SayedOBT17},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/EbrahimiABT16,
  author    = {Mojtaba Ebrahimi and
               Hossein Asadi and
               Rajendra Bishnoi and
               Mehdi Baradaran Tahoori},
  title     = {Layout-Based Modeling and Mitigation of Multiple Event Transients},
  journal   = {{IEEE} Trans. on {CAD} of Integrated Circuits and Systems},
  volume    = {35},
  number    = {3},
  pages     = {367--379},
  year      = {2016},
  url       = {https://doi.org/10.1109/TCAD.2015.2459053},
  doi       = {10.1109/TCAD.2015.2459053},
  timestamp = {Sat, 16 Sep 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/tcad/EbrahimiABT16},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tmscs/PrenatJVPOBELBG16,
  author    = {Guillaume Prenat and
               Kotb Jabeur and
               Pierre Vanhauwaert and
               Gregory di Pendina and
               Fabian Oboril and
               Rajendra Bishnoi and
               Mojtaba Ebrahimi and
               Nathalie Lamard and
               Olivier Boulle and
               Kevin Garello and
               Juergen Langer and
               Berthold Ocker and
               Marie{-}Claire Cyrille and
               Pietro Gambardella and
               Mehdi Baradaran Tahoori and
               Gilles Gaudin},
  title     = {Ultra-Fast and High-Reliability {SOT-MRAM:} From Cache Replacement
               to Normally-Off Computing},
  journal   = {{IEEE} Trans. Multi-Scale Computing Systems},
  volume    = {2},
  number    = {1},
  pages     = {49--60},
  year      = {2016},
  url       = {https://doi.org/10.1109/TMSCS.2015.2509963},
  doi       = {10.1109/TMSCS.2015.2509963},
  timestamp = {Sun, 28 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/tmscs/PrenatJVPOBELBG16},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tvlsi/BishnoiOET16,
  author    = {Rajendra Bishnoi and
               Fabian Oboril and
               Mojtaba Ebrahimi and
               Mehdi Baradaran Tahoori},
  title     = {Self-Timed Read and Write Operations in {STT-MRAM}},
  journal   = {{IEEE} Trans. {VLSI} Syst.},
  volume    = {24},
  number    = {5},
  pages     = {1783--1793},
  year      = {2016},
  url       = {https://doi.org/10.1109/TVLSI.2015.2496363},
  doi       = {10.1109/TVLSI.2015.2496363},
  timestamp = {Thu, 18 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/tvlsi/BishnoiOET16},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/aspdac/BishnoiOT16,
  author    = {Rajendra Bishnoi and
               Fabian Oboril and
               Mehdi Baradaran Tahoori},
  title     = {Non-Volatile Non-Shadow flip-flop using Spin Orbit Torque for efficient
               normally-off computing},
  booktitle = {21st Asia and South Pacific Design Automation Conference, {ASP-DAC}
               2016, Macao, Macao, January 25-28, 2016},
  pages     = {769--774},
  year      = {2016},
  crossref  = {DBLP:conf/aspdac/2016},
  url       = {https://doi.org/10.1109/ASPDAC.2016.7428104},
  doi       = {10.1109/ASPDAC.2016.7428104},
  timestamp = {Fri, 26 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/aspdac/BishnoiOT16},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/GebregiorgisKOB16,
  author    = {Anteneh Gebregiorgis and
               Saman Kiamehr and
               Fabian Oboril and
               Rajendra Bishnoi and
               Mehdi Baradaran Tahoori},
  title     = {A cross-layer analysis of Soft Error, aging and process variation
               in Near Threshold Computing},
  booktitle = {2016 Design, Automation {\&} Test in Europe Conference {\&}
               Exhibition, {DATE} 2016, Dresden, Germany, March 14-18, 2016},
  pages     = {205--210},
  year      = {2016},
  crossref  = {DBLP:conf/date/2016},
  url       = {http://ieeexplore.ieee.org/document/7459305/},
  timestamp = {Sun, 30 Apr 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/GebregiorgisKOB16},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/BishnoiOT16,
  author    = {Rajendra Bishnoi and
               Fabian Oboril and
               Mehdi Baradaran Tahoori},
  title     = {Fault Tolerant Non-Volatile spintronic flip-flop},
  booktitle = {2016 Design, Automation {\&} Test in Europe Conference {\&}
               Exhibition, {DATE} 2016, Dresden, Germany, March 14-18, 2016},
  pages     = {261--264},
  year      = {2016},
  crossref  = {DBLP:conf/date/2016},
  url       = {http://ieeexplore.ieee.org/document/7459317/},
  timestamp = {Sun, 30 Apr 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/BishnoiOT16},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/glvlsi/BishnoiOT16,
  author    = {Rajendra Bishnoi and
               Fabian Oboril and
               Mehdi Baradaran Tahoori},
  title     = {Low-Power Multi-Port Memory Architecture based on Spin Orbit Torque
               Magnetic Devices},
  booktitle = {Proceedings of the 26th edition on Great Lakes Symposium on VLSI,
               {GLVLSI} 2016, Boston, MA, USA, May 18-20, 2016},
  pages     = {409--414},
  year      = {2016},
  crossref  = {DBLP:conf/glvlsi/2016},
  url       = {https://doi.org/10.1145/2902961.2903022},
  doi       = {10.1145/2902961.2903022},
  timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/glvlsi/BishnoiOT16},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/islped/OborilHBANT16,
  author    = {Fabian Oboril and
               Fazal Hameed and
               Rajendra Bishnoi and
               Ali Ahari and
               Helia Naeimi and
               Mehdi Baradaran Tahoori},
  title     = {Normally-OFF {STT-MRAM} Cache with Zero-Byte Compression for Energy
               Efficient Last-Level Caches},
  booktitle = {Proceedings of the 2016 International Symposium on Low Power Electronics
               and Design, {ISLPED} 2016, San Francisco Airport, CA, USA, August
               08 - 10, 2016},
  pages     = {236--241},
  year      = {2016},
  crossref  = {DBLP:conf/islped/2016},
  url       = {https://doi.org/10.1145/2934583.2934629},
  doi       = {10.1145/2934583.2934629},
  timestamp = {Tue, 06 Nov 2018 16:59:21 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/islped/OborilHBANT16},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/OborilBET15,
  author    = {Fabian Oboril and
               Rajendra Bishnoi and
               Mojtaba Ebrahimi and
               Mehdi Baradaran Tahoori},
  title     = {Evaluation of Hybrid Memory Technologies Using {SOT-MRAM} for On-Chip
               Cache Hierarchy},
  journal   = {{IEEE} Trans. on {CAD} of Integrated Circuits and Systems},
  volume    = {34},
  number    = {3},
  pages     = {367--380},
  year      = {2015},
  url       = {https://doi.org/10.1109/TCAD.2015.2391254},
  doi       = {10.1109/TCAD.2015.2391254},
  timestamp = {Sat, 20 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/tcad/OborilBET15},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/aspdac/BishnoiEOT14,
  author    = {Rajendra Bishnoi and
               Mojtaba Ebrahimi and
               Fabian Oboril and
               Mehdi Baradaran Tahoori},
  title     = {Architectural aspects in design and analysis of SOT-based memories},
  booktitle = {19th Asia and South Pacific Design Automation Conference, {ASP-DAC}
               2014, Singapore, January 20-23, 2014},
  pages     = {700--707},
  year      = {2014},
  crossref  = {DBLP:conf/aspdac/2014},
  url       = {https://doi.org/10.1109/ASPDAC.2014.6742972},
  doi       = {10.1109/ASPDAC.2014.6742972},
  timestamp = {Fri, 26 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/aspdac/BishnoiEOT14},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/BishnoiEOT14,
  author    = {Rajendra Bishnoi and
               Mojtaba Ebrahimi and
               Fabian Oboril and
               Mehdi Baradaran Tahoori},
  title     = {Asynchronous Asymmetrical Write Termination {(AAWT)} for a low power
               {STT-MRAM}},
  booktitle = {Design, Automation {\&} Test in Europe Conference {\&} Exhibition,
               {DATE} 2014, Dresden, Germany, March 24-28, 2014},
  pages     = {1--6},
  year      = {2014},
  crossref  = {DBLP:conf/date/2014},
  url       = {https://doi.org/10.7873/DATE.2014.193},
  doi       = {10.7873/DATE.2014.193},
  timestamp = {Wed, 15 Nov 2017 16:53:38 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/date/BishnoiEOT14},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/BishnoiOET14,
  author    = {Rajendra Bishnoi and
               Fabian Oboril and
               Mojtaba Ebrahimi and
               Mehdi Baradaran Tahoori},
  title     = {Avoiding unnecessary write operations in {STT-MRAM} for low power
               implementation},
  booktitle = {Fifteenth International Symposium on Quality Electronic Design, {ISQED}
               2014, Santa Clara, CA, USA, March 3-5, 2014},
  pages     = {548--553},
  year      = {2014},
  crossref  = {DBLP:conf/isqed/2014},
  url       = {https://doi.org/10.1109/ISQED.2014.6783375},
  doi       = {10.1109/ISQED.2014.6783375},
  timestamp = {Thu, 25 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/isqed/BishnoiOET14},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BishnoiEOT14,
  author    = {Rajendra Bishnoi and
               Mojtaba Ebrahimi and
               Fabian Oboril and
               Mehdi Baradaran Tahoori},
  title     = {Read disturb fault detection in {STT-MRAM}},
  booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
               October 20-23, 2014},
  pages     = {1--7},
  year      = {2014},
  crossref  = {DBLP:conf/itc/2014},
  url       = {https://doi.org/10.1109/TEST.2014.7035342},
  doi       = {10.1109/TEST.2014.7035342},
  timestamp = {Wed, 24 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/BishnoiEOT14},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/aspdac/2019,
  editor    = {Toshiyuki Shibuya},
  title     = {Proceedings of the 24th Asia and South Pacific Design Automation Conference,
               {ASPDAC} 2019, Tokyo, Japan, January 21-24, 2019},
  publisher = {{ACM}},
  year      = {2019},
  url       = {https://doi.org/10.1145/3287624},
  doi       = {10.1145/3287624},
  isbn      = {978-1-4503-6007-4},
  timestamp = {Sun, 20 Jan 2019 16:08:16 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/aspdac/2019},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/aspdac/2018,
  editor    = {Youngsoo Shin},
  title     = {23rd Asia and South Pacific Design Automation Conference, {ASP-DAC}
               2018, Jeju, Korea (South), January 22-25, 2018},
  publisher = {{IEEE}},
  year      = {2018},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=8291862},
  isbn      = {978-1-5090-0602-1},
  timestamp = {Mon, 09 Apr 2018 15:36:28 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/aspdac/2018},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/date/2018,
  title     = {2018 Design, Automation {\&} Test in Europe Conference {\&}
               Exhibition, {DATE} 2018, Dresden, Germany, March 19-23, 2018},
  publisher = {{IEEE}},
  year      = {2018},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=8337149},
  isbn      = {978-3-9819263-0-9},
  timestamp = {Tue, 24 Apr 2018 20:36:50 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/2018},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/isqed/2018,
  title     = {19th International Symposium on Quality Electronic Design, {ISQED}
               2018, Santa Clara, CA, USA, March 13-14, 2018},
  publisher = {{IEEE}},
  year      = {2018},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=8354411},
  isbn      = {978-1-5386-1214-9},
  timestamp = {Tue, 15 May 2018 09:14:45 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/isqed/2018},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/2018,
  title     = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
               October 29 - Nov. 1, 2018},
  publisher = {{IEEE}},
  year      = {2018},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=8610502},
  isbn      = {978-1-5386-8382-8},
  timestamp = {Sat, 26 Jan 2019 17:53:25 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/itc/2018},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/date/2017,
  editor    = {David Atienza and
               Giorgio Di Natale},
  title     = {Design, Automation {\&} Test in Europe Conference {\&} Exhibition,
               {DATE} 2017, Lausanne, Switzerland, March 27-31, 2017},
  publisher = {{IEEE}},
  year      = {2017},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=7919927},
  isbn      = {978-3-9815370-8-6},
  timestamp = {Mon, 14 Aug 2017 16:15:29 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/2017},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ets/2017,
  title     = {22nd {IEEE} European Test Symposium, {ETS} 2017, Limassol, Cyprus,
               May 22-26, 2017},
  publisher = {{IEEE}},
  year      = {2017},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=7960777},
  isbn      = {978-1-5090-5457-2},
  timestamp = {Thu, 13 Jul 2017 13:55:35 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ets/2017},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/isvlsi/2017,
  title     = {2017 {IEEE} Computer Society Annual Symposium on VLSI, {ISVLSI} 2017,
               Bochum, Germany, July 3-5, 2017},
  publisher = {{IEEE} Computer Society},
  year      = {2017},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=7985547},
  isbn      = {978-1-5090-6762-6},
  timestamp = {Tue, 14 Aug 2018 10:06:04 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/isvlsi/2017},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/vts/2017,
  title     = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
               April 9-12, 2017},
  publisher = {{IEEE} Computer Society},
  year      = {2017},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=7921795},
  isbn      = {978-1-5090-4482-5},
  timestamp = {Mon, 04 Jun 2018 17:15:34 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vts/2017},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/aspdac/2016,
  title     = {21st Asia and South Pacific Design Automation Conference, {ASP-DAC}
               2016, Macao, Macao, January 25-28, 2016},
  publisher = {{IEEE}},
  year      = {2016},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=7422345},
  isbn      = {978-1-4673-9569-4},
  timestamp = {Fri, 18 Mar 2016 13:19:13 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/aspdac/2016},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/date/2016,
  editor    = {Luca Fanucci and
               J{\"{u}}rgen Teich},
  title     = {2016 Design, Automation {\&} Test in Europe Conference {\&}
               Exhibition, {DATE} 2016, Dresden, Germany, March 14-18, 2016},
  publisher = {{IEEE}},
  year      = {2016},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=7454909},
  isbn      = {978-3-9815-3707-9},
  timestamp = {Tue, 03 May 2016 10:06:49 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/2016},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/glvlsi/2016,
  editor    = {Ayse Kivilcim Coskun and
               Martin Margala and
               Laleh Behjat and
               Jie Han},
  title     = {Proceedings of the 26th edition on Great Lakes Symposium on VLSI,
               {GLVLSI} 2016, Boston, MA, USA, May 18-20, 2016},
  publisher = {{ACM}},
  year      = {2016},
  url       = {http://dl.acm.org/citation.cfm?id=2902961},
  isbn      = {978-1-4503-4274-2},
  timestamp = {Thu, 30 Aug 2018 12:30:46 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/glvlsi/2016},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/islped/2016,
  title     = {Proceedings of the 2016 International Symposium on Low Power Electronics
               and Design, {ISLPED} 2016, San Francisco Airport, CA, USA, August
               08 - 10, 2016},
  publisher = {{ACM}},
  year      = {2016},
  url       = {https://doi.org/10.1145/2934583},
  doi       = {10.1145/2934583},
  isbn      = {978-1-4503-4185-1},
  timestamp = {Tue, 06 Nov 2018 16:59:21 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/islped/2016},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/aspdac/2014,
  title     = {19th Asia and South Pacific Design Automation Conference, {ASP-DAC}
               2014, Singapore, January 20-23, 2014},
  publisher = {{IEEE}},
  year      = {2014},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6736726},
  isbn      = {978-1-4799-2816-3},
  timestamp = {Fri, 20 May 2016 11:02:17 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/aspdac/2014},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/date/2014,
  editor    = {Gerhard P. Fettweis and
               Wolfgang Nebel},
  title     = {Design, Automation {\&} Test in Europe Conference {\&} Exhibition,
               {DATE} 2014, Dresden, Germany, March 24-28, 2014},
  publisher = {European Design and Automation Association},
  year      = {2014},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6784162},
  isbn      = {978-3-9815370-2-4},
  timestamp = {Wed, 15 Nov 2017 16:53:38 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/date/2014},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/isqed/2014,
  title     = {Fifteenth International Symposium on Quality Electronic Design, {ISQED}
               2014, Santa Clara, CA, USA, March 3-5, 2014},
  publisher = {{IEEE}},
  year      = {2014},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6779216},
  isbn      = {978-1-4799-3945-9},
  timestamp = {Fri, 26 Sep 2014 14:08:22 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/isqed/2014},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/2014,
  title     = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
               October 20-23, 2014},
  publisher = {{IEEE} Computer Society},
  year      = {2014},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=7024668},
  isbn      = {978-1-4799-4722-5},
  timestamp = {Wed, 26 Aug 2015 09:28:45 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/2014},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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