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2010 – 2019
- 2013
[c10]Junghyun Lee, Yungseon Eo:
An efficient eye-diagram determination technique for multi-coupled interconnect lines. PATMOS 2013: 185-190- 2012
- [j8]Dongchul Kim, Hyewon Kim, Yungseon Eo:
Analytical Eye-Diagram Determination for the Efficient and Accurate Signal Integrity Verification of Single Interconnect Lines. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(10): 1536-1545 (2012) - 2010
- [j7]Hyunsik Kim, Yungseon Eo:
Compact CAD Models for the Signal Integrity Verification of Multi-Coupled Transmission Lines. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 93-A(4): 752-760 (2010) - [c9]Dongchul Kim, Hyewon Kim, Yungseon Eo:
Signal integrity verification of coupled interconnect lines using efficient eye-diagram determination. ISCAS 2010: 3669-3672
2000 – 2009
- 2008
- [j6]Taehoon Kim, Yungseon Eo:
Analytical CAD Models for the Signal Transients and Crosstalk Noise of Inductance-Effect-Prominent Multicoupled RLC Interconnect Lines. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(7): 1214-1227 (2008) - [c8]Taehoon Kim, Dongchul Kim, Jung-A Lee, Yungseon Eo:
Compact Models for Signal Transient and Crosstalk Noise of Coupled RLC Interconnect Lines with Ramp Inputs. DELTA 2008: 205-209 - [c7]Dongchul Kim, Taehoon Kim, Jung-A Lee, Yungseon Eo:
Experimental Characterisations of Coupled Transmission Lines. DELTA 2008: 262-265 - 2007
- [c6]Taeyong Je, Yungseon Eo:
Efficient Signal Integrity Verification of Multi-Coupled Transmission Lines with Asynchronously Switching Non-Linear Drivers. ISQED 2007: 245-250 - [c5]Hyunsik Kim, Yungseon Eo:
High-Frequency-Measurement-Based Frequency-Variant Transmission Line Characterization and Circuit Modeling for Accurate Signal Integrity Verification. ISQED 2007: 507-512 - 2006
- [c4]Seongkyun Shin, Yungseon Eo:
Non-Physical Pseudo-Wave-Based Modal Decoupling Technique of Multi- Coupled Co-Planar Transmission Lines with Homogeneous Dielectric Media. ISQED 2006: 278-283 - [c3]Taeyong Je, Yungseon Eo:
Efficient Signal Integrity Verification Method of Multi-Coupled RLC Interconnect Lines with Asynchronous Circuit Switching. ISQED 2006: 419-424 - 2004
- [j5]Yungseon Eo, Seongkyun Shin, William R. Eisenstadt
, Jongin Shim:
A decoupling technique for efficient timing analysis of VLSI interconnects with dynamic circuit switching. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 23(9): 1321-1337 (2004) - [j4]Seongkyun Shin, Yungseon Eo, William R. Eisenstadt, Jongin Shim:
Analytical models and algorithms for the efficient signal integrity verification of inductance-effect-prominent multicoupled VLSI circuit interconnects. IEEE Trans. Very Large Scale Integr. Syst. 12(4): 395-407 (2004) - [c2]Seongkyun Shin, Yungseon Eo, William R. Eisenstadt, Jongin Shim:
Analytical Dynamic Time Delay Model of Strongly Coupled RLC Interconnect Lines Dependent on Switching. ISQED 2004: 337-342 - 2002
- [j3]Yungseon Eo, Jongin Shim, William R. Eisenstadt:
A traveling-wave-based waveform approximation technique for thetiming verification of single transmission lines. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 21(6): 723-730 (2002) - [j2]Yungseon Eo, Seongkyun Shin, William R. Eisenstadt, Jongin Shim:
Generalized traveling-wave-based waveform approximation technique for the efficient signal integrity verification of multicoupled transmission line system. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 21(12): 1489-1497 (2002) - [c1]Seongkyun Shin, Yungseon Eo, William R. Eisenstadt, Jongin Shim:
Analytical signal integrity verification models for inductance-dominant multi-coupled VLSI interconnects. SLIP 2002: 61-68 - 2001
- [j1]Woojin Jin, Yungseon Eo, William R. Eisenstadt, Jongin Shim:
Fast and accurate quasi-three-dimensional capacitance determination of multilayer VLSI interconnects. IEEE Trans. Very Large Scale Integr. Syst. 9(3): 450-460 (2001)
Coauthor Index
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