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J. Edlinger

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2010 – 2019

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2019
[c2]
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  - conf/icton/SeyringerSMEREM19
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Dana Seyringer, Martin Sagmeister, A. Maese-Novo, Moritz Eggeling, Elisabet Rank, J. Edlinger, Paul Muellner, Rainer Hainberger, Wolfgang Drexler, Jochen Kraft, G. Koppitsch, G. Meinhardt, Marko Vlaskovic, Horst Zimmermann:
Compact and High-Resolution 256-Channel Silicon Nitride Based AWG-Spectrometer for OCT on a Chip. ICTON 2019: 1-4
2016
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Dana Seyringer, Catalina Burtscher, S. Partel, J. Edlinger, A. Maese-Novo, Paul Muellner, Rainer Hainberger, Jochen Kraft, G. Koppitsch, G. Meinhardt:
Design and simulation of Si3N4 based arrayed waveguide gratings applying AWG-Parameters tool. ICTON 2016: 1-5

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