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Scott T. Dunham

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2022
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Arun Mannodi-Kanakkithodi, Xiaofeng Xiang, Laura Jacoby, Robert Biegaj, Scott T. Dunham, Daniel R. Gamelin, Maria K. Y. Chan:
Universal machine learning framework for defect predictions in zinc blende semiconductors. Patterns 3(3): 100450 (2022)

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