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2020 – today
- 2024
[j3]Kushagra Bhatheja
, Shravan K. Chaganti, Johnathan Leisinger, Emmanuel Nti Darko, Isaac Bruce, Degang Chen:
A BIST Approach to Approximate Co-Testing of Embedded Data Converters. IEEE Des. Test 41(3): 21-28 (2024)- [c13]Ekaniyere Oko-Odion, Isaac Bruce, Emmanuel Nti Darko, Michael Sekyere, Degang Chen:
Ultra-Small Area, Highly Linear, Modified All Mosfet Digital-to-Analog Converters with Novel Real Time Digital Calibration Algorithm. ISVLSI 2024: 27-32 - [c12]Isaac Bruce, Emmanuel Nti Darko, Ekaniyere Oko-Odion, Kushagra Bhatheja, Matthew Crabb, Degang Chen:
A 3-Segment Interpolating String DAC with Low-Cost Built-In-Self-Test Capabilities. ISVLSI 2024: 708-711 - [c11]Isaac Bruce, Emmanuel Nti Darko, Ekaniyere Oko-Odion, Matthew Crabb, Degang Chen:
Redundancy Based Resistor String DAC with an all Digital Calibration Algorithm. MWSCAS 2024: 571-575 - [c10]Saeid Karimpour, Isaac Bruce, Michael Sekyere, Ruohan Yang, Emmanuel Nti Darko, Degang Chen:
A Direct Current-to-digital converter (DCDC) for Advanced Current Measurement in System-on-Chip (SOC) Designs. MWSCAS 2024: 1051-1055 - 2023
- [j2]Isaac Bruce, Praise O. Farayola, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen:
A Weighted-Bin Difference Method for Issue Site Identification in Analog and Mixed-Signal Multi-Site Testing. J. Electron. Test. 39(1): 57-69 (2023) - [c9]Isaac Bruce, Michael Sekyere, Emmanuel Nti Darko, Ekaniyere Oko-Odion, Kushagra Bhatheja, Degang Chen:
Small Area, High Accuracy Sub-Radix Resistive Current Mode Digital-To-Analog Converter with Novel Calibration Algorithm. MWSCAS 2023: 477-481 - [c8]Michael Sekyere, Emmanuel Nti Darko, Isaac Bruce, Ekaniyere Oko-Odion, Kushagra Bhatheja, Degang Chen:
Ultra-Small Area, Highly Linear Sub-Radix R-2R Digital-To-Analog Converters with Novel Calibration Algorithm. MWSCAS 2023: 604-608 - 2022
- [j1]Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen:
A Polynomial Transform Method for Hardware Systematic Error Identification and Correction in Semiconductor Multi-Site Testing. J. Electron. Test. 38(6): 637-651 (2022) - [c7]Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen:
Cross-Correlation Approach to Detecting Issue Test Sites in Massive Parallel Testing. DFT 2022: 1-6 - [c6]Abraham Steenhoek, Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen:
Graph Theory Approach for Multi-site ATE Board Parameter Extraction. ETS 2022: 1-2 - [c5]Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen:
Optimal Order Polynomial Transformation for Calibrating Systematic Errors in Multisite Testing. ITC 2022: 509-513 - [c4]Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen:
The Least-Squares Approach to Systematic Error Identification and Calibration in Semiconductor Multisite Testing. VTS 2022: 1-7 - 2021
- [c3]Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen:
Massive Multisite Variability-Aware Die Distribution Estimation for Analog/Mixed-Signal Circuits Test Validation. DTIS 2021: 1-6 - [c2]Isaac Bruce, Praise O. Farayola, Shravan K. Chaganti, Abdullah O. Obaidi, Abalhassan Sheikh, Srivaths Ravi, Degang Chen:
An Ordinal Optimization-Based Approach To Die Distribution Estimation For Massive Multi-site Testing Validation: A Case Study. ETS 2021: 1-4 - [c1]Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abdullah O. Obaidi, Abalhassan Sheikh, Srivaths Ravi, Degang Chen:
Systematic Hardware Error Identification and Calibration for Massive Multisite Testing. ITC 2021: 304-308
Coauthor Index
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