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ORCIDReliability Engineering & System Safety, Volume 67
Volume 67, Number 1, January 2000
- Yongxiang Zhao, Qing Gao, Jinnuo Wang:
An approach for determining an appropriate assumed distribution of fatigue life under limited data. 1-7 - Radim Bris
:
Bayes approach in RDT using accelerated and long-term life data. 9-16 - C. W. Kang, Michael W. Golay:
An integrated method for comprehensive sensor network development in complex power plant systems. 17-27 - Chin-Feng Fan, Wen-Hou Chen:
Accident sequence analysis of human-computer interface design. 29-40 - Raffaela Calabria, Gianpaolo Pulcini:
Inference and test in modeling the failure/repair process of repairable mechanical equipments. 41-53 - Fan C. Meng:
Relationships of Fussell-Vesely and Birnbaum importance to structural importance in coherent systems. 55-60 - Emanuele Borgonovo, Marzio Marseguerra, Enrico Zio:
A Monte Carlo methodological approach to plant availability modeling with maintenance, aging and obsolescence. 61-73 - Igor Kozine, Yevgeny V. Filimonov:
Imprecise reliabilities: experiences and advances. 75-83
Volume 67, Number 2, February 2000
- Mark S. Jarzemba, Budhi Sagar:
A parameter tree approach to estimating system sensitivities to parameter sets. 89-102 - Anatoly Lisnianski, Gregory Levitin, Hanoch Ben-Haim:
Structure optimization of multi-state system with time redundancy. 103-112 - John Crocker, U. Dinesh Kumar:
Age-related maintenance versus reliability centred maintenance: a case study on aero-engines. 113-118 - K. S. Wang, J. J. Huang, Y. T. Tsai, F. S. Hsu:
Study of loading policies for unequal strength shared-load system. 119-128 - Rosa E. Lillo:
Note on relations between criteria for ageing. 129-133 - Dimitris Diamantidis, F. Zuccarelli, A. Westhäuser:
Safety of long railway tunnels. 135-145 - Mehmet Savsar:
Reliability analysis of a flexible manufacturing cell. 147-152 - Yangping Zhou, Bingquan Zhao, DongXin Wu:
Application of genetic algorithms to fault diagnosis in nuclear power plants. 153-160 - Y.-L. Cheng, J. Yuan:
On structured fault tree construction by modularizing control loops. 161-173 - Chris W. Johnson:
Proving properties of accidents. 175-191 - Gregory Levitin, Anatoly Lisnianski:
Optimization of imperfect preventive maintenance for multi-state systems. 193-203 - Joakim Ramsberg:
Comments on Bohnenblust and Slovic, and Vrijling, van Hengel and Houben. 205-209 - J. K. Vrijling, W. van Hengel, R. J. Houben:
Response to comments by J. Ramsberg on the paper "Acceptable risk as a basis for design". 211-212
Volume 67, Number 3, March 2000
- Sebastián Martorell, Sofía Carlos, Ana Isabel Sánchez, Vicente Serradell:
Constrained optimization of test intervals using a steady-state genetic algorithm. 215-232 - J. Mira, M. J. Sánchez:
Reducing computational costs for reliability indicators of electric power generating systems. 233-240 - Zupei Shen, Jia Gao, Xiangrui Huang:
A new quantification algorithm for the GO methodology. 241-247 - Claudio Rocco, A. J. Miller, José Alí Moreno, Néstor Carrasquero, Manuel Medina:
Sensitivity and uncertainty analysis in optimization programs using an evolutionary approach: a maintenance application. 249-256 - Rajesh Deoliya, T. K. Datta:
Reliability analysis of a microwave tower for fluctuating mean wind with directional effect. 257-267 - Wei Long, Yoshinobu Sato, Michio Horigome:
Quantification of sequential failure logic for fault tree analysis. 269-274 - Enrico Cagno, Franco Caron, Mauro Mancini, Fabrizio Ruggeri:
Using AHP in determining the prior distributions on gas pipeline failures in a robust Bayesian approach. 275-284 - S. Apeland, Terje Aven:
Risk based maintenance optimization: foundational issues. 285-292 - Ammar M. Sarhan:
Reliability equivalence of independent and non-identical components series systems. 293-300 - Marc Sachon, Marie-Elisabeth Paté-Cornell:
Delays and safety in airline maintenance. 301-309 - Bing Li, Meilin Zhu, Kai Xu:
A practical engineering method for fuzzy reliability analysis of mechanical structures. 311-315 - So Young Sohn:
Application of degradation test data to advertisement of consumer electronic products. 317-320 - Suprasad V. Amari:
Comment on: transient analysis of reliability with and without repair for K-out-of-N: G systems with M failure modes. 321-324 - Magdi Sami Moustafa:
Rejoinder on Amari's comments: transient analysis of reliability with and without repair of K-out-of-N: G systems with M failure modes. 325-326
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