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ORCIDReliability Engineering & System Safety, Volume 137
Volume 137, May 2015
- Stein Haugen
, Jan Erik Vinnem:
Perspectives on risk and the unforeseen. 1-5 - Soonyoung Yu, Sung-Wook Kim, Chang-Whan Oh, Hyunuk An, Jin-Man Kim:
Quantitative assessment of disaster resilience: An empirical study on the importance of post-disaster recovery costs. 6-17 - Nicola Paltrinieri, Alessandro Tugnoli, Valerio Cozzani:
Hazard identification for innovative LNG regasification technologies. 18-28 - Jui-Sheng Chou, Citra Satria Ongkowijoyo:
Reliability-based decision making for selection of ready-mix concrete supply using stochastic superiority and inferiority ranking method. 29-39 - Z. Zhang, Chao Jiang, G. G. Wang, Xue Han:
First and second order approximate reliability analysis methods using evidence theory. 40-49 - Sinuhé Martinez-Martinez, Nadhir Messai, Jean-Philippe Jeannot, Danielle Nuzillard:
Two neural network based strategies for the detection of a total instantaneous blockage of a sodium-cooled fast reactor. 50-57 - Liu Hong, Min Ouyang, Srinivas Peeta, Xiaozheng He, Yongze Yan:
Vulnerability assessment and mitigation for the Chinese railway system under floods. 58-68 - Terje Aven:
Comments to the short communication by Jan Erik Vinnem and Stein Haugen titled "Perspectives on risk and the unforeseen". 69-75 - Xuejuan Liu, Wenbin Wang, Rui Peng:
An integrated production, inventory and preventive maintenance model for a multi-product production system. 76-86 - Pengfei Wei, Zhenzhou Lu, Jingwen Song:
Regional and parametric sensitivity analysis of Sobol' indices. 87-100 - Veronica L. Foreman, Francesca M. Favarò, Joseph Homer Saleh, Christopher W. Johnson:
Software in military aviation and drone mishaps: Analysis and recommendations for the investigation process. 101-111 - Kamiar Jamali:
Achieving reasonable conservatism in nuclear safety analyses. 112-119 - Isis Didier Lins, Enrique López Droguett, Márcio das Chagas Moura, Enrico Zio, Carlos Magno Couto Jacinto:
Computing confidence and prediction intervals of industrial equipment degradation by bootstrapped support vector regression. 120-128 - Narayanaswamy Balakrishnan, Hon Yiu So, Man Ho Ling:
EM algorithm for one-shot device testing with competing risks under exponential distribution. 129-140
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