![](https://dblp.uni-trier.de/img/logo.ua.320x120.png)
![](https://dblp.uni-trier.de/img/dropdown.dark.16x16.png)
![](https://dblp.uni-trier.de/img/peace.dark.16x16.png)
Остановите войну!
for scientists:
![search dblp search dblp](https://dblp.uni-trier.de/img/search.dark.16x16.png)
![search dblp](https://dblp.uni-trier.de/img/search.dark.16x16.png)
default search action
Integration, Volume 83
Volume 83, March 2022
- Ihab Abderraouf Boulham
, Ahsene Boubakir
, Salim Labiod
:
Neural network ℒ1 adaptive control for a class of uncertain fractional order nonlinear systems. 1-11
- Monalisa Swain
, Debabala Swain
:
An effective watermarking technique using BTC and SVD for image authentication and quality recovery. 12-23 - Navya Mohan
, J. P. Anita:
Test and diagnosis pattern generation for distinguishing stuck-at faults and bridging faults. 24-32 - P. Meenakshi Vidya, S. Sudha:
A fully integrated VLSI architecture using chaotic PWM for RF transmitter design with electromagnetic interference reduction. 33-45 - Ali Ghorbani
, Mehdi Dolatshahi
, Sayed Mohammad Ali Zanjani
, Behrang Barekatain
:
A new low-power Dynamic-GDI full adder in CNFET technology. 46-59 - Jani Babu Shaik
, Sonal Singhal, Siona Menezes Picardo, Nilesh Goel:
Impact of various NBTI distributions on SRAM performance for FinFET technology. 60-66 - Benzheng Li
, Zhongdong Qi
, Zhengguang Tang
, Xiyi He
, Hailong You:
High quality hypergraph partitioning for logic emulation. 67-76 - Tahesin Samira Delwar, Abrar Siddique, Manas Ranjan Biswal
, Prangyadarsini Behera, Ahmed Nabih Zaki Rashed
, Yeji Choi, Jee-Youl Ryu:
A novel dual mode configurable and tunable high-gain, high-efficient CMOS power amplifier for 5G applications. 77-87
![](https://dblp.uni-trier.de/img/cog.dark.24x24.png)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.