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International Conference on Biometrics: Theory, Applications and Systems (BTAS)
International Joint Conference on Biometrics (IJCB)
10th BTAS 2019: Tampa, FL, USA
- 10th IEEE International Conference on Biometrics Theory, Applications and Systems, BTAS 2019, Tampa, FL, USA, September 23-26, 2019. IEEE 2019, ISBN 978-1-7281-1522-1 [contents]
9th BTAS 2018: Redondo Beach, CA, USA
- 9th IEEE International Conference on Biometrics Theory, Applications and Systems, BTAS 2018, Redondo Beach, CA, USA, October 22-25, 2018. IEEE 2018, ISBN 978-1-5386-7180-1 [contents]
IJCB (ICB+BTAS) 2017: Denver, CO, USA
- 2017 IEEE International Joint Conference on Biometrics, IJCB 2017, Denver, CO, USA, October 1-4, 2017. IEEE 2017, ISBN 978-1-5386-1124-1 [contents]
8th BTAS 2016: Niagara Falls, NY, USA
- 8th IEEE International Conference on Biometrics Theory, Applications and Systems, BTAS 2016, Niagara Falls, NY, USA, September 6-9, 2016. IEEE 2016, ISBN 978-1-4673-9733-9 [contents]
7th BTAS 2015: Arlington, VA, USA
- IEEE 7th International Conference on Biometrics Theory, Applications and Systems, BTAS 2015, Arlington, VA, USA, September 8-11, 2015. IEEE 2015, ISBN 978-1-4799-8776-4 [contents]
IJCB (ICB+BTAS) 2014: Clearwater, FL, USA
- IEEE International Joint Conference on Biometrics, Clearwater, IJCB 2014, FL, USA, September 29 - October 2, 2014. IEEE 2014, ISBN 978-1-4799-3584-0 [contents]
6th BTAS 2013: Arlington, VA, USA
- IEEE Sixth International Conference on Biometrics: Theory, Applications and Systems, BTAS 2013, Arlington, VA, USA, September 29 - October 2, 2013. IEEE 2013, ISBN 978-1-4799-0527-0 [contents]
5th BTAS 2012: Arlington, VA, USA
- IEEE Fifth International Conference on Biometrics: Theory, Applications and Systems, BTAS 2012, Arlington, VA, USA, September 23-27, 2012. IEEE 2012, ISBN 978-1-4673-1384-1 [contents]
IJCB (ICB+BTAS) 2011: Washington, DC, USA
- 2011 IEEE International Joint Conference on Biometrics, IJCB 2011, Washington, DC, USA, October 11-13, 2011. IEEE Computer Society 2011, ISBN 978-1-4577-1358-3 [contents]
BTAS 2010: Washington, DC, USA
- Fourth IEEE International Conference on Biometrics: Theory Applications and Systems, BTAS 2010, Washington, DC, USA, 27-29 September, 2010. IEEE 2010, ISBN 978-1-4244-7581-0 [contents]
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