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Publication search results
found 686 matches
- 2024
- Jieyu Li, Weifeng He, Bo Zhang, Guanghui He, Jing Jin, Jun Yang, Mingoo Seok:
TICA: Timing Slack Inference and Clock Frequency Adaption Technique for a Deeply Pipelined Near-Threshold-Voltage Bitcoin Mining Core. IEEE J. Solid State Circuits 59(2): 605-615 (2024) - Chuxiong Lin, Weifeng He, Yanan Sun, Lin Shao, Bo Zhang, Jun Yang, Mingoo Seok:
A Metastability Risk Prediction and Mitigation Technique for Clock-Domain Crossing With Single-Stage Synchronizer in Near-Threshold-Voltage Multivoltage/ Frequency-Domain Network-on-Chip. IEEE J. Solid State Circuits 59(2): 616-625 (2024) - Quan Nguyen-Gia, Hyungcheol Shin:
Modeling of Threshold Voltage Shift by Neighboring Transistors for Macaroni Channel MOSFETs in Series. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 43(1): 324-327 (2024) - 2023
- Hung-Chi Han, Zhixing Zhao, Steffen Lehmann, Edoardo Charbon, Christian C. Enz:
Novel Approach to FDSOI Threshold Voltage Model Validated at Cryogenic Temperatures. IEEE Access 11: 56951-56957 (2023) - Yang Wei Lim, Noor Ain Kamsani, Roslina Mohd Sidek, Shaiful Jahari Hashim, Fakhrul Zaman Rokhani:
Energy-Performance Optimization via P/N Ratio Sizing With Full Diffusion Layout Structure and Standard Cell Height Tuning in Near-Threshold Voltage Operation. IEEE Access 11: 12536-12546 (2023) - Seoyeon Choi, Dong Geun Park, Min Jung Kim, Seain Bang, Jungchun Kim, Seunghee Jin, Ki Seok Huh, Donghyun Kim, Jérôme Mitard, Cheol E. Han, Jae Woo Lee:
Automatic Prediction of Metal-Oxide-Semiconductor Field-Effect Transistor Threshold Voltage Using Machine Learning Algorithm. Adv. Intell. Syst. 5(1) (2023) - Seoyeon Choi, Dong Geun Park, Min Jung Kim, Seain Bang, Jungchun Kim, Seunghee Jin, Ki Seok Huh, Donghyun Kim, Jérôme Mitard, Cheol E. Han, Jae Woo Lee:
Automatic Prediction of Metal-Oxide-Semiconductor Field-Effect Transistor Threshold Voltage Using Machine Learning Algorithm. Adv. Intell. Syst. 5(1) (2023) - Yang Feng, Bing Chen, Mingfeng Tang, Yuerang Qi, Maoying Bai, Chengcheng Wang, Hai Wang, Xuepeng Zhan, Junyu Zhang, Jing Liu, Jixuan Wu, Jiezhi Chen:
Near-threshold-voltage operation in flash-based high-precision computing-in-memory to implement Poisson image editing. Sci. China Inf. Sci. 66(12) (2023) - Bing-Chen Wu, Wei-Ting Chen, Tsung-Te Liu:
An Error-Resilient RISC-V Microprocessor With a Fully Integrated DC-DC Voltage Regulator for Near-Threshold Operation in 28-nm CMOS. IEEE J. Solid State Circuits 58(11): 3275-3285 (2023) - Lijun Xu, Guitai Wu, Pei Li, Tiedong Cheng:
Modeling threshold voltage and drain-induced barrier lowering effect of opposite doping core-shell channel surrounding-gate junctionless MOSFET. Microelectron. J. 139: 105830 (2023) - Run-Ze Yu, Zhen-Hao Li, Xi Deng, Zheng-Lin Liu:
Negative Design Margin Realization through Deep Path Activity Detection Combined with Dynamic Voltage Scaling in a 55 nm Near-Threshold 32-Bit Microcontroller. Sensors 23(17): 7498 (2023) - Shan Shen, Peng Cao, Ming Ling, Longxing Shi:
A Timing Yield Model for SRAM Cells at Sub/Near-Threshold Voltages Based on a Compact Drain Current Model. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(4): 1223-1234 (2023) - Jincheol Sim, Hyunsu Park, Yoonjae Choi, Jonghyuck Choi, Youngwook Kwon, Chulwoo Kim:
PAM-4 Receiver With 1-Tap DFE Using Clocked Comparator Offset Instead of Threshold Voltages for Improved LSB BER Performance. IEEE Trans. Circuits Syst. I Regul. Pap. 70(5): 1907-1916 (2023) - Zuheng Wu, Changwei Zhang, Jianxun Zou, Chunyu Peng, Xiulong Wu:
Threshold Switching Memristor-Based Voltage Regulative Circuit. IEEE Trans. Circuits Syst. II Express Briefs 70(3): 1034-1038 (2023) - Umme Rani Irin, Sajib Barua, Md Minhajul Azmir, Tasnuva Hassan, Dewan Mohammed:
Process Variation's Effect on Various Threshold Voltage Assignments in 6T SRAM Designs Using 12nm FinFET Technology. CCWC 2023: 928-932 - Ayesha Siddique, Khaza Anuarul Hoque:
Improving Reliability of Spiking Neural Networks through Fault Aware Threshold Voltage Optimization. DATE 2023: 1-6 - Lingyan Shen, Xinhong Cheng, Li Zheng, Yuehui Yu:
A Fin-p-GaN HEMT for High Threshold Voltage with Enhanced Stability. DRC 2023: 1-2 - Sumaiya Wahid, Lauren Hoang, Alwin Daus, Eric Pop:
Up to 100-fold Improvement of Threshold Voltage Stability in ITO Transistors. DRC 2023: 1-2 - Khakim Akhunov, Eren Yildiz, Kasim Sinan Yildirim:
Enabling Efficient Intermittent Computing on Brand New Microcontrollers via Tracking Programmable Voltage Thresholds. ENSsys@SenSys 2023: 16-22 - Md Raquibuzzaman, Aleksandar Milenkovic, Biswajit Ray:
Hide-and-Seek: Hiding Secrets in Threshold Voltage Distributions of NAND Flash Memory Cells. HotStorage 2023: 80-86 - Christian Bogner, Christian Schlünder, Michael Waltl, Hans Reisinger, Tibor Grasser:
Modeling of NBTI Induced Threshold Voltage Shift Based on Activation Energy Maps Under Consideration of Variability. IRPS 2023: 1-7 - Sunil Rathore, Rajeewa Kumar Jaisawal, P. N. Kondekar, Navneet Gandhi, Shashank Banchhor, Young Suh Song, Navjeet Bagga:
Self-Heating Aware Threshold Voltage Modulation Conforming to Process and Ambient Temperature Variation for Reliable Nanosheet FET. IRPS 2023: 1-5 - Christian Schwabe, Xing Liu, Tobias N. Wassermann, Paul Salmen, Thomas Basler:
SiC MOSFET threshold voltage stability during power cycling testing and the impact on the result interpretation. IRPS 2023: 1-6 - Limeng Shi, Shengnan Zhu, Jiashu Qian, Michael Jin, Monikuntala Bhattacharya, Marvin H. White, Anant K. Agarwal, Atsushi Shimbori, Tianshi Liu:
Investigation of different screening methods on threshold voltage and gate oxide lifetime of SiC Power MOSFETs. IRPS 2023: 1-7 - William Vandendaele, Camille Leurquin, R. Lavieville, Marie-Anne Jaud, Abygaël Viey, Romain Gwoziecki, B. Mohamad, E. Nowak, A. Constant, Ferdinando Iucolano:
Reliability of GaN MOSc-HEMTs: From TDDB to Threshold Voltage Instabilities (Invited). IRPS 2023: 1-8 - Zhichao Chen, Yang Xiao, Li Du, Yuan Du:
Characterization of Charge-Trap-Transistor (CTT) Threshold Voltage Degradation and Differential-Pair-Based Memory Design. ISCAS 2023: 1-5 - Matteo D'Addato, Luca Perilli, Alessia Maria Elgani, Eleonora Franchi Scarselli, Antonio Gnudi, Roberto Canegallo, Giulio Ricotti:
A Threshold Voltage Generator Circuit with Automatic Refresh and Dynamic Updating for Ultra-Low-Power Continuous-Time Comparators. ISCAS 2023: 1-5 - Lin Shao, Mingche Lai, Shi Xu, Chuxiong Lin, Weifeng He:
A Metastability Inference and Avoidance Technique for Near-Threshold-Voltage Network-on-Chip. ISCAS 2023: 1-5 - Konstantinos Moustakas, Vasiliki Gogolou, Thomas Noulis, Dimitrios H. Tassis, Stylianos Siskos:
A CMOS Threshold Voltage Monitoring Sensor. MOCAST 2023: 1-4 - Mahfuzul Islam, Shogo Harada, Takashi Hisakado, Osami Wada:
CMOS Temperature Sensor Utilizing Gate-length-based Threshold Voltage Modulation. NEWCAS 2023: 1-5
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